JP3973283B2 - プラズマ処理装置及びプラズマ処理方法 - Google Patents

プラズマ処理装置及びプラズマ処理方法 Download PDF

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Publication number
JP3973283B2
JP3973283B2 JP00799198A JP799198A JP3973283B2 JP 3973283 B2 JP3973283 B2 JP 3973283B2 JP 00799198 A JP00799198 A JP 00799198A JP 799198 A JP799198 A JP 799198A JP 3973283 B2 JP3973283 B2 JP 3973283B2
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Japan
Prior art keywords
magnetic field
plasma
gauss
etching
frequency
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Expired - Fee Related
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JP00799198A
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English (en)
Japanese (ja)
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JPH11204297A5 (2
JPH11204297A (ja
Inventor
俊夫 増田
潤一 田中
哲徳 加治
克哉 渡辺
徹 大坪
一郎 佐々木
茂 白米
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP00799198A priority Critical patent/JP3973283B2/ja
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Publication of JPH11204297A5 publication Critical patent/JPH11204297A5/ja
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Publication of JP3973283B2 publication Critical patent/JP3973283B2/ja
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  • Chemical Vapour Deposition (AREA)
  • ing And Chemical Polishing (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
JP00799198A 1998-01-19 1998-01-19 プラズマ処理装置及びプラズマ処理方法 Expired - Fee Related JP3973283B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP00799198A JP3973283B2 (ja) 1998-01-19 1998-01-19 プラズマ処理装置及びプラズマ処理方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP00799198A JP3973283B2 (ja) 1998-01-19 1998-01-19 プラズマ処理装置及びプラズマ処理方法

Publications (3)

Publication Number Publication Date
JPH11204297A JPH11204297A (ja) 1999-07-30
JPH11204297A5 JPH11204297A5 (2) 2005-06-16
JP3973283B2 true JP3973283B2 (ja) 2007-09-12

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JP00799198A Expired - Fee Related JP3973283B2 (ja) 1998-01-19 1998-01-19 プラズマ処理装置及びプラズマ処理方法

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Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6451703B1 (en) * 2000-03-10 2002-09-17 Applied Materials, Inc. Magnetically enhanced plasma etch process using a heavy fluorocarbon etching gas
US7232766B2 (en) * 2003-03-14 2007-06-19 Lam Research Corporation System and method for surface reduction, passivation, corrosion prevention and activation of copper surface
JP4506318B2 (ja) 2004-07-15 2010-07-21 三菱電機株式会社 表示装置の製造方法および表示装置の製造装置
KR100941070B1 (ko) * 2007-05-10 2010-02-09 세메스 주식회사 플라즈마를 이용하여 기판을 처리하는 장치
US8247315B2 (en) * 2008-03-17 2012-08-21 Semiconductor Energy Laboratory Co., Ltd. Plasma processing apparatus and method for manufacturing semiconductor device
CN103854944A (zh) * 2012-12-04 2014-06-11 上海华虹宏力半导体制造有限公司 刻蚀设备腔体的气体导入结构和气体导入方法
JP6159757B2 (ja) * 2014-07-10 2017-07-05 東京エレクトロン株式会社 基板の高精度エッチングのプラズマ処理方法
KR102482734B1 (ko) * 2020-11-13 2022-12-30 충남대학교산학협력단 고주파 펄스 소스 및 저주파 펄스 바이어스를 이용한 플라즈마 극고종횡비 식각 방법
CN114156157B (zh) * 2021-12-01 2024-08-16 大连理工大学 一种等离子体产生装置
CN120977921A (zh) * 2025-10-17 2025-11-18 上海谙邦半导体设备有限公司 一种可控非均匀陶瓷板出气系统及方法

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JPH11204297A (ja) 1999-07-30

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