JP6183929B2 - コンパクトな質量分析計 - Google Patents

コンパクトな質量分析計 Download PDF

Info

Publication number: JP6183929B2
Authority: JP; Japan
Prior art keywords: ion; mass spectrometer; gas; gas pressure; source
Prior art date: 2012-12-31
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Active

Application number

JP2015550371A

Other languages

English (en)

Japanese (ja)

Other versions

JP2016510477A (ja

Inventor

アンドリュージェイ．バートフェイ−ザボ，

クリストファーディー．ブラウン，

マイケルジョビン，

ケビンジェイ．ノップ，

エフゲニークリロフ，

スコットミラー，

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

908 Devices Inc

Original Assignee

908 Devices Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2012-12-31

Filing date

2012-12-31

Publication date

2017-08-23

2012-12-31 Application filed by 908 Devices Inc filed Critical 908 Devices Inc

2016-04-07 Publication of JP2016510477A publication Critical patent/JP2016510477A/ja

2017-08-23 Application granted granted Critical

2017-08-23 Publication of JP6183929B2 publication Critical patent/JP6183929B2/ja

Status Active legal-status Critical Current

2032-12-31 Anticipated expiration legal-status Critical

Links

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/24—Vacuum systems, e.g. maintaining desired pressures

Landscapes

Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Electron Tubes For Measurement (AREA)

JP2015550371A 2012-12-31 2012-12-31 コンパクトな質量分析計 Active JP6183929B2 (ja)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
PCT/US2012/072328 WO2014105089A1 (fr)	2012-12-31	2012-12-31	Spectromètre de masse compact

Related Child Applications (1)

Application Number	Title	Priority Date	Filing Date
JP2017140816A Division JP2017201635A (ja)	2017-07-20	2017-07-20	コンパクトな質量分析計

Publications (2)

Publication Number	Publication Date
JP2016510477A JP2016510477A (ja)	2016-04-07
JP6183929B2 true JP6183929B2 (ja)	2017-08-23

Family

ID=47553492

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP2015550371A Active JP6183929B2 (ja)	2012-12-31	2012-12-31	コンパクトな質量分析計

Country Status (4)

Country	Link
EP (1)	EP2939255B1 (fr)
JP (1)	JP6183929B2 (fr)
CN (4)	CN116864367A (fr)
WO (1)	WO2014105089A1 (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP3167269B1 (fr) *	2014-07-07	2024-03-13	Nanotech Analysis S.R.L.	Dispositif électronique portable pour l'analyse d'une composition gazeuse
WO2018046083A1 (fr) *	2016-09-07	2018-03-15	Tofwerk Ag	Appareil et procédé d'analyse d'une composition chimique de particules d'aérosol
EP3545292B1 (fr) *	2016-11-23	2021-09-15	Atonarp Inc.	Système et procédé pour déterminer un ensemble de rapports masse/charge pour un ensemble de gaz
CN106872559B (zh) *	2017-03-17	2024-02-27	宁波大学	一种超分辨生物分子质谱成像装置及其工作方法
CN107065950B (zh) *	2017-03-28	2020-10-23	清华大学	一种基于质谱仪真空腔内气压变化的控制方法
JP6753366B2 (ja) *	2017-06-23	2020-09-09	株式会社島津製作所	分析装置
CN109100774A (zh) *	2018-07-12	2018-12-28	北京大学深圳研究生院	地下溢出带电粒子监测装置、系统和监测数据处理方法
GB2576169B (en) *	2018-08-07	2022-03-09	Applied Science & Tech Solutions Ltd	Mass spectrometry system
DE102019204694A1 (de) *	2019-04-02	2020-10-08	Carl Zeiss Smt Gmbh	Massenspektrometer mit einer Ionisierungseinrichtung
GB2588462A (en)	2019-10-25	2021-04-28	Spacetek Tech Ag	Compact time-of-flight mass analyzer
US11715359B1 (en) *	2022-04-04	2023-08-01	Capped Out Media	Smoke warning system and smoke classification system thereof
CN116581013B (zh) *	2023-04-07	2024-08-06	国仪量子技术(合肥)股份有限公司	离子阱芯片更换系统
CN116721586A (zh) *	2023-06-19	2023-09-08	湖州师范学院	一种离子阱囚禁和四极杆质谱原理演示教具及其演示方法
CN118737802B (zh) *	2024-09-03	2025-02-07	烟台至公生物医药科技有限公司	一种质谱仪内部腔室气压自调节控制方法及系统
EP4708330A1 (fr) *	2024-09-06	2026-03-11	Infineon Technologies Austria AG	Dispositif de piège à ions

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5401962A (en) *	1993-06-14	1995-03-28	Ferran Scientific	Residual gas sensor utilizing a miniature quadrupole array
US5600136A (en) *	1995-06-07	1997-02-04	Varian Associates, Inc.	Single potential ion source
IL115984A (en) *	1995-11-14	1998-08-16	Yeda Res & Dev	Low-vacuum mass spectrometer
US6753523B1 (en) *	1998-01-23	2004-06-22	Analytica Of Branford, Inc.	Mass spectrometry with multipole ion guides
US6469298B1 (en)	1999-09-20	2002-10-22	Ut-Battelle, Llc	Microscale ion trap mass spectrometer
US6762406B2 (en)	2000-05-25	2004-07-13	Purdue Research Foundation	Ion trap array mass spectrometer
US7274015B2 (en)	2001-08-08	2007-09-25	Sionex Corporation	Capacitive discharge plasma ion source
JP3936908B2 (ja) *	2002-12-24	2007-06-27	株式会社日立ハイテクノロジーズ	質量分析装置及び質量分析方法
US6933498B1 (en)	2004-03-16	2005-08-23	Ut-Battelle, Llc	Ion trap array-based systems and methods for chemical analysis
WO2006041567A2 (fr) *	2004-08-16	2006-04-20	Oi Corporation	Banc optique pour systeme a spectrometre de masse
GB2422951B (en) *	2005-02-07	2010-07-28	Microsaic Systems Ltd	Integrated analytical device
US8449842B2 (en) *	2009-03-19	2013-05-28	Thermo Scientific Portable Analytical Instruments Inc.	Molecular reader
US9224586B2 (en) *	2009-12-23	2015-12-29	Academia Sinica	Apparatuses and methods for portable mass spectrometry
CN103069538B (zh) *	2010-08-19	2016-05-11	莱克公司	具有软电离辉光放电和调节器的质谱仪

2012
- 2012-12-31 WO PCT/US2012/072328 patent/WO2014105089A1/fr not_active Ceased
- 2012-12-31 CN CN202310656854.4A patent/CN116864367A/zh active Pending
- 2012-12-31 CN CN202010069903.0A patent/CN111243938B/zh active Active
- 2012-12-31 CN CN201711304468.XA patent/CN107946166B/zh active Active
- 2012-12-31 JP JP2015550371A patent/JP6183929B2/ja active Active
- 2012-12-31 EP EP12813735.3A patent/EP2939255B1/fr active Active
- 2012-12-31 CN CN201280078246.XA patent/CN105009250B/zh active Active

Also Published As

Publication number	Publication date
CN107946166A (zh)	2018-04-20
CN105009250B (zh)	2018-01-09
CN107946166B (zh)	2020-02-18
WO2014105089A1 (fr)	2014-07-03
CN111243938A (zh)	2020-06-05
JP2016510477A (ja)	2016-04-07
EP2939255A1 (fr)	2015-11-04
CN116864367A (zh)	2023-10-10
EP2939255B1 (fr)	2021-03-10
CN111243938B (zh)	2023-06-23
CN105009250A (zh)	2015-10-28

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Publication	Publication Date	Title
JP6183929B2 (ja)	2017-08-23	コンパクトな質量分析計
US9093253B2 (en)	2015-07-28	High pressure mass spectrometry systems and methods
US10204775B2 (en)	2019-02-12	High pressure mass spectrometry systems and methods
US9099286B2 (en)	2015-08-04	Compact mass spectrometer
US8525111B1 (en)	2013-09-03	High pressure mass spectrometry systems and methods
US8816272B1 (en)	2014-08-26	High pressure mass spectrometry systems and methods
US9978574B2 (en)	2018-05-22	Sample collection in compact mass spectrometry systems
US10438787B2 (en)	2019-10-08	Integrated mass spectrometry systems
CN101578684B (zh)	2014-10-15	静电离子阱
US11501961B2 (en)	2022-11-15	Mass spectrometry by detecting positively and negatively charged particles
JP7141432B2 (ja)	2022-09-22	コンパクトな質量分析計
JP2019091700A (ja)	2019-06-13	コンパクトな質量分析計
JP2017201635A (ja)	2017-11-09	コンパクトな質量分析計