JP2000266523A - Method and apparatus for measuring object under test - Google Patents
Method and apparatus for measuring object under testInfo
- Publication number
- JP2000266523A JP2000266523A JP11072893A JP7289399A JP2000266523A JP 2000266523 A JP2000266523 A JP 2000266523A JP 11072893 A JP11072893 A JP 11072893A JP 7289399 A JP7289399 A JP 7289399A JP 2000266523 A JP2000266523 A JP 2000266523A
- Authority
- JP
- Japan
- Prior art keywords
- light cutting
- pitch
- light
- image
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
(57)【要約】
【課題】 クリーム半田のような被測定物を安価な構成
で確実に三次元測定することが可能な被測定物の測定方
法及び装置を提供する。
【解決手段】 投光ユニット7を順次移動させてライン
光を被測定物11に投光し、この像をCCDカメラ6で
撮像して光切断法に基づき被測定物の高さデータが測定
される。光切断開始位置から第1のピッチで順次ライン
光が複数本引かれ、その像が撮像される。続いて、光切
断開始位置から第1のピッチより短い第2のピッチに相
当する距離分だけ光切断開始位置をずらせ、そのずれた
光切断開始位置から第1のピッチで順次ライン光が引か
れて撮像が行われる。このような撮像を複数回行い、撮
像された複数の画像から第2のピッチで引かれた複数の
光切断線による高さデータが取得される。このような構
成では、一つの撮像視野内に複数のライン光が引かれて
撮像されるので、測定時間を大幅に短縮することができ
る。
An object of the present invention is to provide a method and an apparatus for measuring an object to be measured, such as cream solder, which can surely perform three-dimensional measurement with an inexpensive configuration. SOLUTION: A light projecting unit 7 is sequentially moved to project line light onto a device under test 11, an image of which is taken by a CCD camera 6, and height data of the device under test is measured based on a light cutting method. You. A plurality of line lights are sequentially drawn at a first pitch from the light cutting start position, and an image thereof is captured. Subsequently, the light cutting start position is shifted by a distance corresponding to a second pitch shorter than the first pitch from the light cutting start position, and line light is sequentially drawn at the first pitch from the shifted light cutting start position. Imaging is performed. Such imaging is performed a plurality of times, and height data based on a plurality of light cutting lines drawn at the second pitch from the captured images is acquired. In such a configuration, a plurality of line lights are drawn in one imaging field of view and an image is taken, so that the measurement time can be significantly reduced.
Description
【0001】[0001]
【発明の属する技術分野】木発明は、被測定物の測定方
法及びその装置、更に詳細には、ライン光を用い光切断
法に基づいて被測定物を三次元測定する被測定物の測定
方法及びその装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for measuring an object to be measured, and more particularly, to a method for measuring an object to be measured three-dimensionally based on a light section method using line light. And its device.
【0002】[0002]
【従来の技術】電子部品が搭載される基板には、電子部
品と配線を導通させるためにクリーム半田が印刷されて
いる。この印刷されたクリーム半田の形状を測定するた
めに、光切断法を用いた三次元測定が行なわる。光切断
法は、細いスリット状の光束で対象物(クリーム半田)
表面を切断するように照射し、表面に生じる切断線の形
状から被測定物の表面形状あるいは表面凹凸を測定する
もので、その構成の一例が図1に示されている。2. Description of the Related Art Cream solder is printed on a substrate on which electronic components are mounted in order to electrically connect the electronic components to wiring. In order to measure the shape of the printed cream solder, three-dimensional measurement using a light cutting method is performed. The light cutting method uses a thin slit-shaped light beam for the target object (cream solder)
Irradiation is performed so as to cut the surface, and the surface shape or surface unevenness of the object to be measured is measured from the shape of the cutting line generated on the surface. An example of the configuration is shown in FIG.
【0003】図1において、光源であるライン光発生器
21から発生したライン光22は、斜め上方から所定の
角度で被測定物23に投光され、被測定物23の表面に
形成された面形状に沿ってできた像が垂直上方よりCC
Dカメラ24で撮影される。CCDカメラで撮影した画
像はCCDカメラ制御器25でA/D変換され、画像取
込み器26で取り込まれる。そして、その取り込まれた
データは次の座標演算装置27によって被測定物23の
三次元座標に変換される。クリーム半田印刷機に組込ん
で使用するような、クリーム半田高さ測定装置において
は、図1の点線で囲まれた部分(測定ユニット)が、X
Y移動ガントリーに組み込まれる。In FIG. 1, a line light 22 generated from a line light generator 21 as a light source is projected from a diagonally upper part onto an object 23 at a predetermined angle to form a surface formed on the surface of the object 23. Image formed along the shape is CC from above vertically
Photographed by the D camera 24. The image captured by the CCD camera is A / D converted by the CCD camera controller 25 and captured by the image capturing device 26. Then, the captured data is converted into three-dimensional coordinates of the DUT 23 by the next coordinate calculation device 27. In a cream solder height measuring device which is used by being incorporated in a cream solder printing machine, a portion (measurement unit) surrounded by a dotted line in FIG.
