JP2000511329A - 電子顕微鏡の光学結合画像センサ用の解像度拡張装置 - Google Patents
電子顕微鏡の光学結合画像センサ用の解像度拡張装置Info
- Publication number
- JP2000511329A JP2000511329A JP09514311A JP51431197A JP2000511329A JP 2000511329 A JP2000511329 A JP 2000511329A JP 09514311 A JP09514311 A JP 09514311A JP 51431197 A JP51431197 A JP 51431197A JP 2000511329 A JP2000511329 A JP 2000511329A
- Authority
- JP
- Japan
- Prior art keywords
- image
- scintillator
- light
- electron microscope
- resolution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004606 Fillers/Extenders Substances 0.000 title 1
- 230000003287 optical effect Effects 0.000 claims abstract description 33
- 238000003384 imaging method Methods 0.000 claims abstract description 29
- 238000000576 coating method Methods 0.000 claims description 15
- 239000011248 coating agent Substances 0.000 claims description 14
- 238000010894 electron beam technology Methods 0.000 claims description 13
- 239000013307 optical fiber Substances 0.000 claims description 11
- 239000013078 crystal Substances 0.000 claims description 9
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 claims description 6
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 claims description 6
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 26
- 239000000463 material Substances 0.000 description 17
- 239000000835 fiber Substances 0.000 description 13
- 239000010408 film Substances 0.000 description 5
- 239000003921 oil Substances 0.000 description 5
- 238000001816 cooling Methods 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 239000011358 absorbing material Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 2
- 239000006117 anti-reflective coating Substances 0.000 description 2
- 238000000149 argon plasma sintering Methods 0.000 description 2
- 238000005253 cladding Methods 0.000 description 2
- 230000002708 enhancing effect Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000001429 visible spectrum Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000001444 catalytic combustion detection Methods 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 239000011236 particulate material Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000034408 response to ionizing radiation Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/224—Luminescent screens or photographic plates for imaging; Apparatus specially adapted therefor, e. g. cameras, TV-cameras, photographic equipment or exposure control; Optical subsystems specially adapted therefor, e. g. microscopes for observing image on luminescent screen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/86—Vessels; Containers; Vacuum locks
- H01J29/89—Optical or photographic arrangements structurally combined or co-operating with the vessel
- H01J29/892—Optical or photographic arrangements structurally combined or co-operating with the vessel using fibre optics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2443—Scintillation detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2445—Photon detectors for X-rays, light, e.g. photomultipliers
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1. 電子画像を形成する電子ビーム(11)と、該電子ビームの通路に配置さ れて前記電子画像を光画像に変換するシンチレータ(22)と、該光画像を受信 して記録するように配置された撮像センサ(26)とを備えた電子画像の解像度 を改良する装置において、該装置が更に、前記シンチレータ(22)に関係した 、前記光学画像を前記撮像センサ(26)へ転送するための転送光学素子(24 )を含み、且つ、吸光層(36)が前記シンチレータ(22)上に設けられてい ることを特徴とする電子画像の解像度を改良する装置。 2. 前記撮像センサが電荷結合デバイスであることを特徴とする請求項1に記 載の装置。 3. 前記撮像センサが陰極線管であることを特徴とする請求項1に記載の装置 。 4. 前記吸光層(36)上に更に導電コーティング(38)を含んでいること を特徴とする請求項1に記載の装置。 5. 前記シンチレータ(22)と、前記転送光学素子(24)との間に更に透 過導電層(40)を含んでいることを特徴とする請求項1に記載の装置。 6. 前記転送光学素子が光学繊維プレートを備えていることを特徴とする請求 項1に記載の装置。 7. 前記転送光学素子が光学レンズを備えていることを特徴とする請求項1に 記載の装置。 8. 前記シンチレータがイットリウム−アルミニウム−ガーネット結晶を備え ていることを特徴とする請求項1に記載の装置。 9. 前記シンチレータが粒状燐光物質からなるコーティングを備えていること を特徴とする請求項1に記載の装置。 10. 電子顕微鏡であって、光画像及び/又は回折パターンを形成する電子ビ ーム(11)が横断する投射室(10)を有し、前記電子顕微鏡により生成され た画像の解像度を改良し且つ前記電子ビームを傍受するように前記投射室内に配 置された、前記電子ビーム(11)の通路に配置されて前記電子画像を光画像に 変換するシンチレータ(22)と、該光画像を受信して記録するように配置され た撮像センサ(26)とを備えた装置を含んだ電子顕微鏡において、前記装置が 更に、前記シンチレータ(22)に関係した、前記光学画像を前記撮像センサ( 26)へ転送するための転送光学素子(24)を含み、且つ、吸光層(36)が 前記シンチレータ(22)上に設けられていることを特徴とする電子顕微鏡。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/539,017 US5635720A (en) | 1995-10-03 | 1995-10-03 | Resolution-enhancement device for an optically-coupled image sensor for an electron microscope |
