JP2013170899A5 - - Google Patents
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- JP2013170899A5 JP2013170899A5 JP2012034396A JP2012034396A JP2013170899A5 JP 2013170899 A5 JP2013170899 A5 JP 2013170899A5 JP 2012034396 A JP2012034396 A JP 2012034396A JP 2012034396 A JP2012034396 A JP 2012034396A JP 2013170899 A5 JP2013170899 A5 JP 2013170899A5
- Authority
- JP
- Japan
- Prior art keywords
- waveform
- electromagnetic wave
- time
- condensing
- wave pulse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000005259 measurement Methods 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 9
- 230000003287 optical effect Effects 0.000 claims description 7
- 241001385733 Aesculus indica Species 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 3
- 230000000704 physical effect Effects 0.000 claims description 3
- 238000003325 tomography Methods 0.000 claims 3
- 238000000691 measurement method Methods 0.000 claims 2
- 238000001228 spectrum Methods 0.000 claims 1
- 238000004070 electrodeposition Methods 0.000 description 2
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012034396A JP2013170899A (ja) | 2012-02-20 | 2012-02-20 | 測定装置及び測定方法、トモグラフィー装置 |
| US13/769,170 US20130218008A1 (en) | 2012-02-20 | 2013-02-15 | Measuring device, measuring method, and tomographic apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012034396A JP2013170899A (ja) | 2012-02-20 | 2012-02-20 | 測定装置及び測定方法、トモグラフィー装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013170899A JP2013170899A (ja) | 2013-09-02 |
| JP2013170899A5 true JP2013170899A5 (2) | 2015-04-02 |
Family
ID=48982788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012034396A Pending JP2013170899A (ja) | 2012-02-20 | 2012-02-20 | 測定装置及び測定方法、トモグラフィー装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20130218008A1 (2) |
| JP (1) | JP2013170899A (2) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012218174A1 (de) * | 2012-10-05 | 2014-04-10 | Robert Bosch Gmbh | Ortungsvorrichtung zur Bestimmung einer Objekttiefe |
| JP2015087163A (ja) * | 2013-10-29 | 2015-05-07 | パイオニア株式会社 | テラヘルツ波計測装置 |
| DE102013226277A1 (de) * | 2013-12-17 | 2015-06-18 | Leica Microsystems Cms Gmbh | Verfahren und Vorrichtung zum Untersuchen einer Probe mittels optischer Projektionstomografie |
| JP2016028230A (ja) * | 2014-07-09 | 2016-02-25 | キヤノン株式会社 | 測定装置及び測定方法 |
| JP2016114371A (ja) * | 2014-12-11 | 2016-06-23 | パイオニア株式会社 | テラヘルツ波計測装置 |
| KR101793609B1 (ko) * | 2015-09-11 | 2017-11-06 | 연세대학교 산학협력단 | 다중 광학 융합영상 기반 실시간으로 뇌종양을 진단하는 방법 및 장치 |
| EP3315953A1 (en) * | 2016-10-31 | 2018-05-02 | Twoptics Systems Design SL | Optical inspection system of objects destined to be used in a quality control system in a series manufacturing process and associated method |
| WO2018105332A1 (ja) * | 2016-12-06 | 2018-06-14 | パイオニア株式会社 | 検査装置、検査方法、コンピュータプログラム及び記録媒体 |
| JP6829993B2 (ja) * | 2016-12-28 | 2021-02-17 | 株式会社キーエンス | 光走査高さ測定装置 |
| US11041715B2 (en) | 2017-08-31 | 2021-06-22 | Pioneer Corporation | Optical measurement apparatus, measurement method, program, and recording medium |
| EP3711161B1 (en) * | 2018-03-08 | 2023-11-01 | Alcon Inc. | Detecting peak laser pulses using control signal timings |
| JP6952917B2 (ja) * | 2019-07-17 | 2021-10-27 | パイオニア株式会社 | テラヘルツ波計測装置 |
| JP2019174489A (ja) * | 2019-07-17 | 2019-10-10 | パイオニア株式会社 | テラヘルツ波計測装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3575805D1 (de) * | 1984-10-11 | 1990-03-08 | Hitachi Ltd | Halterung fuer optische linse. |
| GB2405466B (en) * | 2003-08-27 | 2006-01-25 | Teraview Ltd | Method and apparatus for investigating a non-planner sample |
| CN101566589B (zh) * | 2008-12-15 | 2011-08-10 | 深圳先进技术研究院 | 太赫兹成像装置和太赫兹成像方法 |
| JP5717335B2 (ja) * | 2009-01-23 | 2015-05-13 | キヤノン株式会社 | 分析装置 |
| US20100305885A1 (en) * | 2009-05-27 | 2010-12-02 | Enraf B. V. | System and method for detecting adulteration of fuel or other material using wireless measurements |
| JP5284184B2 (ja) * | 2009-06-05 | 2013-09-11 | キヤノン株式会社 | テラヘルツ波の時間波形を取得するための装置及び方法 |
| JP2011085412A (ja) * | 2009-10-13 | 2011-04-28 | Sony Corp | テラヘルツ合焦方法、テラヘルツ合焦装置及びテラヘルツ合焦プログラム |
| WO2011096563A1 (ja) * | 2010-02-08 | 2011-08-11 | 国立大学法人 岡山大学 | パルス電磁波を用いた計測装置及び計測方法 |
| JP5743453B2 (ja) * | 2010-05-18 | 2015-07-01 | キヤノン株式会社 | テラヘルツ波の測定装置及び測定方法 |
-
2012
- 2012-02-20 JP JP2012034396A patent/JP2013170899A/ja active Pending
-
2013
- 2013-02-15 US US13/769,170 patent/US20130218008A1/en not_active Abandoned
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