JP5657232B2 - 半導体パッケージ - Google Patents
半導体パッケージ Download PDFInfo
- Publication number
- JP5657232B2 JP5657232B2 JP2009242295A JP2009242295A JP5657232B2 JP 5657232 B2 JP5657232 B2 JP 5657232B2 JP 2009242295 A JP2009242295 A JP 2009242295A JP 2009242295 A JP2009242295 A JP 2009242295A JP 5657232 B2 JP5657232 B2 JP 5657232B2
- Authority
- JP
- Japan
- Prior art keywords
- conductive
- conductive pad
- cell region
- lead
- semiconductor package
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Wire Bonding (AREA)
Description
前記第1導電パッドは、前記半導体チップの一側に配置され、前記第2導電パッドは、前記半導体チップの他の側に配置されることができる。
110 ベース膜
120 リードパターン
130 保護絶縁膜
140 補充絶縁膜
200 半導体チップ
202 半導体チップの上面
204 半導体チップの下面
206 半導体チップの側面
500 半導体パッケージ
Claims (10)
- 第1導電リード及び第2導電リードを含む配線基板と、
信号が提供される第1セル領域と、前記第1セル領域から離れて配置されかつ前記信号と同一の信号が提供される第2セル領域と、前記第1セル領域と電気的に接続する第1導電パッドと、前記第2セル領域と電気的に接続する第2導電パッドと、を含み、前記配線基板上に実装され、前記第2導電リード上に前記第1及び第2導電パッドを配置する半導体チップと、を含み、
前記第1導電パッドと前記第2導電パッドは互いに対向するように配置され、
前記第1セル領域と前記第2セル領域は、前記第1導電パッドと前記第2導電パッドとの間に配置され、
前記第2導電リードは、前記第1導電パッドと前記第2導電パッドに接続される前記第1セル領域と前記第2セル領域を横切るように配置され、
前記第1セル領域及び前記第2セル領域の双方は外部ソースから前記第2導電リードに伝達された信号を受信することを特徴とする半導体パッケージ。 - 前記第1及び第2セル領域は、隣接し、平面上に互いに左右又は上下対称に配置されることを特徴とする請求項1に記載の半導体パッケージ。
- 前記第2導電リードは、前記第1導電パッドと前記第2導電パッドとの間に曲がった部分を有することを特徴とする請求項1に記載の半導体パッケージ。
- 前記第1導電パッドは、前記半導体チップの一側に配置され、前記第2導電パッドは、前記半導体チップの他の側に配置されることを特徴とする請求項1に記載の半導体パッケージ。
- 前記半導体チップは、前記第1セル領域と前記第1導電パッドとの間及び前記第2セル領域と前記第2導電パッドとの間に配置され、互いに電気的に接続する内部配線パターンをさらに含むことを特徴とする請求項1に記載の半導体パッケージ。
- 前記半導体チップは、前記第2導電リードと前記第1導電パッドとの間及び前記第2導電リードと前記第2導電パッドとの間に各々に介在される接続端子をさらに含むことを特徴とする請求項1に記載の半導体パッケージ。
- 前記配線基板は、ベース基板と、前記ベース基板上の保護絶縁膜とをさらに含むことを特徴とする請求項1に記載の半導体パッケージ。
- 前記第1及び第2導電リードは、前記ベース基板上に互いに離隔されて配置されることを特徴とする請求項7に記載の半導体パッケージ。
- 前記配線基板は、前記半導体チップが実装される実装領域及び前記実装領域の他の非実装領域をさらに含むことを特徴とする請求項7に記載の半導体パッケージ。
- 前記第1及び第2導電リードは、前記実装領域で露出され、前記非実装領域で前記保護絶縁膜によって覆われることを特徴とする請求項9に記載の半導体パッケージ。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020080104112A KR101539402B1 (ko) | 2008-10-23 | 2008-10-23 | 반도체 패키지 |
| KR10-2008-0104112 | 2008-10-23 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010103535A JP2010103535A (ja) | 2010-05-06 |
| JP5657232B2 true JP5657232B2 (ja) | 2015-01-21 |
Family
ID=42116672
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009242295A Active JP5657232B2 (ja) | 2008-10-23 | 2009-10-21 | 半導体パッケージ |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8198722B2 (ja) |
| JP (1) | JP5657232B2 (ja) |
| KR (1) | KR101539402B1 (ja) |
| CN (1) | CN101728356A (ja) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2940521B1 (fr) * | 2008-12-19 | 2011-11-11 | 3D Plus | Procede de fabrication collective de modules electroniques pour montage en surface |
| KR102252380B1 (ko) | 2014-04-24 | 2021-05-14 | 삼성전자주식회사 | 테이프 배선 기판, 반도체 패키지 및 상기 반도체 패키지를 포함한 디스플레이 장치 |
| CN116111033B (zh) * | 2023-03-03 | 2023-06-27 | 佛山市国星半导体技术有限公司 | 一种led车灯光源及其制作方法 |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54133878A (en) * | 1978-04-07 | 1979-10-17 | Nec Corp | Semiconductor device |
| JPS57184226A (en) * | 1981-05-08 | 1982-11-12 | Nec Corp | Semiconductor device |
| JPH04181748A (ja) * | 1990-11-16 | 1992-06-29 | Seiko Epson Corp | Tabテープ |
| JP3025357B2 (ja) * | 1991-11-14 | 2000-03-27 | 富士通株式会社 | 半導体装置 |
| JPH0669276A (ja) * | 1992-05-22 | 1994-03-11 | Nec Corp | 半導体装置 |
| KR960008514B1 (ko) * | 1993-07-23 | 1996-06-26 | 삼성전자 주식회사 | 테스트 소켓 및 그를 이용한 노운 굳 다이 제조방법 |
| JPH09107048A (ja) * | 1995-03-30 | 1997-04-22 | Mitsubishi Electric Corp | 半導体パッケージ |
| US6492719B2 (en) * | 1999-07-30 | 2002-12-10 | Hitachi, Ltd. | Semiconductor device |
| JPH1195243A (ja) | 1997-09-22 | 1999-04-09 | Citizen Watch Co Ltd | 液晶表示装置の電極駆動ic |
| KR19990041909A (ko) * | 1997-11-25 | 1999-06-15 | 윤종용 | 반도체 칩 |
| US6522018B1 (en) * | 2000-05-16 | 2003-02-18 | Micron Technology, Inc. | Ball grid array chip packages having improved testing and stacking characteristics |
| JP4018375B2 (ja) * | 2000-11-30 | 2007-12-05 | 株式会社東芝 | 半導体装置 |
| JP4818519B2 (ja) * | 2001-02-06 | 2011-11-16 | ルネサスエレクトロニクス株式会社 | 磁気記憶装置 |
| DE10231385B4 (de) * | 2001-07-10 | 2007-02-22 | Samsung Electronics Co., Ltd., Suwon | Halbleiterchip mit Bondkontaktstellen und zugehörige Mehrchippackung |
| JP3708467B2 (ja) * | 2001-09-26 | 2005-10-19 | 株式会社日立製作所 | 表示装置 |
| JP2003330041A (ja) * | 2002-05-10 | 2003-11-19 | Sharp Corp | 半導体装置及びそれを備えた表示パネルモジュール |
| US6870252B2 (en) * | 2003-06-18 | 2005-03-22 | Sun Microsystems, Inc. | Chip packaging and connection for reduced EMI |
| KR100627006B1 (ko) * | 2004-04-01 | 2006-09-25 | 삼성전자주식회사 | 인덴트 칩과, 그를 이용한 반도체 패키지와 멀티 칩 패키지 |
| US20060060639A1 (en) * | 2004-09-21 | 2006-03-23 | Byrne Tiffany A | Doped contact formations |
| US7176575B2 (en) * | 2004-09-30 | 2007-02-13 | Intel Corporation | Input/output routing on an electronic device |
| KR100845774B1 (ko) * | 2006-10-13 | 2008-07-14 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 및 이를 이용한 전압 제어 방법 |
| KR100800486B1 (ko) * | 2006-11-24 | 2008-02-04 | 삼성전자주식회사 | 개선된 신호 전달 경로를 갖는 반도체 메모리 장치 및 그구동방법 |
| US7791173B2 (en) * | 2007-01-23 | 2010-09-07 | Samsung Electronics Co., Ltd. | Chip having side pad, method of fabricating the same and package using the same |
| JP5111878B2 (ja) * | 2007-01-31 | 2013-01-09 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| US8129845B2 (en) * | 2007-09-25 | 2012-03-06 | Stats Chippac, Ltd. | Semiconductor device and method of forming interconnect structure in non-active area of wafer |
| KR100886717B1 (ko) * | 2007-10-16 | 2009-03-04 | 주식회사 하이닉스반도체 | 적층 반도체 패키지 및 이의 제조 방법 |
| US7901957B2 (en) * | 2007-12-17 | 2011-03-08 | Sandisk Corporation | Disguising test pads in a semiconductor package |
| KR101479509B1 (ko) * | 2008-08-29 | 2015-01-08 | 삼성전자주식회사 | 반도체 패키지 |
| JP5580981B2 (ja) * | 2008-11-21 | 2014-08-27 | ラピスセミコンダクタ株式会社 | 半導体素子及び半導体装置 |
-
2008
- 2008-10-23 KR KR1020080104112A patent/KR101539402B1/ko active Active
-
2009
- 2009-10-16 US US12/580,306 patent/US8198722B2/en active Active
- 2009-10-21 JP JP2009242295A patent/JP5657232B2/ja active Active
- 2009-10-22 CN CN200910174068A patent/CN101728356A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CN101728356A (zh) | 2010-06-09 |
| KR20100045076A (ko) | 2010-05-03 |
| US8198722B2 (en) | 2012-06-12 |
| JP2010103535A (ja) | 2010-05-06 |
| US20100102432A1 (en) | 2010-04-29 |
| KR101539402B1 (ko) | 2015-07-27 |
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