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WO2026021792A1
(en)
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Asml Netherlands B.V. |
Optimizing a patterning device layout and a discretized pupil profile to control facet mirrors used in a lithographic process
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WO2026027141A1
(en)
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2024-07-31 |
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Asml Netherlands B.V. |
Systems and methods for optical proximity correction (opc) model calibration in a stitching region
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WO2026032616A1
(en)
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Asml Netherlands B.V. |
Post-optical proximity correction mask layout correction for wafer back side overlay
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