JP7286247B2 - ウェーハの加工方法 - Google Patents
ウェーハの加工方法 Download PDFInfo
- Publication number
- JP7286247B2 JP7286247B2 JP2019107315A JP2019107315A JP7286247B2 JP 7286247 B2 JP7286247 B2 JP 7286247B2 JP 2019107315 A JP2019107315 A JP 2019107315A JP 2019107315 A JP2019107315 A JP 2019107315A JP 7286247 B2 JP7286247 B2 JP 7286247B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- polyester
- sheet
- frame
- based sheet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/362—Laser etching
- B23K26/364—Laser etching for making a groove or trench, e.g. for scribing a break initiation groove
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
- B23K26/402—Removing material taking account of the properties of the material involved involving non-metallic material, e.g. isolators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
- B23K26/53—Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
- C09J7/22—Plastics; Metallised plastics
- C09J7/25—Plastics; Metallised plastics based on macromolecular compounds obtained otherwise than by reactions involving only carbon-to-carbon unsaturated bonds
- C09J7/255—Polyesters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/6922—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0432—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0436—Apparatus for thermal treatment mainly by radiation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0442—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7402—Wafer tapes, e.g. grinding or dicing support tapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/067—Manufacture or treatment of conductive parts of the interconnections by modifying the pattern of conductive parts
- H10W20/068—Manufacture or treatment of conductive parts of the interconnections by modifying the pattern of conductive parts by using a laser, e.g. laser cutting or laser direct writing
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H10P72/742—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/744—Details of chemical or physical process used for separating the auxiliary support from a device or a wafer
- H10P72/7442—Separation by peeling
Landscapes
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Dicing (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
Description
波長 :1064nm
繰り返し周波数:50kHz
平均出力 :1W
送り速度 :200mm/秒
1a 表面
1b 裏面
3 分割予定ライン
3a 改質層
5 デバイス
7 フレーム
7a 開口
9 ポリエステル系シート
9a 切断痕
11 フレームユニット
2 チャックテーブル
2a 保持面
2b,36a 吸引源
2c,36b 切り替え部
4 ヒートガン
4a 熱風
6 ヒートローラー
8 赤外線ランプ
8a 赤外線
10 カッター
12 レーザー加工装置
14 レーザー加工ユニット
14a 加工ヘッド
14b 集光点
16 レーザービーム
18 ピックアップ装置
20 ドラム
22 フレーム保持ユニット
24 クランプ
26 フレーム支持台
28 ロッド
30 エアシリンダ
32 ベース
34 突き上げ機構
34a 冷却部
36 コレット
Claims (9)
- 複数のデバイスが、分割予定ラインによって区画された表面の各領域に形成されたウェーハを個々のデバイスチップに分割するウェーハの加工方法であって、
ウェーハを収容する開口を有するフレームの該開口内にウェーハを位置付け、該ウェーハの裏面または該表面と、該フレームの外周と、に糊層を備えないポリエステル系シートを配設するポリエステル系シート配設工程と、
該ポリエステル系シートを加熱し熱圧着により該ウェーハと該フレームとを該ポリエステル系シートを介して一体化する一体化工程と、
該ウェーハに対して透過性を有する波長のレーザービームの集光点を該ウェーハの内部に位置付け、該レーザービームを該分割予定ラインに沿って該ウェーハに照射して該ウェーハに改質層を形成し、該ウェーハを個々のデバイスチップに分割する分割工程と、
該ポリエステル系シートの各デバイスチップに対応する個々の領域において、該ポリエステル系シートを冷却し、該ポリエステル系シート側から該デバイスチップを突き上げ、該ポリエステル系シートから該デバイスチップをピックアップするピックアップ工程と、
を備えることを特徴とするウェーハの加工方法。 - 該一体化工程において、赤外線の照射によって該熱圧着を実施することを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、一体化を実施した後、該フレームの外周からはみ出したポリエステル系シートを除去することを特徴とする請求項1記載のウェーハの加工方法。
- 該ピックアップ工程では、該ポリエステル系シートを拡張して各デバイスチップ間の間隔を広げることを特徴とする請求項1記載のウェーハの加工方法。
- 該ポリエステル系シートは、ポリエチレンテレフタレートシート、ポリエチレンナフタレートシートのいずれかであることを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、該ポリエステル系シートが該ポリエチレンテレフタレートシートである場合に加熱温度は250℃~270℃であり、該ポリエステル系シートが該ポリエチレンナフタレートシートである場合に加熱温度は160℃~180℃であることを特徴とする請求項5記載のウェーハの加工方法。
- 該ウェーハは、Si、GaN、GaAs、ガラスのいずれかで構成されることを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、該ポリエステル系シートに熱風を当てて該ポリエステル系シートを加熱して該熱圧着を実施することを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、該ポリエステル系シートをローラーで押圧して該熱圧着を実施することを特徴とする請求項1記載のウェーハの加工方法。
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019107315A JP7286247B2 (ja) | 2019-06-07 | 2019-06-07 | ウェーハの加工方法 |
| SG10202004870SA SG10202004870SA (en) | 2019-06-07 | 2020-05-26 | Wafer processing method |
| CN202010465658.5A CN112053993B (zh) | 2019-06-07 | 2020-05-28 | 晶片的加工方法 |
| MYPI2020002643A MY200770A (en) | 2019-06-07 | 2020-05-28 | Wafer processing method including uniting a wafer, a ring frame and a polyester sheet without using an adhesive layer |
| KR1020200064943A KR20200140721A (ko) | 2019-06-07 | 2020-05-29 | 웨이퍼의 가공 방법 |
| TW109118686A TWI841744B (zh) | 2019-06-07 | 2020-06-03 | 晶圓的加工方法 |
| DE102020207072.5A DE102020207072B4 (de) | 2019-06-07 | 2020-06-05 | Waferbearbeitungsverfahren |
| US16/895,186 US11380587B2 (en) | 2019-06-07 | 2020-06-08 | Wafer processing method including uniting a wafer, a ring frame and a polyester sheet without using an adhesive layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019107315A JP7286247B2 (ja) | 2019-06-07 | 2019-06-07 | ウェーハの加工方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2020202257A JP2020202257A (ja) | 2020-12-17 |
| JP7286247B2 true JP7286247B2 (ja) | 2023-06-05 |
Family
ID=73459823
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019107315A Active JP7286247B2 (ja) | 2019-06-07 | 2019-06-07 | ウェーハの加工方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US11380587B2 (ja) |
| JP (1) | JP7286247B2 (ja) |
| KR (1) | KR20200140721A (ja) |
| CN (1) | CN112053993B (ja) |
| DE (1) | DE102020207072B4 (ja) |
| MY (1) | MY200770A (ja) |
| SG (1) | SG10202004870SA (ja) |
| TW (1) | TWI841744B (ja) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7430515B2 (ja) * | 2019-11-06 | 2024-02-13 | 株式会社ディスコ | ウエーハの処理方法 |
| JP7844124B2 (ja) | 2021-09-24 | 2026-04-13 | 株式会社ディスコ | 板状物の加工方法 |
| JP7847960B2 (ja) * | 2021-09-27 | 2026-04-20 | 株式会社ディスコ | 板状物の加工方法 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000208447A (ja) | 1998-11-12 | 2000-07-28 | Toshiba Corp | 半導体製造装置及び半導体装置の製造方法 |
| JP2002265821A (ja) | 2001-03-15 | 2002-09-18 | Nippon Paint Co Ltd | 下地処理剤 |
| JP2007165636A (ja) | 2005-12-14 | 2007-06-28 | Nippon Zeon Co Ltd | 半導体素子の製造方法 |
| JP2013055137A (ja) | 2011-09-01 | 2013-03-21 | Disco Abrasive Syst Ltd | チップ間隔維持方法 |
| JP2014165325A (ja) | 2013-02-25 | 2014-09-08 | Disco Abrasive Syst Ltd | 積層ウェーハの加工方法 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3076179B2 (ja) | 1993-07-26 | 2000-08-14 | 株式会社ディスコ | ダイシング装置 |
| JPH09167779A (ja) * | 1995-12-14 | 1997-06-24 | Toshiba Corp | 半導体製造装置 |
| US6352073B1 (en) * | 1998-11-12 | 2002-03-05 | Kabushiki Kaisha Toshiba | Semiconductor manufacturing equipment |
| JP3076179U (ja) | 2000-09-07 | 2001-03-30 | 和雄 落合 | コップ型ボトルキャップ |
| JP3408805B2 (ja) | 2000-09-13 | 2003-05-19 | 浜松ホトニクス株式会社 | 切断起点領域形成方法及び加工対象物切断方法 |
| JP2003152056A (ja) | 2001-11-08 | 2003-05-23 | Sony Corp | 半導体素子保持具及びその製造方法 |
| JP2003209080A (ja) | 2002-01-11 | 2003-07-25 | Disco Abrasive Syst Ltd | 半導体ウェーハ保護部材及び半導体ウェーハの研削方法 |
| TWI225279B (en) * | 2002-03-11 | 2004-12-11 | Hitachi Ltd | Semiconductor device and its manufacturing method |
| KR100480628B1 (ko) | 2002-11-11 | 2005-03-31 | 삼성전자주식회사 | 에어 블로잉을 이용한 칩 픽업 방법 및 장치 |
| JP2007150065A (ja) * | 2005-11-29 | 2007-06-14 | Shin Etsu Chem Co Ltd | ダイシング・ダイボンド用接着テープ |
| EP2200075A4 (en) * | 2007-10-09 | 2011-12-07 | Hitachi Chemical Co Ltd | METHOD FOR PRODUCING A SEMICONDUCTOR CHIP WITH A LONG-TERM FILM, A LONG-TERM FOR A SEMICONDUCTOR USED IN THE PROCESS, AND METHOD FOR PRODUCING A SEMICONDUCTOR CONSTRUCTION ELEMENT |
| JP5904720B2 (ja) * | 2011-05-12 | 2016-04-20 | 株式会社ディスコ | ウエーハの分割方法 |
| KR101939636B1 (ko) | 2011-09-30 | 2019-01-17 | 린텍 코포레이션 | 보호막 형성층을 갖는 다이싱 시트 및 칩의 제조 방법 |
| CN105143380B (zh) | 2013-03-28 | 2019-05-17 | 古河电气工业株式会社 | 粘合带及晶片加工用胶带 |
| JP2015126082A (ja) | 2013-12-26 | 2015-07-06 | 株式会社デンソー | 半導体チップのピックアップ方法 |
| JP6425435B2 (ja) | 2014-07-01 | 2018-11-21 | 株式会社ディスコ | チップ間隔維持装置 |
| KR102457313B1 (ko) * | 2014-09-29 | 2022-10-20 | 린텍 가부시키가이샤 | 반도체 웨이퍼 가공용 시트용 기재, 반도체 웨이퍼 가공용 시트 및 반도체 장치의 제조 방법 |
| US10483215B2 (en) * | 2016-09-22 | 2019-11-19 | International Business Machines Corporation | Wafer level integration including design/co-design, structure process, equipment stress management and thermal management |
| JP2019192717A (ja) | 2018-04-20 | 2019-10-31 | 株式会社ディスコ | ウエーハの加工方法 |
| JP7154809B2 (ja) | 2018-04-20 | 2022-10-18 | 株式会社ディスコ | ウエーハの加工方法 |
| JP7181020B2 (ja) * | 2018-07-26 | 2022-11-30 | 株式会社ディスコ | ウエーハの加工方法 |
| JP7387228B2 (ja) * | 2019-10-17 | 2023-11-28 | 株式会社ディスコ | ウェーハの加工方法 |
-
2019
- 2019-06-07 JP JP2019107315A patent/JP7286247B2/ja active Active
-
2020
- 2020-05-26 SG SG10202004870SA patent/SG10202004870SA/en unknown
- 2020-05-28 CN CN202010465658.5A patent/CN112053993B/zh active Active
- 2020-05-28 MY MYPI2020002643A patent/MY200770A/en unknown
- 2020-05-29 KR KR1020200064943A patent/KR20200140721A/ko not_active Ceased
- 2020-06-03 TW TW109118686A patent/TWI841744B/zh active
- 2020-06-05 DE DE102020207072.5A patent/DE102020207072B4/de active Active
- 2020-06-08 US US16/895,186 patent/US11380587B2/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000208447A (ja) | 1998-11-12 | 2000-07-28 | Toshiba Corp | 半導体製造装置及び半導体装置の製造方法 |
| JP2002265821A (ja) | 2001-03-15 | 2002-09-18 | Nippon Paint Co Ltd | 下地処理剤 |
| JP2007165636A (ja) | 2005-12-14 | 2007-06-28 | Nippon Zeon Co Ltd | 半導体素子の製造方法 |
| JP2013055137A (ja) | 2011-09-01 | 2013-03-21 | Disco Abrasive Syst Ltd | チップ間隔維持方法 |
| JP2014165325A (ja) | 2013-02-25 | 2014-09-08 | Disco Abrasive Syst Ltd | 積層ウェーハの加工方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202046394A (zh) | 2020-12-16 |
| DE102020207072A1 (de) | 2020-12-10 |
| CN112053993B (zh) | 2026-04-07 |
| US11380587B2 (en) | 2022-07-05 |
| SG10202004870SA (en) | 2021-01-28 |
| TWI841744B (zh) | 2024-05-11 |
| DE102020207072B4 (de) | 2025-10-23 |
| US20200388537A1 (en) | 2020-12-10 |
| JP2020202257A (ja) | 2020-12-17 |
| KR20200140721A (ko) | 2020-12-16 |
| MY200770A (en) | 2024-01-15 |
| CN112053993A (zh) | 2020-12-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7286245B2 (ja) | ウェーハの加工方法 | |
| JP7246825B2 (ja) | ウェーハの加工方法 | |
| JP7330616B2 (ja) | ウェーハの加工方法 | |
| JP7277019B2 (ja) | ウェーハの加工方法 | |
| JP7313767B2 (ja) | ウェーハの加工方法 | |
| JP7305268B2 (ja) | ウェーハの加工方法 | |
| JP7282453B2 (ja) | ウェーハの加工方法 | |
| JP7286247B2 (ja) | ウェーハの加工方法 | |
| JP7229636B2 (ja) | ウェーハの加工方法 | |
| JP7199786B2 (ja) | ウェーハの加工方法 | |
| JP7282456B2 (ja) | ウェーハの加工方法 | |
| CN112216653B (zh) | 晶片的加工方法 | |
| JP7171134B2 (ja) | ウェーハの加工方法 | |
| JP7330615B2 (ja) | ウェーハの加工方法 | |
| JP7282455B2 (ja) | ウェーハの加工方法 | |
| JP7301480B2 (ja) | ウェーハの加工方法 | |
| JP7387228B2 (ja) | ウェーハの加工方法 | |
| JP7277020B2 (ja) | ウェーハの加工方法 | |
| JP7277021B2 (ja) | ウェーハの加工方法 | |
| JP2021064642A (ja) | ウェーハの加工方法 | |
| JP7305260B2 (ja) | ウェーハの加工方法 | |
| JP7305261B2 (ja) | ウェーハの加工方法 | |
| JP7305269B2 (ja) | ウェーハの加工方法 | |
| JP7305259B2 (ja) | ウェーハの加工方法 | |
| JP2020202261A (ja) | ウェーハの加工方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20220428 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20230228 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20230228 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230426 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20230523 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20230523 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7286247 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |