JP5416883B2 - 位相測定用システムと方法 - Google Patents

位相測定用システムと方法 Download PDF

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Publication number: JP5416883B2
Authority: JP; Japan
Prior art keywords: phase; sample; interferometer; light; signal
Prior art date: 2003-06-19
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

JP2006517372A

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English (en)

Japanese (ja)

Other versions

JP2007524075A (ja

Inventor

フアング−イエン，クリストフアー・エム

ポペス，ガブリール

ヤング，チヤングエイ

ワツクス，アダム・ピー

ダサリ，ラマチヤンドラ・アール

フエルド，マイケル・エス

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Massachusetts Institute of Technology

Original Assignee

Massachusetts Institute of Technology

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2003-06-19

Filing date

2004-06-18

Publication date

2014-02-12

2004-04-13 Priority claimed from US10/823,389 external-priority patent/US7365858B2/en

2004-06-18 Application filed by Massachusetts Institute of Technology filed Critical Massachusetts Institute of Technology

2007-08-23 Publication of JP2007524075A publication Critical patent/JP2007524075A/ja

2014-02-12 Application granted granted Critical

2014-02-12 Publication of JP5416883B2 publication Critical patent/JP5416883B2/ja

2024-06-18 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

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Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
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- G01B9/0209—Low-coherence interferometers
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Investigating Or Analysing Materials By Optical Means (AREA)
Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)

JP2006517372A 2003-06-19 2004-06-18 位相測定用システムと方法 Expired - Lifetime JP5416883B2 (ja)

Applications Claiming Priority (5)

Application Number	Priority Date	Filing Date	Title
US47973203P	2003-06-19	2003-06-19
US60/479,732		2003-06-19
US10/823,389		2004-04-13
US10/823,389 US7365858B2 (en)	2001-12-18	2004-04-13	Systems and methods for phase measurements
PCT/US2004/019456 WO2005001445A2 (en)	2001-12-18	2004-06-18	Systems and methods for phase measurements

Related Child Applications (1)

Application Number	Title	Priority Date	Filing Date
JP2013077045A Division JP2013152243A (ja)	2003-06-19	2013-04-02	位相測定用システムと方法

Publications (2)

Publication Number	Publication Date
JP2007524075A JP2007524075A (ja)	2007-08-23
JP5416883B2 true JP5416883B2 (ja)	2014-02-12

Family

ID=35874879

Family Applications (2)

Application Number	Title	Priority Date	Filing Date
JP2006517372A Expired - Lifetime JP5416883B2 (ja)	2003-06-19	2004-06-18	位相測定用システムと方法
JP2013077045A Pending JP2013152243A (ja)	2003-06-19	2013-04-02	位相測定用システムと方法

Family Applications After (1)

Application Number	Title	Priority Date	Filing Date
JP2013077045A Pending JP2013152243A (ja)	2003-06-19	2013-04-02	位相測定用システムと方法

Country Status (3)

Country	Link
EP (1)	EP1644720A2 (de)
JP (2)	JP5416883B2 (de)
CA (1)	CA2529942A1 (de)

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JP4898639B2 (ja)	2007-11-22	2012-03-21	キヤノン株式会社	絶対位置の計測装置及び計測方法
US8599383B2 (en)	2009-05-06	2013-12-03	The Regents Of The University Of California	Optical cytometry
JP5775068B2 (ja) *	2010-04-23	2015-09-09	浜松ホトニクス株式会社	細胞観察装置および細胞観察方法
WO2011132587A1 (ja) *	2010-04-23	2011-10-27	浜松ホトニクス株式会社	細胞観察装置および細胞観察方法
CA2843445C (en) *	2011-08-02	2019-09-24	The Regents Of The University Of California	Rapid, massively parallel single-cell drug response measurements via live cell interferometry
JP6227337B2 (ja)	2013-01-24	2017-11-08	株式会社日立エルジーデータストレージ	光計測装置
JP6367318B2 (ja)	2013-05-24	2018-08-01	ザリージェンツオブザユニバーシティオブカリフォルニア	質量応答における変化による望ましいｔリンパ球の同定
US9316536B2 (en)	2013-06-24	2016-04-19	ASTRODESIGN, Inc.	Spatial frequency reproducing apparatus and optical distance measuring apparatus
JP5843330B1 (ja) *	2014-07-10	2016-01-13	日本電信電話株式会社	光干渉断層装置
JP6436753B2 (ja) *	2014-12-05	2018-12-12	国立大学法人茨城大学	位相差干渉顕微装置
EP3240990A4 (de) *	2015-01-04	2018-07-04	Joshua Noel Hogan	Referenzsignalfilter für interferometrisches system
CN104614072B (zh) *	2015-02-10	2016-09-21	中国科学院上海光学精密机械研究所	基于全反射镜的二维光谱测量装置及测量方法
WO2017209079A1 (ja) *	2016-05-30	2017-12-07	株式会社ニコン	観察装置および観察方法
JP7027422B2 (ja) *	2016-11-18	2022-03-01	ザイゴコーポレーション	干渉計の光学性能を最適化するための方法及び装置
KR20180124489A (ko) *	2017-05-12	2018-11-21	휴멘 주식회사	광간섭 측정 장치
EP3712596A4 (de) *	2017-11-14	2021-11-24	Nikon Corporation	Verfahren zur erzeugung eines quantitativen phasenbildes, vorrichtung zur erzeugung eines quantitativen phasenbildes und programm
KR102127326B1 (ko) *	2018-12-17	2020-06-29	국방과학연구소	광 증폭기의 위상 잡음 보정 방법 및 시스템
WO2021081215A1 (en) *	2019-10-23	2021-04-29	The Johns Hopkins University	Offset illumination capillaroscope
CN111122617A (zh) *	2019-12-26	2020-05-08	东莞理工学院	一种基于中子成像的增材制造气孔裂纹检测方法和装置
CN112945140B (zh) *	2021-01-29	2022-09-16	四川大学	一种基于查找表和区域分割的彩色物体三维测量方法
CN113706509B (zh) *	2021-08-30	2024-02-27	常州工利精机科技有限公司	一种可用于冲压件表面微缺陷成像的检测方法
EP4404004A4 (de) *	2021-09-16	2025-07-23	Otsuka Denshi Kk	Optisches messsystem und optisches messverfahren
CN114414528A (zh) *	2021-12-07	2022-04-29	广东科学技术职业学院	基于5g微波光子信号的双光纤端面干涉盐度检测方法
CN114374779B (zh) *	2021-12-16	2023-06-20	中国科学院上海高等研究院	一种全光场成像相机及其成像方法及全光场成像装置
CN114785650B (zh) *	2022-05-10	2024-02-27	北京邮电大学	一种新型盲相位搜索算法结构及实现方法
CN116337134A (zh) *	2023-01-03	2023-06-27	镭脉工业科技(上海)有限公司	一种激光监控仪器的使用方法
US20260049930A1 (en) *	2024-08-16	2026-02-19	The Chinese University Of Hong Kong	Phase amplification microscopy
CN118883025B (zh) *	2024-09-27	2024-12-13	中国科学院长春光学精密机械与物理研究所	定焦及焦距测量装置及方法

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2004
- 2004-06-18 JP JP2006517372A patent/JP5416883B2/ja not_active Expired - Lifetime
- 2004-06-18 EP EP04776731A patent/EP1644720A2/de not_active Withdrawn
- 2004-06-18 CA CA002529942A patent/CA2529942A1/en not_active Abandoned
2013
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