JP4510534B2 - 光学特性測定装置及び眼底像観察装置 - Google Patents

光学特性測定装置及び眼底像観察装置 Download PDF

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Publication number
JP4510534B2
JP4510534B2 JP2004183389A JP2004183389A JP4510534B2 JP 4510534 B2 JP4510534 B2 JP 4510534B2 JP 2004183389 A JP2004183389 A JP 2004183389A JP 2004183389 A JP2004183389 A JP 2004183389A JP 4510534 B2 JP4510534 B2 JP 4510534B2
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Prior art keywords
eye
wavefront
fundus
examined
light
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JP2004183389A
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Japanese (ja)
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JP2006006362A (ja
Inventor
達夫 山口
俊文 三橋
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Topcon Corp
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Topcon Corp
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Priority to JP2004183389A priority Critical patent/JP4510534B2/ja
Priority to EP05012885A priority patent/EP1609405B1/de
Priority to AT05012885T priority patent/ATE507763T1/de
Priority to EP10176597A priority patent/EP2308368B1/de
Priority to DE602005027777T priority patent/DE602005027777D1/de
Priority to US11/155,903 priority patent/US7281797B2/en
Publication of JP2006006362A publication Critical patent/JP2006006362A/ja
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Publication of JP4510534B2 publication Critical patent/JP4510534B2/ja
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/14—Arrangements specially adapted for eye photography

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  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Biophysics (AREA)
  • Ophthalmology & Optometry (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Eye Examination Apparatus (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2004183389A 2004-06-22 2004-06-22 光学特性測定装置及び眼底像観察装置 Expired - Fee Related JP4510534B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2004183389A JP4510534B2 (ja) 2004-06-22 2004-06-22 光学特性測定装置及び眼底像観察装置
EP05012885A EP1609405B1 (de) 2004-06-22 2005-06-15 Gerät zum Messen optischer Charakteristiken
AT05012885T ATE507763T1 (de) 2004-06-22 2005-06-15 Gerät zum messen optischer charakteristiken
EP10176597A EP2308368B1 (de) 2004-06-22 2005-06-15 Gerät zum Messen optischer Charakteristiken und zum Beobachten eines Fundus-Bildes
DE602005027777T DE602005027777D1 (de) 2004-06-22 2005-06-15 Gerät zum Messen optischer Charakteristiken
US11/155,903 US7281797B2 (en) 2004-06-22 2005-06-20 Optical-characteristic measurement apparatus and fundus-image observation apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004183389A JP4510534B2 (ja) 2004-06-22 2004-06-22 光学特性測定装置及び眼底像観察装置

Publications (2)

Publication Number Publication Date
JP2006006362A JP2006006362A (ja) 2006-01-12
JP4510534B2 true JP4510534B2 (ja) 2010-07-28

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Family Applications (1)

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JP2004183389A Expired - Fee Related JP4510534B2 (ja) 2004-06-22 2004-06-22 光学特性測定装置及び眼底像観察装置

Country Status (5)

Country Link
US (1) US7281797B2 (de)
EP (2) EP1609405B1 (de)
JP (1) JP4510534B2 (de)
AT (1) ATE507763T1 (de)
DE (1) DE602005027777D1 (de)

Cited By (1)

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WO2012147899A1 (en) 2011-04-27 2012-11-01 Canon Kabushiki Kaisha Fundus imaging apparatus, method of controlling fundus imaging apparatus, and storage medium