| US08/539,017 | 1995-10-03 | ||
| PCT/US1996/015357 WO1997013270A1 (en) | 1995-10-03 | 1996-09-24 | Resolution-enhancement device for an optically-coupled image sensor for an electron microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2000511329A true JP2000511329A (ja) | 2000-08-29 |
| JP3967771B2 JP3967771B2 (ja) | 2007-08-29 |
Family
ID=24149406
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51431197A Expired - Lifetime JP3967771B2 (ja) | 1995-10-03 | 1996-09-24 | 電子顕微鏡の光学結合画像センサ用の解像度拡張装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5635720A (ja) |
| EP (1) | EP0853813B1 (ja) |
| JP (1) | JP3967771B2 (ja) |
| DE (1) | DE69629122T2 (ja) |
| WO (1) | WO1997013270A1 (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010212233A (ja) * | 2009-02-10 | 2010-09-24 | Univ Of Tokyo | 透過型電子顕微鏡 |
| JP2019102456A (ja) * | 2017-11-30 | 2019-06-24 | ガタン インコーポレイテッドGatan Inc. | 電子顕微鏡法のための高密度高速発光体 |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1998057350A1 (en) * | 1997-06-13 | 1998-12-17 | Gatan, Inc. | Methods and apparatus for improving resolution and reducing noise in an image detector for an electron microscope |
| US6031234A (en) * | 1997-12-08 | 2000-02-29 | General Electric Company | High resolution radiation imager |
| US6518580B1 (en) * | 1998-11-16 | 2003-02-11 | The United States Of America As Represented By The United States Department Of Energy | Proton radiography based on near-threshold Cerenkov radiation |
| EP1218919B1 (en) | 1999-09-30 | 2006-05-03 | Gatan, Inc. | Electron image detector coupled by optical fibers with absorbing outer cladding to reduce blurring |
| US6803583B2 (en) * | 2001-03-21 | 2004-10-12 | M.E. Taylor Engineering Inc. | Scintillator for electron microscope and method of making |
| JP2004127760A (ja) * | 2002-10-03 | 2004-04-22 | Jeol Ltd | 透過電子顕微鏡像の撮像装置 |
| MX2008009392A (es) * | 2006-01-24 | 2009-02-18 | Univ North Carolina | Sistemas y metodos para detectar una imagen de un objeto por el uso de un haz de rayos x que tiene una distribucion policromatica. |
| EP2006881A3 (en) * | 2007-06-18 | 2010-01-06 | FEI Company | In-chamber electron detector |
| US7745786B2 (en) * | 2008-03-19 | 2010-06-29 | Fama Leo A | Method and apparatus allowing simultaneous direct observation and electronic capture of scintillation images in an electron microscope |
| WO2010065532A2 (en) | 2008-12-01 | 2010-06-10 | The University Of North Carolina At Chapel Hill | Systems and methods for detecting an image of an object using multi-beam imaging from an x-ray beam having a polychromatic distribution |
| CA2763367C (en) * | 2009-06-04 | 2016-09-13 | Nextray, Inc. | Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods |
| US8204174B2 (en) * | 2009-06-04 | 2012-06-19 | Nextray, Inc. | Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals |
| JP5065516B2 (ja) | 2010-08-04 | 2012-11-07 | エフ イー アイ カンパニ | 薄い電子検出器における後方散乱の減少 |
| US8993971B2 (en) * | 2011-06-15 | 2015-03-31 | The Board Of Trustees Of The Leland Stanford Junior University | High resolution positron emission tomography |
| US8735815B2 (en) | 2012-06-22 | 2014-05-27 | Edax, Inc. | Method and apparatus for electron pattern imaging |
| JP5967538B2 (ja) * | 2012-09-25 | 2016-08-10 | 株式会社日立ハイテクノロジーズ | 電子顕微鏡および電子線検出器 |
| DE112014002859T5 (de) * | 2013-07-31 | 2016-04-14 | Hitachi High-Technologies Corporation | Ladungsteilchenstrahlvorrichtung |
| WO2016172291A1 (en) * | 2015-04-23 | 2016-10-27 | Fermi Research Alliance, Llc | Monocrystal-based microchannel plate image intensifier |
| EP4726766A1 (en) * | 2024-10-10 | 2026-04-15 | ASML Netherlands B.V. | Charged particle-optical apparatus |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2740050A (en) * | 1952-03-15 | 1956-03-27 | Gen Electric | Phosphor screen and method of making the same |
| GB2183898A (en) * | 1985-11-05 | 1987-06-10 | Texas Instruments Ltd | Checking voltages in integrated circuit by means of an electron detector |
| US4739399A (en) * | 1987-08-06 | 1988-04-19 | Gatan Inc. | TV system for transmission electron microscopes |
| FR2628562A1 (fr) * | 1988-03-11 | 1989-09-15 | Thomson Csf | Dispositif d'imagerie a structure matricielle |
