JP5123889B2 - 赤外光検出器 - Google Patents
赤外光検出器 Download PDFInfo
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- JP5123889B2 JP5123889B2 JP2009125194A JP2009125194A JP5123889B2 JP 5123889 B2 JP5123889 B2 JP 5123889B2 JP 2009125194 A JP2009125194 A JP 2009125194A JP 2009125194 A JP2009125194 A JP 2009125194A JP 5123889 B2 JP5123889 B2 JP 5123889B2
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/184—Infrared image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/124—Active materials comprising only Group III-V materials, e.g. GaAs
- H10F77/1248—Active materials comprising only Group III-V materials, e.g. GaAs having three or more elements, e.g. GaAlAs, InGaAs or InGaAsP
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/143—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies comprising quantum structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/413—Optical elements or arrangements directly associated or integrated with the devices, e.g. back reflectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/95—Circuit arrangements
- H10F77/953—Circuit arrangements for devices having potential barriers
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- Light Receiving Elements (AREA)
Description
(実施例1)
図9(a)は、図3(a)(b)に示されている光結合機構110が形成されている場合の実験結果を表わしている。この場合、量子効率ηは7.8%であった。
(比較例1)
図9(b)は、長さl=2.8[μm]、かつ、幅w=0.5[μm]の相互に中央部分で直交する線分により構成される十字形状の窓が、x方向およびy方向のそれぞれに周期p=2.8[μm]で相互に連続して配列されている金属薄膜により光結合機構110が形成されている場合の実験結果を表わしている。この場合、量子効率ηは1.6%であった。
(比較例2)
図9(c)は、各辺の長さw=3.3[μm]の正方形状の窓が、x方向およびy方向のそれぞれに周期p=4.0[μm]で相互に離れて配列されている金属薄膜により光結合機構110が形成されている場合の実験結果を表わしている。この場合、量子効率ηは1.5%であった。
(比較例3)
図9(d)は、各辺の長さw=1.9[μm]の正方形状の窓が、x方向およびy方向のそれぞれに周期p=4.0[μm]で相互に離れて配列されている金属薄膜により光結合機構110が形成されている場合の実験結果を表わしている。この場合、量子効率ηは2.5%であった。
Claims (3)
- 2次元電子層である第1電子層において電気的に孤立した状態が維持されうる第1電子領域と、
入射赤外光に応じて前記第1電子領域に垂直な振動電場成分を生成することにより電子を励起し、前記第1電子領域に形成されている量子井戸のサブバンドの間で遷移させる光結合機構と、
前記第1電子層に対して中間絶縁層を介して平行に配置されている2次元電子層である第2電子層において、前記光結合機構により励起された電子が前記第1電子領域から流出した結果として電気伝導度が変化する伝導チャネルと、
前記第1電子領域が外部電子系から電気的に遮断されている遮断状態と、前記外部電子系と電気的に接続されている接続状態とを切り替える状態制御機構とを備え、
前記伝導チャネルの指定方向についての電気伝導度の変化を検出することにより前記入射赤外光を検出する赤外光検出器であって、
単一の前記第1電子領域が、相互に電気的に独立しているとともに、前記伝導チャネルに対向して前記指定方向に並んでいる複数の前記第1電子領域に分割され、
前記複数の第1電子領域のそれぞれについて所定条件が満たされるように前記外部電子系が構成され、
前記所定条件は、前記接続状態における前記第1電子領域のそれぞれの前記励起サブバンドの電子エネルギーレベルが、前記伝導チャネルにおいて前記第1電子領域のそれぞれに対向する第2電子領域のそれぞれにおけるフェルミ準位に対して、前記遮断状態における前記第1電子領域のそれぞれの励起サブバンドに遷移した電子が、前記第2電子領域のそれぞれに流出しうる程度に高くなるという条件であることを特徴とする赤外光検出器。 - 請求項1記載の赤外光検出器において、
前記第2電子領域のそれぞれが、前記第1電子領域のそれぞれの前記外部電子系として構成されていることを特徴とする赤外光検出器。 - 請求項1記載の赤外光検出器において、
前記中間絶縁層とともに前記一の2次元電子層を挟む上部絶縁層の上面において前記単一の第1電子領域を横断するように複数のゲート電極が形成され、
それぞれの前記ゲート電極にバイアス電圧が印加されて前記一の2次元電子層に電位障壁が形成されることにより、前記単一の第1電子領域が前記複数の第1電子領域に分割されることを特徴とする赤外光検出器。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009125194A JP5123889B2 (ja) | 2009-05-25 | 2009-05-25 | 赤外光検出器 |
| US13/322,208 US8395142B2 (en) | 2009-05-25 | 2010-04-16 | Infrared light detector |
| PCT/JP2010/056864 WO2010137422A1 (ja) | 2009-05-25 | 2010-04-16 | 赤外光検出器 |
| EP10780379.3A EP2426738B1 (en) | 2009-05-25 | 2010-04-16 | Infrared light detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009125194A JP5123889B2 (ja) | 2009-05-25 | 2009-05-25 | 赤外光検出器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010272794A JP2010272794A (ja) | 2010-12-02 |
| JP5123889B2 true JP5123889B2 (ja) | 2013-01-23 |
Family
ID=43222539
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009125194A Expired - Fee Related JP5123889B2 (ja) | 2009-05-25 | 2009-05-25 | 赤外光検出器 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8395142B2 (ja) |
| EP (1) | EP2426738B1 (ja) |
| JP (1) | JP5123889B2 (ja) |
| WO (1) | WO2010137422A1 (ja) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013090233A (ja) | 2011-10-20 | 2013-05-13 | Sony Corp | 撮像素子およびカメラシステム |
| US9293627B1 (en) * | 2012-12-03 | 2016-03-22 | Sandia Corporation | Sub-wavelength antenna enhanced bilayer graphene tunable photodetector |
| JP6342674B2 (ja) * | 2014-02-27 | 2018-06-13 | 国立研究開発法人科学技術振興機構 | 赤外光検出器、赤外顕微鏡、および、赤外分光器 |
| US10439093B2 (en) * | 2016-04-15 | 2019-10-08 | Arizon Board Of Regents On Behalf Of Arizona State University | Antenna-assisted photovoltaic graphene detectors |
| JP2023131259A (ja) * | 2022-03-09 | 2023-09-22 | 国立研究開発法人理化学研究所 | 光検出器及び光検出方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4106044A (en) | 1974-03-16 | 1978-08-08 | Nippon Gakki Seizo Kabushiki Kaisha | Field effect transistor having unsaturated characteristics |
| US5309007A (en) * | 1991-09-30 | 1994-05-03 | The United States Of America As Represented By The Secretary Of The Navy | Junction field effect transistor with lateral gate voltage swing (GVS-JFET) |
| JPH114017A (ja) * | 1995-10-16 | 1999-01-06 | Toshiba Corp | 光学装置 |
| JP3192397B2 (ja) * | 1997-11-19 | 2001-07-23 | 株式会社東芝 | 電子機能素子の製造方法 |
| JP3743745B2 (ja) | 1998-08-31 | 2006-02-08 | 株式会社東芝 | 半導体素子 |
| WO2006006469A1 (ja) * | 2004-07-09 | 2006-01-19 | Japan Science And Technology Agency | 赤外光検出器 |
| JP5240748B2 (ja) | 2007-02-19 | 2013-07-17 | 独立行政法人科学技術振興機構 | 赤外光検出器 |
-
2009
- 2009-05-25 JP JP2009125194A patent/JP5123889B2/ja not_active Expired - Fee Related
-
2010
- 2010-04-16 US US13/322,208 patent/US8395142B2/en not_active Expired - Fee Related
- 2010-04-16 EP EP10780379.3A patent/EP2426738B1/en active Active
- 2010-04-16 WO PCT/JP2010/056864 patent/WO2010137422A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP2426738A4 (en) | 2012-07-18 |
| JP2010272794A (ja) | 2010-12-02 |
| US20120068158A1 (en) | 2012-03-22 |
| EP2426738B1 (en) | 2019-10-02 |
| EP2426738A1 (en) | 2012-03-07 |
| US8395142B2 (en) | 2013-03-12 |
| WO2010137422A1 (ja) | 2010-12-02 |
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