JP2012068043A - Electric inspection device and method for planar circuit board - Google Patents

Abstract

An inspection is performed by the same apparatus regardless of the type of the planar circuit board.
An electrical inspection device 2 is arranged so as to face a planar circuit board 1 and supports a large number of probe pins 3 arranged uniformly according to a predetermined rule, and a large number of probe pins 3. A pin board 4 for moving the probe pin 3 with respect to the planar circuit board 1 and connected to each probe pin 3 for measuring electrical characteristics of the planar circuit board 1 based on signals from each probe pin 3 The measurement unit 12 and the like, a connection switching unit 15 for selectively connecting each probe pin 3 to the measurement unit 12 and the like, a power supply unit 13, a communication unit 14, and a control unit 11 are provided. The arrangement of the inspection points 37 </ b> A to 37 </ b> H that can come into contact with the probe pins 3 formed on the planar circuit board 1 is arranged in advance so as to match the arrangement of a large number of probe pins 3.
[Selection] Figure 1

Description

  The present invention relates to an electrical inspection apparatus and an electrical inspection method for a planar circuit board used for electrical inspection of a planar circuit board formed by planarly forming circuit elements and wirings on the substrate.

  Conventionally, as this type of technology, for example, an apparatus described in Patent Document 1 below is known. In this apparatus, the inspection unit includes a plurality of contacts each configured in a multi-needle shape. These contacts are arranged and held corresponding to the positions of inspection points such as lands and pads in the wiring pattern on the substrate. The following patent document 2 describes related technology.

  Here, as the “substrate”, various substrates such as a printed circuit board, a flexible circuit board, a multilayer circuit board, an electrode plate for a liquid crystal display, a package substrate for a semiconductor package, and a film carrier are assumed.

  Patent Document 2 describes an example of electrical inspection using a pin board provided with a large number of probe pins in order to inspect a product in which individual components are mounted on a circuit board by soldering or the like.

JP 2005-172603 A JP-A-9-21841

  However, in the apparatus described in Patent Document 1, the position of the inspection point may change depending on the type of substrate. For this reason, it is necessary to change the arrangement of the contacts due to the different types of substrates, which takes time for changeover and may cause mistakes.

  In the inspection method described in Patent Document 2, probe pins are arranged on a pin board so as to avoid contact with components. Here, when the types of products increase and the component arrangement is changed, it is necessary to change the arrangement of the probe pins and recreate the pin board in order to avoid interference with the components. For this reason, in practice, it has been necessary to keep the printed circuit board in a certain type under the constraint that the number of printed circuit board types increases.

  The present invention has been made in view of the above circumstances, and in particular, has been made by paying attention to the inspection specialized in the planar circuit board, and the purpose thereof is the same apparatus regardless of the type of the planar circuit board. It is an object of the present invention to provide an electrical inspection apparatus and electrical inspection method for a planar circuit board that can be inspected by the above.

  In order to achieve the above object, the invention according to claim 1 is configured to support a plurality of probe pins, a plurality of probe pins that are arranged so as to face the planar circuit board and are uniformly arranged according to a predetermined rule, and a plurality of probe pins. A pin board for moving a large number of probe pins with respect to the planar circuit board; and a measuring means connected to each probe pin for measuring electrical characteristics of the planar circuit board based on signals from each probe pin; The purpose of this is to provide connection switching means for selectively connecting each probe pin to the measuring means.

  According to the configuration of the invention, a large number of probe pins are uniformly arranged according to a predetermined rule and supported on the pin board, and the inspection points of the planar circuit board are arranged in advance so as to be aligned with a part of the arrangement. deep. This makes it possible to bring some of the many probe pins into contact with the inspection points on the planar circuit board. Here, the “planar circuit board” is configured by planarly forming circuit elements and wirings on the substrate, and the circuit elements and wirings are formed, for example, by printing on the substrate.

  In order to achieve the above object, according to a second aspect of the present invention, in the first aspect of the present invention, the predetermined rule relating to the arrangement of a plurality of probe pins is made such that one unit of the arrangement forms a square. It is preferable.

  To achieve the above object, the invention according to claim 3 is the invention according to claim 1, wherein the predetermined rule relating to the arrangement of the plurality of probe pins is set so that the arrangement of one unit forms an equilateral triangle. It is preferable to do.

