JPH01314959A - Simple check jig of analyser for measuring ion activity - Google Patents

Abstract

PURPOSE:To perform accurate inspection by generating the potential difference equal to that generated between both electrodes at the time of continuity between electric good conductors by a porous bridge having a specimen solution and a reference solution penetrated therein. CONSTITUTION:As a simple check jig 1, three kinds of ones for high concn., medium concn. and low concn. are prepared according to the magnitude of ion activity. As the battery of each jig 1, for example, one having output of 3V is used. Resistors 8a, 8b are used in order to form appropriate potential difference from the battery 7 and a resistor 8c is used in order to adjust output impedance. When an analyser is inspected, the mounts 2, 3 of the jig 1 are set to a slide setting hole in place of a slide. Next, in the same way as that at the time of the measurement of ion activity, the probes of the analyser are passed through the piercing holes 3a-3f of the mount 3 to be brought into contact with respective electrical good conductors 4A-6A, 4B-6B and the same voltage as that at the time of the measurement of ion activity is applied. By this method, accurate inspection can be performed.

Description

Detailed Description of the Invention (Industrial Field of Application) The present invention uses a slide type ion activity measurement device to measure aqueous liquid samples, such as alcoholic beverages, drinks, tap water, and especially biological body fluids (
The present invention relates to a jig for testing the function of an analyzer that quantitatively analyzes the activity (or concentration) of a specific ion in blood, urine, saliva, etc. using potentiometry.

(Prior art) A slide-type ion activity measuring instrument capable of spotting a liquid sample and measuring the ionic activity of specific ions contained therein was disclosed in Japanese Patent Publication No. 58-4981 and Japanese Patent Application Laid-Open No. 58-1982. -1
513848, Japanese Patent Application Laid-Open No. 58-211848, etc.

This slide type ion activation ffi fullll device (hereinafter also referred to as "slide") includes at least one ion selection electrode pair consisting of an ion selection electrode that generates a potential corresponding to the ionic activity of a specific ion; A reference solution in which the ionic activity of a specific ion is known and a sample in which the ionic activity of the ion is unknown. When a liquid is dot-supplied to one electrode and the other electrode of the ion-selective electrode pair, and the interface between the two liquids is brought into contact (liquid junction) by the action of the porous bridge to establish electrical continuity, a flow occurs between the two electrodes. Since a potential difference occurs corresponding to the difference in the ionic activity of the ions existing between the reference solution and the sample solution, if this potential difference is determined by n1, the calibration curve determined in advance (the principle is the Nernst equation) The ionic activity of a specific ion in the sample liquid is determined based on the following equation.

To measure ion activity using such a slide-type ion activity measurement device, it is necessary to use an analyzer that has the functions of point-feeding the reference solution and sample solution and constant n1 of the potential difference. preferable.

Such analyzers are described, for example, in U.S. Pat. No. 4,257.
．． No. 862 and Japanese Patent Application No. 12794/1984. In this type of conventional analyzer, after spotting the reference solution and the sample solution, the slide type ion activity measuring device is sent to the potential difference 711j constant section, and there, the potential measurement probe is brought into contact with each of the image electrodes of the electrode pair. , and is configured to measure the potential difference between the electrodes.

By the way, when manufacturing and using an analyzer configured as described above, it is necessary to inspect whether the analyzer is in a normal operating state. That is, for example, the manufacturer needs to perform a shipping inspection, and on the other hand, a service person or user needs to perform the above-mentioned inspection as appropriate for maintenance management or confirmation of measured values.

In order to easily carry out such inspections, the present applicant has developed a simple check jig (Japanese Patent Application No. 62-94551).

(Problem to be Solved by the Invention) The above simple check jig has approximately the same external dimensions as the slide, and when performing the same operation as measuring the potential difference, the two potential 11PI measuring probes are short-circuited or It was configured to connect both probes via a resistor. By inspecting the analyzer using this simple check jig, it is possible to check whether the analyzer has poor contact or disconnection.

However, although the above-mentioned simple check jig can detect defects such as poor contact or disconnection, when the ion activity is measured by measuring the potential difference, the analyzer can detect the ion activity. Whether the amount is measured accurately and whether the analyzer outputs an accurate measurement value depends on
Testing cannot be performed using the simple check jig mentioned above; for example, prepare a solution with a known ionic activity in advance, measure the ionic activity using a slide, and check whether the measured value is accurate. Therefore, there is a problem in that the above-mentioned simple check jig can only be used for very limited and simple inspections.

In view of the above-mentioned problems, the present invention provides an accurate measurement value when measuring the ion activity, instead of only detecting the poor contact or disconnection, etc., without having to prepare a solution with a known ion activity. It is an object of the present invention to provide a simple check jig for an analyzer for measuring ion activity, which can easily check whether or not the ion activity is detected.

(Means for Solving the Problems) One of the simple check jigs for the analyzer for measuring ion activity of the present invention includes at least one pair of ion-selective electrodes that generate a potential corresponding to the ion activity of a specific ion; Using an ion activity measurement device having a porous bridge arranged to communicate between both electrodes of the ion selection electrode pair, the image electrode of the ion selection electrode pair of the ion activity measurement device is placed at a predetermined position. A simple check jig for testing the function of an analyzer that measures ion activity by contacting potential difference measuring probes to the respective electrodes and measuring the potential difference between the electrodes, the jig comprising: a support having external dimensions that can be placed in a predetermined position; a pair of electrically conductive conductors attached to the support and arranged at a position where the probe of the analyzer comes into contact; It is characterized by comprising a power source that generates a potential difference between the pair of electrically conductive materials that is approximately equal to the potential difference that occurs between the two electrodes when electrical conduction occurs through the porous bridge into which a liquid has penetrated.

Further, another simple check jig of the present invention is one in which the simple check jig is equipped with a power source that generates a potential difference between the pair of electrically good conductors that is substantially equal to the potential difference that occurs between the two electrodes. Instead, the device is characterized in that it includes a power source that generates between the pair of electrically conductive conductors a potential difference and output impedance that are substantially equal to the potential difference and output impedance that occur between the two electrodes.

(Function) A support having the external dimensions as described above can be set in the potential difference measuring section of the analyzer instead of the slide. When using the simple check jig of the present invention, in the above state, move the probe in the same manner as when measuring the potential difference and bring it into contact with the electrically conductive material of the jig, and then create a potential difference between the probes that is approximately equal to the potential difference during ion activity measurement. By using the snake that causes the error, it is possible to detect malfunctions such as poor contact or disconnection of the analyzer, and it is also possible to check whether the analyzer is accurately measuring and outputting data.

In addition, by configuring a simple check jig that measures not only the potential difference but also the output impedance between the ion activity ff1ll regular time and the road, it is possible to more accurately simulate the state of ion activity measurement, allowing for more accurate inspection. can be done.

In addition, by preparing a plurality of the above simple check jigs that simulate the potential difference at high, medium, and low concentrations of ion activity, it is also possible to check the linearity of the analyzer's measurement system. Become.

(Example) Hereinafter, the present invention will be described in detail based on an example shown in the drawings.

First, an analyzer to which the simple check jig of the present invention is applied and a sliding type ion activity measuring instrument used therein will be explained.

Figure m1 shows an example of the above analyzer, and Figures 2.3 and 4 show its main parts. As shown in FIG.
This cover 11 has an opening 12 for setting a slide type ion activity measurement device (slide) 20 and spotting the reference solution and sample solution therein, and a slide 20 on which the potential difference has been measured. A discharge port 13 for discharging the water is provided. The analyzer IO is also provided with a start button 14, an ion activity display section 15, an ion activity recording section 16, and the like.

The mechanism shown in FIGS. 2.3 and 4 is disposed below the portion where the opening 12 is provided, and is fixed to a flat instrument mounting table 30 and both ends of this instrument mounting table 30. a pair of side plates 31.31, and six rods 32.32 arranged parallel to the instrument mounting table 30 and connecting the side plates 31.31.
．． 33. : (3, 34, 34) A liquid spotting part 30A is provided in the center of the instrument placement table 30,
Also, across this liquid spotting part 30A, there is a potential difference measuring part 30B.
and an instrument discharge section 30C are provided.

This instrument mounting table 30 is arranged inside the cover 11 so that the liquid spotting part 30A is located directly below the opening 12. Further, in the potential difference measuring section 30B, a through hole 35 is provided in the instrument mounting table 30, and this through hole 35
A heating plate 3B that can move up and down is incorporated inside. A slide presser plate 37 is disposed at a position facing the heating plate 3B at a predetermined distance from the surface of the instrument mounting table 30. On the other hand, in the instrument ejection section 30C, the instrument mounting table 30 is provided with a slide ejection hole 38. This slide discharge hole 38 is formed larger than the slide 20 described above, and has an inclined passage 39 and an opening 40 in the side plate 31.
It is connected to the discharge port 13 of the cover 11 via.

A slide set hole (through hole>
An instrument holder 42 having 41 is arranged.

Both ends of this instrument holder 42 are connected to the pair of rods 32.
, 32, so that the instrument holder 42 can move on the instrument mounting table 30 in the directions of arrows A and B (that is, sequentially to the liquid spotting section 30A, the potential difference measuring section 30B, and the instrument discharge section 30C). ) is movable. Note that the slide presser plate 37 is arranged at a distance from the surface of the instrument mounting table 30 by at least the thickness of the instrument holder 42 so that the instrument holder 42 can move up to the top of the heating plate 36. On the other hand, below the instrument table 30,
A holder moving table 43 is provided. Both ends of this holder moving table 43 are slidably fitted to the pair of rods 33, 33, so that this holder moving table 43 is also movable in the directions of the arrows A and B. A female screw 44 (see FIG. 4) is attached to the lower part of this holder moving table 43, and this female screw 44 is screwed into a drive screw (male screw) 45 arranged parallel to the rod 33. ing. The drive screw 45 is rotated forward and backward by a motor 4B fixed to the side plate 31 via gears 47 and 48. By rotating the drive screw 45 in this way, the holder moving base 43 is the arrow ASB
move in the direction. Connecting members 49 that protrude upward are provided at both ends of the holder moving table 43, respectively.
The rear surface of these connecting members 49 (i.e., when the holder moving table 43 is near the liquid spotting section 30A, the instrument discharging section 30C
A magnet 50 is fixed to the surface facing the side. On the other hand, connecting members 51 projecting downward are provided at both ends of the instrument holder 42.
The connecting member 51 is provided with the magnet 5.
A magnet 52 facing 0 is fixed. The polar directions of these magnets 50 and 52 are set so that they attract each other. Therefore, when the drive screw 45 is rotated and the holder moving base 43 is moved in the direction of arrow A as described above, if both magnets 50 and 52 are attracted to each other, the instrument holder 42 is moved to this holder moving base. 43 and moves in the direction of arrow A. On the other hand, holder moving table 4
3 is moved in the direction of arrow B, the instrument holder 42 is pushed by the holder moving table 43 and similarly moves in the direction of arrow B. Note that a cam member 53 is provided in the center of the holder moving table 43 as a probe moving means. The cam member 53 has a cam surface 53a that protrudes upward and is formed such that the instrument ejection section 30C side is higher and the potential difference measuring section 30B side is lower.

Next, the structure around the heating plate 36 will be explained with reference to FIG. 5.6. Note that each of these Figures 5.6 is
It shows the cross-sectional shape of a portion along the v-v line and the VI-VI line shown in FIG. 3. A pair of probe holder holding rods 60 and 80 are fixed to the lower surface of the instrument mounting table 30 in the potential difference measuring section 30B. These holding rods 6o, eo are arranged so as to sandwich the heating plate 36 between them, and a probe holder 81 is fitted into the holding rods θ0, 60 so as to be slidable in the vertical direction. Note that the probe holder 61 has each holding rod 60. GO
The receiver is fixed from below by a washer 62.82 attached to the lower end of the holder. Further, a pair of heating plate holding rods 83.63 are inserted into the probe holder 61 so as to be slidable in the vertical direction.
The heating plate 3G is fixed to the upper end of the heating plate 3G. A spring 64 is compressed around the holding rod 63 between the heating plate 36 and the probe holder 61, and the spring 64 biases the two in a direction away from each other. The probe holder 61 biased in this manner is held by washers 85.65 attached to the lower ends of the heating plate holding rods 83.83. The lengths of the holding rods 60, 60 and 63.63 are such that when the lower surface of the probe holder 61 is held by the washer 65.85 and the washer 132.62, the upper surface of the heating plate 36 is placed on the instrument mounting table. It is set to align with the surface of 30. Further, the lower ends of a pair of guide rods 613.88 are fixed to the probe holder 61. These guide rods 88, 88 are arranged so as to sandwich the heating plate 36 between them, and their upper ends can protrude upward from a through hole 30d provided in the instrument mounting table 30.

A spring 6 is provided around the guide rod 66 between the instrument mounting table 30 and the probe holder 61.
7 has been reduced. Therefore, the probe holder 61
When the probe holder 6 is pushed upward from below, the probe holder 6
1 elastically moves upward together with the heating plate 36 along the rods 60, 60, and at this time, when the heating plate 3B is pressed from above, the probe holder 61 moves upward with the heating plate 36.
It moves elastically relative to.

Further, the probe holder 61 includes, for example, three pairs of potential difference measurement probes 68a, 68b, 139a,
69b, 70a, and 70b are provided to protrude upward.

Probes 68a, [i8b, 69a,
89b, 70a, and 70b can each protrude upward through a cutout through hole provided in the heating plate 36. That is, when the heating plate 36 and the probe holder 61 are separated from each other by the action of the spring 64 (the state shown in FIG. 4), the tips of the probes 88a to 70b are located inside the heating plate 36. As described above, when the probe holder [il moves relative to the heating plate 3B, the tip protrudes upward from the surface of the heating plate 36. Further, a roller 71 is attached to the lower part of the probe holder 61 at a position facing the cam member 53 of the holder moving table 43.

A through hole 72 is provided in the instrument mounting table 30 between the junction attachment portion 30A and the potential difference measurement portion 30B, and a barcode sensor 73 is attached to the lower side of the through hole 72.

When measuring ion activity, the instrument holder 42 is connected to a holder moving table 43 as will be described later, and the motor 46 is driven and controlled by a known position detection sensor and drive control circuit. Instrument holder 4
2 is placed in the liquid spotting section 30A. As described above, in this state, the instrument holder 42 is located directly below the opening 12 of the cover 11, so the slide 20 is set in the slide setting hole 41 of the instrument holder 42 through the opening 12.

As mentioned above, this slide 20 is, for example,
211848, etc. or Japanese Patent Application No. 148584/1984, Japanese Patent Application No. 180358/1983,
This is described in Japanese Utility Model Application No. 80-204899, and will be briefly explained here with reference to FIG. 7. The slide 20 includes a 3tI ion-selective electrode pair 101 (consisting of ion-selective electrodes 111 and 112 having the same type of ion-selective layer on the surface and electrically separated from each other), LO2 (the same <
112 and 122), 103 (also 1
13 and 123), a water-impermeable member layer 200 having an adhesive layer on both sides, and a pair of porous liquid distribution members 310. 320 is housed between an upper frame 400 and a lower frame 500 made of plastic.

The upper frame 400 has a pair of liquid supply holes 410. 420 and four portions 450 extending across these liquid supply holes, and a porous bridge 600 made of spun polyethylene terephthalate fiber or the like is accommodated in this recess.
Fixed. In the fourth part 450, the bridge 600 is the upper frame body 4.
The depth shall be such that it does not extend above the top surface of 00.

Ion selective electrode pair 101. 102. Liquid supply holes 410. Through hole (liquid descending passage) aligned with 420 210. 220, ion selective electrode 111.
112°113, 121. 122. Through holes (liquid rising passages) 211, 212. which are aligned with a part of the ion selective layer region of 123, respectively. 213. 221.
222. 223 is provided. Water impermeable material layer 2
A porous liquid distribution member 310 is arranged below the through holes 21O1211, 212, 213 so as to align with the through holes 220.00. 221. A porous liquid distribution member 320 is disposed in alignment with 222°223. Lower frame 5
00 includes these porous liquid distribution members 310. Recess (liquid horizontal passage) shaped to accommodate 320 510.
520 is formed. Further, the upper frame body 400. The water-impermeable member layer 200 and the lower frame 500 each have a pair of through holes (air vent holes) 430, 440. 23
0. 240. 530. 540 is provided to form an air vent hole passing through the entire slide 20.

Ion selective electrode pair 101. 102. 103 are arranged with the ion selective layer facing downward, and the terminal portions of these electrode pairs are connected to a pair of notches 250.103 provided in the water-impermeable material layer 200. 260 and a pair of notches 550 provided in the lower frame 500. 560 and is exposed on the lower surface of the slide.

In such a slide 20, for example, the ion selective electrode pair 101. 102. 103woltsotLC9Je
.

It has an ion selective layer for KΦ and Nae, and a reference liquid whose ion activities are known is placed in the liquid supply hole 410, and a sample liquid whose ion activities are unknown is placed in the liquid supply hole 420. When the reference liquid is spotted in the liquid descending passage 210
liquid rise passageway 211. 212. 213 to the ion selective electrode 111. 112. 113, while the sample liquid permeates into the porous liquid distribution member 320 via liquid descending passages 220 and liquid rising passages 221. 22
2. 223 through the ion selective electrodes 121, 122
．． 123 ion selective layers are reached.

Furthermore, both liquids are brought into contact near the center of the bridge 600 to create electrical continuity. As a result, the (4
Since a potential difference corresponding to the difference in the ion activities of Φ and NaΦ occurs at e, a potential measuring probe is inserted from below the notch 550°560 and brought into contact with the terminal part of each ion selection electrode. The potential difference generated from the ion-selective electrode pair is 1 l.
Once llJ is determined, the activity of each of the above-mentioned ions in the sample solution can be measured in the same way as with conventional slides.

The slide 20 is set in the slide setting hole 41 with the upper frame 400 facing upward. Then, using, for example, a double pipette, the reference liquid and the sample liquid are applied to the liquid spotting holes 410, respectively. It is spotted within 420. When the start button 14 (see FIG. 1) is pressed after this spotting is completed, the motor 46 is driven and the holder moving table 43 is driven.
is moved in the direction of the arrow A. Then, the instrument holder 42 is also moved toward the potential difference measuring section 30B by being pulled by the holder moving table 43, comes into contact with the stopper 90, and is stopped at a predetermined position where the set slide 20 faces the heating plate 36.

Thereafter, the motor 46 continues to be driven to further move the holder moving table 43 by a predetermined distance. At this time, since the instrument holder 42 cannot be moved, both the magnets 50 and 52
are separated, and the holder moving table 43 moves independently as described above. When the holder moving table 43 moves in this manner, the cam surface 53a of the cam member 53 comes into contact with the roller 71 of the probe holder 61, and as the holder moving table 43 moves, the probe holder 61 is pushed upward. Then, as mentioned earlier, the heating plate 3B
is pushed up, and the heating plate 36 presses and fixes the slide 20 held in the instrument holder 42 to the holding plate 37. At this time, as the probe holder 61 rises, the guide rollers 88 and 68 protrude above the instrument mounting table 30, and the guide holes of the instrument holder 42! IJI, 91 and position instrument holder 42 (ie, slide 20) in position. Slide 20 as above
When pressed against the holding plate 37, the heating plate 36 is prevented from rising from then on, but the probe holder 61 is further pushed up a predetermined distance, thereby removing the probes [f8a, B8b, 69a, 89b, and 70 from the surface of the heating plate 36].
a and 70b protrude upward. The probes B8a and 88b that protruded in this way are inserted into the notch 550 of the slide 20.
580 are inserted from below and each ion selective electrode il
Contact with l, 121. Similarly, the probe 69a
, 69b are also inserted from below the notches 550 and 560 to form the ion selection electrodes 112., 69b, respectively. 122, and the probes 70a, 70b also have the notches 550. 560
The ion selective electrodes 113. are inserted from below, respectively.
Contact with 123.

In this state, the motor 46 is stopped, and then the slide 20 is heated to a predetermined temperature by the heating plate 36.

After a predetermined period of time has elapsed, the probe 89
A known potential difference ΔIII constant circuit (not shown) connected to the ion selective electrode pair 101. 102,
103 are measured. As mentioned earlier, by measuring these potential differences, l, 9J
The ionic activities of Φ and NaΦ are measured in e. The ion activity thus measured is displayed on the display section I5 or recorded on the recording paper 17 in the recording section 1B (see FIG. 1). The barcode of the slide 20 subjected to potential difference measurement is read by the barcode sensor 73, and the ion activity is displayed or recorded together with the identification code of the slide 20.

When the potential difference measurement described above is completed, the motor 4B is driven in the opposite direction to that in the above case. As a result, the holder moving table 43 is moved in the direction of arrow B.

Then, the cam member 53 touches the roller 7 of the probe holder 61.
1, the probe holder 61 descends. Then, each of the probes 69a to 70b first leaves the slide 20, the guide rods 88.66 come out downward from the guide holes 91.91 of the instrument holder 42, and then the surface of the heating plate 36 is aligned with the surface of the instrument mounting table 30. descend to the position. The motor 46 is further driven and the holder moving table 43 continues to move, so the connecting member 49 of the holder moving table 43 pushes the connecting member 51 via the magnets 50 and 52, and the instrument holder 42 also moves in the direction of arrow B. will be done. Therefore, the slide 20 whose potential difference has been measured is sent out from the potential difference measurement section 30B to the liquid spotting section 30A side by the instrument holder 42. The motor 46 is driven until the instrument holder 42 is above the instrument ejector 30C. The instrument holder 42 is the instrument ejection part 30C
Once up, the slide 20 held in the instrument holder 42 is dropped into the slide ejection hole 38. This slide 20 is discharged from the discharge port 13 through the passage 39. The motor 46 is then reversed and the instrument holder 42 is sent to the junction docking section 30A, where it is stopped and ready for the next docking.

Next, the simple check jig of the present invention will be explained.

FIG. 8 is an exploded perspective view showing an embodiment of the simple check jig of the present invention.

This simple check jig 1 includes an upper mount 2 and a lower mount 3 as supports, and three pairs of good electrical conductors 4.
A, 4B, 5A, 5B, 6A, 6B, a battery 7, and three resistors 8a, 8b, 8c. The upper mount 2 and the lower mount 3 have approximately the same external dimensions as the upper frame 400 and lower frame 500 of the slide 20, respectively, and are made of plastic, for example. However, the center part of the upper mount 2 is hollowed out, and the battery 7,
The resistors 8 a , 8 b r 8 c are arranged in the hollows. After the battery 7 and resistors 8a, 8b, and 8c are wired, they are molded with plastic or the like poured from above the figure.

In addition, the lower mount 3 has six through holes 3a, 3b, 3
c, 3d, 3e, and 3f are provided.

These through holes 3a, 3b, 3c, 3d, 3e.

3f is the water-impermeable member layer 2°O of the slide 20, respectively.
Through holes 211 , 212 , 2.13 , 221 ,
They are provided at positions corresponding to 222 and 223. Note that these mounts 2 and 3 each include the upper frame body 4.
00 with the center cut out, or the lower frame 500 itself may be used. Also, metal good conductors 4A, 4B,
5A, 5B; 6A, 6B are stainless steel plates that are resistant to rust and have high durability, copper alloys with tin plating or gold plating on the surface, or the like.

FIG. 9 shows the battery 7 shown in FIG. 8, three resistors 8a,
FIG. 8 is a circuit diagram showing wiring 8b and 8c.

Both ends of the battery 7 are connected to each other in series with a resistor 8a,
8b (the positive side is the resistor 8a).

Also, a resistor 8C is connected to the connection point between these resistors 8a and 8b.
One end of the resistor 8C is connected, and the other end of the resistor 8C is connected to a pair of good electrical conductors 4A, 4B; 5A.

One of 5B, 6A, and 6B is connected to 4A, 5A, and 6A. The other good electrical conductors 4B, 5B, and 6B are
held at ground potential.

Figure 10 shows the sodium ion activity in the solution (horizontal axis) and the amount of energy generated between the two electrodes of the slide 20 (see Figure 7) when this solution and the reference solution were spotted on the slide 20. It is a graph showing the relationship with electric potential (vertical axis).

As shown in this figure, as the concentration of ionic activity increases, the potential difference increases linearly. Furthermore, a negative potential is output on the low concentration side where the ion activity is low.

The simple check jig 1 shown in FIG. 8 is available in three types depending on the ion activity: high concentration, medium concentration, and low concentration.

As the battery 7 of the simple check jig 1 (see FIG. 8), a battery with an output of 3 V, for example, is used. In addition, as the respective resistance values R1+RZ+R3 of the resistors 8a, 8b, and 8c of the simple check jig 1 for high concentration, for example, R1-LOMΩ, R2-20 is Ωr RR3-1o
Ω is used. For medium concentration, for example, R1-10MΩ R2==11 and Ω+R3=1OM
Ω is used. In addition, for low concentration, for example, R1-10MΩ + R2-40 is Ω, R3-10MΩ is used, and the battery 7 is set so that a negative potential is output.
The polarity of the circuit is reversed from that in the circuit diagram shown in FIG. Note that the resistors 8a and 8b are used to generate an appropriate potential difference from the battery 7 (3V), and the resistor 8c is
Used to adjust output impedance. Further, in the above configuration, the resistor 8a is connected to the battery 7.

Although current always flows through 8b, if a resistor having the above-mentioned resistance value is used, it can be used for about two years. Of course, a switch may also be provided to prevent current from flowing when not in use.

The simple check jig 1 having the above configuration is set in the slide setting hole 41 described above instead of the slide 20 when inspecting the analyzer 10. In this case, since the mount 2.3 has the external dimensions as described above, the simple check jig 1 is tightly accommodated in the slide set hole 41. At this time, the simple check jig 1 is set with the upper mount 2 facing upward. Then the ionic activity n1
Similarly to the scheduled time, the start button 14 is pressed to move the holder moving table 43 and raise the probe holder 61. Thereby probes 88a, 68b, 89a, 69b
and 70a, 70b protrude upward, and the probe 68a
, 68b pass through the through holes 3a, 3d of the lower mount 3, probes 69a, 69b similarly pass through the through holes 3b, 3e, and probes 70a, 70b pass through the through holes 3c,
Passing through 3f, good electrical conductors 4A, 4B, 5A,
Contact 5B, 6A, 6B. Therefore, the probe 88a
and 68b1 probe 89a and 69b1 and probe 7
The same voltage as when measuring ion activity is applied between 0a and 70b.

If all the electrical circuits of the analyzer 10 are in a normal state, when voltage is applied between the probes as described above,
This value is displayed on the display section 15 (see FIG. 1). This display allows the subject to check whether there is a poor contact or disconnection, and whether the ion activity is accurately measured and displayed by the analyzer 10. In addition, as mentioned above, by preparing multiple simple check jigs corresponding to high, medium, and low ion activity concentrations and performing the tests as described above, more accurate tests can be carried out. The linearity of the measurement system can also be confirmed.

After the inspection has been completed, the simple check jig is discharged in the same manner as the slide 20 at the time of measuring the potential difference described above. In the above embodiment, the analyzer 10 is configured to automatically send the slide 20 to the potential difference measuring section and discharge it from the potential difference measuring section. However, the simple check jig of the present invention It can be used not only in this type of analyzer but also in an analyzer configured so that the slide 20 is manually sent to the potential difference measuring section and discharged from the potential difference measuring section.

(Effects of the Invention) As explained in detail above, the simple check jig of the present invention has the following features:
placed in place on the analyzer instead of the slide,
When the probes of the analyzer are brought into contact, a potential difference similar to that used when measuring ion activity is generated between the probes, so it is extremely easy to prevent poor contact, disconnection, etc. of the analyzer's measurement system, and to correct the accuracy of the measurement output of the analyzer. This makes the inspection work for analyzer manufacturers, service personnel, and users easier and more efficient than ever before.

In addition, by configuring a simple check jig that can check not only the potential difference but also the output impedance during ion activity measurement, it is possible to more accurately simulate the ion activity measurement state, allowing for more accurate testing. can be done.

[Brief explanation of the drawing]

FIG. 1 is a perspective view showing an example of an analyzer to which the simple check jig of the present invention is applied; FIGS. 2.3 and 4 are a perspective view, a plan view, and a side sectional view showing essential parts of the analyzer, respectively; Figure 5 is the third
Figure 6 is a side sectional view of the part along the line ■-v in the figure, Figure 6 is a side sectional view of the part taken along the Vl-vr line in Figure 3, Figure 7 is the sliding type ion activity used in the above analyzer. FIG. 8 is an exploded perspective view showing an example of the measuring instrument; FIG. 8 is an exploded perspective view showing an embodiment of the simple check jig of the present invention; FIG. 9 shows the wiring of the battery and resistor shown in FIG. 8. The circuit diagram shown in FIG. 10 is a graph showing an example of the relationship between the ionic activity of the solution and the potential difference generated between the electrodes of the slide. 1... Simple check jig 2... Upper mount 3... Lower mount 4A
, 4B, 5A, 5B, 6A, 6B...Good electrical conductor 7...Battery 8a, 8b, 8cm--Resistor 10...Analyzer 20...Sliding type ion active Jul + fixed fixture B8a,
88b, 69a, 69b, 70a, 70b・
...Probe for determining potential difference nj Fig. 3 Fig. 4 Fig. 5 Fig. 6 Fig. 8 Fig. 9 Fig. 10

Claims (2)

[Claims] (1) Ions that have at least one ion-selective electrode pair that generates a potential corresponding to the ionic activity of a specific ion, and a porous bridge arranged to communicate between both electrodes of this ion-selective electrode pair. Using an activity measuring device, the ion activity is measured by bringing a potential difference measuring probe into contact with both electrodes of the ion selective electrode pair of the ion activity measuring device placed at a predetermined position and measuring the potential difference between the electrodes. A simple check jig for inspecting the function of an analyzer for measuring ion activity, comprising: a support having external dimensions that can be placed at the predetermined position in place of the ion activity measuring instrument; It is approximately equal to the potential difference that occurs between the two electrodes when electrical conduction is established between the pair of electrically conductive conductors arranged at the position where the probe contacts and the porous bridge attached to this support and permeated with the sample solution and the reference solution. A simple check jig for an analyzer for measuring ion activity, comprising a power source that generates a potential difference between the pair of good electrical conductors. (2) Ions having at least one pair of ion-selective electrodes that generate a potential corresponding to the ionic activity of a specific ion, and a porous bridge arranged to communicate between both electrodes of the pair of ion-selective electrodes. Using an activity measuring device, the ion activity is measured by bringing a potential difference measuring probe into contact with both electrodes of the ion selective electrode pair of the ion activity measuring device placed at a predetermined position and measuring the potential difference between the electrodes. A simple check jig for inspecting the function of an analyzer for measuring ion activity, comprising: a support having external dimensions that can be placed at the predetermined position in place of the ion activity measuring instrument; A potential difference and output impedance that occur between the two electrodes when conduction is established between a pair of electrically conductive conductors disposed at a position where the probe contacts and the porous bridge attached to this support and permeated with a sample solution and a reference solution. A simple check jig for an analyzer for measuring ion activity, comprising a power source that generates substantially equal potential difference and output impedance between the pair of electrically conductive conductors.