JP2005148497A5 - - Google Patents

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Publication number
JP2005148497A5
JP2005148497A5 JP2003387096A JP2003387096A JP2005148497A5 JP 2005148497 A5 JP2005148497 A5 JP 2005148497A5 JP 2003387096 A JP2003387096 A JP 2003387096A JP 2003387096 A JP2003387096 A JP 2003387096A JP 2005148497 A5 JP2005148497 A5 JP 2005148497A5
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JP
Japan
Prior art keywords
laser
light
laser beam
laser light
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003387096A
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English (en)
Japanese (ja)
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JP2005148497A (ja
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Publication date
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Priority to JP2003387096A priority Critical patent/JP2005148497A/ja
Priority claimed from JP2003387096A external-priority patent/JP2005148497A/ja
Publication of JP2005148497A publication Critical patent/JP2005148497A/ja
Publication of JP2005148497A5 publication Critical patent/JP2005148497A5/ja
Pending legal-status Critical Current

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JP2003387096A 2003-11-17 2003-11-17 走査型レーザ顕微鏡システム Pending JP2005148497A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003387096A JP2005148497A (ja) 2003-11-17 2003-11-17 走査型レーザ顕微鏡システム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003387096A JP2005148497A (ja) 2003-11-17 2003-11-17 走査型レーザ顕微鏡システム

Publications (2)

Publication Number Publication Date
JP2005148497A JP2005148497A (ja) 2005-06-09
JP2005148497A5 true JP2005148497A5 (da) 2007-01-11

Family

ID=34694585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003387096A Pending JP2005148497A (ja) 2003-11-17 2003-11-17 走査型レーザ顕微鏡システム

Country Status (1)

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JP (1) JP2005148497A (da)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007183111A (ja) * 2006-01-04 2007-07-19 Nikon Corp 光強度検出装置とこれを有する光学装置、顕微鏡
JP5075722B2 (ja) * 2008-04-14 2012-11-21 オリンパス株式会社 走査型レーザ顕微鏡
JP5549740B2 (ja) * 2010-10-14 2014-07-16 株式会社ニコン 構造化照明装置、構造化照明顕微鏡装置、及び面形状測定装置
WO2015087629A1 (ja) * 2013-12-10 2015-06-18 ソニー株式会社 画像取得装置及び画像取得方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2666840B2 (ja) * 1987-05-12 1997-10-22 オリンパス光学工業株式会社 高温顕微鏡
JP3343276B2 (ja) * 1993-04-15 2002-11-11 興和株式会社 レーザー走査型光学顕微鏡
DE19827140C2 (de) * 1998-06-18 2002-12-12 Zeiss Carl Jena Gmbh Laserscanmikroskop mit AOTF
JP2001013417A (ja) * 1999-07-01 2001-01-19 Keyence Corp 光走査装置
DE10037783A1 (de) * 2000-08-03 2002-02-14 Leica Microsystems Verfahren und Vorrichtung zur Phasenkorrektur von Positions- und Detektionssignalen in der Scanmikroskopie und Scanmikroskop
JP3861000B2 (ja) * 2001-12-25 2006-12-20 オリンパス株式会社 走査型レーザー顕微鏡
JP2003270146A (ja) * 2002-03-15 2003-09-25 Communication Research Laboratory 顕微鏡システム
JP2005140981A (ja) * 2003-11-06 2005-06-02 Nikon Corp 顕微鏡装置

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