【図面の簡単な説明】[Brief explanation of the drawing]
第１図は本考案の電気検査装置に使用するプロ
ーブの平面図、第２図は本考案の電気検査装置に
使用するプローブの側面図、第３図は四隅表面に
銅露出を有するパツド部を設けた基板の斜視図、
第４図は四隅表面に銅露出を有するパツド部を設
けた基板と円形かつ先端に突起を有する本考案の
電気検査装置で使用するプローブが接触した状態
の側面図、第５図は四隅表面に銅露出を有するパ
ツド部に円形で中心にドツトの打痕跡（電気検査
実施マーク）が形成された状態を表わす平面図、
第６図は四隅表面に銅露出を有するパツド部に円
形で中心にドツトの打痕跡（電気検査実施マーク
）が形成された状態を表わす断面図、第７図は一
般的な電気検査機で基板をセツトする時の側面概
略図、第８図は従来のプローブの側面図、第９図
は従来実施している基板側面へのマジツクインク
等による電気検査実施マークの斜視図である。
１ａ，１ｂ……突起部、２……プローブ、３…
…電気検査治具、４……パツド部、５……基板（
印刷配線板）、６……上部フタ、７……打痕跡（
電気検査実施マーク）。
Fig. 1 is a plan view of the probe used in the electrical testing device of the present invention, Fig. 2 is a side view of the probe used in the electrical testing device of the present invention, and Fig. 3 shows pad portions with exposed copper on the four corner surfaces. A perspective view of the provided board,
Fig. 4 is a side view of a circuit board having pads with exposed copper on the four corner surfaces, and a probe used in the electrical inspection device of the present invention, which is circular and has a protrusion at the tip, and is in contact with the board, and Fig. 5 is a side view of the probe used in the electrical inspection device of the present invention, which has a circular protrusion at the tip. A plan view showing a state in which a circular dot (electrical inspection mark) is formed in the center of a pad having exposed copper;
Figure 6 is a cross-sectional view showing a state in which a circular dot (electrical inspection mark) is formed in the center of a pad with exposed copper on the four corner surfaces, and Figure 7 is a board with a general electrical inspection machine. FIG. 8 is a side view of a conventional probe, and FIG. 9 is a perspective view of a conventional electrical inspection mark made by magic ink or the like on the side surface of a substrate. 1a, 1b...protrusion, 2...probe, 3...
...Electrical inspection jig, 4... Pad part, 5... Board (
Printed wiring board), 6...Top lid, 7...Hitting traces (
electrical inspection mark).