JP3380744B2 - センサおよびこれを利用した測定装置 - Google Patents

センサおよびこれを利用した測定装置

Info

Publication number
JP3380744B2
JP3380744B2 JP13699498A JP13699498A JP3380744B2 JP 3380744 B2 JP3380744 B2 JP 3380744B2 JP 13699498 A JP13699498 A JP 13699498A JP 13699498 A JP13699498 A JP 13699498A JP 3380744 B2 JP3380744 B2 JP 3380744B2
Authority
JP
Japan
Prior art keywords
free electron
fine particle
layer
particle layer
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP13699498A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11326193A (ja
Inventor
弘之 竹井
健 坂本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13699498A priority Critical patent/JP3380744B2/ja
Priority to US09/313,782 priority patent/US6331276B1/en
Priority to DE1999632289 priority patent/DE69932289T2/de
Priority to EP19990109794 priority patent/EP0965835B1/fr
Publication of JPH11326193A publication Critical patent/JPH11326193A/ja
Application granted granted Critical
Publication of JP3380744B2 publication Critical patent/JP3380744B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/53—Immunoassay; Biospecific binding assay; Materials therefor
    • G01N33/543—Immunoassay; Biospecific binding assay; Materials therefor with an insoluble carrier for immobilising immunochemicals
    • G01N33/54366—Apparatus specially adapted for solid-phase testing
    • G01N33/54373—Apparatus specially adapted for solid-phase testing involving physiochemical end-point determination, e.g. wave-guides, FETS, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/53—Immunoassay; Biospecific binding assay; Materials therefor
    • G01N33/543—Immunoassay; Biospecific binding assay; Materials therefor with an insoluble carrier for immobilising immunochemicals
    • G01N33/551—Immunoassay; Biospecific binding assay; Materials therefor with an insoluble carrier for immobilising immunochemicals the carrier being inorganic
    • G01N33/553—Metal or metal coated
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites

Landscapes

  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Urology & Nephrology (AREA)
  • Hematology (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Microbiology (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Cell Biology (AREA)
  • Biotechnology (AREA)
  • Inorganic Chemistry (AREA)
  • Nanotechnology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP13699498A 1998-05-19 1998-05-19 センサおよびこれを利用した測定装置 Expired - Lifetime JP3380744B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP13699498A JP3380744B2 (ja) 1998-05-19 1998-05-19 センサおよびこれを利用した測定装置
US09/313,782 US6331276B1 (en) 1998-05-19 1999-05-17 Sensor and measuring apparatus using the same
DE1999632289 DE69932289T2 (de) 1998-05-19 1999-05-18 Sensor und Messgerät mit dessen Nutzung
EP19990109794 EP0965835B1 (fr) 1998-05-19 1999-05-18 Capteur et appareil de mesure l'utilisant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13699498A JP3380744B2 (ja) 1998-05-19 1998-05-19 センサおよびこれを利用した測定装置

Publications (2)

Publication Number Publication Date
JPH11326193A JPH11326193A (ja) 1999-11-26
JP3380744B2 true JP3380744B2 (ja) 2003-02-24

Family

ID=15188312

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13699498A Expired - Lifetime JP3380744B2 (ja) 1998-05-19 1998-05-19 センサおよびこれを利用した測定装置

Country Status (4)

Country Link
US (1) US6331276B1 (fr)
EP (1) EP0965835B1 (fr)
JP (1) JP3380744B2 (fr)
DE (1) DE69932289T2 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007132795A1 (fr) * 2006-05-12 2007-11-22 Canon Kabushiki Kaisha Élément de détection, dispositif de détection et procédé de détection
JP5167486B2 (ja) * 2005-06-09 2013-03-21 国立大学法人東京農工大学 反射率変化型センサ、光学式測定装置、反射率変化型センサの製造方法、並びに反射率変化型センサ用自己組織化微粒子単層膜、自己組織化微粒子単層膜及びこれら単層膜の製造方法

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KR100377192B1 (ko) * 2000-12-30 2003-03-26 한국전자통신연구원 표면 플라즈몬 공명을 이용한 전광 센서
JP2002286636A (ja) * 2001-01-19 2002-10-03 Advantest Corp 化学物質検出方法及び装置
JP2002365210A (ja) * 2001-06-11 2002-12-18 Hitachi Ltd 生体分子検出方法
US6778316B2 (en) * 2001-10-24 2004-08-17 William Marsh Rice University Nanoparticle-based all-optical sensors
JP3783677B2 (ja) * 2002-10-29 2006-06-07 株式会社日立製作所 生体物質精製方法および生体物質精製用キットおよび生体物質分析システム
KR100480340B1 (ko) * 2002-11-02 2005-03-31 한국전자통신연구원 정렬된 나노 크기의 금속 구조체들을 사용하는 국소 표면플라즈몬 센서 및 그 제조 방법
EP1445601A3 (fr) * 2003-01-30 2004-09-22 Fuji Photo Film Co., Ltd. Puces pour la mesure par résonnance de plasmons de surface locale, procédés de fabrication de ces puces, et des capteurs employant ces puces
DE10314579A1 (de) * 2003-03-31 2004-10-14 Carl Zeiss Jena Gmbh Verfahren und Vorrichtung zur Sequenzanalyse von Nukleinsäuren
US20060240573A1 (en) * 2003-07-29 2006-10-26 Lamdagen, Llc Optical system including nanostructures for biological or chemical sensing
DE10335533A1 (de) * 2003-07-31 2005-02-17 "Stiftung Caesar" (Center Of Advanced European Studies And Research) Berührungsloser Dehnungssensor
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JP4548416B2 (ja) * 2004-03-31 2010-09-22 オムロン株式会社 局在プラズモン共鳴センサ及び検査装置
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JP2006003217A (ja) * 2004-06-17 2006-01-05 Kyoto Univ センサチップ及びそれを用いたセンサ装置
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JP4417215B2 (ja) 2004-09-27 2010-02-17 株式会社日立製作所 生体分子相互作用測定装置
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EP1715326A1 (fr) * 2005-04-22 2006-10-25 Universität Heidelberg Puce de détection comprenant une couche de particules connectées non-métalliques revêtues d'un métal
JP2006329631A (ja) * 2005-05-23 2006-12-07 Hitachi Ltd 分子間相互作用検出装置およびそれを用いた分子回収装置
JP4640797B2 (ja) * 2005-05-30 2011-03-02 株式会社日立製作所 生体分子相互作用測定装置及び測定方法
JP4947253B2 (ja) * 2005-06-16 2012-06-06 隆雄 齋藤 プラズモン共鳴構造体及びその製造方法
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WO2007015556A1 (fr) * 2005-08-01 2007-02-08 Canon Kabushiki Kaisha Dispositif de detection d'une substance cible, procede de detection d'une substance cible l'utilisant, et appareil de detection et ensemble destine a cet effet
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JP2007085770A (ja) * 2005-09-20 2007-04-05 Fujifilm Corp 可動式導電体を備えたバイオセンサー
US8094314B2 (en) * 2005-10-21 2012-01-10 The Regents Of The University Of California Optical sensing based on surface plasmon resonances in nanostructures
JP4933091B2 (ja) * 2005-12-20 2012-05-16 スタンレー電気株式会社 表面プラズモン共鳴センサー素子
TWI284734B (en) * 2005-12-20 2007-08-01 Nat Univ Chung Cheng Sensing apparatus containing noble metal and sensing system and method thereof
JP4900900B2 (ja) * 2005-12-21 2012-03-21 独立行政法人産業技術総合研究所 金属微粒子表面プラズモン共鳴特性を可逆的に制御する方法、材料及びデバイス
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JP4893032B2 (ja) 2006-03-15 2012-03-07 オムロン株式会社 光学部品、光学センサ及び表面プラズモンセンサ
JP2007286045A (ja) * 2006-03-20 2007-11-01 Canon Inc 検出装置、検出素子用基板、検出素子、検出素子用キット及び検出方法
US8471217B2 (en) 2006-05-01 2013-06-25 Fujirebio Inc. Fluorescent non-metallic particles encapsulated in a metallic coating
TWI297767B (en) * 2006-05-30 2008-06-11 Nat Univ Tsing Hua Measuring apparatus and method using surface plasmon resonance
WO2008111949A2 (fr) * 2006-07-05 2008-09-18 Optimax Technology Corporation Nanotechnologie de métal pour des applications d'affichage et optiques avancées
JP5110254B2 (ja) * 2006-10-10 2012-12-26 富士レビオ株式会社 蛍光測定法と、蛍光測定のための測定用チップ及びその製造方法
JP4939182B2 (ja) * 2006-11-22 2012-05-23 キヤノン株式会社 検知素子、該検知素子を用いた標的物質検知装置及び標的物質を検知する方法
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5167486B2 (ja) * 2005-06-09 2013-03-21 国立大学法人東京農工大学 反射率変化型センサ、光学式測定装置、反射率変化型センサの製造方法、並びに反射率変化型センサ用自己組織化微粒子単層膜、自己組織化微粒子単層膜及びこれら単層膜の製造方法
WO2007132795A1 (fr) * 2006-05-12 2007-11-22 Canon Kabushiki Kaisha Élément de détection, dispositif de détection et procédé de détection

Also Published As

Publication number Publication date
EP0965835A3 (fr) 2000-07-26
JPH11326193A (ja) 1999-11-26
US6331276B1 (en) 2001-12-18
EP0965835A2 (fr) 1999-12-22
EP0965835B1 (fr) 2006-07-12
DE69932289D1 (de) 2006-08-24
DE69932289T2 (de) 2007-02-15

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