JPH01287919A - Solid electrolytic capacitor - Google Patents

Solid electrolytic capacitor

Info

Publication number
JPH01287919A
JPH01287919A JP63097318A JP9731888A JPH01287919A JP H01287919 A JPH01287919 A JP H01287919A JP 63097318 A JP63097318 A JP 63097318A JP 9731888 A JP9731888 A JP 9731888A JP H01287919 A JPH01287919 A JP H01287919A
Authority
JP
Japan
Prior art keywords
resin
capacitor element
case
epoxy resin
tcnq salt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63097318A
Other languages
Japanese (ja)
Other versions
JP2594101B2 (en
Inventor
Katsunori Minatomi
水富 勝則
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP63097318A priority Critical patent/JP2594101B2/en
Priority to KR1019890001152A priority patent/KR970006432B1/en
Publication of JPH01287919A publication Critical patent/JPH01287919A/en
Application granted granted Critical
Publication of JP2594101B2 publication Critical patent/JP2594101B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Paints Or Removers (AREA)

Abstract

PURPOSE:To prevent the deterioration of TCNQ salt as an oxide film and an organic semiconductor formed on the anode of a capacitor element by a method wherein the capacitor element is coated with a specific resin which practically does not react with the TCNQ salt. CONSTITUTION:After TCNQ salt 2 has been impregnated into a capacitor element 1, it is cooled down and solidified, and the capacitor element 1 is coated with denatured acrylate resin 8, cyanoacrylate resin, or nylon resin. As the above-mentioned denatured acrylate resin 8, cyano acrylate resin or nylon resin has the mechanical strength and the heat-resisting property in the same degree as epoxy resin, said resins are suitable for coating on the capacitor element 1, and at the same time, they practically do not react with the TCNQ salt 2. As a result, the deterioration of the organic semiconductor 2, as the oxide film and a solid electrolyte formed on the positive electrode of the capacitor element 1, caused by the reaction of epoxy resin with an organic semiconductor 2 can be prevented.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は、有機半導体としてTCNQ塩を用いた固体電
解コンデンサに関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Industrial Application Field The present invention relates to a solid electrolytic capacitor using TCNQ salt as an organic semiconductor.

(ロ) 従来の技術 従来、固体電解コンデンサの固体電解質として有機半導
体、特にTCNQ塩(ここでTCNQとは7.7.8.
8テトラシアノキノジメタンを意味する)を用いること
が提案されている(特公昭62−52939号公報(H
OIG  9102)参照)。
(b) Conventional technology Conventionally, organic semiconductors, especially TCNQ salt (herein, TCNQ is 7.7.8.
8 (meaning tetracyanoquinodimethane)) (Japanese Patent Publication No. 62-52939 (H
(See OIG 9102).

上記従来技術においては、TCNQ塩からなる有機半導
体の粉末を適量熱伝導性のケース(アルミニウムケース
)に適度に加圧して収納し、これを250〜300°C
の温度で融解液化し、あらかじめ予熱しておいたコンデ
ンサ素子を浸漬する。さらにコンデンサ素子をケースと
共に急冷却後、ケース開口部に熱硬化性樹脂例えばエポ
キシ系樹脂を充填し、85〜105℃の温度で長時間加
熱してエポキシ系樹脂を硬化させていた。第9図は上記
従来の固体電解コンデンサの構造を示す断面図で、(1
)はコンデンサ素子、(2)はTCNQ塩(有機半導体
)、(3)はケース、(4)はエポキシ系樹脂、(5)
はリードボス、(6)は陽極リード線、(7)は陰極リ
ード線である。尚、第9図のようにコンデンサ素子をケ
ースに収納しない所謂樹脂デイツプタイプの場合には、
エポキシ系樹脂でコンデンサ素子全体を被覆(全面樹脂
封口)する。
In the above conventional technology, an appropriate amount of organic semiconductor powder made of TCNQ salt is stored under moderate pressure in a thermally conductive case (aluminum case), and the powder is heated to 250 to 300°C.
The capacitor element, which has been preheated, is immersed in the capacitor element. Furthermore, after rapidly cooling the capacitor element together with the case, the opening of the case is filled with a thermosetting resin, such as an epoxy resin, and the epoxy resin is cured by heating at a temperature of 85 to 105° C. for a long period of time. FIG. 9 is a sectional view showing the structure of the conventional solid electrolytic capacitor described above.
) is a capacitor element, (2) is TCNQ salt (organic semiconductor), (3) is a case, (4) is an epoxy resin, (5)
is a lead boss, (6) is an anode lead wire, and (7) is a cathode lead wire. In addition, in the case of the so-called resin dip type, in which the capacitor element is not housed in a case, as shown in Figure 9,
Cover the entire capacitor element with epoxy resin (full resin sealing).