Incorporated in a Y-movement gantry.
【0004】このような構成で、クリーム半田印刷機
に、印刷用の配線基板が搬入されると、配線基板とステ
ンシルの位置決め完了後に、配線基板のパッド面にクリ
ーム半田が印刷される。配線基板のパッド面への印刷が
完了した後に、XY移動ガントリーによって、初期待避
位置から、目的とする測定位置まで、上述の測定ユニッ
トが移動される。そして配線基板上のパッド面上のクリ
ーム半田形状に沿って形成されたライン光22の像が、
CCDカメラ24によって撮像される。測定ユニットは
その後初期退避位置に再び移動され、その位置で退避す
る。In such a configuration, when a wiring board for printing is carried into the cream solder printing machine, the cream solder is printed on the pad surface of the wiring board after the positioning of the wiring board and the stencil is completed. After the printing on the pad surface of the wiring board is completed, the above-described measurement unit is moved from the initial expected retreat position to the target measurement position by the XY movement gantry. Then, the image of the line light 22 formed along the cream solder shape on the pad surface on the wiring board is
The image is captured by the CCD camera 24. The measuring unit is then moved again to the initial retract position, where it retracts.
【0005】以上の撮像データから、配線基板のパッド
面の高さ方向の重心位置座標と、クリーム半田部の高さ
方向の重心位置座標が計算される。そして、配線基板の
パッド面の高さ方向の重心位置座標とクリーム半田部の
高さ方向の重心位置座標の差し引きから、配線基板のパ
ッド面を基準として、印刷後のクリーム半田部の高さが
算出され、各パッド面にわたるクリーム半田部の平均高
さが算出される。三次元形状を得るためには、光切断位
置を変えた複数のデータが必要となる。例えば長さが2
mmのパッドに印刷されたクリーム半田の三次元形状を
得るために、0.05mmのピッチで光切断を行うとす
る。この場合は、クリーム半田印刷後に、クリーム半田
の形状に沿ってできたライン光の像を、CCDカメラ
で、光切断の位置を変えながら40回撮像する必要があ
る。すなわち光切断一本の切断毎に測定ユニットを微小
移動させることになる。From the above image data, the coordinates of the center of gravity of the pad surface of the wiring board in the height direction and the coordinates of the center of gravity of the cream solder portion in the height direction are calculated. Then, from the subtraction of the coordinates of the center of gravity of the pad surface of the wiring board in the height direction and the coordinates of the center of gravity of the cream solder portion in the height direction, the height of the cream solder portion after printing is determined based on the pad surface of the wiring board. The calculated height of the cream solder portion over each pad surface is calculated. In order to obtain a three-dimensional shape, a plurality of data at different light cutting positions are required. For example, length 2
It is assumed that light cutting is performed at a pitch of 0.05 mm in order to obtain a three-dimensional shape of the cream solder printed on the pad of mm. In this case, after the cream solder printing, it is necessary to image the line light image formed along the shape of the cream solder 40 times with a CCD camera while changing the light cutting position. That is, the measuring unit is minutely moved every time one light cutting is performed.
【0006】[0006]
【発明が解決しようとする課題】上述したような、従来
装置において、光切断の位置を微小に変える場合、CC
Dカメラが搭載された重い測定ユニットを移動しなけれ
ばならず、XY移動ガントリーに対しては、目的とする
測定位置までのスキップ機能と、測定目的位置での微小
移動という二つの機能を持たせねばならず、XY移動ガ
ントリー駆動用のサーボ系が、複雑になるという問題点
があった。また、光切断一本の切断毎に測定ユニットを
微小移動させ、ライン光を投光して撮像しなければなら
ず測定に時間がかかるという問題点があった。In the conventional apparatus as described above, when the position of the light cutting is slightly changed, the CC
A heavy measurement unit equipped with a D camera must be moved, and the XY moving gantry is provided with two functions: a skip function to a target measurement position and a minute movement at a measurement target position. However, there is a problem that the servo system for driving the XY moving gantry becomes complicated. In addition, there is a problem in that the measurement unit must be slightly moved every time one light cut is performed, and line light is projected to capture an image.
