JPH01102879U

JPH01102879U -

Info

Publication number: JPH01102879U
Application number: JP19889987U
Authority: JP
Priority date: 1987-12-28
Filing date: 1987-12-28
Publication date: 1989-07-11

Description

[Brief explanation of the drawing]

第１図はこの考案のリレー接点のメイク検査装
置の１実施例のブロツク図、第２図は第１図の一
部の詳細な結線図、第３図は従来のメイク検査装
置の結線図である。１４……遅延回路、１６……ラツチ回路、１７
ａ〜１７ｂ……第１、第２ＦＦ、１８……表示器
、１９ａ〜１９ｂ……赤色、緑色発光ダイオード
。 Fig. 1 is a block diagram of one embodiment of the relay contact make inspection device of this invention, Fig. 2 is a detailed wiring diagram of a part of Fig. 1, and Fig. 3 is a wiring diagram of a conventional make inspection device. be. 14...Delay circuit, 16...Latch circuit, 17
a to 17b...first and second FF, 18...indicator, 19a to 19b...red and green light emitting diodes.

Claims

[Claims for Utility Model Registration] A delay circuit that delays a DC test signal consisting of a pulse-driven make contact signal of a relay or a detection signal of the contact signal by a reference time integral, and a delay circuit that latches the test signal and holds the output. a latch circuit having a first signal latch and a second signal latch that latches and holds the output signal of the delay circuit; and first and second lighting elements that are lit by the output signals of both signal latches, respectively. a test result display, and a reset switch that outputs a reset signal to the latch circuit when operated at the start of the test before driving the relay, resets both the signal latches to an initial state, and turns both the lighting elements into the off state. A relay contact make inspection device equipped with and.