このような従来の固体電解コンデンサにおいては、コン
デンサ素子(1)の陽極に形成きれた酸化皮膜および固
体電解質としての有機半導体が、熱硬化性樹脂と有機半
導体との反応により劣化を招く。その結果、上記要因に
より酸化皮膜には弱体部が存在し、高電圧印加時におい
て漏れ電流が増大したりショートに至る。さらに半田付
は時においても加熱時の熱ストレスにより酸化皮膜の弱
体部が破壊し、漏れ電流の増大化につながる。
In such a conventional solid electrolytic capacitor, the oxide film completely formed on the anode of the capacitor element (1) and the organic semiconductor as the solid electrolyte deteriorate due to the reaction between the thermosetting resin and the organic semiconductor. As a result, the oxide film has weak parts due to the above factors, leading to increased leakage current and short circuit when high voltage is applied. Furthermore, during soldering, the weak parts of the oxide film are sometimes destroyed due to thermal stress during heating, leading to an increase in leakage current.

(ハ)発明が解決しようとする課題 本発明は、上記課題即ちコンデンサ素子の陽極に形成さ
れた酸化皮膜および固体電解質としての有機半導体が、
エポキシ系樹脂と有機半導体との反応により劣化し、高
電圧印加時または半田付時に漏れ電流が増大する点を解
決するものである。
(c) Problems to be Solved by the Invention The present invention solves the above problems, that is, the oxide film formed on the anode of a capacitor element and the organic semiconductor as a solid electrolyte,
This solves the problem of deterioration due to the reaction between epoxy resin and organic semiconductor, which increases leakage current when high voltage is applied or during soldering.

(ニ)課題を解決するための手段 本発明は、コンデンサ素子にTCNQ塩を含浸後冷却固
化し、該コンデンサ素子を変性アクリレート系樹脂、シ
アノアクリレート系樹脂、又はナイロン樹脂で被覆する
ものである。更に、斯る変性アクリレート系樹脂、シア
ノアクリレート系樹脂、又はナイロン樹脂による被覆後
、更に耐湿性に特に優れたエポキシ系樹脂で被覆するも
のである。
(d) Means for Solving the Problems In the present invention, a capacitor element is impregnated with TCNQ salt, cooled and solidified, and the capacitor element is coated with a modified acrylate resin, a cyanoacrylate resin, or a nylon resin. Furthermore, after being coated with the modified acrylate resin, cyanoacrylate resin, or nylon resin, it is further coated with an epoxy resin having particularly excellent moisture resistance.

また、コンデンサ素子を全面樹脂封口した所謂樹脂デイ
ツプタイプにするのではなく、ケースに収納するタイプ
にする場合、該コンデンサ素子を被覆する変性アクリレ
ート系樹脂、シアノアクリレート系樹脂、又はナイロン
樹脂でケースの開口部を封止するものである。更に、斯
るケース開口部を耐湿性に特に優れたエポキシ系樹脂で
被覆するものである。
In addition, if the capacitor element is to be housed in a case rather than a so-called resin dip type in which the entire surface is sealed with resin, the capacitor element is covered with a modified acrylate resin, cyanoacrylate resin, or nylon resin that covers the opening of the case. This is to seal the area. Furthermore, the opening of the case is coated with an epoxy resin having particularly excellent moisture resistance.

(ホ)作用 変性アクリレート系樹脂、シアノアクリレート系樹脂、
又はナイロン樹脂はエポキシ系樹脂と同程度の機械的強
度、耐熱性を有しているので、コンデンサ素子の被覆に
適していると共に、TCNQ塩とほとんど反応しないの
で、酸化皮膜及びTCNQ塩(有機半導体)が劣化する
ことがない。
(e) Action-modified acrylate resin, cyanoacrylate resin,
Nylon resin has the same mechanical strength and heat resistance as epoxy resin, so it is suitable for covering capacitor elements, and it hardly reacts with TCNQ salt, so it can be used to coat oxide films and TCNQ salt (organic semiconductors). ) will not deteriorate.

更に、斯る変性アクリレート系樹脂、或いはシアノアク
リレート系樹脂、或いはナイロン樹脂をエポキシ系樹脂
で被覆すれば、コンデンサ素子への水分の侵入が二重に
防止きれる。また、この時エポキシ系樹脂とTCNQ塩
との間にTCNQ塩とほとんど反応しない樹脂層が形成
されているので、エポキシ系樹脂とTCNQ塩との反応
により酸化皮膜およびTCNQ塩(有機半導体)が劣化
することがない。
Furthermore, if the modified acrylate resin, cyanoacrylate resin, or nylon resin is coated with an epoxy resin, moisture can be doubly prevented from entering the capacitor element. In addition, at this time, a resin layer that hardly reacts with the TCNQ salt is formed between the epoxy resin and the TCNQ salt, so the oxide film and TCNQ salt (organic semiconductor) deteriorate due to the reaction between the epoxy resin and the TCNQ salt. There's nothing to do.

また、コンデンサ素子を厚さllm1以下のナイロン樹
脂で被覆した後、更にエポキシ系樹脂で被覆すれば耐湿
特性に特に優れたエポキシ系樹脂暦の厚みが十分に得ら
れ、エポキシ系樹脂だけを用いた従来の固体電解コンデ
ンサと同レベルの耐湿特性になる。
In addition, if the capacitor element is coated with a nylon resin having a thickness of 1 mm or less, and then further coated with an epoxy resin, a sufficient thickness of the epoxy resin, which has particularly excellent moisture resistance, can be obtained, and it is possible to obtain a sufficient thickness of the epoxy resin, which has particularly excellent moisture resistance. It has the same level of moisture resistance as conventional solid electrolytic capacitors.

(へ)実施例 以下本発明を第1図〜第8図に従って説明する。尚、従
来と同一個所には同一符号を付して説明を省略する。
(f) Examples The present invention will be explained below with reference to FIGS. 1 to 8. Incidentally, the same parts as in the prior art are denoted by the same reference numerals, and the description thereof will be omitted.

第1図は本発明一実施例の固体電解コンデンサの断面図
である。先ずエツチング処理、化成処理を行なったアル
ミニウム箔を陽極箔とし、対向陰極箔との間にセパし一
夕を挾み円筒状に巻き取り、コンデンサ素子(1)を形
成する。
FIG. 1 is a sectional view of a solid electrolytic capacitor according to an embodiment of the present invention. First, an aluminum foil that has been subjected to etching treatment and chemical conversion treatment is used as an anode foil, separated between it and an opposing cathode foil, and then rolled up into a cylindrical shape to form a capacitor element (1).

次にTCNQ塩(2)、例えばN−n−ブチルイソキノ
リニウムのTCNQ塩((N−n−ブチルイソキノリニ
ウム)” (TCNQ)−(TCNQ))の粉末をケー
ス(3)に収納し、融点(210〜230℃)以上の温
度、例えば290℃〜300℃の温度でTCNQ塩(2
)を融解液化する。更に融解液化したTCNQ塩を29
0℃〜300℃の温度に保持し、コンデンサ素子(1)
を浸漬してTCNQ塩(2)を含浸する。含浸後ケース
(3)を冷却し、コンデンサ素子(1)に含浸したTC
NQ塩(2)を冷却固化し、ケース(3)内にコンデン
サ素子(1)を固定する。なお、TCNQ塩(2)を融
解液化後冷却固化するまでの時間は約4分以内にする必
要があり、この時間を越えると有機半導体はほぼ電気的
絶縁物となる。
Next, powder of TCNQ salt (2), for example, TCNQ salt of N-n-butylisoquinolinium ((N-n-butylisoquinolinium)” (TCNQ)-(TCNQ)), is placed in case (3). TCNQ salt (2
) is melted and liquefied. Furthermore, 29 pieces of melted and liquefied TCNQ salt
Maintain the temperature between 0℃ and 300℃, capacitor element (1)
to impregnate with TCNQ salt (2). After the impregnation, the case (3) is cooled, and the TC impregnated into the capacitor element (1) is
The NQ salt (2) is cooled and solidified, and the capacitor element (1) is fixed in the case (3). Note that the time from melting and liquefying the TCNQ salt (2) to cooling and solidifying it must be within about 4 minutes; after this time, the organic semiconductor becomes almost an electrical insulator.

次にケース(3)内に変性アクリレート系m5(8〉(
例えば高圧ガス工業株式会社製商品名′ベガロツク、1
品番9073)を注入して、コンデンサ素’f−(1)
を被覆すると共に、ケース(3)の開口部(3a)を封
止する。なお、上記変性アクリレート系樹脂(8)は室
温(20℃〜30℃)で2時間程度放置することにより
硬化するものである。
Next, in case (3), the modified acrylate system m5 (8〉(
For example, the product name 'Vegalock, 1 manufactured by Kosatsu Gas Kogyo Co., Ltd.
Part number 9073) is injected to form a capacitor element 'f-(1)
At the same time, the opening (3a) of the case (3) is sealed. The modified acrylate resin (8) is cured by being left at room temperature (20°C to 30°C) for about 2 hours.

第2図は本発明の他の実施例の固体電解コンデンサを示
す断面図である。前述したようにコンデンサ素子(1)
を、TCNQ塩(2)の含浸後の冷却固化によりケース
(3)内に固定後、コンデンサ素子(1)を変性アクリ
レート系樹脂(8)により被覆する。このとき変性アク
リレート系樹脂(8)の量は前述した第1図の場合より
もかなり少なく、ケース(3)の開口部(3a)を封止
するのに十分ではない、このようにコンデンサ素子(1
)を変性アクリレート系樹脂(8)により被覆後、前述
したように室温(20℃〜30℃)で2時間程度放置し
樹Ji11(8)を硬化きせる。
FIG. 2 is a sectional view showing a solid electrolytic capacitor according to another embodiment of the present invention. As mentioned above, the capacitor element (1)
is fixed in the case (3) by cooling and solidifying after impregnation with TCNQ salt (2), and then the capacitor element (1) is coated with modified acrylate resin (8). At this time, the amount of modified acrylate resin (8) is much smaller than in the case of FIG. 1 described above, and is not sufficient to seal the opening (3a) of the case (3). 1
) is coated with the modified acrylate resin (8), and then left to stand at room temperature (20° C. to 30° C.) for about 2 hours as described above to harden the wood Ji11 (8).

次にエポキシ系樹脂(4)(例えば田辺化学工業株式会
社製商品名「エピフートンヨ)をケース(3)に注入し
て、変性アクリレート系樹脂(8)の上からコンデンサ
素子(1)を二重に被覆する。そし工このエポキシ系樹
脂(4)を、85℃で2時間の硬化条件による一次硬化
と、105°Cで15時間の硬化条件による二次硬化を
経て硬化きせる。
Next, epoxy resin (4) (for example, trade name "Epifutonyo" manufactured by Tanabe Chemical Industry Co., Ltd.) is injected into the case (3), and the capacitor element (1) is doubled over the modified acrylate resin (8). The epoxy resin (4) is then cured through primary curing at 85° C. for 2 hours and secondary curing at 105° C. for 15 hours.

こうして完成した本発明の固体電解コンデンサと、従来
の固体電解コンデンサの初期特性の20℃における比較
を第1表に示す。
Table 1 shows a comparison of the initial characteristics of the thus completed solid electrolytic capacitor of the present invention and a conventional solid electrolytic capacitor at 20°C.

(以下、余白) 第   1   表 第1表において、(A >、(B )、(C)は定格電
圧25v、容量3.311F、 (D)、(E)、(F
)ハ定格電圧35V、容景4.7up (7) コ?/
デンサで、(A)、(D>は前述した本発明の第1図の
構造、(B)、(E)は前述した本発明の第2図の構造
、(C)、(F’)は前述した従来例の第9図の構造で
ある。尚、Car、は120Hzにおける静電容量、t
anδは120Hzにおける誘電正接、LCは漏れt流
のデータで定格電圧印加15秒後の値(μ^)と歩留り
く%)を示し、ESRは100kHzにおける等個直列
抵抗を示すものである。また数値はLCを除き、いずれ
も各10個の平均値である。LCについては規格内の良
品10個の平均値を示し、歩留りは試料50個中の歩留
りを示しているが、各機種のLC規格は25V、3.3
Jの場合は1、6(IJA/15sec、 )以下、3
5V、4.7LP(7)場合ハ3.3(u^/15se
(、)以下である。第1表から本発明品が漏れt流の歩
留りにおいて、従来品に比較して著しく改善されている
ことがわかる。
(Hereafter, blank space) Table 1 In Table 1, (A >, (B), (C) are rated voltage 25V, capacity 3.311F, (D), (E), (F
) Rated voltage 35V, 4.7up (7) Ko? /
In the capacitor, (A) and (D> have the structure shown in FIG. 1 of the present invention described above, (B) and (E) have the structure shown in FIG. 2 of the present invention described above, and (C) and (F') have the structure shown in FIG. This is the structure of the conventional example described above as shown in Fig. 9.Car is the capacitance at 120Hz, t
and.delta. is the dielectric loss tangent at 120 Hz, LC is the leakage current data and indicates the value (μ^) and yield rate (%) after 15 seconds of application of the rated voltage, and ESR is the equal series resistance at 100 kHz. In addition, all numerical values are average values of 10 samples except for LC. Regarding LC, the average value of 10 good products within the standard is shown, and the yield is the yield of 50 samples, but the LC standard for each model is 25V, 3.3
For J, 1, 6 (IJA/15sec, ) or less, 3
5V, 4.7LP (7) case Ha 3.3 (u^/15se
(,) is below. From Table 1, it can be seen that the product of the present invention has significantly improved yield of leakage t flow compared to the conventional product.

第2表は本発明品と従来品のりフロー式半田付は装置に
よる半田付は前後における各特性の比較を示すものであ
る。
Table 2 shows a comparison of the characteristics of the products of the present invention and the conventional products before and after soldering using glue flow soldering equipment.

第  2  表 第2表において、(G )、(H)、(I )は定格電
圧25V、容gk1iiF+ノコンデンサで、(G)は
前述した本発明の第1図の構造、(H)は前述した本発
明の第2図の構造、(I)は前述した従来例の第9図の
構造である。尚、各特性値の説明は前述した第1表のも
のと同様であるが、LCの値は第1表のものと異なり、
不良品を含めた10個の平均値である。第2表から本発
明品が漏れ電流値(LC)において、従来品に比べ極め
て半田付けに強く、tan8においても同様にすぐれて
いることがわかる。
Table 2 In Table 2, (G), (H), and (I) are capacitors with a rated voltage of 25 V and a capacity of gk1iiF+, (G) is the structure of the present invention shown in FIG. The structure shown in FIG. 2 of the present invention is shown in FIG. 2, and (I) is the structure shown in FIG. 9 of the conventional example described above. The description of each characteristic value is the same as that in Table 1 above, but the LC value is different from that in Table 1.
This is the average value of 10 items including defective items. From Table 2, it can be seen that the products of the present invention are extremely resistant to soldering compared to the conventional products in terms of leakage current value (LC), and are also excellent in tan8.

第3図は本発明の他の実施例の固体電解コンデンサを示
す断面図である。前述したようにコンデンサ素子(1)
を、TCNQ塩(2)の含浸後の冷却固化によりケース
(3)内に固定し、コンデンサ素子(1)にシアノアク
リレート系樹脂(9)〈例えば2−シアノアクリレート
モノマー、東亜合成化学工業株式会社製商品名「アロン
アルファ■4、またはセメダイン株式会社製商品名1セ
メダイン3000ゴールド、等)を0.03cc〜0.
2cc滴下して、コンデンサ素子(1)表面上を完全に
被覆する。上記シアノアクリレート系樹脂〈9)の滴下
量はコンデンサ素子(1)の外径にほぼ比例する。なお
上記2−シアノアクリレートモノマーの硬化(2−シア
ノアクリレートモノマーの重合による2−シアノアクリ
レートポリマーの形成)は室温く20℃〜30”C)で
約12時間放置することにより完了する。
FIG. 3 is a sectional view showing a solid electrolytic capacitor according to another embodiment of the present invention. As mentioned above, the capacitor element (1)
is fixed in the case (3) by cooling and solidifying after impregnation with the TCNQ salt (2), and the capacitor element (1) is coated with a cyanoacrylate resin (9) (for example, 2-cyanoacrylate monomer, Toagosei Chemical Industry Co., Ltd.). 0.03cc~0.
Drop 2 cc to completely cover the surface of the capacitor element (1). The amount of the cyanoacrylate resin (9) dropped is approximately proportional to the outer diameter of the capacitor element (1). The curing of the 2-cyanoacrylate monomer (formation of a 2-cyanoacrylate polymer by polymerization of the 2-cyanoacrylate monomer) is completed by leaving it at room temperature (20 to 30"C) for about 12 hours.

硬化後、ケース(3)に前述したエポキシ系樹脂(4)
を注入して、開口部(3a)を封止する。そしてこのエ
ポキシ系樹脂(4)は、85℃で2時間の硬化条件によ
る一次硬化と、105℃で15時間の硬化条件による二
次硬化を経て硬化する。こうして完成した固体電解コン
デンサ(第3図)と、従来の固体電解コンデンサの初期
特性の20°Cにおける比較を第3表に示す。
After curing, apply the above-mentioned epoxy resin (4) to the case (3).
is injected to seal the opening (3a). This epoxy resin (4) is cured through primary curing at 85° C. for 2 hours and secondary curing at 105° C. for 15 hours. Table 3 shows a comparison of the initial characteristics of the thus completed solid electrolytic capacitor (Fig. 3) and a conventional solid electrolytic capacitor at 20°C.

(以下、余白) 第  3  表 第3表において、(J)、(K)は定格電圧25v、容
量ILF、(L)、(M>は定格電圧25v、容量10
IJI−1(N)、(0)は定格電圧25v、容量10
y、(P)、(Q)は定格電EE35V、容量4.71
JF、(R)、(S)は定格1圧35v、容!2.2L
IFのコンデンサである。また、(J )、(L )、
(N )、(P )、(R)は前述した本発明の第3図
の構造、(K)、(M)、(0)、(Q)、(S)は従
来例の第9図の構造である。さらに、(J)は前述すた
東亜合成化学工業株式会社製「アロンアルファ■J、(
L)は同社製「アロンアルファ[F]201」、(N)
はセメダイン株式会社製1セメダイン3000ゴールド
J、(P)は同社製「セメダイン30007ルチJ、(
R)は同社製1セメダイン木工用3000 Jをシアノ
アクリレート系樹脂(9)として使用したものである。
(Left below) Table 3 In Table 3, (J) and (K) are rated voltage 25v and capacity ILF, (L) and (M> are rated voltage 25v and capacity 10
IJI-1 (N), (0) has a rated voltage of 25V and a capacity of 10
y, (P), (Q) are rated voltage EE35V, capacity 4.71
JF, (R), (S) are rated at 1 pressure 35V, capacity! 2.2L
This is an IF capacitor. Also, (J), (L),
(N), (P), and (R) are the structures shown in FIG. 3 of the present invention, and (K), (M), (0), (Q), and (S) are the structures shown in FIG. 9 of the conventional example. It is a structure. Furthermore, (J) is the above-mentioned “Aron Alpha J,” manufactured by Toagosei Kagaku Kogyo Co., Ltd. (
L) is the same company's "Aron Alpha [F] 201", (N)
1 Cemedine 3000 Gold J manufactured by Cemedine Co., Ltd. (P)
R) uses 1 Cemedine woodworking grade 3000 J manufactured by the same company as the cyanoacrylate resin (9).

なお各特性値の説明は前述した第1表のものと同様であ
るから省略するが、LCは第1表の場合と異なり定格電
圧印加30秒後の値(U^)と歩留り(%)を示してい
る。また数値はLCを除き、いずれも各20個の平均値
である。LCについては規格内の良品20個の平均値を
示し、歩留りは試料各100個中の歩留りを示している
が、各機種のLC規格は25V、ILIFの場合は0.
25(IJA/30sec、 )以下、25V 、 1
owの場合は2.5(u^/30sec、 )以下、3
5v。
The description of each characteristic value is omitted because it is the same as that in Table 1 above, but unlike in Table 1, for LC, the value (U^) and yield (%) after 30 seconds of applying the rated voltage are It shows. In addition, except for LC, all numerical values are average values of 20 samples. Regarding LC, the average value of 20 non-defective products within the specifications is shown, and the yield is the yield of each 100 samples, but the LC standard for each model is 25V, and in the case of ILIF, it is 0.
25 (IJA/30sec, ) or less, 25V, 1
In the case of OW, 2.5 (u^/30sec, ) or less, 3
5v.

4.7Wの場合は1.6(IJA/30sec、 )以
下、35L 2.21JFの場合は0.77(μ^/3
0sec、 )以下である。第3表から本発明品が漏れ
電流<LC>の歩留り〈%)において、従来品に比べ著
しく改善されていることがわかる。
In the case of 4.7W, it is 1.6 (IJA/30sec, ) or less, and in the case of 35L 2.21JF, it is 0.77 (μ^/3
0sec, ) or less. It can be seen from Table 3 that the products of the present invention are significantly improved in yield (%) of leakage current <LC> compared to conventional products.

第4図は本発明の池の実施例の固体電解コンデンサを示
す断面図である。即ち、前述した本発明の構造(第2図
及び第3t5にりでは耐湿性に特に優れているエポキシ
系樹脂層がコンデンサ素子を被覆している変性アクリレ
ート系樹脂、又はシアノアクリレート樹脂要分だけ薄く
なって、その耐湿特性が従来品よりも悪くなっているの
で、変性アクリレート系樹脂、又はシアノアクリレート
系樹脂よりもその層厚を薄く形成出来るナイロン樹脂で
コンデンサ素子を被覆するようにしたものである。前述
したようにコンデンサ素子(1)をTCNQ塩(2)の
含浸後の冷却固化によりケース(3)内に固定し、コン
デンサ素子(1)にナイロン樹脂(例えばゼネラル通商
株式会社製商品名「ナイコートMT25J)を注入して
、ケース(3)の開口部(3a)まで注入する。尚、上
記ナイロン樹脂は低級アルコールを主溶剤とした液体ナ
イロン樹脂であり、室温(20°C〜30°C)で1〜
8時間程度(素子の外径にほぼ比例)放置して、液体ナ
イロン樹脂中の溶剤を蒸発させ、コンデンサ素子(1)
上に厚き1m以下のナイロン樹脂(10)の皮膜を形成
する。ナイ【】ン皮膜形成後(溶剤蒸発後)ケース(3
)に前述した。エポキシ系樹脂(4)を注入して、ナイ
ロン樹脂(10)の上からコンデンサ素子(1)を二重
に被覆し、ケース(3)の開口部(3a)を封止する。
FIG. 4 is a sectional view showing a solid electrolytic capacitor according to an embodiment of the present invention. That is, in the structure of the present invention described above (FIGS. 2 and 3t5), the epoxy resin layer, which has particularly excellent moisture resistance, is made of a modified acrylate resin or cyanoacrylate resin that covers the capacitor element, and is made as thin as the epoxy resin layer that is particularly excellent in moisture resistance. Since its moisture resistance is worse than conventional products, the capacitor element is coated with modified acrylate resin or nylon resin, which can be formed thinner than cyanoacrylate resin. As mentioned above, the capacitor element (1) is fixed in the case (3) by cooling and solidifying after impregnating with TCNQ salt (2), and the capacitor element (1) is coated with nylon resin (for example, General Tsusho Co., Ltd. product name: Nycoat MT25J) and inject it up to the opening (3a) of the case (3).The above nylon resin is a liquid nylon resin with lower alcohol as the main solvent, and is heated at room temperature (20°C to 30°C). ) from 1 to
Leave it for about 8 hours (approximately proportional to the outer diameter of the element) to evaporate the solvent in the liquid nylon resin, and then remove the capacitor element (1).
A film of nylon resin (10) with a thickness of 1 m or less is formed on top. Case (3) after formation of the nine film (after solvent evaporation)
) as mentioned above. Epoxy resin (4) is injected to double cover the capacitor element (1) from above the nylon resin (10) and seal the opening (3a) of the case (3).

そして、このエポキシ系樹脂(4)を85℃で2時間の
硬化条件による一次硬化と、105℃で15時間の硬化
条件による二次硬化を経て硬化させる。
This epoxy resin (4) is then cured through primary curing at 85° C. for 2 hours and secondary curing at 105° C. for 15 hours.

こうして完成した本発明の固体電解コンデンサと、従来
の固体電解コンデンサのりフロー式半田付は装置による
半田付は前後における各特性の比較を第4表に示す。
Table 4 shows a comparison of the characteristics of the thus completed solid electrolytic capacitor of the present invention and a conventional solid electrolytic capacitor soldered by flow soldering before and after soldering using the device.