【0007】従って、本発明は、このような問題点を解
決するためになされたもので、クリーム半田のような被
測定物を安価な構成で確実に三次元測定することが可能
な被測定物の測定方法及び装置を提供することをその課
題とする。SUMMARY OF THE INVENTION Accordingly, the present invention has been made to solve such a problem, and an object to be measured such as cream solder which can surely perform three-dimensional measurement with an inexpensive configuration. It is an object of the present invention to provide a measuring method and apparatus.
【0008】[0008]
【課題を解決するための手段】本発明は、光切断線の引
かれた被測定物を撮像して光切断法に基づき被測定物を
三次元測定する被測定物の測定方法及び装置において、
光切断開始位置から第1のピッチで順次光切断線を引い
て被測定物を撮像し、前記光切断開始位置から第1のピ
ッチより短い第2のピッチに相当する距離分だけ光切断
開始位置をずらせ、そのずれた光切断開始位置から第1
のピッチで順次光切断線を引いて被測定物を撮像し、前
記光切断開始位置を順次ずらせて撮像することを複数回
数行い、前記撮像された複数の画像から第2のピッチで
引かれた複数の光切断線による高さデータを取得するこ
とを特徴としている。SUMMARY OF THE INVENTION The present invention relates to a method and an apparatus for measuring an object to measure an object to be measured three-dimensionally based on an optical sectioning method by imaging an object to be measured along a light section line.
A light cutting line is sequentially drawn at a first pitch from the light cutting start position to image the object to be measured, and the light cutting start position is separated from the light cutting start position by a distance corresponding to a second pitch shorter than the first pitch. From the shifted optical cutting start position.
A light cutting line is sequentially drawn at a pitch to image the object to be measured, and the light cutting start position is sequentially shifted and imaged a plurality of times, and the image is drawn at a second pitch from the plurality of imaged images. It is characterized in that height data by a plurality of light cutting lines is obtained.
【0009】このような構成では、一つの撮像視野内に
複数の光切断線を引いて撮像するので、測定時間を大幅
に短縮することができる。また、光切断開始位置を所望
する光切断ピッチづつずらせて複数画像撮像し、その複
数の画像データから高さデータを前記ずらせたピッチの
順に配列することにより細かな所望の光切断ピッチの高
さデータを得ることができるので、高い測定精度を得る
ことが可能になる。In such a configuration, since a plurality of light cutting lines are drawn in one field of view for imaging, the measurement time can be greatly reduced. In addition, a plurality of images are captured by shifting the light cutting start position by a desired light cutting pitch, and the height data from the plurality of image data is arranged in the order of the shifted pitch to thereby achieve a fine desired light cutting pitch height. Since data can be obtained, high measurement accuracy can be obtained.
【0010】[0010]
【発明の実施の形態】以下、図面に示す実施の形態に基
づいて本発明を詳細に説明する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail based on embodiments shown in the drawings.
【0011】図2は、本発明の1実施形態に係わる三次
元測定装置の構成を示す斜視図であり、図3はその側面
図である。各図において、レーザダイオード1から射出
されるレーザ光は、コリメートレンズ2により平行光束
にされ、フォーカシングレンズ3、投光ミラー4を介し
てラインジェネレータレンズ5に入射する。ラインジェ
ネレータレンズ5によりレーザ光は、被測定物(クリー
ム半田ないしそれが印刷される基板面)11にライン光
9として投光され、そのライン光の像がCCDカメラ6
により撮像される。フォーカシングレンズ3、投光ミラ
ー4並びにラインジェネレータレンズ5は、投光ユニッ
ト7として構成され、リニアアクチュエータ8により矢
印10に示した方向に往復動される。FIG. 2 is a perspective view showing a configuration of a three-dimensional measuring apparatus according to one embodiment of the present invention, and FIG. 3 is a side view thereof. In each figure, a laser beam emitted from a laser diode 1 is converted into a parallel light beam by a collimator lens 2 and enters a line generator lens 5 via a focusing lens 3 and a light projecting mirror 4. The laser light is projected by the line generator lens 5 onto the object to be measured (cream solder or the substrate surface on which it is printed) 11 as line light 9, and the image of the line light is captured by the CCD camera 6.
Is imaged. The focusing lens 3, the light projecting mirror 4 and the line generator lens 5 are configured as a light projecting unit 7, and are reciprocated in a direction indicated by an arrow 10 by a linear actuator 8.
【0012】レーザダイオード1の接合面は被測定物で
ある基板面と平行になるように構成されており、その光
はコリメートレンズ2で集光され平行光となる。フォー
カシングレンズ3はこの平行光をスポット光となるよう
に絞り込み、フォーカシングレンズ3からの光は、投光
ミラー4により垂直軸と45度の角度をなすように曲げ
られる。フォーカシングレンズ3は被測定物11上で、
小さなスポット径を結ぶように作用するが、フォーカシ
ングレンズ3から被測定物11への光路の途中に置かれ
たラインジェネレータレンズ5の作用により、一方向に
引き伸ばされてライン光となる。このようにしてレーザ
光は、幅14〜20μm(本実施形態では14μm)、
長さ10mmのライン光9として被測定物11に投光さ
れ、被測定物からの拡散反射光が、CCDカメラ6によ
り撮像される。The bonding surface of the laser diode 1 is configured so as to be parallel to the surface of the substrate to be measured, and the light is condensed by the collimating lens 2 to become parallel light. The focusing lens 3 narrows the parallel light into a spot light, and the light from the focusing lens 3 is bent by the light projecting mirror 4 so as to form an angle of 45 degrees with the vertical axis. The focusing lens 3 is placed on the DUT 11,
Although it acts so as to connect a small spot diameter, it is elongated in one direction by the action of the line generator lens 5 placed in the optical path from the focusing lens 3 to the device under test 11 to become line light. Thus, the laser beam has a width of 14 to 20 μm (14 μm in the present embodiment),
The light is projected on the DUT 11 as a line light 9 having a length of 10 mm, and diffusely reflected light from the DUT is imaged by the CCD camera 6.
【0013】リニアアクチュエータ8は、その軸を前後
に直線運動する作用を持っていて、その軸にはフォーカ
シングレンズ3、投光ミラー4並びにラインジェネレー
タレンズ5からなる投光ユニット7が取付けられてお
り、コリメートレンズ2によって形成された平行光線に
向かって投光ユニット7が、矢印10で示したように、
前後直線運動をする。平行光線に向かって前後に直線運
動を行っても、フォーカシングレンズ3の結像作用には
影響を及ぼさないから、被測定物11には常に一定の幅
のライン光が結像される。そして、このライン光の像が
真上に取り付けられたCCDカメラ6によって撮像され
る。CCDカメラ6の視野は6mm×6mmで、ノンイ
ンターレースであり、またリニアアクチュエータ8のス
トロークは10mmである。The linear actuator 8 has a function of linearly moving back and forth on its axis, and the light emitting unit 7 including the focusing lens 3, the light emitting mirror 4 and the line generator lens 5 is mounted on the axis. , The light projecting unit 7 directs parallel light rays formed by the collimating lens 2 as shown by an arrow 10,
Make a linear motion back and forth. Even if the linear motion is performed back and forth toward the parallel rays, the imaging action of the focusing lens 3 is not affected. Therefore, a line light having a constant width is always formed on the DUT 11. Then, the image of the line light is picked up by the CCD camera 6 mounted directly above. The field of view of the CCD camera 6 is 6 mm × 6 mm, non-interlaced, and the stroke of the linear actuator 8 is 10 mm.
【0014】図3において、投光ユニット7は右端から
左に、一定速度4.8mm/secで移動される。CC
Dカメラ6の視野内の所定の個所に投光出来る位置に来
た時に、レーザダイオード1を2msec間点灯する。
これによる撮像画像を図4に示す。図4において、リニ
アアクチュエータ8が移動してP1〜P3の光切断の位
置に移動したときに、それぞれレーザダイオードが点灯
され、パッド面30bから突出したクリーム半田30a
がライン光により光切断され撮像されている状態が示さ
れている。In FIG. 3, the light projecting unit 7 is moved from the right end to the left at a constant speed of 4.8 mm / sec. CC
The laser diode 1 is turned on for 2 msec when it reaches a position where light can be projected to a predetermined position in the field of view of the D camera 6.
FIG. 4 shows a captured image by this. In FIG. 4, when the linear actuator 8 moves and moves to the light cutting positions P1 to P3, the respective laser diodes are turned on, and the cream solder 30a protruding from the pad surface 30b.
3 shows a state in which the light is cut by the line light and an image is taken.
【0015】このように、リニアアクチュエータ8を微
小移動させながらクリーム半田の形状に沿ってできたラ
イン光の像を、CCDカメラで、光切断の位置を変えな
がら多数撮像して、各データから、例えば、図1に示し
たような座標演算器を用いて、配線基板のパッド面30
bの高さ方向の重心位置座標と、クリーム半田部30a
の高さ方向の重心位置座標を計算し、各重心位置座標の
差し引きから、配線基板のパッド面を基準として、印刷
後のクリーム半田部の高さを算出する。そして各パッド
面にわたるクリーム半田部の平均高さを算出する。As described above, a large number of line light images formed along the shape of the cream solder while the linear actuator 8 is slightly moved are imaged by the CCD camera while changing the position of the light cutting. For example, by using a coordinate calculator as shown in FIG.
b, the coordinates of the center of gravity in the height direction and the cream solder portion 30a
The coordinates of the center of gravity in the height direction are calculated, and the height of the cream solder portion after printing is calculated based on the subtraction of the coordinates of each center of gravity with reference to the pad surface of the wiring board. Then, the average height of the cream solder portion over each pad surface is calculated.
【0016】クリーム半田の凹凸形状を更に詳しく解析
する場合には、光切断ピッチを狭くする必要がある。し
かしながら、上述した方法で一本の光切断線ごとに撮像
したのでは非常に時間がかかってしまう。そこで、本発
明では、一回の撮像において順次光切断線を複数引く方
法を取った。その場合、通常に狭ピッチで光切断線を引
いたのでは切断線が重なり合ってしまう。例えば高さ
0.12mmの半田を、角度45度の投光で0.05m
mのピッチでの光切断線を引きこれを撮像すると、撮像
画面では光切断線は高さ方向に半分以上重なり合ってし
まう。そこで、本発明では、光切断開始位置を狭ピッチ
に相当する距離ずらせながら光切断線が重ならない荒い
等ピッチの光切断線を順次複数引いて撮像を行ない、こ
のような撮像を複数回繰返し、狭ピッチで引かれた光切
断線による高さデータを取得するようにしている。When analyzing the uneven shape of the cream solder in more detail, it is necessary to narrow the light cutting pitch. However, it takes a very long time to take an image for each light cutting line by the above-described method. Therefore, in the present invention, a method of sequentially arranging a plurality of light cutting lines in one image pickup is adopted. In such a case, if the light cutting lines are normally drawn at a narrow pitch, the cutting lines will overlap. For example, a solder having a height of 0.12 mm is irradiated with light at an angle of 45 degrees and a height of 0.05 m
If a light cutting line is drawn at a pitch of m and an image is taken, the light cutting lines overlap in the height direction by more than half on the imaged screen. Therefore, in the present invention, imaging is performed by sequentially arranging a plurality of light cutting lines of a uniform pitch such that light cutting lines do not overlap while shifting the light cutting start position by a distance corresponding to a narrow pitch, and such imaging is repeated a plurality of times. Height data is obtained by light cutting lines drawn at a narrow pitch.
【0017】図5はその一実施形態を示している。図5
(A)は一回目の撮像で、t1のピッチ、例えば0.3
mmのピッチでライン光を投光し撮像視野内に3本の光
切断線を順次引いて光切断を行い、これを撮像したもの
である。図5(B)は二回目の撮像で、同じt1の0.
3mmのピッチで光切断するが、一回目の撮像の光切断
開始位置からt2の距離、例えば0.05mmずれた位
置が二回目の光切断開始位置となる。この光切断開始位
置から一回目の撮像時と同様に0.3mmのピッチで3
本の光切断線を引き撮像を行なう。図5(C)は三回目
の撮像であり、同じく0.3mmのピッチで光切断を行
なうときの光切断開始位置は二回目の撮像の光切断開始
位置から0.05mmずれた位置となる。FIG. 5 shows one embodiment. FIG.
(A) is the first imaging, at a pitch of t1, for example, 0.3
The line light is projected at a pitch of mm, and three light cutting lines are sequentially drawn in the field of view of the image to perform light cutting, and this is imaged. FIG. 5 (B) shows the second imaging, in which 0.
Although light is cut at a pitch of 3 mm, a position shifted by a distance of t2, for example, 0.05 mm, from the light cutting start position of the first imaging is the second light cutting start position. From the light cutting start position, 3 mm at a pitch of 0.3 mm as in the first imaging.
A light cutting line is drawn and imaging is performed. FIG. 5C shows the third imaging, in which the light cutting start position when performing light cutting at a pitch of 0.3 mm is a position shifted by 0.05 mm from the light cutting start position in the second imaging.
【0018】このように位置を0.05mmずらせなが
ら6回撮像し、これらの画像データを二値化処理を行っ
て重心を計算して高さデータを求め、高さデータを0.
05mmピッチの順番で並び替えれば、0.05mmの
狭ピッチでの光切断データが得られることになる。なお
荒い光切断ピッチt1(0.3mm)は目的とする細か
い光切断ピッチt2(0.05mm)の整数倍となるよ
うにする。すなわち0.3mm/0.05mm=6とな
り、本実施形態では視野内の光切断ピッチt1は、所望
する光切断ピッチt2の6倍である。As described above, the image is taken six times while shifting the position by 0.05 mm, the image data is subjected to a binarization process, the center of gravity is calculated, height data is obtained, and the height data is set to 0.
By rearranging in the order of the pitch of 05 mm, light cutting data with a narrow pitch of 0.05 mm can be obtained. The rough light cutting pitch t1 (0.3 mm) is set to be an integral multiple of the target fine light cutting pitch t2 (0.05 mm). That is, 0.3 mm / 0.05 mm = 6, and in this embodiment, the light cutting pitch t1 in the visual field is six times the desired light cutting pitch t2.
【0019】次に二値化の方法であるが、各行毎に輝度
の平均値と標準偏差を求め、標準偏差+n×標準偏差な
るしきい値を設けて各行毎に二値化する。ここでnは係
数である。但し、二値化は一つの光切断線ごとに行う。
一つの画面に複数の光切断線が引かれた状態で二値化を
行うと前記係数nの値を固定できない。なぜなら一つの
画面に引かれる光切断線の数は常に同じ数とは限らない
からである。そこでおよその半田の高さは既知であるか
ら光切断位置より1/2の高さの位置を求める。そして
1/2の高さの位置を中心として荒い切断ピッチの幅
(0.3mm)で、光切断位置情報と共に画像データを
取出して二値化処理とその後の高さ計算処理を行う。こ
れを光切断線毎に行う。一つの光切断線毎に高さ計算処
理を行うので、係数nは固定することができる。従っ
て、光切断ピッチごとに係数nを決めること無く、単一
の係数nで任意の光切断ピッチを選択することが可能に
なる。Next, as a binarization method, an average value and a standard deviation of luminance are obtained for each row, and a threshold value of standard deviation + n × standard deviation is provided to perform binarization for each row. Here, n is a coefficient. However, binarization is performed for each light cutting line.
If binarization is performed in a state where a plurality of light cutting lines are drawn on one screen, the value of the coefficient n cannot be fixed. This is because the number of light cutting lines drawn on one screen is not always the same. Therefore, since the approximate height of the solder is known, a position half as high as the light cutting position is obtained. Then, image data is taken out along with the light cutting position information at a rough cutting pitch width (0.3 mm) centered on the half height position, and binarization processing and subsequent height calculation processing are performed. This is performed for each light cutting line. Since the height calculation processing is performed for each light cutting line, the coefficient n can be fixed. Therefore, it is possible to select an arbitrary light cutting pitch with a single coefficient n without determining the coefficient n for each light cutting pitch.
【0020】上述した実施形態では、光切断線としてラ
イン光を用いたが、ガルバノミラー等を使用して、スポ
ット光をライン光の長さに走査しても光切断線を形成す
ることができる。その場合、スポット光はライン光を引
いている間は連続点灯であり、次の光切断位置に移動中
は消灯する。In the above embodiment, the line light is used as the light cutting line. However, the light cutting line can be formed by scanning the spot light to the length of the line light using a galvanometer mirror or the like. . In that case, the spot light is continuously turned on while the line light is being drawn, and is turned off while moving to the next light cutting position.
【0021】なお、光切断を行う場合、リニアアクチュ
エータの動きはその動きを検出する位置情報センサが設
けられているので、リニアアクチュェータを前進させて
あるいは後退させて光切断線を引いても、光切断画像の
撮像は可能である。In the case of performing the light cutting, since the linear actuator is provided with a position information sensor for detecting the movement, the linear actuator is moved forward or backward to draw a light cutting line. Also, it is possible to capture a light section image.
【0022】[0022]
【発明の効果】以上説明したように、本発明では、一つ
の撮像視野内に複数の光切断線を引いて撮像するので、
一つの光切断線を引いて撮像するのに比較して測定時間
を大幅に短縮することができる。また、本発明では、光
切断開始位置を所望する光切断ピッチづつずらせて複数
画像撮像し、その複数の画像データから高さデータを前
記ずらせたピッチの順に配列することにより細かな所望
の光切断ピッチの高さデータを得ることができるので、
高い測定精度を得ることが可能になる。また、複数引か
れた光切断線の中から各切断線毎に光切断位置データと
共に画像データを切り出して二値化等の高さ計算処理を
行うので、任意のピッチで光切断することが可能にな
る。As described above, according to the present invention, a plurality of light-section lines are drawn in one field of view, and an image is taken.
The measurement time can be greatly reduced as compared with the case where one light section line is drawn and imaged. Also, in the present invention, a plurality of images are captured by shifting the light cutting start position by a desired light cutting pitch, and height data is arranged from the plurality of image data in the order of the shifted pitch, whereby a fine desired light cutting is performed. Since pitch height data can be obtained,
High measurement accuracy can be obtained. In addition, since the image data is cut out along with the light cutting position data for each cutting line from the plurality of drawn light cutting lines and height calculation processing such as binarization is performed, light cutting can be performed at an arbitrary pitch. become.
【図1】従来の測定装置の構成を示すブロック図であ
る。FIG. 1 is a block diagram showing a configuration of a conventional measuring device.
【図2】本発明による測定装置の概略構成を示す斜視図
である。FIG. 2 is a perspective view showing a schematic configuration of a measuring device according to the present invention.
【図3】図2の側面図である。FIG. 3 is a side view of FIG. 2;
【図4】光切断法で撮像したクリーム半田の画像を示す
説明図である。FIG. 4 is an explanatory view showing an image of cream solder captured by a light cutting method.
【図5】複数の光切断線を引き撮像する状態を説明した
説明図である。FIG. 5 is an explanatory diagram illustrating a state in which a plurality of light cutting lines are drawn and imaged.
1 レーザダイオード 2 コリメートレンズ 3 フォーカシングレンズ 5 ラインジェネレータレンズ 6 CCDカメラ 7 投光ユニット 9 ライン光 11 被測定物 Reference Signs List 1 laser diode 2 collimating lens 3 focusing lens 5 line generator lens 6 CCD camera 7 light emitting unit 9 line light 11 DUT
───────────────────────────────────────────────────── フロントページの続き (72)発明者 斉藤 勝 東京都調布市国領町8丁目2番地の1 ジ ューキ株式会社内 Fターム(参考) 2F065 AA04 AA17 AA24 AA53 CC26 DD06 FF01 FF02 FF04 FF09 GG06 HH05 HH12 JJ03 JJ09 JJ26 LL10 MM14 QQ03 QQ04 QQ41 QQ42 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Masaru Saito 1-Fuku term in Juke Corporation, 8-2 Kokuryo-cho, Chofu-shi, Tokyo 2F065 AA04 AA17 AA24 AA53 CC26 DD06 FF01 FF02 FF04 FF09 GG06 HH05 HH12 JJ03 JJ09 JJ26 LL10 MM14 QQ03 QQ04 QQ41 QQ42
Claims (6)
光切断法に基づき被測定物を三次元測定する被測定物の
測定方法において、 光切断開始位置から第1のピッチで順次光切断線を引い
て被測定物を撮像し、 前記光切断開始位置から第1のピッチより短い第2のピ
ッチに相当する距離分だけ光切断開始位置をずらせ、そ
のずれた光切断開始位置から第1のピッチで順次光切断
線を引いて被測定物を撮像し、 前記光切断開始位置を順次ずらせて撮像することを複数
回数行い、 前記撮像された複数の画像から第2のピッチで引かれた
複数の光切断線による高さデータを取得することを特徴
とする被測定物の測定方法。1. A method for measuring an object to be measured, wherein an image of the object on which an optical section line is drawn is imaged and the object is three-dimensionally measured based on an optical section method. A light cutting line is sequentially drawn to image the object to be measured, and the light cutting start position is shifted from the light cutting start position by a distance corresponding to a second pitch shorter than the first pitch, and the shifted light cutting start position is shifted. From a plurality of times, the light cutting line is sequentially drawn at a first pitch to take an image of an object to be measured, and the light cutting start position is sequentially shifted to take an image a plurality of times. A method for measuring an object to be measured, characterized by acquiring height data based on a plurality of drawn optical cutting lines.
