JPH01100093A - Production of diamond thin film - Google Patents
Production of diamond thin filmInfo
- Publication number
- JPH01100093A JPH01100093A JP25854487A JP25854487A JPH01100093A JP H01100093 A JPH01100093 A JP H01100093A JP 25854487 A JP25854487 A JP 25854487A JP 25854487 A JP25854487 A JP 25854487A JP H01100093 A JPH01100093 A JP H01100093A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- diamond thin
- substrate
- gas
- production
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
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- Formation Of Insulating Films (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔技術分野〕
本発明は気相合成法のうち、熱フイラメントCVD法に
よりダイヤモンド薄膜を製造する方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to a method of manufacturing a diamond thin film by a hot filament CVD method among vapor phase synthesis methods.
従来、ダイヤモンド薄膜は気相合成法により製膜され、
その気相合成法は次の3種の方法に大別されるものであ
る。すなわち、■化学的気相合成法(CVD法)・・・
熱分解CVD法、熱フィラメントCVD−法、■プラズ
マCVD法・・・RFプラズマCVD法、マイクロ波C
VD法、■イオンビーム蒸着法等である。Conventionally, diamond thin films have been produced by vapor phase synthesis.
The gas phase synthesis method is roughly divided into the following three types. In other words, ■Chemical vapor phase synthesis method (CVD method)...
Pyrolysis CVD method, hot filament CVD method, ■Plasma CVD method...RF plasma CVD method, microwave C
These methods include the VD method and the ion beam evaporation method.
しかしながら、これら従来の気相合成法においては結晶
性のよいダイヤモンドを製膜しようとすると、基板温度
を700℃以上の高温にする必要があり、基板温度それ
より低くすると非晶質のダイヤモンド状炭素膜となって
しまうという問題を有するとともに、ダイヤモンド薄膜
ができたとしてもその堆積速度は小さいという問題点を
有するものであった。However, in these conventional vapor phase synthesis methods, in order to form a diamond film with good crystallinity, it is necessary to raise the substrate temperature to a high temperature of 700°C or higher, and if the substrate temperature is lower than that, amorphous diamond-like carbon This method has the problem of forming a diamond film, and even if a diamond thin film is formed, the deposition rate is slow.
一方、ダイヤモンド薄膜を半導体および電子デバイス、
例えば高温動作トランジスタ、半導体レーザー、大電力
素子等に応用する場合には、少なくとも600℃以下の
比較的低温にて製膜することが不可欠の条件となるもの
であった。On the other hand, diamond thin films can be used in semiconductors and electronic devices,
For example, when applied to high-temperature operation transistors, semiconductor lasers, high-power devices, etc., it is essential to form the film at a relatively low temperature of at least 600° C. or lower.
本発明は半導体および電子デバイス分野にも応用可能な
比較的低温で結晶性に優れたダイヤモンド薄膜を速い堆
積速度にて製造し得る方法を提供することを目的とする
ものである。An object of the present invention is to provide a method that can be applied to the semiconductor and electronic device fields and can produce a diamond thin film with excellent crystallinity at a relatively low temperature and at a high deposition rate.
本発明者らは上記課題を達成するために鋭意研究を重ね
た結果、熱フイラメントCVD法において1.基板表面
に不活性の荷電エネルギー粒子を照射することにより低
温製膜が可能となり。The inventors of the present invention have conducted intensive research to achieve the above-mentioned problems, and as a result have found that 1. Low-temperature film formation is possible by irradiating the substrate surface with inert charged energy particles.
しかも堆積速度が著しく大きくなるという知見を得、本
発明を完成したものである。Furthermore, the present invention was completed based on the knowledge that the deposition rate was significantly increased.
以下に実施例により本発明をより詳しく説明する。The present invention will be explained in more detail with reference to Examples below.
