JPH0132922B2 - - Google Patents

Info

Publication number
JPH0132922B2
JPH0132922B2 JP56175369A JP17536981A JPH0132922B2 JP H0132922 B2 JPH0132922 B2 JP H0132922B2 JP 56175369 A JP56175369 A JP 56175369A JP 17536981 A JP17536981 A JP 17536981A JP H0132922 B2 JPH0132922 B2 JP H0132922B2
Authority
JP
Japan
Prior art keywords
knife mark
output
pass filter
divider
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56175369A
Other languages
Japanese (ja)
Other versions
JPS5876707A (en
Inventor
Yutaka Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP17536981A priority Critical patent/JPS5876707A/en
Publication of JPS5876707A publication Critical patent/JPS5876707A/en
Publication of JPH0132922B2 publication Critical patent/JPH0132922B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacture Of Wood Veneers (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 本発明はシート状の被検査物表面にできた直線
状の傷(ナイフマーク)を検出するナイフマーク
検出装置のナイフマーク検出回路に関するもので
ある。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a knife mark detection circuit of a knife mark detection device for detecting linear scratches (knife marks) formed on the surface of a sheet-like object to be inspected.

第1図はナイフマーク検出装置Aの概略構成図
を示し、ランプ1の光をシリンドリカルレンズ2
によつて帯状光3とし、この帯状光3をシート状
の被検査物4に対して斜め上から被検査物4の巾
方向に投光している。第2図に示すように投光部
位の垂直上方には被検査物4の巾方向にスリツト
5を開口したスリツト板6を介してシリンドリカ
ルレンズ7を配設し、このシリンドリカルレンズ
7の上方には更にすりガラス8と、このスリツト
板9と、フオトマルチプライヤ10との順に配置
しており、被検査物4表面に有るスライサの刃こ
ぼれや異物のつまり等によつて生じる直線状の傷
(ナイフマークと以下称する)11が投光部位に
至るとスリツト5と、シリンドカルレンズ7を介
してすりガラス8上にナイフマーク11の像が結
像される。このナイフマーク像をスリツト板9の
スリツト12を介してフオトマルチプライヤ10
で受光する。このようにして移動する被検査物4
表面のナイフマーク11を電気信号に変換するの
であるが、従来のナイフマーク検出回路はフオト
マルチプライヤ10の出力信号を適宜な増巾器で
増巾して第3図aに示す増巾器の電圧が閾レベル
Lを越えた際、第3図bに示す判定信号を発生さ
せてナイフマーク検出を行なうものであるが、第
3図aで示すように増巾器の出力電圧は被検査物
4の波打ち(うねり等)によつて変動し、ナイフ
マーク信号AのS/N比があまりよくないという
問題があつた。また品種毎の被検査物4の地肌の
色の違いよりノイズレベルが変動し、被検査物4
の品種毎に閾レベルLを設定する必要があつた。
FIG. 1 shows a schematic configuration diagram of a knife mark detection device A, in which light from a lamp 1 is transmitted through a cylindrical lens 2.
This strip-shaped light 3 is projected onto a sheet-shaped object 4 to be inspected from diagonally above in the width direction of the object 4 to be inspected. As shown in FIG. 2, a cylindrical lens 7 is disposed vertically above the light emitting area through a slit plate 6 in which a slit 5 is opened in the width direction of the object 4 to be inspected. Furthermore, a ground glass 8, this slit plate 9, and a photomultiplier 10 are arranged in this order, and are used to remove linear scratches (knife marks) caused by scraping of the slicer blade or clogging with foreign objects on the surface of the inspected object 4. (hereinafter referred to as ) 11 reaches the light projection site, an image of the knife mark 11 is formed on the ground glass 8 via the slit 5 and the cylindrical lens 7. This knife mark image is passed through the slit 12 of the slit plate 9 to the photo multiplier 10.
It receives light. The object to be inspected 4 moving in this way
The knife mark 11 on the surface is converted into an electrical signal, and the conventional knife mark detection circuit amplifies the output signal of the photo multiplier 10 with an appropriate amplifier to generate the amplifier shown in FIG. 3a. When the voltage exceeds the threshold level L, knife mark detection is performed by generating the judgment signal shown in Figure 3b, but as shown in Figure 3a, the output voltage of the amplifier is There was a problem that the S/N ratio of the knife mark signal A was not very good due to fluctuations due to the undulations (undulations, etc.) of the knife mark signal A. In addition, the noise level fluctuates due to the difference in the background color of the inspected object 4 for each product type.
It was necessary to set a threshold level L for each product type.

本発明は上述の問題点に鑑みて為されたもので
その目的とするところはシート状の被検査物上の
直線状の傷(ナイフマーク)を被検査物のうねり
や、電源ノイズや、被検査物の品種による明暗差
の影響を除去して確実に検出することができるナ
イフマーク検出装置の検出回路を提供するにあ
る。
The present invention has been made in view of the above-mentioned problems, and its purpose is to remove linear scratches (knife marks) on a sheet-like object to be inspected from undulations, power supply noise, and An object of the present invention is to provide a detection circuit for a knife mark detection device capable of reliably detecting by eliminating the influence of differences in brightness depending on the type of an object to be inspected.

以下本発明の実施例によつて説明する。第4図
は一実施例の回路ブロツク図を示し、10のフオ
トマルチプライヤの出力は増巾器13で増巾す
る。この増巾器13出力を20Hz程度のローパスフ
イルタ14に通して減算器15に入力させ、ロー
パスフイルタ14を通さない増巾器13出力とで
減算を行ない、被検査物4のうねりの影響を除去
するのである。16は200Hz程度のハイパスフイ
ルタで、このハイパスフイルタ16は電源ノイズ
(例えば120Hz)を除去するためのものである。1
7は除算器で、この除算器17はハイパスフイル
タ16通過後の信号をローパスフイルタ14通過
後の増巾器13出力で割ることによつて、被検査
物4の品種による明暗差の影響を除去(正規化)
してS/N比向上を図るのである。18はコンパ
レータで、このコンパレータ18は除算器17出
力と予め設定してある閾レベルLとを比較し除算
器17出力が第5図aに示すよう閾レベルLを越
えたとき、即ちナイフマーク信号Aが存在すると
き第5図bのように判定信号を発生させるのであ
る。
The present invention will be explained below using examples. FIG. 4 shows a circuit block diagram of one embodiment, in which the outputs of ten photomultipliers are amplified by an amplifier 13. The output of this amplifier 13 is passed through a low-pass filter 14 of about 20 Hz and inputted to a subtracter 15, and subtraction is performed with the output of the amplifier 13 that does not pass through the low-pass filter 14 to remove the influence of the waviness of the object to be inspected 4. That's what I do. 16 is a high pass filter of about 200 Hz, and this high pass filter 16 is for removing power supply noise (for example, 120 Hz). 1
7 is a divider, and this divider 17 divides the signal after passing through the high-pass filter 16 by the output of the amplifier 13 after passing through the low-pass filter 14, thereby removing the influence of brightness difference due to the type of the object to be inspected 4. (Normalization)
This is to improve the S/N ratio. 18 is a comparator, which compares the output of the divider 17 with a preset threshold level L, and when the output of the divider 17 exceeds the threshold level L as shown in FIG. 5a, that is, the knife mark signal is detected. When A exists, a determination signal is generated as shown in FIG. 5b.

第6図は本発明の別の実施例の回路図であり、
かかる実施例回路は増巾器13の出力をローパス
フイルタ14、ハイパスフイルタ16に夫々通し
て除算器17で除算するようになつており、第4
図実施例における減算を省略してある。
FIG. 6 is a circuit diagram of another embodiment of the present invention,
In this embodiment circuit, the output of the amplifier 13 is passed through a low-pass filter 14 and a high-pass filter 16, respectively, and divided by a divider 17.
Subtraction in the illustrated embodiment is omitted.

本発明は上述のように構成してフオトマルチプ
ライヤの出力を増巾した増巾信号を夫々通す20Hz
程度のローパスフイルタと、電源ノイズ除去用の
ハイパスフイルタとを有するとともにローパスフ
イルタの出力信号でハイパスフイルタの出力信号
を割る除算器と、該除算器の出力と予め設定した
閾レベルとを比較して除算器の出力が閾レベルを
越えたときに判定信号を出力するコンパレータと
を有してあるので、被検査物のうねりによる増巾
信号のレベルの変動成分の影響を取除くことがで
きる上に電源ノイズを除去できる。しかも、ロー
パスフイルタの出力信号でハイパスフイルタの出
力信号を割る除算器を備えているので、被検査物
のナイフマーク部分の他の部分からの変動成分を
比で求める(正規化して求める)ことができ、こ
のため被検査物の品種に応じて比例して変動する
ナイフマーク部分とそれ以外の部分との両方の明
暗差を相殺することができ、従つて被検査物の品
種に拘わりなく同一のナイフマークであるなら、
同一の変動成分を抽出できることになり、被検査
物の品種の明暗差の影響を除去することができ、
結果的にはナイフマーク信号のS/N比が良くな
る。そして、この除算器の出力をコンパレータに
て閾レベルと比較してナイフマークを検出するの
で、被検査物の品種毎にコンパレータの閾レベル
を変える必要がない効果を奏する。
The present invention is configured as described above to pass amplified signals obtained by amplifying the output of the photo multiplier to 20 Hz.
a divider that has a low-pass filter of about 100 kHz and a high-pass filter for removing power supply noise, and divides the output signal of the high-pass filter by the output signal of the low-pass filter, and compares the output of the divider with a preset threshold level. Since it is equipped with a comparator that outputs a judgment signal when the output of the divider exceeds a threshold level, it is possible to eliminate the influence of fluctuation components in the level of the amplified signal due to undulations of the object to be inspected. Power supply noise can be removed. Moreover, since it is equipped with a divider that divides the output signal of the high-pass filter by the output signal of the low-pass filter, it is possible to calculate the fluctuation component of the knife mark part of the object to be inspected from other parts by ratio (normalize it). Therefore, it is possible to cancel out the difference in brightness between the knife mark part and other parts, which varies proportionally depending on the type of object to be inspected. If it's a knife mark,
The same variation component can be extracted, and the influence of the difference in brightness of the type of object to be inspected can be removed.
As a result, the S/N ratio of the knife mark signal improves. Since a knife mark is detected by comparing the output of this divider with a threshold level in a comparator, there is an advantage that there is no need to change the threshold level of the comparator for each type of object to be inspected.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はナイフマーク検査装置の一部省略せる
概略構成図、第2図は同上の拡大側断面図、第3
図a,bは従来例の動作説明用のタイムチヤー
ト、第4図は本発明の一実施例の回路ブロツク
図、第5図a,bは同上の動作説明用のタイムチ
ヤート、第6図は本発明の別の実施例の回路ブロ
ツク図であり、4は被検査物、10はフオトマル
チプライヤ、14はローパスフイルタ、16はハ
イパスフイルタ、17は除算器、18はコンパレ
ータ、Aはナイフマーク信号、Lは閾レベルであ
る。
Fig. 1 is a partially omitted schematic configuration diagram of the knife mark inspection device, Fig. 2 is an enlarged side sectional view of the same as above, and Fig. 3 is a partially omitted schematic diagram of the knife mark inspection device.
Figures a and b are time charts for explaining the operation of the conventional example, Figure 4 is a circuit block diagram of an embodiment of the present invention, Figures 5 a and b are time charts for explaining the operation of the same, and Figure 6 is 2 is a circuit block diagram of another embodiment of the present invention, in which 4 is an object to be inspected, 10 is a photomultiplier, 14 is a low-pass filter, 16 is a high-pass filter, 17 is a divider, 18 is a comparator, and A is a knife mark signal. , L is the threshold level.

Claims (1)

【特許請求の範囲】 1 シート状の被検査物の表面に帯状光を投光す
る投光手段と、投光部位からの反射光によつて結
像させた像の光を受光するフオトマルチプライヤ
とを備えたナイフマーク検出装置において、フオ
トマルチプライヤの出力を増巾した増巾信号を
夫々通す20Hz程度のローパスフイルタと、電源ノ
イズ除去用のハイパスフイルタとを有するととも
にローパスフイルタの出力信号でハイパスフイル
タの出力信号を割る除算器と、該除算器の出力と
予め設定した閾レベルとを比較して除算器の出力
が閾レベルを越えたときに測定信号を出力するコ
ンパレータとを有して成ることを特徴とするナイ
フマーク検出装置のナイフマーク検出回路。 2 ローパスフイルタの出力信号とフオトマルチ
プライヤの出力を増巾した増巾信号とを減算した
後にハイパスフイルタを通過させることを特徴と
する特許請求の範囲第1項記載のナイフマーク検
出装置のナイフマーク検出回路。
[Scope of Claims] 1. A light projecting means that projects a band-shaped light onto the surface of a sheet-like object to be inspected, and a photo multiplier that receives light of an image formed by reflected light from the light projecting portion. The knife mark detection device includes a low-pass filter of about 20 Hz that passes amplified signals obtained by amplifying the output of the photo multiplier, and a high-pass filter for removing power supply noise. It comprises a divider that divides the output signal of the filter, and a comparator that compares the output of the divider with a preset threshold level and outputs a measurement signal when the output of the divider exceeds the threshold level. A knife mark detection circuit of a knife mark detection device characterized by: 2. The knife mark of the knife mark detection device according to claim 1, wherein the knife mark is passed through a high pass filter after subtracting the output signal of the low pass filter and the amplified signal obtained by amplifying the output of the photo multiplier. detection circuit.
JP17536981A 1981-10-31 1981-10-31 Knife mark detecting circuit of knife mark detecting device Granted JPS5876707A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17536981A JPS5876707A (en) 1981-10-31 1981-10-31 Knife mark detecting circuit of knife mark detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17536981A JPS5876707A (en) 1981-10-31 1981-10-31 Knife mark detecting circuit of knife mark detecting device

Publications (2)

Publication Number Publication Date
JPS5876707A JPS5876707A (en) 1983-05-09
JPH0132922B2 true JPH0132922B2 (en) 1989-07-11

Family

ID=15994883

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17536981A Granted JPS5876707A (en) 1981-10-31 1981-10-31 Knife mark detecting circuit of knife mark detecting device

Country Status (1)

Country Link
JP (1) JPS5876707A (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4949687A (en) * 1972-09-13 1974-05-14
JPS50104655U (en) * 1974-01-31 1975-08-28
JPS51148452A (en) * 1975-06-14 1976-12-20 Fujitsu Ltd Pattern defects detector
JPS55158505A (en) * 1979-05-28 1980-12-10 Matsushita Electric Works Ltd Knifed mark inspector

Also Published As

Publication number Publication date
JPS5876707A (en) 1983-05-09

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