JPH01137411U - - Google Patents

Info

Publication number
JPH01137411U
JPH01137411U JP1988132765U JP13276588U JPH01137411U JP H01137411 U JPH01137411 U JP H01137411U JP 1988132765 U JP1988132765 U JP 1988132765U JP 13276588 U JP13276588 U JP 13276588U JP H01137411 U JPH01137411 U JP H01137411U
Authority
JP
Japan
Prior art keywords
sin
sensor
test object
shape evaluation
sampling points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1988132765U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPH01137411U publication Critical patent/JPH01137411U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/30—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B7/31—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B7/312—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes for measuring eccentricity, i.e. lateral shift between two parallel axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/282—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring roundness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/293—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring radius of curvature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Description

【図面の簡単な説明】 第１図はこの考案による形状評価装置の一実施
例の角度情報と距離情報の関係を示す図、第２図
はこの実施例に係る装置のブロツク図である。 １２…試験台、１３…回転軸、１４…正弦／余
弦関数発生用ポテンシヨメータ、１５…被試験物
、１６…トランスジユーサ、１７，１８，１９，
２１，２２，２３，２４，２５，２６…サンプル
ホールド回路、２０…スイツチ、２７，２８，２
９，３０，３１，３２，３３…加減算回路、３４
，３５，３６，３８，３９，４０，４１…乗算回
路、３７…加算回路、４２，４３…反転加算回路
。

Claims (1)

  1. 【実用新案登録請求の範囲】 (1) 被試験物１５を載置する試験台１２とセン
    サ１６を有し、試験台１２をその回転軸１３を中
    心に回転させるかあるいはセンサ１６を回転軸１
    ３を中心に回転させ、この回転中心を原点とする
    直交座標系で被試験物１５の曲面の曲率中心位置
    を検出する形状評価装置において、センサ１６で
    被試験物１５を走査する手段と、センサ１６の走
    査中に第１、第２、第３のサンプリング点でセン
    サ１６の検出信号を出力する手段と、これら３つ
    の信号と、前記サンプリング点の回転角に応じた
    信号を演算し、第１、第２、第３のサンプリング
    点の回転角をそれぞれθ１，θ２，θ３、第１お
    よび第２サンプリング点の検出信号の差をｙ１、
    第１および第３サンプリング点の検出信号の差を
    ｙ２としたとき； ｘ＝ｙ１（ｓｉｎθ１−ｓｉｎθ３）−ｙ２（
    ｓｉｎθ１−ｓｉｎθ２）ｓｉｎ（θ１−θ３）
    ＋ｓｉｎ（θ２−θ１）−ｓｉｎ（θ２−θ３） ｙ＝−ｙ１（ｃｏｓθ１−ｃｏｓθ３）＋ｙ２
    （ｃｏｓθ１−ｃｏｓθ２）ｓｉｎ（θ１−θ３
    ）＋ｓｉｎ（θ２−θ１）−ｓｉｎ（θ２−θ３
    ） で表わされる被試験物１５の曲率中心位置表示
    信号ｘ，ｙを出力する手段とを具備することを特
    徴とする形状評価装置。 (2) 前記センサ１６は被試験物１５の表面の所
    定の円弧上を走査することを特徴とする実用新案
    登録請求の範囲第１項に記載の形状評価装置。 (3) 前記センサ１６が走査中の３つのサンプリ
    ング点のうち、第１サンプリング点と第３サンプ
    リング点は前記所定の円弧の両端の点とすること
    を特徴とする実用新案登録請求の範囲第２項に記
    載の形状評価装置。 (4) 前記センサ１６は被試験物１５の表面の複
    数の所定の円弧上を走査し、得られた被試験物の
    中心位置を示す座標を平均することを特徴とする
    実用新案登録請求の範囲第１項に記載の形状評価
    装置。 (5) 被試験物１５を曲率中心位置と原点との距
    離に応じて移動させる手段を有することを特徴と
    する実用新案登録請求の範囲第１項に記載の形状
    評価装置。
JP1988132765U 1979-01-04 1988-10-11 Pending JPH01137411U (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB7900230A GB2039050B (en) 1979-01-04 1979-01-04 Measuring centre of curvature

Publications (1)

Publication Number Publication Date
JPH01137411U true JPH01137411U (ja) 1989-09-20

Family

ID=10502307

Family Applications (2)

Application Number Title Priority Date Filing Date
JP17398779A Pending JPS5594108A (en) 1979-01-04 1979-12-27 Method of estimating shape
JP1988132765U Pending JPH01137411U (ja) 1979-01-04 1988-10-11

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP17398779A Pending JPS5594108A (en) 1979-01-04 1979-12-27 Method of estimating shape

Country Status (5)

Country Link
US (1) US4342091A (ja)
EP (1) EP0015045B1 (ja)
JP (2) JPS5594108A (ja)
DE (1) DE3062992D1 (ja)
GB (1) GB2039050B (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3129590C2 (de) * 1981-07-28 1984-02-09 Reinhold Christoffel Vorrichtung zum genauen Einstellen der Relativlage zwischen einer Werkstückkante und der Achse der Werkzeugspindel spanender Werkzeugmaschinen
US4623797A (en) 1983-06-27 1986-11-18 Mts Vektronics Corporation Event scanning
US4695982A (en) * 1985-07-12 1987-09-22 Verbatim Corporation Hub hole characterization system
US4866643A (en) * 1987-10-09 1989-09-12 Brown & Sharpe Manufacturing Company Method for automatic compensation of probe offset in a coordinate measuring machine
ATE112074T1 (de) * 1989-07-07 1994-10-15 Siemens Ag Verfahren zum bestimmen einer werkstückkontur.
JPH07104146B2 (ja) * 1989-08-29 1995-11-13 株式会社ミツトヨ 座標測定用プローブの回転テーブル倣い制御方法
US5033003A (en) * 1990-06-01 1991-07-16 Illinois Tool Works Inc. Wheel measuring machine
CA2082708C (en) * 1991-12-02 2004-01-13 James Edward Randolph Jr. Tool point compensation for hardware displacement and inclination
GB2294327A (en) * 1994-10-18 1996-04-24 Rank Taylor Hobson Ltd Roundness measuring
CN111649701B (zh) * 2020-06-30 2021-10-29 长春博信光电子有限公司 一种复曲面镜偏心值检测方法和装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4898861A (ja) * 1972-03-29 1973-12-14
JPS48104570A (ja) * 1972-04-13 1973-12-27

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1100978B (de) * 1958-07-11 1961-03-02 Johannes Perthen Dr Ing Verfahren und Einrichtung zum Pruefen der Oberflaechen- und Fehlgestalt eines Werkstueckes
GB1399729A (en) * 1972-08-17 1975-07-02 Rank Organisation Ltd Surface profile testing instrument
US3869802A (en) * 1973-09-14 1975-03-11 Gillette Co Gauging apparatus
US3895446A (en) * 1973-12-03 1975-07-22 Petr Nikolaevich Orlov Device for measuring surface profiles
IT1047307B (it) * 1974-09-24 1980-09-10 Rank Organisation Ltd Strumento per la misurazione di superfici
US4084324A (en) * 1975-04-23 1978-04-18 The Rank Organisation Limited Measuring instrument
GB1492401A (en) * 1975-09-18 1977-11-16 Rank Organisation Ltd Surface measuring instruments
GB1553414A (en) * 1977-10-13 1979-09-26 Rank Organisation Ltd Surface measuring instruments

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4898861A (ja) * 1972-03-29 1973-12-14
JPS48104570A (ja) * 1972-04-13 1973-12-27

Also Published As

Publication number Publication date
JPS5594108A (en) 1980-07-17
US4342091A (en) 1982-07-27
GB2039050A (en) 1980-07-30
DE3062992D1 (en) 1983-06-16
GB2039050B (en) 1982-12-15
EP0015045A1 (en) 1980-09-03
EP0015045B1 (en) 1983-05-11

Similar Documents

Publication Publication Date Title
JPH01137411U (ja)
JPS6343103B2 (ja)
JPH11151246A5 (ja)
JP4864904B2 (ja) コイン受付部に導入されたコインの正確な中心を決定する方法
JPH10221021A (ja) 寸法測定及び形状検査装置と検査方法
JP3011254B2 (ja) 測定範囲に制限のない３次元測定器
JP2572637B2 (ja) 表面状態検出用光学的距離センサの構成
JPH06127477A (ja) 舵角検出表示装置
JPH03104803U (ja)
JPH0716238Y2 (ja) 指針の読み取り装置
JPS6420812U (ja)
JPS6259857A (ja) 超音波探触子位置検出装置
JPH01115689U (ja)
JPS6262984U (ja)
KR200181783Y1 (ko) 곡판의 곡량 자동 측정용 지그
JPH04151715A (ja) 光学式マウス型入力装置
JPH0442081A (ja) 回転センサによる障害物検出装置
JP2001016411A (ja) 画像入力装置
JPH0713692A (ja) 位置入力装置
JPS63142206A (ja) 物体測長器
JPH0413618Y2 (ja)
JP2002023939A (ja) 入力装置
JPH0573207A (ja) ポインテイング装置
JPH04121615A (ja) ウエーハ傾き検出器
JPS58178673U (ja) スキヤニング用治具