JP2015190868A5 - - Google Patents

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Publication number
JP2015190868A5
JP2015190868A5 JP2014068561A JP2014068561A JP2015190868A5 JP 2015190868 A5 JP2015190868 A5 JP 2015190868A5 JP 2014068561 A JP2014068561 A JP 2014068561A JP 2014068561 A JP2014068561 A JP 2014068561A JP 2015190868 A5 JP2015190868 A5 JP 2015190868A5
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JP
Japan
Prior art keywords
ray
goniometer
measuring device
detector array
drive mechanism
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JP2014068561A
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JP2015190868A (ja
JP6256152B2 (ja
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Priority to JP2014068561A priority Critical patent/JP6256152B2/ja
Priority claimed from JP2014068561A external-priority patent/JP6256152B2/ja
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Publication of JP2015190868A5 publication Critical patent/JP2015190868A5/ja
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Claims (2)

  1. 前記Ｘ線測定装置がゴニオメータを備えたＸ線回折装置であり、前記Ｘ線検出器アレイには前記ゴニオメータの回転中心を中心として回転するための回転駆動機構が設けられており、
    前記揺動機構は前記回転駆動機構が兼用される請求項１又は請求項２に記載のＸ線測定装置。
  2. 前記Ｘ線測定装置が分光素子により波長分散された蛍光Ｘ線のＸ線信号を、前記Ｘ線検出器アレイで検出する蛍光Ｘ線分析装置である請求項１又は請求項２に記載のＸ線測定装置。
JP2014068561A 2014-03-28 2014-03-28 Ｘ線測定装置 Active JP6256152B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014068561A JP6256152B2 (ja) 2014-03-28 2014-03-28 Ｘ線測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014068561A JP6256152B2 (ja) 2014-03-28 2014-03-28 Ｘ線測定装置

Publications (3)

Publication Number Publication Date
JP2015190868A JP2015190868A (ja) 2015-11-02
JP2015190868A5 true JP2015190868A5 (ja) 2016-08-25
JP6256152B2 JP6256152B2 (ja) 2018-01-10

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ID=54425464

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014068561A Active JP6256152B2 (ja) 2014-03-28 2014-03-28 Ｘ線測定装置

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JP (1) JP6256152B2 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017067516A (ja) 2015-09-29 2017-04-06 株式会社ミツトヨ 計測機器用の信号処理装置
DE102016014213A1 (de) * 2015-12-08 2017-07-06 Shimadzu Corporation Röntgenspektroskopische analysevorrichtung und elementaranalyseverfahren
JP2019211209A (ja) * 2018-05-31 2019-12-12 国立研究開発法人物質・材料研究機構 一次元または二次元検出器を用いた回折ｘ線の強度を測定する方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5698641A (en) * 1980-01-09 1981-08-08 Rigaku Denki Kk X-ray diffraction device
JPS59186481A (ja) * 1983-04-08 1984-10-23 Citizen Watch Co Ltd 撮像装置
JPH0678913A (ja) * 1992-09-03 1994-03-22 Toshiba Corp Ｃｔスキャナ
JP2003156565A (ja) * 2001-11-20 2003-05-30 Canon Inc 光電変換装置を用いた撮影装置
GB2496484B (en) * 2011-11-11 2016-04-06 Rigaku Denki Co Ltd X-Ray intensity correction method and x-ray diffractometer
JP5492173B2 (ja) * 2011-11-11 2014-05-14 株式会社リガク 回折ｘ線検出方法およびｘ線回折装置
JP5695589B2 (ja) * 2012-03-02 2015-04-08 株式会社リガク Ｘ線強度補正方法およびｘ線回折装置

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