第1図は本発明の実施に使用する装置の一例を示すもの
である。第1図において、1はチャンバーであり、この
チャンバー1内にはサセプター2が設けられ、その上に
基板3が載置されている。基板3はサセプター2からの
熱供給によって加熱され、反応中、250〜85G’C
1好ましくは300〜700℃に保持さ九る。従って、
基板3としてはW、Mo、Ta等の金属板のみならずS
iウェハー、SiC,、石英ガラス等の無機材料をも適
宜使用できる0M料ガスはチャンバー1の上方から挿入
され、基板3上方に開口するガス導入管6から供給され
、このガス導入管6の先端部と基板3との間に配置され
た加熱体4(熱フィラメント)により熱分解され、製膜
に有効な活性種が生成される。原料ガスとしては炭化水
素ガスもしくはCH,基を含む有機化合物ガスの少なく
とも一種と水素ガスとの混合ガスが使用される。具体的
には炭化水素ガスとしてはメタン、エタン、プロパン、
ブタン等の飽和炭化水素、エチレン、プロピレン、アセ
チレン、ブタジェン等の不飽和炭化水素、シクロプロパ
ン、シクロヘキサジ、シクロブタジェン、ベンゼン、ト
ルエン等の芳香族炭化水素のいずれであってもよい、ま
た、有機化合物ガスとしてはメチルアルコール、エチル
アルコール、イソプロパツール等のアルコール類、アセ
トン等のケトン類、イソプロピルエーテル、ジエチルエ
ーテル等のエーテル類のいずれであってもよい、これら
炭素化合物は2種以上を併用してもよい、そして、この
よやな炭素化合物と水素ガスとの混合比は炭素化合物ガ
ス/水素ガス中炭素化合物ガスの値が0.1〜10.好
ましくは0.5〜5の範囲とする。こりような原料ガス
中の水素ガスは熱分解によって、原子状Hを発生し、副
生成物であるグラフアイ、トの除去およびダイヤモンド
の製膜上こ有効な活性種、例えばCH3ラジカル、CH
3イオンの基板3表面での移動を助ける働きをするもの
と思わ九る。加熱体4としてはW、Mo、Ta、カンタ
ル等の金属発熱体のワイヤーもしくはボート、あるいは
5iC1C等の宰ラミック発熱体のロンド等が好適に使
用でき、通常は1800〜2300℃、好ましくは19
00〜2100℃程度に加熱される。また、イオン源5
からはAr、N、、He等の不活性ガス力1らなる荷電
エネルギー粒子が基板3に向けて数十〜数千eVのエネ
ルギーで数十〜数百mA/ajの量照射となるように照
射される。FIG. 1 shows an example of an apparatus used to carry out the present invention. In FIG. 1, 1 is a chamber, a susceptor 2 is provided in the chamber 1, and a substrate 3 is placed on it. The substrate 3 is heated by heat supply from the susceptor 2, and is heated to 250 to 85 G'C during the reaction.
1 Preferably, the temperature is maintained at 300 to 700°C. Therefore,
As the substrate 3, not only metal plates such as W, Mo, Ta, etc. but also S
The 0M material gas, which can be used for inorganic materials such as i-wafer, SiC, and quartz glass, is inserted from above the chamber 1 and supplied from a gas introduction tube 6 that opens above the substrate 3. The heating element 4 (thermal filament) disposed between the part and the substrate 3 thermally decomposes the activated species, and active species effective for film formation are generated. As the raw material gas, a mixed gas of hydrogen gas and at least one of hydrocarbon gas or organic compound gas containing CH or groups is used. Specifically, hydrocarbon gases include methane, ethane, propane,
It may be a saturated hydrocarbon such as butane, an unsaturated hydrocarbon such as ethylene, propylene, acetylene, butadiene, or an aromatic hydrocarbon such as cyclopropane, cyclohexadi, cyclobutadiene, benzene, toluene, etc. The organic compound gas may be any of alcohols such as methyl alcohol, ethyl alcohol, and isopropanol, ketones such as acetone, and ethers such as isopropyl ether and diethyl ether. Two or more of these carbon compounds may be used. It may be used in combination, and the mixing ratio of this carbon compound and hydrogen gas is such that the value of carbon compound gas/carbon compound gas in hydrogen gas is 0.1 to 10. Preferably it is in the range of 0.5 to 5. Hydrogen gas in such a raw material gas generates atomic H through thermal decomposition, and active species such as CH3 radicals, CH
It is thought that this serves to assist the movement of 3 ions on the surface of the substrate 3. As the heating element 4, a wire or boat of a metal heating element such as W, Mo, Ta, Kanthal, etc., or a rond of a lamic heating element such as 5iC1C can be suitably used, and the temperature is usually 1800 to 2300°C, preferably 19
It is heated to about 00 to 2100°C. In addition, the ion source 5
From there, charged energy particles consisting of an inert gas force 1 such as Ar, N, He, etc. are irradiated toward the substrate 3 with an energy of several tens to several thousand eV and an amount of several tens to several hundred mA/aj. irradiated.