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AU2003266599A1 (en) * 2002-09-26 2004-04-19 Kabushiki Kaisha Topcon Eye characteristics measuring system
AU2003290094A1 (en) 2003-10-29 2005-06-08 Asml Netherlands B.V. Optical assembly for photolithography
US7296893B2 (en) * 2004-03-03 2007-11-20 Visx, Incorporated Transformation methods of wavefront maps from one vertex distance to another
US7547102B2 (en) * 2004-03-03 2009-06-16 Amo Manufacturing Usa, Llc Wavefront propagation from one plane to another
EP1928294B1 (de) * 2005-08-18 2010-09-08 Imagine Eyes Verfahren und system zur korrektur von abweichungen des auges für ein ophthalmisches instrument
JP4917824B2 (ja) 2006-04-07 2012-04-18 株式会社トプコン 眼科撮影装置
JP4776428B2 (ja) 2006-05-02 2011-09-21 株式会社トプコン 眼科撮影装置
JP4783219B2 (ja) 2006-06-16 2011-09-28 株式会社トプコン 眼科撮影装置
JP4776450B2 (ja) 2006-06-16 2011-09-21 株式会社トプコン 眼科撮影装置
JP4822332B2 (ja) * 2006-06-22 2011-11-24 株式会社トプコン 眼科装置
JP4822331B2 (ja) 2006-06-22 2011-11-24 株式会社トプコン 眼科装置
DE102006061933A1 (de) 2006-12-21 2008-06-26 Carl Zeiss Meditec Ag Optisches System für eine Funduskamera
JP5038703B2 (ja) * 2006-12-22 2012-10-03 株式会社トプコン 眼科装置
JP2008161406A (ja) * 2006-12-28 2008-07-17 Topcon Corp 眼科装置
US7621636B2 (en) * 2007-01-10 2009-11-24 Clarity Medical Systems, Inc. Working distance and alignment sensor for a fundus camera
JP4880561B2 (ja) * 2007-10-03 2012-02-22 新光電気工業株式会社 フリップチップ実装装置
JP5574670B2 (ja) * 2009-10-30 2014-08-20 キヤノン株式会社 補償光学装置、撮像装置および補償光学方法
JP5511323B2 (ja) 2009-11-17 2014-06-04 キヤノン株式会社 補償光学装置、補償光学方法、撮像装置、撮像方法
JP5567847B2 (ja) * 2010-01-29 2014-08-06 キヤノン株式会社 補償光学装置、補償光学方法、撮像装置
JP5545984B2 (ja) * 2010-05-31 2014-07-09 株式会社ニデック 波面補償付眼底撮影装置
JP5879830B2 (ja) * 2011-09-02 2016-03-08 株式会社ニデック 波面補償付眼底撮影装置
JP5727197B2 (ja) * 2010-11-04 2015-06-03 株式会社ニデック 波面補償付眼底撮影装置
FR2971693B1 (fr) * 2011-02-22 2013-03-08 Imagine Eyes Methode et dispositif d'imagerie retinienne a haute resolution
JP5915034B2 (ja) * 2011-09-02 2016-05-11 株式会社ニデック 波面補償付眼底撮影装置
WO2013110059A1 (en) * 2012-01-20 2013-07-25 University Of Rochester System and method for designing wavefront-guided ophthalmic lenses
JP6098061B2 (ja) * 2012-07-27 2017-03-22 株式会社ニデック 眼底撮影装置
US10149615B2 (en) 2012-11-30 2018-12-11 Kabushiki Kaisha Topcon Fundus imaging apparatus that determines a state of alignment
JP6224908B2 (ja) * 2013-04-17 2017-11-01 キヤノン株式会社 撮像装置
JP6394850B2 (ja) 2013-09-20 2018-09-26 大学共同利用機関法人自然科学研究機構 補償光学系及び光学装置
CA2916561A1 (en) 2013-11-26 2015-06-04 Abbott Medical Optics Inc. System and method for measuring dysphotopsia
JP5943954B2 (ja) * 2014-03-27 2016-07-05 キヤノン株式会社 撮像装置及びその制御方法
JP6327748B2 (ja) * 2014-05-27 2018-05-23 国立研究開発法人物質・材料研究機構 生体画像取得装置
JP2016028786A (ja) * 2015-12-02 2016-03-03 キヤノン株式会社 眼底撮像装置、眼底撮像装置の制御方法、およびプログラム
JP6305463B2 (ja) * 2016-05-25 2018-04-04 キヤノン株式会社 撮像装置及びその制御方法
DE102016211310B3 (de) * 2016-06-23 2017-07-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur messung einer aberration, abbildungssysteme und verfahren zur messung einer aberration
US11013594B2 (en) 2016-10-25 2021-05-25 Amo Groningen B.V. Realistic eye models to design and evaluate intraocular lenses for a large field of view
US10739227B2 (en) 2017-03-23 2020-08-11 Johnson & Johnson Surgical Vision, Inc. Methods and systems for measuring image quality
CA3082053A1 (en) 2017-11-30 2019-06-06 Amo Groningen B.V. Intraocular lenses that improve post-surgical spectacle independent and methods of manufacturing thereof
JP7479179B2 (ja) * 2020-04-07 2024-05-08 株式会社タムロン 光学系、眼底検査装置、眼底撮像装置、及び眼底検査システム
EP4333685B1 (de) 2021-05-05 2026-01-14 AMO Groningen B.V. Ringhalometersystem und verfahren zur quantifizierung von dysphotopsien

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2966992B2 (ja) 1992-02-07 1999-10-25 株式会社トプコン 角膜内皮細胞観察撮影装置
JPH0994230A (ja) 1995-09-29 1997-04-08 Topcon Corp 眼科装置
US5777719A (en) * 1996-12-23 1998-07-07 University Of Rochester Method and apparatus for improving vision and the resolution of retinal images
US6299307B1 (en) 1997-10-10 2001-10-09 Visx, Incorporated Eye tracking device for laser eye surgery using corneal margin detection
JP2002209854A (ja) 2000-10-18 2002-07-30 Topcon Corp 光学特性測定装置
US6736507B2 (en) * 2001-01-22 2004-05-18 Alexis Kudryashov High resolution, multispectral, wide field of view retinal imager
US6595643B2 (en) * 2001-06-05 2003-07-22 Adaptive Optics Associates,.Inc. Ophthalmic imaging instrument that measures and compensates for phase aberrations in reflections derived from light produced by an imaging light source
JP4157839B2 (ja) * 2001-08-30 2008-10-01 ユニバーシティー オブ ロチェスター 生体眼の網膜領域撮像方法及びそのシステム
US6631991B2 (en) 2001-08-31 2003-10-14 Adaptive Optics Associates, Inc. Ophthalmic instrument having hartmann wavefront sensor deriving location of spots with spot fitting techniques
JP4296093B2 (ja) * 2001-12-11 2009-07-15 株式会社トプコン 眼特性測定装置
JP4252288B2 (ja) * 2002-11-11 2009-04-08 株式会社トプコン 眼特性測定装置
JP4231273B2 (ja) * 2002-11-11 2009-02-25 株式会社トプコン 眼特性測定装置
US6910770B2 (en) * 2003-02-10 2005-06-28 Visx, Incorporated Eye refractor with active mirror wavefront sensor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012147899A1 (en) 2011-04-27 2012-11-01 Canon Kabushiki Kaisha Fundus imaging apparatus, method of controlling fundus imaging apparatus, and storage medium
US9510750B2 (en) 2011-04-27 2016-12-06 Canon Kabushiki Kaisha Fundus imaging apparatus, method of controlling fundus imaging apparatus, and storage medium

Also Published As

Publication number Publication date
EP1609405A1 (de) 2005-12-28
US7281797B2 (en) 2007-10-16
DE602005027777D1 (de) 2011-06-16
JP2006006362A (ja) 2006-01-12
EP1609405B1 (de) 2011-05-04
ATE507763T1 (de) 2011-05-15
US20050286018A1 (en) 2005-12-29
EP2308368A3 (de) 2012-05-23
EP2308368B1 (de) 2013-02-13
EP2308368A2 (de) 2011-04-13

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