JPH01180677U - - Google Patents
Info
- Publication number
- JPH01180677U JPH01180677U JP7136788U JP7136788U JPH01180677U JP H01180677 U JPH01180677 U JP H01180677U JP 7136788 U JP7136788 U JP 7136788U JP 7136788 U JP7136788 U JP 7136788U JP H01180677 U JPH01180677 U JP H01180677U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor integrated
- integrated circuit
- feedback element
- applying
- directly connected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は本考案装置を説明する回路図、第２図
は半導体集積回路装置の一例を示す回路図である
。 Ａ……半導体集積回路装置、Ｒｆ……帰還用素
子。
は半導体集積回路装置の一例を示す回路図である
。 Ａ……半導体集積回路装置、Ｒｆ……帰還用素
子。
Claims (1)
- 内部で直結された増巾回路の出力電圧を外付け
の帰還用素子にて入力側に帰還させるようにした
半導体集積回路装置に、前記帰還用素子を接続せ
ずにバイアス電圧を印加することを特徴とする半
導体集積回路装置の検査装置。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7136788U JPH01180677U (ja) | 1988-05-30 | 1988-05-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7136788U JPH01180677U (ja) | 1988-05-30 | 1988-05-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01180677U true JPH01180677U (ja) | 1989-12-26 |
Family
ID=31296575
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7136788U Pending JPH01180677U (ja) | 1988-05-30 | 1988-05-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01180677U (ja) |
-
1988
- 1988-05-30 JP JP7136788U patent/JPH01180677U/ja active Pending