  In order to achieve the above object, the invention according to claim 4 is configured such that the tips of a large number of probe pins arranged uniformly according to a predetermined rule are brought into contact with a planar circuit board, and among the plurality of probe pins, The purpose is to inspect the planar circuit board by selectively switching only the probe pins that are in contact with the plurality of inspection points formed on the planar circuit board and connecting to the measuring unit and measuring the electrical characteristics. To do.

  According to the configuration of the above invention, according to the configuration of the above invention, the planar circuit board is arranged so that a large number of probe pins are uniformly arranged according to a predetermined rule and supported on the pin board and aligned with a part of the arrangement. The inspection points are arranged in advance. This makes it possible to bring some of the many probe pins into contact with the inspection points on the planar circuit board.

  According to the present invention, the electrical characteristics of the planar circuit board can be inspected using the same apparatus for general purposes regardless of the type of the planar circuit board.

1 is a schematic diagram illustrating an electrical configuration of a planar circuit board and an electrical inspection device according to an embodiment. Sectional drawing which shows the outline of the mechanical structure of an electrical inspection apparatus according to the embodiment. Sectional drawing which shows the outline of the mechanical structure of an electrical inspection apparatus according to the embodiment. The top view which expands and shows the arrangement | sequence state of many probe pins in a pin board concerning the embodiment. The top view which expands and shows a planar circuit board concerning the embodiment. The top view which shows the relationship between arrangement | positioning of the circuit element, wiring, and test | inspection point which were formed on the board | substrate, and many probe pins concerning the embodiment. The flowchart which shows the control program which concerns on the same embodiment and a control part performs. The top view which concerns on another embodiment and expands and shows the arrangement | sequence state of many probe pins in a pin board.

  Hereinafter, an embodiment of an electrical inspection apparatus and electrical inspection method for a planar circuit board according to the present invention will be described in detail with reference to the drawings.

  FIG. 1 schematically shows the electrical configuration of the planar circuit board 1 and the electrical inspection apparatus 2 of this embodiment. The electrical inspection device 2 is arranged so as to be opposed to the planar circuit board 1 and supports a large number of probe pins 3 arranged uniformly according to a predetermined rule, and supports a large number of probe pins 3 and a large number of probe pins. 3 includes a pin board 4 for moving 3 with respect to the planar circuit board 1 and a measuring device 5. The measurement device 5 includes a control unit 11, a measurement unit 12 such as an AD converter, a power supply unit 13, a communication unit 14, and a connection switching unit 15. The control unit 11, the measurement unit 12, the power supply unit 13, and the communication unit 14 correspond to the measurement unit of the present invention. The connection switching unit 15 corresponds to the connection switching unit of the present invention.

  The control unit 11 controls the measurement unit 12, the power supply unit 13, the communication unit 14, and the connection switching unit 15, respectively. The control unit 11 includes a central processing unit (CPU) and a memory, and a predetermined control program is stored in the memory.

  The connection switching unit 15 includes first to fourth switching circuits 16A to 16D. The switching circuits 16A to 16D are electrically connected to the probe pins 3, respectively. Each switching circuit 16 </ b> A to 16 </ b> D is configured to selectively connect each probe pin 3 to the measurement unit 12, the power supply unit 13, and the communication unit 14.

  The measurement unit 12 includes an AD converter and the like, and is connected to each probe pin 3 via the first and second switching circuits 16A and 16B. The measuring unit 12 is configured to measure the electrical characteristics of the planar circuit board 1 based on signals from the probe pins 3.

  The power supply unit 13 is connected to each probe pin 3 via the third switching circuit 16C. The power supply unit 13 is configured to supply power to each probe pin 3.

  The communication unit 14 is connected to each probe pin 3 via the fourth switching circuit 16D. The communication unit 14 is configured to communicate with the planar circuit board 1 via each probe pin 3 and receive a measurement value by the element 32 on the planar circuit board 1.

  2 and 3 are schematic sectional views showing the mechanical configuration of the electrical inspection apparatus 2. The apparatus 2 includes a support base 21 that horizontally supports the planar circuit board 1, a pin board 4 that integrally supports a large number of probe pins 3, and a mechanism that horizontally supports the pin board 4 via support rods 22. A case 23. The mechanism case 23 is configured to be movable up and down by a lifting mechanism (not shown).

  Then, by lowering the mechanism case 23 by the elevating mechanism from the state shown in FIG. 2, the tip of each probe pin 3 comes into contact with the planar circuit board 1 in a slightly pressurized state as shown in FIG. Can be made.

  The pin board 4 is provided with a plurality of guide bars 24 facing downward. Further, the support base 21 is provided with a plurality of guide holes 25 aligned with the respective guide bars 24. As shown in FIG. 2, each guide bar 24 is moved from the state where the pin board 4 is away from the support base 21, and when the pin board 4 approaches the support base 21 as shown in FIG. 3, Inserted into each guide hole 25, the support base 21 and the pin board 4 are positioned integrally.

  FIG. 4 is an enlarged plan view showing a partial arrangement state of a large number of probe pins 3 on the pin board 4. The predetermined rule relating to the arrangement of a large number of probe pins 3 is configured so that one unit of the arrangement forms a square as shown by a two-dot chain line in FIG. The pin board 4 is provided with 1000 to 1500 probe pins 3, for example. In this embodiment, as an interval between adjacent probe pins 3, for example, a dimension of about “2 to 2.5 (mm)” is assumed.

  FIG. 5 is an enlarged plan view of the planar circuit board 1. The planar circuit board 1 is configured by planarly forming a plurality of circuit elements 31, 32, 33, 34 and wirings 35 on a substrate 36. In this embodiment, the circuit elements 31 to 34 and the wiring 35 are formed on the substrate 36 by printing. Printing is performed using a technique such as inkjet or screen printing. On the wiring 35, a plurality of inspection points 37A, 37B, 37C, 37D, 37E, 37F, 37G, and 37H having conductivity are formed in places. Except for the inspection points 37A to 37H, the upper surface of the substrate 36 is covered and protected by an insulating film (not shown).

  In this embodiment, the arrangement of the inspection points 37 </ b> A to 37 </ b> H described above matches the arrangement of a large number of probe pins 3 supported by the pin board 4. FIG. 6 is a plan view showing the relationship between the arrangement of the circuit elements 31 to 34, the wiring 35 and the inspection points 37 </ b> A to 37 </ b> H formed on the substrate 36 and the arrangement of a large number of probe pins 3. As is clear from FIG. 6, it can be seen that each of the inspection points 37 </ b> A to 37 </ b> H matches the arrangement of a part of the probe pins 3. That is, in this embodiment, the inspection points 37 </ b> A to 37 </ b> H on the planar circuit board 1 are formed in accordance with the arrangement of a large number of probe pins 3 supported by the pin board 4.

  Next, an inspection method performed using the above-described electrical inspection apparatus 2 will be described. As shown in FIG. 3, this inspection is performed by bringing each probe pin 3 into contact with the planar circuit board 1 in a pressurized state. FIG. 7 is a flowchart showing a control program executed by the control unit 11.

  In step 100, the control unit 11 performs measurement confirmation. That is, the control unit 11 switches the connection switching unit 15, applies a minute voltage from the power supply unit 13 to the planar circuit board 1 via each probe pin 3, and confirms whether the predetermined current is measured by the measurement unit 12. Let In this step, it is confirmed whether the circuit of the planar circuit board 1 is open or shorted.

  In step 110, the control unit 11 executes the first communication result confirmation. That is, the control unit 11 switches the connection switching unit 15, supplies power from the power supply unit 13 to the planar circuit board 1 via each probe pin 3, and sends the communication unit 14 to the planar circuit board 1 via each probe pin 3. And the communication unit 14 confirms whether a predetermined communication result is obtained. In this step, it is confirmed whether the circuit element 32 operates normally.

  In step 120, the control unit 11 performs a first voltage check. That is, the control unit 11 switches the connection switching unit 15, supplies power from the power supply unit 13 to the planar circuit board 1 via each probe pin 3, and sends the communication unit 14 to the planar circuit board 1 via each probe pin 3. And the output terminal is set to a predetermined state, and then the measurement unit 12 checks whether a predetermined voltage is measured. In this step, it is confirmed whether the output circuit operates normally.

  In step 130, the control unit 11 executes the second communication result confirmation. That is, the control unit 11 switches the connection switching unit 15, supplies power from the power supply unit 13 to the planar circuit board 1 via each probe pin 3, and sends the communication unit 14 to the planar circuit board 1 via each probe pin 3. And the communication unit 14 confirms whether a predetermined communication result is obtained by applying a voltage to the inspection point 37A. In this step, it is confirmed whether the input circuit operates normally.