(以下、余白) 第  4  表 第4表において、(T)、(U)、(V)は、定格電圧
25■、容量ILJPのコンデンサで、(T)は前述し
た本発明の第4図の構造、(U)は前述した従来例の第
9図の構造、(V)は前述した本発明の第2図の構造で
ある。尚、Ca P、は120Hzにおける静電容量、
tanδは120Hzにおける誘電正接、LCは漏れ電
流のデータで定格電圧印加15秒後の値(+1^)を示
し、ESRは100kHzにおける等個直列抵抗を示す
ものである。また数値は、何れも各10個の平均値であ
る。第4表から本発明品(第4図)が漏れ電流(LC)
において、エポキシ系樹脂だけを用いた従来品(第9図
)に比べて極めて半田付けに強いことがわかる。
(Hereinafter, blank spaces) Table 4 In Table 4, (T), (U), and (V) are capacitors with a rated voltage of 25 cm and a capacity ILJP, and (T) is the capacitor shown in Fig. 4 of the present invention described above. The structure, (U) is the structure shown in FIG. 9 of the conventional example described above, and (V) is the structure shown in FIG. 2 of the invention described above. In addition, CaP is the capacitance at 120Hz,
tan δ is the dielectric loss tangent at 120 Hz, LC is the leakage current data and indicates the value (+1^) 15 seconds after application of the rated voltage, and ESR is the equal series resistance at 100 kHz. All numerical values are average values of 10 values. Table 4 shows that the product of the present invention (Figure 4) has a leakage current (LC) of
It can be seen that this product is extremely resistant to soldering compared to the conventional product using only epoxy resin (Fig. 9).

第5表は本発明品と従来品のプレッシャークツカー試験
(条件=120℃、2atm、32時間)による耐湿特
性の比較を示すものである。
Table 5 shows a comparison of the moisture resistance properties of the products of the present invention and the conventional products in a pressure courier test (conditions = 120° C., 2 atm, 32 hours).

第  5  表 第5表において、(W)、(X)、(Y)は定格電圧2
5v、容11 yのコンデンサで、(W>は前述した本
発明の第4図の構造、(X)は前述した従来例の第9図
の構造、(Y)は前述した本発明の第2図の構造である
。尚、各特性値の説明は前述した第4表のものと同様で
ある。第5表から本発明品(第4130)が耐湿特性に
おいて、変性アクリレート系樹脂を用いた本発明品(第
2図)に比べて極めて良好であり、エポキシ系樹脂だけ
を用いた従来品(第9図)と同レベルの耐湿特性になる
ことがわかる。
Table 5 In Table 5, (W), (X), and (Y) are the rated voltage 2
5V, capacity 11y capacitor, (W> is the structure shown in FIG. 4 of the present invention described above, (X) is the structure shown in FIG. 9 of the conventional example described above, (Y) is the structure shown in FIG. It has the structure shown in the figure.The explanation of each characteristic value is the same as that in Table 4 above.Table 5 shows that the product of the present invention (No. 4130) has the same moisture resistance as the product using modified acrylate resin. It can be seen that the moisture resistance properties are extremely good compared to the invented product (Fig. 2) and are on the same level as the conventional product (Fig. 9) using only epoxy resin.

以上、本実施例ではコンデンサ素子をケースに収納する
タイプの場合について述べたが、ケースを用いずにコン
デンサ素子を全面樹脂封口する所謂樹脂デ1ノブタイプ
のものであっても良く、例えば第5図及び第6図は変性
アクリレート系樹脂を用いた場合、第7図はシアノアク
リレート系樹脂を用いた場合、第8図はナイロン樹脂を
用いた場合を示す図である。
In this embodiment, the case of the type in which the capacitor element is housed in the case has been described, but it may also be of the so-called resin de-1 knob type in which the capacitor element is entirely sealed with resin without using a case, for example, as shown in Fig. 5. 6 shows a case where a modified acrylate resin is used, FIG. 7 shows a case where a cyanoacrylate resin is used, and FIG. 8 shows a case where a nylon resin is used.

(ト) 発明の効果 上述した如く本発明に依れば、コンデンサ素子をTCN
Q塩とほとんど反応しない変性アクリレート系樹脂、シ
アノアクリレート系樹脂、ナイロン樹脂で被覆するよう
にしているので、コンデンサ素子の陽極に形成された酸
化皮膜および有機半導体としてのTCNQ塩が、エポキ
シ系樹脂とTCNQ塩との反応により劣化する点が前止
され工、高電圧印加時または半田付時に漏れ電流が増大
することがなく、従来品に比べ歩留りが著しく向上する
。また、コンデンサ素子を厚さ1a以下のナイロン樹脂
で被覆した後、更にエポキシ系樹脂で被覆するようにす
れば、エポキシ系樹脂だけでコンデンサ素子を被覆した
従来品とほぼ同じ厚みのエポキシ系樹脂層を形成するこ
とが出来るので、変性アクリレート系樹脂、又はシアノ
アクリレート系樹脂を用いた場合に比べて耐湿特性を向
上させ、従来品と同レベルにすることが出来る。
(G) Effects of the Invention As described above, according to the present invention, the capacitor element is TCN
Since the coating is made with a modified acrylate resin, cyanoacrylate resin, or nylon resin that hardly reacts with Q salt, the oxide film formed on the anode of the capacitor element and the TCNQ salt as an organic semiconductor will interact with the epoxy resin. Deterioration due to reaction with TCNQ salt is prevented, leakage current does not increase when applying high voltage or during soldering, and yields are significantly improved compared to conventional products. In addition, if the capacitor element is coated with a nylon resin with a thickness of 1 a or less and then further coated with an epoxy resin, the epoxy resin layer will be approximately the same thickness as the conventional product in which the capacitor element is coated with only epoxy resin. can be formed, so the moisture resistance can be improved compared to when modified acrylate resin or cyanoacrylate resin is used, and it can be made to the same level as conventional products.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明一実施例の固体電解コンデンサを示す断
面図、第2図、第3図及び第4図は夫々池の実施例を示
す断面図、第5図、第6図、第7図及び第8図は夫々樹
脂デイツプタイプの実施例を示す断面図、第9図は従来
例を示す断面図である。 (1)・・・コンデンサ素子、(2)・・・TCNQ塩
(有機半導体)、(3)・・・ケース、(4)・・・エ
ポキシ系樹脂、(8)・・・変性アクリレート系樹脂、
(9)・・・シアノアクリレート系樹脂、(10)・・
・ナイロン樹脂。
FIG. 1 is a sectional view showing a solid electrolytic capacitor according to an embodiment of the present invention, FIGS. 2, 3, and 4 are sectional views showing an embodiment of a pond, respectively, and FIGS. 8 and 8 are sectional views showing an embodiment of the resin dip type, respectively, and FIG. 9 is a sectional view showing a conventional example. (1) Capacitor element, (2) TCNQ salt (organic semiconductor), (3) Case, (4) Epoxy resin, (8) Modified acrylate resin ,
(9)...Cyanoacrylate resin, (10)...
・Nylon resin.

Claims (4)

【特許請求の範囲】[Claims] (1)陽極箔と陰極箔とをセパレータを介して巻回した
コンデンサ素子と、該コンデンサ素子に含浸後冷却固化
されたTCNQ塩と、該コンデンサ素子を被覆した変性
アクリレート系樹脂、シアノアクリレート系樹脂、又は
ナイロン樹脂から構成したことを特徴とする固体電解コ
ンデンサ。
(1) A capacitor element in which an anode foil and a cathode foil are wound with a separator in between, TCNQ salt that is impregnated into the capacitor element and solidified by cooling, and a modified acrylate resin and a cyanoacrylate resin that cover the capacitor element. A solid electrolytic capacitor characterized in that it is made of , or nylon resin.
(2)前記コンデンサ素子を前記変性アクリレート系樹
脂、シアノアクリレート系樹脂、又はナイロン樹脂で被
覆した後、更にエポキシ系樹脂で被覆したことを特徴と
する請求項(1)記載の固体電解コンデンサ。
(2) The solid electrolytic capacitor according to claim 1, wherein the capacitor element is coated with the modified acrylate resin, cyanoacrylate resin, or nylon resin and then further coated with an epoxy resin.
(3)前記コンデンサ素子をケースに収納し、該ケース
の開口部を前記変性アクリレート系樹脂、シアノアクリ
レート系樹脂、又はナイロン樹脂で封止したことを特徴
とする請求項(1)記載の固体電解コンデンサ。
(3) The solid electrolyte according to claim (1), wherein the capacitor element is housed in a case, and an opening of the case is sealed with the modified acrylate resin, cyanoacrylate resin, or nylon resin. capacitor.
(4)前記ケースの開口部を更にエポキシ系樹脂で封止
したことを特徴とする請求項(3)記載の固体電解コン
デンサ。
(4) The solid electrolytic capacitor according to claim (3), wherein the opening of the case is further sealed with an epoxy resin.
JP63097318A 1988-02-02 1988-04-20 Solid electrolytic capacitors Expired - Lifetime JP2594101B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP63097318A JP2594101B2 (en) 1988-02-02 1988-04-20 Solid electrolytic capacitors
KR1019890001152A KR970006432B1 (en) 1988-02-02 1989-02-01 Solid electrolytic capacitor

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP63-23372 1988-02-02
JP2337288 1988-02-02
JP63097318A JP2594101B2 (en) 1988-02-02 1988-04-20 Solid electrolytic capacitors

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP6021269A Division JP2771767B2 (en) 1988-02-02 1994-02-18 Method for manufacturing solid electrolytic capacitor

Publications (2)

Publication Number Publication Date
JPH01287919A true JPH01287919A (en) 1989-11-20
JP2594101B2 JP2594101B2 (en) 1997-03-26

Family

ID=26360727

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63097318A Expired - Lifetime JP2594101B2 (en) 1988-02-02 1988-04-20 Solid electrolytic capacitors

Country Status (2)

Country Link
JP (1) JP2594101B2 (en)
KR (1) KR970006432B1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5293958A (en) * 1976-02-03 1977-08-08 Nippon Electric Co Method of sheathing electronic parts
JPS5463354A (en) * 1977-10-31 1979-05-22 Tamura Kaken Co Ltd Tantalum solid electrolytic condenser
JPS58188125A (en) * 1982-04-27 1983-11-02 三洋電機株式会社 Method of producing solid electrolytic condenser

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5293958A (en) * 1976-02-03 1977-08-08 Nippon Electric Co Method of sheathing electronic parts
JPS5463354A (en) * 1977-10-31 1979-05-22 Tamura Kaken Co Ltd Tantalum solid electrolytic condenser
JPS58188125A (en) * 1982-04-27 1983-11-02 三洋電機株式会社 Method of producing solid electrolytic condenser

Also Published As

Publication number Publication date
KR970006432B1 (en) 1997-04-28
KR890013683A (en) 1989-09-25
JP2594101B2 (en) 1997-03-26

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