このような装置において、チャンバー1内を10−3〜
lO−”T o r rとし、原料ガスを数十〜数百8
CCM流して製膜した場合、イオン源からの荷電エネル
ギー粒子の照射を行わないで、良質なダイヤモンド薄膜
を得るためには基板3の温度を少くとも850℃以上に
しなければならなかったが、荷電エネルギー粒子の照射
を行った場合には基板温度が250〜850℃、好まし
くは300〜700℃にても結晶性の良いダイヤモンド
薄膜が得られた。しかも、荷電エネルギー粒子の照射を
行った場合にはダイヤモンド薄膜の堆積速度が150〜
400人/minと比較的大きい値を示した。得られた
薄膜のラマンスペクトルおよび電子線回折の結果を第2
図および第1表に示す。In such a device, the inside of the chamber 1 is 10-3~
lO-”T o r r, and the raw material gas is several tens to several hundred 8
When a film is formed by CCM flow, the temperature of the substrate 3 must be at least 850°C or higher in order to obtain a high-quality diamond thin film without irradiation with charged energy particles from an ion source. When energetic particle irradiation was performed, a diamond thin film with good crystallinity was obtained even at a substrate temperature of 250 to 850°C, preferably 300 to 700°C. Moreover, when irradiation with charged energy particles is performed, the deposition rate of the diamond thin film is 150 ~
It showed a relatively large value of 400 people/min. The Raman spectrum and electron diffraction results of the obtained thin film were
It is shown in the figure and Table 1.
(以下余白)
第1表
これら第2図および第1表の結果より1本発明により得
られた薄膜は天然ダイヤモンドとほぼ同一の構成を有す
るダイヤモンド薄膜であることがわかる。(The following is a blank space) Table 1 From the results shown in FIG. 2 and Table 1, it can be seen that the thin film obtained by the present invention is a diamond thin film having almost the same structure as natural diamond.
本発明において、イオン源からの荷電エネルギー粒子の
照射による低温製膜および堆積速度の向上の理由は照射
された荷電エネルギー粒子が基板表面上にて活性種と衝
突し、活性種の励起状態を高め、また基板表面(反応表
面)をもエネルギー的に励起し、活性種の表面でのマイ
グレーションを促進するためと思われる。In the present invention, the reason for low-temperature film formation and improvement in deposition rate by irradiation with charged energy particles from an ion source is that the irradiated charged energy particles collide with active species on the substrate surface, increasing the excited state of the active species. This seems to be because it also energetically excites the substrate surface (reaction surface) and promotes the migration of active species on the surface.
以上のような本発明によれば、結晶性の良好なダイヤモ
ンド薄膜を低温製膜することができるため半導体および
電子デバイスへのダイヤモンド薄膜の応用が可能となり
、しかも高速での堆積ができ、効率のよいダイヤモンド
薄膜の製膜が可能となるという効果を有する。According to the present invention as described above, a diamond thin film with good crystallinity can be formed at a low temperature, making it possible to apply diamond thin films to semiconductors and electronic devices.Moreover, it is possible to deposit at high speed, and to improve efficiency. This has the effect of making it possible to form a good diamond thin film.
第1図は本発明を実施するための装置の一例を示す概略
説明図である。
第2図は本発明により得られた薄膜のラマンスペクトル
図である・。FIG. 1 is a schematic explanatory diagram showing an example of an apparatus for carrying out the present invention. Figure 2 is a Raman spectrum diagram of the thin film obtained according to the present invention.
Claims (1)
料ガスを分解せしめ、前記基板上にダイヤモンド薄膜を
堆積するに際し、前記 基板表面上に荷電エネルギー粒子を照射することを特徴
とするダイヤモンド薄膜の製造方法。[Claims] 1. When depositing a diamond thin film on the substrate by decomposing the source gas with a heating element placed near the substrate in a vacuum container, irradiating the surface of the substrate with charged energy particles. A method for producing a diamond thin film characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62258544A JP2636856B2 (en) | 1987-10-13 | 1987-10-13 | Method for producing diamond thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62258544A JP2636856B2 (en) | 1987-10-13 | 1987-10-13 | Method for producing diamond thin film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01100093A true JPH01100093A (en) | 1989-04-18 |
| JP2636856B2 JP2636856B2 (en) | 1997-07-30 |
Family
ID=17321702
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62258544A Expired - Fee Related JP2636856B2 (en) | 1987-10-13 | 1987-10-13 | Method for producing diamond thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2636856B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5387310A (en) * | 1989-03-07 | 1995-02-07 | Sumitomo Electric Industries, Ltd. | Method for producing single crystal diamond film |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5927753A (en) * | 1982-08-05 | 1984-02-14 | Nippon Steel Metal Prod Co Ltd | Production of base material for additive for casting of steel |
| JPS60195092A (en) * | 1984-03-15 | 1985-10-03 | Tdk Corp | Method and apparatus for production of carbon thin film |
-
1987
- 1987-10-13 JP JP62258544A patent/JP2636856B2/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5927753A (en) * | 1982-08-05 | 1984-02-14 | Nippon Steel Metal Prod Co Ltd | Production of base material for additive for casting of steel |
| JPS60195092A (en) * | 1984-03-15 | 1985-10-03 | Tdk Corp | Method and apparatus for production of carbon thin film |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5387310A (en) * | 1989-03-07 | 1995-02-07 | Sumitomo Electric Industries, Ltd. | Method for producing single crystal diamond film |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2636856B2 (en) | 1997-07-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |