JP7743341B2 - 増幅回路及びセンサ回路 - Google Patents
増幅回路及びセンサ回路Info
- Publication number
- JP7743341B2 JP7743341B2 JP2022048355A JP2022048355A JP7743341B2 JP 7743341 B2 JP7743341 B2 JP 7743341B2 JP 2022048355 A JP2022048355 A JP 2022048355A JP 2022048355 A JP2022048355 A JP 2022048355A JP 7743341 B2 JP7743341 B2 JP 7743341B2
- Authority
- JP
- Japan
- Prior art keywords
- amplifier
- circuit
- switch
- node
- input terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/26—Modifications of amplifiers to reduce influence of noise generated by amplifying elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/005—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements using switched capacitors, e.g. dynamic amplifiers; using switched capacitors as resistors in differential amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/156—One or more switches are realised in the feedback circuit of the amplifier stage
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/159—Indexing scheme relating to amplifiers the feedback circuit being closed during a switching time
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/252—Multiple switches coupled in the input circuit of an amplifier are controlled by a circuit, e.g. feedback circuitry being controlling the switch
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/312—Indexing scheme relating to amplifiers the loading circuit of an amplifying stage comprising one or more switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/375—Circuitry to compensate the offset being present in an amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/417—A switch coupled in the output circuit of an amplifier being controlled by a circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45038—One or more current sources are added or changed as balancing means to reduce the offset of the dif amp
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45536—Indexing scheme relating to differential amplifiers the FBC comprising a switch and being coupled between the LC and the IC
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45544—Indexing scheme relating to differential amplifiers the IC comprising one or more capacitors, e.g. coupling capacitors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45548—Indexing scheme relating to differential amplifiers the IC comprising one or more capacitors as shunts to earth or as short circuit between inputs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45616—Indexing scheme relating to differential amplifiers the IC comprising more than one switch, which are not cross coupled
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45681—Indexing scheme relating to differential amplifiers the LC comprising offset compensating means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45712—Indexing scheme relating to differential amplifiers the LC comprising a capacitor as shunt
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Amplifiers (AREA)
- Measuring Magnetic Variables (AREA)
Description
実施形態にかかる増幅回路は、センサに接続され、センサからの微小信号を増幅して出力するが、信号を高精度に増幅するための工夫が施される。例えば、センサが差動信号を出力する場合、増幅回路1は、図1に示すように、差動入力・シングル出力型の増幅回路として構成されてもよい。図1は、増幅回路1の構成を示す図である。
Vt_l<VREF1<Vt_h・・・数式1
Vt_h=VREF2・・・数式2
Vt_l=VREF2-ΔV(ΔV>0)・・・数式3
Vc1={gm1(VREF1-VREF1)+gm2(VREF1―Vc1)}/(C1+C2)
=gm2・VREF1/[(C1+C2){1+gm2/(C1+C2)}]
≒VREF1・・・数式5
Vc2=VREF1-Vc1=0・・・数式6
Vc1={gm1(Vin1-Vin2)+gm2(Vc2)}・Tph2/C1
=gm1(Vin1-Vin2)・Tph2/C1・・・数式7
―Vc2=Vofs3―Vofs4
={gm1(Vofs1-Vofs2)+gm2(Vofs3―Vofs4)}/(C1+C2)
=-gm1/gm2(Vofs1-Vofs2)・・・数式8
Vc1=[gm1(Vofs1-Vofs2)+gm2(-Vc2)]/(C1+C2)
≒0・・・数式9
Claims (8)
- 第1の容量素子と、
第1の入力ノードと第2の入力ノードと前記第1の容量素子の一端に接続される出力ノードとを有する第1のGMアンプと、
第1の入力ノードと第2の入力ノードと前記第1の容量素子の一端に接続される出力ノードとを有する第2のGMアンプと、
一端が前記第2のGMアンプの出力ノードに接続され、他端が前記第2のGMアンプの第2の入力ノードに接続されるスイッチと、
一端が前記第2のGMアンプの第1の入力ノードに接続され、他端が前記第2のGMアンプの第2の入力ノードに接続される第2の容量素子と、
第1の入力端子及び前記第1のGMアンプの第1の入力ノードが接続された第1の状態と第1の参照電圧及び前記第1のGMアンプの第1の入力ノードが接続された第2の状態とを切り替える第1のセレクタ回路と、
第2の入力端子及び前記第1のGMアンプの第2の入力ノードが接続された第3の状態と前記第1の参照電圧及び前記第1のGMアンプの第2の入力ノードが接続された第4の状態とを切り替える第2のセレクタ回路と、
を備え、
前記第1の参照電圧は、前記第2のGMアンプの第1の入力ノードに接続され、
前記第1のGMアンプで帰還をかけずに増幅動作を行うことが可能である
増幅回路。 - 前記第1のセレクタ回路の制御端子と前記第2のセレクタ回路の制御端子と前記スイッチの制御端子とに接続される出力ノードを有する制御回路と、
を備えた
請求項1に記載の増幅回路。 - 前記制御回路は、第1の期間に、前記スイッチをオン状態に維持し、前記第1のセレクタ回路を前記第2の状態に維持し、前記第2のセレクタ回路を前記第4の状態に維持し、第2の期間に、前記スイッチをオフ状態に維持し、前記第1のセレクタ回路を前記第1の状態に維持し、前記第2のセレクタ回路を前記第3の状態に維持する
請求項2に記載の増幅回路。 - 前記第1の容量素子が接続される第1の入力ノードと第2の参照電圧が接続される第2の入力ノードとを有するコンパレータをさらに備えた
請求項3に記載の増幅回路。 - 前記第2のGMアンプは、前記スイッチがオン状態に維持される際に、前記第1の参照電圧が入力されるボルテージフォロワとして動作する
請求項1に記載の増幅回路。 - 前記第1の容量素子の一端と前記コンパレータとの間に接続されるサンプルホールド回路をさらに備えた
請求項4に記載の増幅回路。 - センサと、
前記センサに接続される請求項1から6のいずれか1項に記載の増幅回路と、
を備えたセンサ回路。 - 前記センサは、同一チップ上で互いに対称な方向に設置され実質的に同じ信号を検知する複数のホール素子を含む
請求項7に記載のセンサ回路。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022048355A JP7743341B2 (ja) | 2022-03-24 | 2022-03-24 | 増幅回路及びセンサ回路 |
| CN202210967210.2A CN116846344A (zh) | 2022-03-24 | 2022-08-12 | 放大电路以及传感器电路 |
| US17/930,061 US12381526B2 (en) | 2022-03-24 | 2022-09-06 | Amplifier circuit and sensor circuit |
| EP22194319.4A EP4250560A1 (en) | 2022-03-24 | 2022-09-07 | Amplifier circuit and sensor circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022048355A JP7743341B2 (ja) | 2022-03-24 | 2022-03-24 | 増幅回路及びセンサ回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2023141832A JP2023141832A (ja) | 2023-10-05 |
| JP7743341B2 true JP7743341B2 (ja) | 2025-09-24 |
Family
ID=83232554
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022048355A Active JP7743341B2 (ja) | 2022-03-24 | 2022-03-24 | 増幅回路及びセンサ回路 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12381526B2 (ja) |
| EP (1) | EP4250560A1 (ja) |
| JP (1) | JP7743341B2 (ja) |
| CN (1) | CN116846344A (ja) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20250167734A1 (en) * | 2023-11-17 | 2025-05-22 | Nokia Solutions And Networks Oy | Switchable transconductance amplifier |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100164770A1 (en) | 2008-12-31 | 2010-07-01 | Hong Kong Applied Science & Technology Research Institute Company Limited | Multi-stage comparator with offset canceling capacitor across secondary differential inputs for high-speed low-gain compare and high-gain auto-zeroing |
| WO2014155908A1 (ja) | 2013-03-28 | 2014-10-02 | 旭化成エレクトロニクス株式会社 | ホール起電力信号検出回路及びその電流センサ並びにホール素子の駆動方法 |
| JP2019114901A (ja) | 2017-12-22 | 2019-07-11 | ルネサスエレクトロニクス株式会社 | 半導体装置およびセンサシステム |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62208683A (ja) | 1986-03-07 | 1987-09-12 | Seiko Instr & Electronics Ltd | 磁気センサ |
| US5880586A (en) * | 1994-11-22 | 1999-03-09 | Robert Bosch Gmbh | Apparatus for determining rotational position of a rotatable element without contacting it |
| JP4922204B2 (ja) | 2007-02-19 | 2012-04-25 | 株式会社東芝 | 信号検出回路 |
| US7642846B2 (en) | 2007-10-30 | 2010-01-05 | Aptina Imaging Corporation | Apparatuses and methods for providing offset compensation for operational amplifier |
| JP4956573B2 (ja) | 2009-03-19 | 2012-06-20 | 株式会社東芝 | 増幅回路及び磁気センサ |
| JP4975793B2 (ja) | 2009-09-14 | 2012-07-11 | 株式会社東芝 | 半導体集積回路 |
| US8493139B2 (en) | 2011-11-17 | 2013-07-23 | Analog Devices, Inc. | Low noise auto-zero circuits for amplifiers |
| CN102732914A (zh) | 2012-07-25 | 2012-10-17 | 深圳市新星轻合金材料股份有限公司 | 铝电解过程中的电解质及其补充体系的制备方法 |
| WO2016047149A1 (ja) | 2014-09-26 | 2016-03-31 | 旭化成エレクトロニクス株式会社 | ホール起電力信号検出回路及び電流センサ |
| EP3355475B1 (en) | 2017-01-31 | 2022-09-07 | ams AG | Signal processing arrangement for a hall sensor and signal processing method for a hall sensor |
| JP7405589B2 (ja) * | 2019-12-12 | 2023-12-26 | 日清紡マイクロデバイス株式会社 | 増幅装置 |
-
2022
- 2022-03-24 JP JP2022048355A patent/JP7743341B2/ja active Active
- 2022-08-12 CN CN202210967210.2A patent/CN116846344A/zh active Pending
- 2022-09-06 US US17/930,061 patent/US12381526B2/en active Active
- 2022-09-07 EP EP22194319.4A patent/EP4250560A1/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100164770A1 (en) | 2008-12-31 | 2010-07-01 | Hong Kong Applied Science & Technology Research Institute Company Limited | Multi-stage comparator with offset canceling capacitor across secondary differential inputs for high-speed low-gain compare and high-gain auto-zeroing |
| WO2014155908A1 (ja) | 2013-03-28 | 2014-10-02 | 旭化成エレクトロニクス株式会社 | ホール起電力信号検出回路及びその電流センサ並びにホール素子の駆動方法 |
| JP2019114901A (ja) | 2017-12-22 | 2019-07-11 | ルネサスエレクトロニクス株式会社 | 半導体装置およびセンサシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| US20230318550A1 (en) | 2023-10-05 |
| JP2023141832A (ja) | 2023-10-05 |
| CN116846344A (zh) | 2023-10-03 |
| US12381526B2 (en) | 2025-08-05 |
| EP4250560A1 (en) | 2023-09-27 |
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