JP5148073B2 - ソーラシミュレータによる測定方法 - Google Patents
ソーラシミュレータによる測定方法 Download PDFInfo
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- JP5148073B2 JP5148073B2 JP2006138713A JP2006138713A JP5148073B2 JP 5148073 B2 JP5148073 B2 JP 5148073B2 JP 2006138713 A JP2006138713 A JP 2006138713A JP 2006138713 A JP2006138713 A JP 2006138713A JP 5148073 B2 JP5148073 B2 JP 5148073B2
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
- G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
- G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photovoltaic Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Description
(1) 1フラッシュ光の間に負荷をステップ状に掃引することで、少ないフラッシュ点灯数で測定可能となり、測定時間を短縮することができる。例えば、フラッシュ点灯サイクルを約1secとして5回のフラッシュ光で測定した場合、測定時間は約5secで高速測定を実現できる。因みに、従来のショートパルス式の場合、100〜160回フラッシュ点灯すると、測定時間は、約15〜30secである。
2 パルス幅制御回路
3 照度検出器
4 太陽電池
5A 電子負荷
6 パソコン
6a データ収集ボード
6b アナログ出力ボード
7 データ処理ボード
L コイル
C コンデンサ
Claims (7)
- 電源回路に複数のコイルとコンデンサを使用したパルス幅制御回路を具備した光源からパルス波形の最初に照度が大きく上下することがなく波形の頂部が平坦になるフラッシュ光を発光させる工程と、該フラッシュ光を照度検出器で受光してその照度を検出し、該検出値に基づいて光源の照度を規定範囲内に制御する工程と、前記フラッシュ光を被測定体としての太陽電池に照射し、該太陽電池の負荷を制御して太陽電池から出力される電流と電圧を1点測定する測定工程と、複数回のフラッシュ光を発光させ、各フラッシュ光について、前記測定工程を行うことを特徴とするソーラシミュレータによる測定方法。
- 電源回路に複数のコイルとコンデンサを使用したパルス幅制御回路を具備した光源からパルス波形の最初に照度が大きく上下することがなく波形の頂部が平坦になるフラッシュ光を発光させる工程と、該フラッシュ光を照度検出器で受光してその照度を検出し、該検出値に基づいて光源の照度を規定範囲内に制御する工程と、前記フラッシュ光を被測定体としての太陽電池に照射し、該太陽電池の負荷を掃引しながら太陽電池から出力される電流と電圧を複数点測定する測定工程と、複数回のフラッシュ光を発光させ、各フラッシュ光について、前記測定工程を行うことを特徴とするソーラシミュレータによる測定方法。
- 前記測定工程に先だって、前記光源からのフラッシュ光を被測定体としての太陽電池に照射し、負荷を制御して前記太陽電池特性値の概略値を求める予備測定工程を有することを特徴とする請求項1又は2に記載のソーラシミュレータによる測定方法。
- 前記フラッシュ点灯における光パルス波形の上部平坦部の幅が約4msec以上の光パルス波形であることを特徴とする請求項1から3のいずれかに記載のソーラシミュレータによる測定方法。
- 前記フラッシュ点灯のサイクルは、0.5〜1.5secにすることを特徴とする請求項1〜4のいずれかに記載のソーラシミュレータによる測定方法。
- 前記測定された照度波形に対し、被測定体から出力された電流・電圧波形からその被測定体の応答時間を算出し、前記太陽電池の負荷を制御する速度を適切にし、フラッシュ点灯回数を増減することによりデータ収集を行うことを特徴とする請求項1から5のいずれかに記載のソーラシミュレータによる測定方法。
- 光源から発光されるフラッシュ光の照度設定を、基準となる太陽電池の短絡電流又は、最大電力の測定結果と、前記基準となる太陽電池の短絡電流又は、最大電力の校正データの比率から制御して行う請求項1〜6のいずれかに記載のソーラシミュレータによる測定方法。
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006138713A JP5148073B2 (ja) | 2005-06-17 | 2006-05-18 | ソーラシミュレータによる測定方法 |
| US11/454,123 US7411408B2 (en) | 2005-06-17 | 2006-06-16 | Measurement method using solar simulator |
| EP06012429A EP1734373B1 (en) | 2005-06-17 | 2006-06-16 | Measurement method using solar simulator |
| CN2006100928557A CN1892239B (zh) | 2005-06-17 | 2006-06-16 | 基于太阳仿真器的测量方法 |
| HK07107276.3A HK1103307B (en) | 2005-06-17 | 2007-07-06 | Mesurement method using solar simulator |
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005178050 | 2005-06-17 | ||
| JP2005178050 | 2005-06-17 | ||
| JP2005240884 | 2005-08-23 | ||
| JP2005240884 | 2005-08-23 | ||
| JP2006138713A JP5148073B2 (ja) | 2005-06-17 | 2006-05-18 | ソーラシミュレータによる測定方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007088419A JP2007088419A (ja) | 2007-04-05 |
| JP5148073B2 true JP5148073B2 (ja) | 2013-02-20 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006138713A Expired - Fee Related JP5148073B2 (ja) | 2005-06-17 | 2006-05-18 | ソーラシミュレータによる測定方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7411408B2 (ja) |
| EP (1) | EP1734373B1 (ja) |
| JP (1) | JP5148073B2 (ja) |
| CN (1) | CN1892239B (ja) |
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- 2006-06-16 US US11/454,123 patent/US7411408B2/en not_active Expired - Fee Related
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| EP1734373A2 (en) | 2006-12-20 |
| EP1734373A3 (en) | 2012-01-25 |
| CN1892239A (zh) | 2007-01-10 |
| US20060290344A1 (en) | 2006-12-28 |
| EP1734373B1 (en) | 2013-04-03 |
| CN1892239B (zh) | 2012-07-25 |
| JP2007088419A (ja) | 2007-04-05 |
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