JP4332200B2 - モジュール式試験システム内のパターンオブジェクトファイルを管理するための方法およびモジュール式試験システム - Google Patents

モジュール式試験システム内のパターンオブジェクトファイルを管理するための方法およびモジュール式試験システム Download PDF

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Publication number: JP4332200B2
Authority: JP; Japan
Prior art keywords: pattern; test; vendor; compiler; file
Prior art date: 2004-05-22
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

JP2008180843A

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English (en)

Japanese (ja)

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JP2009008683A (ja

Inventor

シング、ハーサンジート

プラマニック、アンカン

エルストン、マーク

善文田原

敏明足立

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Advantest Corp

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Advantest Corp

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2004-05-22

Filing date

2008-07-11

Publication date

2009-09-16

2004-08-13 Priority claimed from US10/918,513 external-priority patent/US7209851B2/en

2008-07-11 Application filed by Advantest Corp filed Critical Advantest Corp

2009-01-15 Publication of JP2009008683A publication Critical patent/JP2009008683A/ja

2009-09-16 Application granted granted Critical

2009-09-16 Publication of JP4332200B2 publication Critical patent/JP4332200B2/ja

2025-05-23 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

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Test And Diagnosis Of Digital Computers (AREA)
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JP2008180843A 2004-05-22 2008-07-11 モジュール式試験システム内のパターンオブジェクトファイルを管理するための方法およびモジュール式試験システム Expired - Fee Related JP4332200B2 (ja)

Applications Claiming Priority (4)

Application Number	Priority Date	Filing Date	Title
US57357704P	2004-05-22	2004-05-22
US60/573,577		2004-05-22
US10/918,513		2004-08-13
US10/918,513 US7209851B2 (en)	2003-02-14	2004-08-13	Method and structure to develop a test program for semiconductor integrated circuits

Related Parent Applications (1)

Application Number	Title	Priority Date	Filing Date
JP2006519573A Division JP4332179B2 (ja)	2004-05-22	2005-05-23	パターンコンパイラ

Publications (2)

Publication Number	Publication Date
JP2009008683A JP2009008683A (ja)	2009-01-15
JP4332200B2 true JP4332200B2 (ja)	2009-09-16

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JP2008180843A Expired - Fee Related JP4332200B2 (ja)	2004-05-22	2008-07-11	モジュール式試験システム内のパターンオブジェクトファイルを管理するための方法およびモジュール式試験システム

Country Status (4)

Country	Link
JP (1)	JP4332200B2 (de)
CN (6)	CN1997909B (de)
AT (3)	ATE451625T1 (de)
DE (3)	DE602005015848D1 (de)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US7925940B2 (en) *	2007-10-17	2011-04-12	Synopsys, Inc.	Enhancing speed of simulation of an IC design while testing scan circuitry
US8094566B2 (en) *	2009-12-24	2012-01-10	Advantest Corporation	Test apparatus and test method
CN102215140B (zh) *	2010-04-02	2013-03-27	英业达股份有限公司	储存局域网络的检验装置
CN102378232A (zh) *	2010-08-23	2012-03-14	财团法人资讯工业策进会	无线网络信号的测试系统及其测量方法
CN103109275B (zh) *	2010-09-07	2016-02-03	爱德万测试公司	在半导体测试环境中使用虚拟仪器的系统、方法和设备
CN101980174B (zh) *	2010-11-24	2012-07-04	中国人民解放军国防科学技术大学	一种自动测试计算机应用程序区间能耗的方法
JP2012167958A (ja) *	2011-02-10	2012-09-06	Nippon Syst Wear Kk	試験情報表示装置、方法、プログラム、および該ソフトウェアを格納したコンピュータ可読媒体
CN102608517A (zh) *	2012-02-16	2012-07-25	工业和信息化部电子第五研究所	一种创建集成电路测试程序包的快速方法
US9606183B2 (en)	2012-10-20	2017-03-28	Advantest Corporation	Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test
US10161993B2 (en) *	2013-02-21	2018-12-25	Advantest Corporation	Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block
JP6174898B2 (ja) *	2013-04-30	2017-08-02	ルネサスエレクトロニクス株式会社	半導体試験装置
TWI490689B (zh) *	2013-05-17	2015-07-01	英業達股份有限公司	不間斷自動更新測試命令之系統及方法
CN104298590B (zh) *	2013-07-16	2019-05-10	爱德万测试公司	用于按管脚apg的快速语义处理器
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KR102147172B1 (ko) *	2014-04-09	2020-08-31	삼성전자주식회사	시스템 온 칩 및 그것의 검증 방법
US9672020B2 (en)	2014-09-19	2017-06-06	Microsoft Technology Licensing, Llc	Selectively loading precompiled header(s) and/or portion(s) thereof
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Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP0143623A3 (de) *	1983-11-25	1987-09-23	Mars Incorporated	Automatisches Prüfgerät
JPH03130839A (ja)	1989-10-17	1991-06-04	Chubu Nippon Denki Software Kk	オンラインシミュレーション方式
US6208439B1 (en) *	1990-11-09	2001-03-27	Litel Instruments	Generalized geometric transforms for computer generated holograms
US6678643B1 (en) *	1999-06-28	2004-01-13	Advantest Corp.	Event based semiconductor test system
US6629282B1 (en) *	1999-11-05	2003-09-30	Advantest Corp.	Module based flexible semiconductor test system
US6651204B1 (en) *	2000-06-01	2003-11-18	Advantest Corp.	Modular architecture for memory testing on event based test system
CN1154045C (zh) *	2000-07-25	2004-06-16	华为技术有限公司	一种跨平台的联合仿真系统
US6779140B2 (en) *	2001-06-29	2004-08-17	Agilent Technologies, Inc.	Algorithmically programmable memory tester with test sites operating in a slave mode
US6737926B2 (en) *	2001-08-30	2004-05-18	Micron Technology, Inc.	Method and apparatus for providing clock signals at different locations with minimal clock skew
CN100341110C (zh) *	2002-04-11	2007-10-03	株式会社爱德万测试	避免asic/soc制造中原型保持的制造方法和设备
US7460988B2 (en) *	2003-03-31	2008-12-02	Advantest Corporation	Test emulator, test module emulator, and record medium storing program therein

2005
- 2005-05-23 DE DE602005015848T patent/DE602005015848D1/de not_active Expired - Lifetime
- 2005-05-23 CN CN2005800164369A patent/CN1997909B/zh not_active Expired - Fee Related
- 2005-05-23 CN CN 200580015953 patent/CN1981202A/zh active Pending
- 2005-05-23 CN CN2005800163968A patent/CN1989417B/zh not_active Expired - Fee Related
- 2005-05-23 DE DE602005018205T patent/DE602005018205D1/de not_active Expired - Lifetime
- 2005-05-23 AT AT05743262T patent/ATE451625T1/de not_active IP Right Cessation
- 2005-05-23 DE DE602005018204T patent/DE602005018204D1/de not_active Expired - Lifetime
- 2005-05-23 CN CNB2005800164373A patent/CN100541218C/zh not_active Expired - Fee Related
- 2005-05-23 AT AT05743229T patent/ATE451624T1/de not_active IP Right Cessation
- 2005-05-23 CN CN200580016355A patent/CN100580473C/zh not_active Expired - Fee Related
- 2005-05-23 AT AT05743357T patent/ATE438865T1/de not_active IP Right Cessation
- 2005-05-23 CN CN200580016215A patent/CN100585422C/zh not_active Expired - Fee Related
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Also Published As

Publication number	Publication date
ATE438865T1 (de)	2009-08-15
JP2009008683A (ja)	2009-01-15
CN100580473C (zh)	2010-01-13
CN1981202A (zh)	2007-06-13
CN100541218C (zh)	2009-09-16
CN1981200A (zh)	2007-06-13
CN1989417A (zh)	2007-06-27
ATE451624T1 (de)	2009-12-15
CN1989417B (zh)	2011-03-16
DE602005015848D1 (de)	2009-09-17
CN1997908A (zh)	2007-07-11
CN1997909A (zh)	2007-07-11
CN1997909B (zh)	2010-11-10
CN1981203A (zh)	2007-06-13
CN100585422C (zh)	2010-01-27
ATE451625T1 (de)	2009-12-15
DE602005018205D1 (de)	2010-01-21
DE602005018204D1 (de)	2010-01-21

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