  In step 140, the control unit 11 performs a second voltage check. That is, the control unit 11 switches the connection switching unit 15, supplies power from the power supply unit 13 to the planar circuit board 1 via each probe pin 3, and sends the communication unit 14 to the planar circuit board 1 via each probe pin 3. And the measurement unit 12 confirms whether a predetermined voltage is output to the inspection point 37F by applying a voltage to the inspection point 37A. In this step, the entire electrical characteristics of the planar circuit board 1 are inspected to check whether the operation of the planar circuit board 1 is normal.

  As described above, in this embodiment, the tips of a large number of probe pins 3 arranged uniformly according to a predetermined rule are brought into contact with the planar circuit board 1, and the planar circuit board 1 out of the numerous probe pins 3. An electrical inspection method for inspecting the planar circuit board 1 by selectively switching the probe pins 3 that are in contact with the plurality of inspection points formed thereon and connecting the probe pins 3 to the measurement unit 12 and measuring the electrical characteristics is performed. Like to do.

  According to the electrical inspection apparatus 2 and the electrical inspection method of this embodiment described above, a large number of probe pins 3 are uniformly arranged according to a predetermined rule and supported on the pin board 4 and aligned with a part of the array. In this way, the inspection points 37A to 37H of the planar circuit board 1 are arranged in advance. Thereby, a part of many probe pins 3 can be brought into contact with each inspection point 37A to 37H of the planar circuit board 1. For this reason, the electrical characteristics of the planar circuit board 1 can be inspected using the same electrical inspection apparatus 2 for general purposes regardless of the type of the planar circuit board 1. In other words, conventionally, it is necessary to create a pin board for each circuit board product. On the other hand, according to the electrical inspection apparatus 2 of this embodiment, any product can be obtained by disposing the inspection points 37A to 37H on the planar circuit board 1 at positions that match the arrangement of the probe pins 3. Even in the (planar circuit board 1), the planar circuit board 1 can be inspected by using the same pin board 4 for general purposes without separately providing a pin board.

  In addition, this invention is not limited to the said embodiment, It can implement by changing a part of structure suitably in the range which does not deviate from the meaning of invention.

  For example, in the above-described embodiment, the predetermined rule relating to the arrangement of a large number of probe pins 3 is configured such that one unit arrangement forms a square as shown in FIG. On the other hand, as shown in FIG. 8, the predetermined rule concerning the arrangement of a large number of probe pins 3 can be configured such that the arrangement of one unit forms a regular triangle.

  The present invention can be used for inspection relating to the electrical characteristics of a planar circuit board.

DESCRIPTION OF SYMBOLS 1 Planar circuit board 2 Electrical inspection apparatus 3 Probe pin 4 Pin board 11 Control part (measuring means)
12 Measuring unit (measuring means)
13 Power supply (measuring means)
14 Communication unit (measuring means)
15 Connection switching part (switching means)
31 Circuit element 32 Circuit element 33 Circuit element 34 Circuit element 35 Wiring 36 Substrate 37A Inspection point 37B Inspection point 37C Inspection point 37D Inspection point 37E Inspection point 37F Inspection point 37G Inspection point 37H Inspection point

Claims (4)

A large number of probe pins arranged so as to face the planar circuit board and uniformly arranged according to a predetermined rule;
A pin board for supporting the multiple probe pins and moving the multiple probe pins relative to the planar circuit board;
Measuring means connected to each probe pin and measuring the electrical characteristics of the planar circuit board based on signals from each probe pin;
An electrical inspection apparatus for a planar circuit board, comprising: a connection switching means for selectively connecting the probe pins to the measuring means.   2. The electrical inspection apparatus for a planar circuit board according to claim 1, wherein one unit of the predetermined rule relating to the array of the plurality of probe pins has a square shape.   2. The electrical inspection apparatus for a planar circuit board according to claim 1, wherein one unit of the predetermined rule relating to the array of the plurality of probe pins forms a regular triangle.   The tips of a large number of probe pins arranged uniformly according to a predetermined rule are brought into contact with the planar circuit board, and the plurality of probe pins are brought into contact with a plurality of inspection points formed on the planar circuit board. An electrical inspection method for a planar circuit board, wherein the planar circuit board is inspected by selectively switching only the probe pins being connected to the measuring unit and measuring electrical characteristics.

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