倍であることを特徴とする請求項1に記載の被測定物の
測定方法。2. The method according to claim 1, wherein the first pitch is an integral multiple of a second pitch.
ほぼ高さデータの1/2を加えた位置を中心として前記
第1のピッチに等しい幅の画像データを光切断位置デー
タと共に取出して各光切断線ごとに二値化処理すること
を特徴とする請求項1または2に記載の被測定物の測定
方法。3. An image data having a width equal to the first pitch is taken out together with the light cutting position data from the taken image and centered on a position obtained by adding approximately 1/2 of the height data to the light cutting position. 3. The method for measuring an object to be measured according to claim 1, wherein a binarization process is performed for each light cutting line.
光切断法に基づき被測定物を三次元測定する被測定物の
測定装置において、 光切断開始位置から第1のピッチで順次光切断線を引く
手段と、 前記光切断線が引かれた被測定物を撮像する手段とを設
け、 光切断開始位置から第1のピッチで順次光切断線を引い
て被測定物を撮像し、 前記光切断開始位置から第1のピッチより短い第2のピ
ッチに相当する距離分だけ光切断開始位置をずらせ、そ
のずれた光切断開始位置から第1のピッチで順次光切断
線を引いて被測定物を撮像し、 前記光切断開始位置を順次ずらせて撮像することを複数
回数行い、 前記撮像された複数の画像から第2のピッチで引かれた
複数の光切断線による高さデータを取得することを特徴
とする被測定物の測定装置。4. An apparatus for measuring an object to be measured, wherein an image of an object to be measured on which a light cutting line is drawn is three-dimensionally measured based on a light cutting method. Means for sequentially drawing light cutting lines, and means for imaging the object to be measured on which the light cutting lines have been drawn, and image the object to be measured by sequentially drawing light cutting lines at a first pitch from the light cutting start position Then, the optical cutting start position is shifted by a distance corresponding to a second pitch shorter than the first pitch from the optical cutting start position, and optical cutting lines are sequentially drawn at the first pitch from the shifted optical cutting start position. The object to be measured is imaged, the light cutting start position is sequentially shifted, and the image is picked up a plurality of times, and the height data by a plurality of light cutting lines drawn at a second pitch from the plurality of imaged images An apparatus for measuring an object to be measured, wherein
倍であることを特徴とする請求項4に記載の被測定物の
測定装置。5. The device for measuring a device under test according to claim 4, wherein the first pitch is an integral multiple of a second pitch.
ほぼ高さデータの1/2を加えた位置を中心として前記
第1のピッチに等しい幅の画像データを光切断位置デー
タと共に取出して各光切断線ごとに二値化処理すること
を特徴とする請求項4または5に記載の被測定物の測定
装置。6. An image data having a width equal to the first pitch is taken out together with the light cutting position data from the imaged image and centered on a position obtained by adding approximately 1/2 of the height data to the light cutting position. The device for measuring an object to be measured according to claim 4 or 5, wherein the binarization process is performed for each light cutting line.
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|---|---|---|---|
| JP07289399A JP4454714B2 (en) | 1999-03-18 | 1999-03-18 | Method and apparatus for measuring object to be measured |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP07289399A JP4454714B2 (en) | 1999-03-18 | 1999-03-18 | Method and apparatus for measuring object to be measured |
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|---|---|
| JP2000266523A true JP2000266523A (en) | 2000-09-29 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101995228A (en) * | 2009-08-18 | 2011-03-30 | 株式会社拓普康 | Measuring apparatus |
| US8243264B2 (en) | 2009-08-18 | 2012-08-14 | Kabushiki Kaisha Topcon | Measuring apparatus |
| WO2021149916A1 (en) * | 2020-01-20 | 2021-07-29 | 주식회사 유사이언스 | Machine vision inspection device using multi-line beam |
-
1999
- 1999-03-18 JP JP07289399A patent/JP4454714B2/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101995228A (en) * | 2009-08-18 | 2011-03-30 | 株式会社拓普康 | Measuring apparatus |
| US8243264B2 (en) | 2009-08-18 | 2012-08-14 | Kabushiki Kaisha Topcon | Measuring apparatus |
| TWI427265B (en) * | 2009-08-18 | 2014-02-21 | Nidec Read Corp | Measuring apparatus |
| WO2021149916A1 (en) * | 2020-01-20 | 2021-07-29 | 주식회사 유사이언스 | Machine vision inspection device using multi-line beam |
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