JP2000249643A5 - - Google Patents
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- Publication number
- JP2000249643A5 JP2000249643A5 JP1999055092A JP5509299A JP2000249643A5 JP 2000249643 A5 JP2000249643 A5 JP 2000249643A5 JP 1999055092 A JP1999055092 A JP 1999055092A JP 5509299 A JP5509299 A JP 5509299A JP 2000249643 A5 JP2000249643 A5 JP 2000249643A5
- Authority
- JP
- Japan
- Prior art keywords
- test
- chamber
- temperature
- refrigerator
- electric heater
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000035939 shock Effects 0.000 description 5
- 238000005259 measurement Methods 0.000 description 4
- 238000009863 impact test Methods 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
Description
【特許請求の範囲】
【請求項１】
試験室，低温室，高温室を各独立に設け、冷凍機を備えた冷凍装置により低温室内の気体を冷却するとともに、電気加熱器により高温室内の気体を加熱し、該加熱された気体と前記冷却された気体を交互に試験室に送り込んで試験室内に配置された試料を加熱冷却する冷熱衝撃試験装置において、低温試験中は高温室の電気加熱器の運転を、高温試験中は低温室の冷凍機の運転を制御することを特徴とする冷熱衝撃試験装置。
【請求項２】
請求項１において、高温試験中に前記試験室の目標温度と前記低温室との温度差及び前記試験室の目標温度への到達時間に基づいて前記冷凍機の運転を制御することを特徴とする冷熱衝撃試験装置。
【請求項３】
請求項２において、前記冷凍機の制御は低温室の測定温度及び測定時刻に基づいて前記冷凍装置の運転を制御することを特徴とする冷熱衝撃試験装置。
【請求項４】
請求項１において、低温試験中に前記試験室の目標温度と前記高温室との温度差及び前記試験室の目標温度への到達時間に基づいて前記電気加熱機の運転を制御することを特徴とする冷熱衝撃試験装置。
【請求項５】
請求項４において、前記の制御は高温室の測定温度及び測定時刻に基づいて前記電気加熱機の運転を制御することを特徴とする冷熱衝撃試験装置。
[Claims]
[Claim 1]
Laboratory, cold room, provided with high-temperature chamber in each independent, cools the cooler compartment of a gas in a refrigeration equipment having a refrigerator, heat the hot chamber of the gas by the electric heater, the heated gas In a cold shock test device that alternately sends the cooled gas to the test chamber to heat and cool the sample placed in the test chamber, the electric heater in the high temperature chamber is operated during the low temperature test, and the low temperature is operated during the high temperature test. A thermal shock test device characterized by controlling the operation of a refrigerator in a room.
2.
The first aspect of the present invention is characterized in that the operation of the refrigerator is controlled based on the temperature difference between the target temperature of the test chamber and the low temperature chamber and the time required to reach the target temperature of the test chamber during the high temperature test. Cold impact test equipment.
3.
The thermal shock test apparatus according to claim 2, wherein the control of the refrigerator is to control the operation of the refrigerator based on the measurement temperature and the measurement time of the low temperature chamber.
4.
The first aspect of the present invention is characterized in that the operation of the electric heater is controlled based on the temperature difference between the target temperature of the test chamber and the high temperature chamber and the time required to reach the target temperature of the test chamber during the low temperature test. Cold shock test equipment.
5.
The thermal shock test apparatus according to claim 4, wherein the control controls the operation of the electric heater based on the measurement temperature and the measurement time of the high temperature chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11055092A JP2000249643A (en) | 1999-03-03 | 1999-03-03 | Thermal shock test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11055092A JP2000249643A (en) | 1999-03-03 | 1999-03-03 | Thermal shock test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2000249643A JP2000249643A (en) | 2000-09-14 |
| JP2000249643A5 true JP2000249643A5 (en) | 2006-01-05 |
Family
ID=12989105
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11055092A Withdrawn JP2000249643A (en) | 1999-03-03 | 1999-03-03 | Thermal shock test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2000249643A (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001066237A (en) * | 1999-08-26 | 2001-03-16 | Tabai Espec Corp | Method for controlling energy conservation of cold heat impact tester |
| JP5204808B2 (en) * | 2010-06-29 | 2013-06-05 | エスペック株式会社 | Thermal shock test equipment |
| CN104596719A (en) * | 2014-12-25 | 2015-05-06 | 北京自动测试技术研究所 | Quick evaluation method for ultimate stress strength of integrated circuit for spaceflight |
| JP6527403B2 (en) * | 2015-06-29 | 2019-06-05 | 日立ジョンソンコントロールズ空調株式会社 | Environmental test equipment |
| JP6785540B2 (en) * | 2015-07-28 | 2020-11-18 | 日立ジョンソンコントロールズ空調株式会社 | Environmental test equipment |
| CN106092801B (en) * | 2016-05-31 | 2018-10-30 | 西安交通大学 | A kind of lasting gradient temperature combines thermal shock experiment System and method for off field |
| CN106680128B (en) * | 2016-12-27 | 2023-06-16 | 无锡宏盛换热系统有限公司 | A thermal shock test system for detecting the life of air intercooler |
| JP7246963B2 (en) * | 2019-02-18 | 2023-03-28 | エスペック株式会社 | Environmental test equipment and environmental test method |
| CN112014653B (en) * | 2019-05-28 | 2023-05-12 | 山东交通学院 | Low-temperature test capability verification equipment for electrical and electronic products |
| CN112985768B (en) * | 2021-03-22 | 2023-09-29 | 广州斯派克环境仪器有限公司 | Optical system high-low temperature test device |
| CN114167262A (en) * | 2021-12-10 | 2022-03-11 | 深圳市芯杰矽科技有限公司 | Debugging-free radio frequency transmitting and receiving integrated circuit performance detection equipment |
| CN114624044A (en) * | 2022-05-11 | 2022-06-14 | 苏州朗高智能科技有限公司 | Temperature impact test device for high-pressure water heater |
| CN116136507A (en) * | 2023-03-07 | 2023-05-19 | 中科科凌(北京)科技有限公司 | A temperature shock test device and temperature control method |
-
1999
- 1999-03-03 JP JP11055092A patent/JP2000249643A/en not_active Withdrawn
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