JP2001037726A5

JP2001037726A5 -

Info

Publication number: JP2001037726A5
Application number: JP1999216418A
Authority: JP
Filing date: 1999-07-30
Publication date: 2004-11-18

Description

【０００８】
（１）被検者の頭部を支持し被検眼の位置を安定させる支持手段と被検眼をスリット照明する照明光学系と被検眼の観察条件を設定する条件設定手段とを持つ細隙灯顕微鏡において、スリット照明された被検眼を光電撮像素子に撮像する撮像手段と、固定台上を操作手段の操作により移動可能に載置されると共に、前記照明光学系と撮像部とが同一軸を中心にして互いに回転可能に取り付けられた基台と、該基台に取り付けられたディスプレイを持ち前記撮像手段によって撮像された被検眼を該ディスプレイ上に表示する表示手段を備えたことを特徴とする。
（２）（１）の細隙灯顕微鏡は、さらに前記条件設定手段により設定される観察条件を検知する検知手段を備え、観察条件を前記ディスプレイ上に表示された被検眼像と同一視野内に表示することを特徴とする。
（３）（１）の細隙灯顕微鏡において、前記支持手段は顎載せ台を電動で上下動させる移動手段と前記顎載せ台の移動を指令する信号を入力する信号入力手段とを備え、該信号入力手段は前記ディスプレイ上に表示された被検眼像と同一視野内に配置されたことを特徴とする。
（４）被検者の顔を支持するための顎載せ台を持ち被検眼の位置を安定させる支持手段と被検眼をスリット照明する照明光学系と被検眼の観察条件を設定する条件設定手段とを持つ細隙灯顕微鏡において、スリット照明された被検眼を観察する観察手段と、固定台上を操作手段の操作により移動可能に載置されると共に、前記照明光学系と撮像部とが同一軸を中心にして互いに回転可能に取り付けられた基台と、前記顎載せ台を電動で上下動させる移動手段と、該移動手段の移動を指令する信号を入力する信号入力手段とを備え、該信号入力手段は検査者が被検眼像を観察する姿勢を維持した状態で操作できる位置に配置されたことを特徴とする。0008
(1) A gap lamp microscope having a support means for supporting the head of the subject and stabilizing the position of the eye to be inspected, an illumination optical system for slit-illuminating the eye to be inspected, and a condition setting means for setting observation conditions for the eye to be inspected. In the above, the imaging means for imaging the slit-illuminated eye to be inspected by the photoelectric imaging element and the imaging means are movably mounted on the fixed table by the operation of the operating means, and the illumination optical system and the imaging unit are centered on the same axis. It is characterized in that it is provided with a base that is rotatably attached to each other and a display means that has a display attached to the base and displays an eye to be inspected imaged by the imaging means on the display.
(2) The slit lamp microscope of (1) further includes a detection means for detecting the observation conditions set by the condition setting means, and the observation conditions are within the same field of view as the eye image to be inspected displayed on the display. It is characterized by displaying.
(3) In the slit lamp microscope of (1), the support means includes a moving means for electrically moving the chin rest and a signal input means for inputting a signal for instructing the movement of the chin rest. The signal input means is arranged in the same visual field as the image to be inspected displayed on the display.
(4) A support means for stabilizing the position of the eye to be inspected by having a jaw rest for supporting the face of the subject, an illumination optical system for slit-illuminating the eye to be inspected, and a condition setting means for setting observation conditions of the eye to be inspected. In a narrow-gap microscope, the observation means for observing the eye to be inspected illuminated by slits is movably mounted on a fixed table by the operation of the operation means, and the illumination optical system and the imaging unit have the same axis. A base that is rotatably attached to each other around the center, a moving means that electrically moves the jaw rest, and a signal input means that inputs a signal instructing the movement of the moving means are provided, and the signal is provided. The input means is characterized in that it is arranged at a position where the examiner can operate the image while maintaining the posture of observing the image to be inspected.

Claims

A slit lamp microscope having a support means for supporting the head of a subject and stabilizing the position of the subject's eye, an illumination optical system for slit lighting the subject's eye, and a condition setting means for setting the observation condition of the subject's eye An imaging means for imaging the illuminated eye to be examined on a photoelectric imaging element, and the stationary table are movably mounted by operation of the operating means, and the illumination optical system and the imaging unit are mutually centered about the same axis A slit lamp microscope characterized by comprising: a rotatably mounted base; and a display unit having a display mounted on the pedestal and displaying on the display an eye to be examined imaged by the imaging unit. .

The slit lamp microscope according to claim 1 further comprises detection means for detecting an observation condition set by the condition setting means, and the observation condition is displayed in the same visual field as the eye image to be examined displayed on the display. Slit lamp microscope characterized by

The slit lamp microscope according to claim 1, wherein the supporting means comprises moving means for moving the chin rest up and down electrically and signal input means for inputting a signal for instructing movement of the chin rest. A slit lamp microscope, wherein the slit lamp microscope is disposed in the same field of view as the eye image displayed on the display.

A support means for supporting the face of the subject, a support means for stabilizing the position of the subject's eye, an illumination optical system for slit lighting the subject's eye, and a condition setting means for setting the observation condition of the subject's eye In the gap lamp microscope, the observation optical system for observing the slit-illuminated eye to be examined and the stationary table are movably mounted by the operation of the operation optical system, and the illumination optical system and the imaging unit are centered on the same axis. And a moving means for electrically moving the chin rest up and down, and a signal input means for inputting a signal for commanding the movement of the moving means, the signal input means comprising: A slit lamp microscope characterized in that it is disposed at a position where an examiner can operate while maintaining a posture for observing an eye image to be examined.