JP3782303B2 - 落射照明接続顕微鏡 - Google Patents

落射照明接続顕微鏡 Download PDF

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Publication number: JP3782303B2
Authority: JP; Japan
Prior art keywords: lens; epi; illumination; microscope; diverging
Prior art date: 1998-08-04
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

JP2000564086A

Other languages

English (en)

Japanese (ja)

Other versions

JP2002522801A (ja

Inventor

ツアルネッツキー（原語表記）ＣＺＡＲＮＥＴＺＫＩ，Ｎｏｒｂｅｒｔノルベルト

シェリュ−ブル（原語表記）ＳＣＨＥＲＵＥＢＬ，Ｔｈｏｍａｓトーマス

マッテ− （原語表記）ＭＡＴＴＨＡＥ，Ｍａｎｆｒｅｄマンフレード

Original Assignee

カールツァイスイエナゲゼルシャフトミットベシュレンクテルハフツング

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1998-08-04

Filing date

1999-06-25

Publication date

2006-06-07

1999-06-25 Application filed by カールツァイスイエナゲゼルシャフトミットベシュレンクテルハフツング filed Critical カールツァイスイエナゲゼルシャフトミットベシュレンクテルハフツング

2002-07-23 Publication of JP2002522801A publication Critical patent/JP2002522801A/ja

2006-06-07 Application granted granted Critical

2006-06-07 Publication of JP3782303B2 publication Critical patent/JP3782303B2/ja

2019-06-25 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

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Classifications

- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/14—Beam splitting or combining systems operating by reflection only
- G02B27/144—Beam splitting or combining systems operating by reflection only using partially transparent surfaces without spectral selectivity
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/082—Condensers for incident illumination only

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Optics & Photonics (AREA)
Spectroscopy & Molecular Physics (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Microscoopes, Condenser (AREA)
Lens Barrels (AREA)

JP2000564086A 1998-08-04 1999-06-25 落射照明接続顕微鏡 Expired - Fee Related JP3782303B2 (ja)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
DE19835073.2		1998-08-04
DE19835073A DE19835073A1 (de)	1998-08-04	1998-08-04	Mikroskop mit Auflichteinkopplung
PCT/EP1999/004431 WO2000008510A1 (fr)	1998-08-04	1999-06-25	Microscope a injection de lumiere incidente

Publications (2)

Publication Number	Publication Date
JP2002522801A JP2002522801A (ja)	2002-07-23
JP3782303B2 true JP3782303B2 (ja)	2006-06-07

Family

ID=7876339

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP2000564086A Expired - Fee Related JP3782303B2 (ja)	1998-08-04	1999-06-25	落射照明接続顕微鏡

Country Status (5)

Country	Link
US (1)	US6307690B1 (fr)
EP (1)	EP1019770B1 (fr)
JP (1)	JP3782303B2 (fr)
DE (2)	DE19835073A1 (fr)
WO (1)	WO2000008510A1 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2005070477A (ja) *	2003-08-26	2005-03-17	Yokogawa Electric Corp	焦点移動機構およびそれを用いた光学顕微鏡
US20050270544A1 (en) *	2004-06-04	2005-12-08	Optoplex Corporation	Variable dispersion step-phase interferometers
CN100458470C (zh) *	2004-10-27	2009-02-04	株式会社尼康	光学元件制造方法、光学元件、尼普科夫盘、共焦光学系统以及三维测量装置
DE102005045165B4 (de) *	2005-09-21	2008-04-17	Leica Microsystems Cms Gmbh	Mikroskop-Fluoreszenz-Filtersystem und umschaltbares Mikroskop zur Erzeugung von Überlagerungsbildern
JP2008225095A (ja) *	2007-03-13	2008-09-25	Olympus Corp	光走査型観察装置
US9885878B2 (en) *	2013-04-10	2018-02-06	Fei Efa, Inc.	Apparatus and method for annular optical power management
DE102014005309A1 (de) *	2014-04-10	2015-10-15	Carl Zeiss Microscopy Gmbh	Einrichtung für mikroskopische Anwendungen
US10054776B1 (en) *	2015-04-09	2018-08-21	Molecular Devices, Llc	Low-autofluorescence and low-reflectance optical components for microscopes, and microscopes utilizing same
CN111474715A (zh) *	2020-04-23	2020-07-31	歌尔股份有限公司	光学系统及增强现实设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3736060A (en) *	1971-02-11	1973-05-29	Altair Scient Inc	Optical contour scanner
US3796477A (en) *	1972-09-25	1974-03-12	Xomox Corp	Lens housing and lens cover for objective lens ring of an operating microscope
JPS54137030U (fr) *	1978-03-16	1979-09-22
JPH01180508A (ja) *	1988-01-12	1989-07-18	Canon Inc	変倍顕微鏡
DD275933A1 (de) *	1988-10-03	1990-02-07	Zeiss Jena Veb Carl	Optischer strahlenteiler
IL103900A (en) *	1992-11-26	1998-06-15	Electro Optics Ind Ltd	Optical system
JP3368561B2 (ja) *	1993-10-28	2003-01-20	オリンパス光学工業株式会社	測光機能を有する実像式ファインダー光学系
DE19541237B4 (de) *	1994-11-12	2006-04-13	Carl Zeiss	Pankratisches Vergrößerungssystem
DE19511937C2 (de) *	1995-03-31	1997-04-30	Zeiss Carl Jena Gmbh	Konfokales Auflichtmikroskop

1998
- 1998-08-04 DE DE19835073A patent/DE19835073A1/de not_active Ceased
1999
- 1999-06-25 JP JP2000564086A patent/JP3782303B2/ja not_active Expired - Fee Related
- 1999-06-25 US US09/509,272 patent/US6307690B1/en not_active Expired - Fee Related
- 1999-06-25 EP EP99931186A patent/EP1019770B1/fr not_active Expired - Lifetime
- 1999-06-25 DE DE59913043T patent/DE59913043D1/de not_active Expired - Lifetime
- 1999-06-25 WO PCT/EP1999/004431 patent/WO2000008510A1/fr not_active Ceased

Also Published As

Publication number	Publication date
DE59913043D1 (de)	2006-04-06
EP1019770A1 (fr)	2000-07-19
HK1031767A1 (zh)	2001-06-22
JP2002522801A (ja)	2002-07-23
EP1019770B1 (fr)	2006-01-11
US6307690B1 (en)	2001-10-23
WO2000008510A1 (fr)	2000-02-17
DE19835073A1 (de)	2000-02-10

Legal Events

Date	Code	Title	Description
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2005-09-29	A871	Explanation of circumstances concerning accelerated examination	Free format text: JAPANESE INTERMEDIATE CODE: A871 Effective date: 20050928
2005-10-04	A621	Written request for application examination	Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050912
2005-10-13	A621	Written request for application examination	Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050912
2005-11-09	A975	Report on accelerated examination	Free format text: JAPANESE INTERMEDIATE CODE: A971005 Effective date: 20051108
2005-11-15	A131	Notification of reasons for refusal	Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20051115
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2006-02-07	A521	Request for written amendment filed	Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060206
2006-02-20	TRDD	Decision of grant or rejection written
2006-02-28	A01	Written decision to grant a patent or to grant a registration (utility model)	Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20060228
2006-03-16	A61	First payment of annual fees (during grant procedure)	Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20060309
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2015-03-17	LAPS	Cancellation because of no payment of annual fees

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