| JPH0775407B2 (ja) * | 1988-05-17 | 1995-08-09 | 日本放送協会 | 撮像デバイス |
| FR2647955B1 (fr) * | 1989-05-30 | 1991-08-16 | Thomson Tubes Electroniques | Ecran d'entree de tube intensificateur d'image radiologique |
| US5065029A (en) * | 1990-08-03 | 1991-11-12 | Gatan, Inc. | Cooled CCD camera for an electron microscope |
| FR2666447B1 (fr) * | 1990-08-31 | 1996-08-14 | Thomson Tubes Electroniques | Tube intensificateur d'image avec compensation de courbe de brillance. |
-
1995
- 1995-10-03 US US08/539,017 patent/US5635720A/en not_active Expired - Lifetime
-
1996
- 1996-09-24 JP JP51431197A patent/JP3967771B2/ja not_active Expired - Lifetime
- 1996-09-24 WO PCT/US1996/015357 patent/WO1997013270A1/en not_active Ceased
- 1996-09-24 DE DE69629122T patent/DE69629122T2/de not_active Expired - Lifetime
- 1996-09-24 EP EP96933893A patent/EP0853813B1/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010212233A (ja) * | 2009-02-10 | 2010-09-24 | Univ Of Tokyo | 透過型電子顕微鏡 |
| JP2019102456A (ja) * | 2017-11-30 | 2019-06-24 | ガタン インコーポレイテッドGatan Inc. | 電子顕微鏡法のための高密度高速発光体 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0853813B1 (en) | 2003-07-16 |
| JP3967771B2 (ja) | 2007-08-29 |
| US5635720A (en) | 1997-06-03 |
| DE69629122D1 (de) | 2003-08-21 |
| EP0853813A1 (en) | 1998-07-22 |
| WO1997013270A1 (en) | 1997-04-10 |
| DE69629122T2 (de) | 2004-02-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP1218919B1 (en) | Electron image detector coupled by optical fibers with absorbing outer cladding to reduce blurring | |
| JP3967771B2 (ja) | 電子顕微鏡の光学結合画像センサ用の解像度拡張装置 | |
| US6847041B2 (en) | Scintillator panel, radiation detector and manufacture methods thereof | |
| EP1118878B1 (en) | Scintillator panel, radiation image sensor, and method for producing the same | |
| US5517033A (en) | Apparatus for improved image resolution in electron microscopy | |
| US11237281B2 (en) | Flat-panel detector comprising light-transmission layer between ray-conversion layer and photoelectric conversion layer and method of manufacturing flat-panel detector | |
| JPH11202053A (ja) | 放射線イメージング装置 | |
| JPH06205768A (ja) | X線検査装置 | |
| US6091796A (en) | Scintillator based microscope | |
| US5723865A (en) | X-ray imaging device | |
| EP0403802B1 (en) | X-ray image intensifier and method of manufacturing input screen | |
| US20110096904A1 (en) | Linear X-ray detector using fiber optic face plate to alter optical path | |
| US5401964A (en) | Reduced electron scattering phosphor screen for high resolution transmission electron microscope imaging | |
| US4406973A (en) | Black glass shield and method for absorbing stray light for image intensifiers | |
| CN211086146U (zh) | 一种软x射线显微成像探测器 | |
| EP0536833B1 (en) | X-ray examination apparatus | |
| JPH04287580A (ja) | X線撮像方法とその装置並びに蛍光板および冷却型ccdカメラ | |
| US7566873B1 (en) | High-resolution, low-distortion and high-efficiency optical coupling in detection system of electron beam apparatus | |
| JPH08306328A (ja) | X線撮像管 | |
| JP3564628B2 (ja) | X線センサおよびx線検査装置 | |
| JPH03200099A (ja) | X線顕微鏡 | |
| JP2026026254A (ja) | 電子線検出装置 | |
| WO2025263053A1 (ja) | 電子線検出装置及び透過型電子顕微鏡 | |
| CN120044575A (zh) | 一种改进耦合结构的间接式探测器及其制作方法 | |
| JPH01149340A (ja) | 撮像管 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20050412 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20050711 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20050822 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050830 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20051206 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060227 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20061219 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070319 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20070515 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20070601 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100608 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110608 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120608 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120608 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130608 Year of fee payment: 6 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |