JPH0136149B2 - - Google Patents
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- Publication number
- JPH0136149B2 JPH0136149B2 JP59010757A JP1075784A JPH0136149B2 JP H0136149 B2 JPH0136149 B2 JP H0136149B2 JP 59010757 A JP59010757 A JP 59010757A JP 1075784 A JP1075784 A JP 1075784A JP H0136149 B2 JPH0136149 B2 JP H0136149B2
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- Prior art keywords
- intersection
- semicircle
- line
- group
- search
- Prior art date
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Description
【発明の詳細な説明】
(1) 発明の属する分野の説明
本発明は、図面上の半円を情報処理装置を用い
て抽出し、符号化する半円抽出処理方式に関する
ものである。DETAILED DESCRIPTION OF THE INVENTION (1) Description of the field to which the invention pertains The present invention relates to a semicircle extraction processing method for extracting and encoding a semicircle on a drawing using an information processing device.
(2) 従来の技術の説明
図面をフアクシミリ送信機などの入力装置を用
いて、白黒二値の図面データとして情報処理装置
に入力し、該図面上の半円を自動抽出する方法と
しては、従来抽出したい半円をピツトパターン列
として表現し、これをマスタパターンとして原図
面データとの照合処理を行い、該マスタパターン
と一致する画素配列を半円として抽出する方法が
あつた。この方法では、マスタパターンと図面の
すべての画素配列との照合処理が必要であり、処
理時間が極めて長くなるという問題があつた。更
に、大きさや傾きが異なる半円に対しては、その
都度、マスタパターンを取り換えて原図面データ
との照合処理を繰り返し行う必要があり、特に任
意の大きさや傾きを持つ半円が記述されている図
面から半円を自動的に抽出しようとする場合に
は、極めて膨大な処理時間を要するという問題が
あつた。(2) Description of conventional technology There is a conventional method of inputting a drawing into an information processing device as black and white binary drawing data using an input device such as a facsimile transmitter, and automatically extracting a semicircle on the drawing. There is a method in which a semicircle to be extracted is expressed as a pit pattern sequence, this is used as a master pattern, and a comparison process is performed with original drawing data, and a pixel array that matches the master pattern is extracted as a semicircle. This method requires a process of matching the master pattern with all the pixel arrays in the drawing, which poses a problem in that the processing time becomes extremely long. Furthermore, for semicircles with different sizes and inclinations, it is necessary to replace the master pattern each time and repeat the matching process with the original drawing data. When trying to automatically extract a semicircle from a drawing, there is a problem in that an extremely large amount of processing time is required.
(3) 発明の目的
本発明は、これらの問題を解決するために、平
行で等間隔な3本の探査線と図形線との交点情報
から、半円を構成する弦上の3個の交点および円
孤上の3個の交点を見い出して、半円を抽出する
ようにしたもので、任意の大きさや傾きを持つ半
円を抽出することを可能にした半円抽出処理方式
を実現したものである。以下、図面を用いて詳細
に説明する。(3) Purpose of the Invention In order to solve these problems, the present invention calculates three intersection points on a chord constituting a semicircle based on intersection information between three parallel and equally spaced search lines and a figure line. This method realizes a semicircle extraction processing method that makes it possible to extract semicircles with arbitrary sizes and inclinations by finding three intersections on the circular arc and the three intersection points on the arc. It is. Hereinafter, it will be explained in detail using the drawings.
(4) 発明の構成および作用の説明
第1図は本方式の原理説明図であり、1は半
円、2は3本の探査線2―1乃至2―3からなる
探査群、3乃至8は探査線の図形線との交点であ
る。(4) Explanation of the structure and operation of the invention Figure 1 is an explanatory diagram of the principle of this method, in which 1 is a semicircle, 2 is a probe group consisting of three probe lines 2-1 to 2-3, 3 to 8 is the intersection of the search line and the figure line.
本方式では、まず平行でかつ等間隔な3本の探
査線2―1,2―2,2―3を設定し、該3本の
探査線と図形線との交点3乃至8を検出する。交
点検出処理は探査線上を走査し、検出された黒ラ
ンの中心画素あるいは中心に近い画素を交点とす
ることで行う。次に探査線2―2上の交点5を基
準に予め定めた範囲内に在る交点3,4,6,
7,8を見い出し、該6個の交点からなる半円構
成候補の交点群を検出し、該交点群内の6個が同
一半円上に存在するか、否かの判定を行う。具体
的には、まず該交点群を各探査線上で左側にある
交点からなる左交点組3,5,7と右側にある交
点からなる右交点組4,6,8とに分け、該2個
の交点組について、一方の交点組内の3個の交点
が同一直線上に存在し、他方の交点組内の3個の
交点を通る円の中心点が該直線上に存在する場合
には、該6個の交点は同一半円上に存在すると判
定する。次に該円と該直線から半円の位置、大き
さ、傾き、を求めることによつて、半円を抽出す
る。 In this method, first, three parallel and equally spaced search lines 2-1, 2-2, and 2-3 are set, and intersection points 3 to 8 between the three search lines and the figure line are detected. The intersection detection process is performed by scanning the search line and setting the center pixel of the detected black run or a pixel close to the center as the intersection. Next, the intersection points 3, 4, 6, which are within a predetermined range based on the intersection point 5 on the exploration line 2-2,
7 and 8 are found, a group of intersection points of a semicircle configuration candidate consisting of the six intersection points is detected, and it is determined whether the six points in the group of intersections exist on the same semicircle. Specifically, first, the group of intersections is divided into left intersection groups 3, 5, and 7 consisting of intersections on the left side on each search line, and right intersection groups 4, 6, and 8 consisting of intersections on the right side, and the two For the intersection set, if the three intersection points in one intersection set exist on the same straight line, and the center point of the circle passing through the three intersection points in the other intersection set exists on the straight line, It is determined that the six intersection points are on the same semicircle. Next, a semicircle is extracted by determining the position, size, and inclination of the semicircle from the circle and the straight line.
なお、かかる処理によつて抽出された半円情
報、例えば位置、大きさ、傾きなどに基づいて、
当該半円をビツトパターン列として発生し、これ
をマスクパターンとして原図面データとの照合処
理を行うことにすれば、抽出精度を更に高めるこ
とも可能である。 Furthermore, based on the semicircle information extracted through such processing, such as position, size, and inclination,
If the semicircle is generated as a bit pattern sequence and this is used as a mask pattern for comparison with the original drawing data, it is possible to further improve the extraction accuracy.
第2図は、探査線の方向と半円の抽出対象とな
る傾き範囲を示した説明図である。9は半円、1
0,11は各々探査線10―1乃至10―3,1
1―1乃至11―3からなる探査線群、12乃至
23は探査線と図形線との交点である。 FIG. 2 is an explanatory diagram showing the direction of the search line and the inclination range from which semicircles are extracted. 9 is a semicircle, 1
0,11 are exploration lines 10-1 to 10-3,1 respectively
The search line group consisting of 1-1 to 11-3, 12 to 23 are the intersections of the search lines and the figure lines.
本方式では上記説明したように、探査線と半円
との交点は弦上に3個、円孤上に3個存在するこ
とが必要である。このため探査線の方向に対して
半円の傾き、つまり当該半円の弦の方向が45度乃
至135度の範囲にある半円を抽出処理の対象とす
る。半円9は第2図aの探査線群10では該半円
との交点が12乃至17となり、該半円の弦上に
3個の交点を検出することができず、抽出は不可
能である。一方、同図bのように探査線群11を
探査線群10と垂直な方向に設定するならば、該
半円と探査線群11との交点が18乃至23とな
り、該半円の弦上に3個、該半円の円孤上に3個
の交点を検出することができるため、上記処理に
よる抽出が可能となる。 In this method, as explained above, there must be three intersections between the search line and the semicircle on the chord and three on the arc. Therefore, a semicircle whose inclination, that is, the direction of the chord of the semicircle, is in the range of 45 degrees to 135 degrees with respect to the direction of the search line is targeted for extraction processing. The semicircle 9 intersects with the semicircle 12 to 17 in the search line group 10 in Figure 2a, and three intersections cannot be detected on the chord of the semicircle, making extraction impossible. be. On the other hand, if the search line group 11 is set in a direction perpendicular to the search line group 10 as shown in figure b, the intersections between the semicircle and the search line group 11 will be 18 to 23, and will be on the chord of the semicircle. Since three intersection points can be detected on the arc of the semicircle, extraction by the above process is possible.
したがつて、図面上で任意の傾きを持つ半円を
すべて抽出するためには、例えば、まず水平方向
の探査線群を用いて、これを図面の上から下へ、
次に垂直方向の探査線群を用いて、これを図面の
左から右へ、というように直交する2方向の探査
線群を順次移動しながら処理を行う。 Therefore, in order to extract all semicircles with arbitrary inclinations on a drawing, for example, first use a group of horizontal exploration lines and move them from the top to the bottom of the drawing.
Next, processing is performed using vertical search line groups while sequentially moving the search line groups in two orthogonal directions, such as from left to right in the drawing.
なお、抽出対象の最小半円の円孤の半径を
Rminとすれば、探査線の間隔はRmin/√2よ
り小さく設定することが必要である。 In addition, the radius of the arc of the smallest semicircle to be extracted is
If Rmin, the interval between the probe lines needs to be set smaller than Rmin/√2.
第3図は半円構成候補の交点群を検出する処理
の説明図である。 FIG. 3 is an explanatory diagram of the process of detecting a group of intersection points of semicircular configuration candidates.
24は半円、25は探査線25―1乃至25―
3からなる探査線群、26乃至31は探査線と図
形線の交点、32乃至35は探査線上の範囲を示
すものであり、36は半円24の孤の端点であ
る。なお第3図では左上に示すようにx,y座標
を設定する。また抽出対象半円の孤の半径範囲を
Rmin〜Rmax(Rmin<Rmax)、探査線の間隔を
Dとする。 24 is a semicircle, 25 is exploration line 25-1 to 25-
3, 26 to 31 are intersection points of the search lines and figure lines, 32 to 35 indicate ranges on the search lines, and 36 is the end point of the arc of the semicircle 24. In FIG. 3, the x and y coordinates are set as shown in the upper left corner. Also, the radius range of the arc of the semicircle to be extracted is
Rmin to Rmax (Rmin<Rmax), and the interval between the exploration lines is D.
まず探査線25―2上の交点28に注目し、該
交点を基準に探査線25―2上でx方向Rmin〜
Rmaxの範囲にある交点29を選出する。該交点
28,29のx座標を各々X1,X2とすると、探
査線25―1上では{(X1―D)〜(X1+D}つ
まり範囲32および{(X2−D)〜(X2+D)}
つまり範囲33に、また探査線25―3上では
{(X1−D)〜(X1+D)}つまり範囲34および
{(X2−D)〜(X2+D)}つまり範囲35に各々
存在する交点26,27,30,31を選出す
る。かかる処理によつて交点群26,27,2
8,29,30,31を検出する。なお該範囲3
2乃至35に複数個の交点が存在する場合にはす
べての組合せを交点群として検出する。 First, focus on the intersection 28 on the exploration line 25-2, and move along the exploration line 25-2 in the x direction Rmin~ with this intersection as a reference.
An intersection point 29 within the range of Rmax is selected. Letting the x coordinates of the intersections 28 and 29 be X 1 and X 2 respectively, on the exploration line 25-1, {(X 1 - D) ~ (X 1 + D}, that is, the range 32 and {(X 2 - D) ~ (X 2 +D)}
In other words, in the range 33, and on the search line 25-3, {(X 1 -D) to (X 1 +D)}, that is, the range 34, and {(X 2 -D) to (X 2 +D)}, that is, the range 35, respectively. Existing intersection points 26, 27, 30, and 31 are selected. Through such processing, the intersection points 26, 27, 2
8, 29, 30, 31 are detected. In addition, the relevant range 3
If there are multiple intersections between points 2 to 35, all combinations are detected as a group of intersections.
次に該交点群内の6個の交点を左交点組26,
28,30、右交点組27,29,31に分け
る。 Next, the six intersections in the intersection group are set as the left intersection set 26,
28, 30, right intersection set 27, 29, 31.
第4図は交点組内の3交点の相対的位置関係を
タイプA乃至に分類した分類テーブルである。
分類は、中央の点(第4図では黒点で表示してい
る)のx座標値を基準にして、上下のそれぞれの
点(第4図では白点で表示している)のx座標値
が大きい、小さい、同じであるかの組み合わせに
依つている。 FIG. 4 is a classification table in which the relative positional relationships of three intersections in an intersection set are classified into types A to type A.
Classification is based on the x-coordinate value of the central point (indicated by a black dot in Fig. 4), and the x-coordinate values of the upper and lower points (indicated by white dots in Fig. 4). It depends on the combination of being larger, smaller, or the same.
上記処理によつて検出された左交点組26,2
8,30および右交点組27,29,31が分類
テーブルのいずれのタイプに該当するかを判定す
る。次に該2交点組が左半円(円孤が弦に対して
左側にある半円)あるいは右半円(円孤が弦に対
して右側にある半円)を構成する可能性があるか
否かを各交点組が該当するタイプを基に判定す
る。具体的には第4図のタイプA乃至Cは弦を、
タイプD乃至は円孤を構成する可能性があると
し、次のように判定する。 Left intersection set 26, 2 detected by the above process
8, 30 and the right intersection set 27, 29, 31 are determined to which type of the classification table they correspond. Next, is there a possibility that the two intersection points constitute a left semicircle (a semicircle where the arc is on the left side with respect to the chord) or a right semicircle (a semicircle where the arc is on the right side with respect to the chord)? It is determined whether or not each intersection set corresponds to the type. Specifically, types A to C in Figure 4 use strings,
It is assumed that there is a possibility of forming a type D or arc, and the determination is made as follows.
(イ) 左半円を構成する可能性がある場合
左交点組…G、H、Iのいずれか、右交点
組…A、B、Cのいずれか
(ロ) 右半円を構成する可能性がある場合
左交点組…A、B、Cのいずれか、
右交点組…D、E、Fのいずれか
(ハ) 左半円も右半円も構成する可能性がない場合
上記(イ)、(ロ)以外の組合せ
第3図の例では、左交点組26,28,30は
タイプB、右交点組27,29,31はタイプD
に該当するから右半円を構成する可能性有と判定
される。(b) When there is a possibility of forming a left semicircle Left intersection group...any of G, H, or I, right intersection group...any of A, B, or C (b) Possibility of forming a right semicircle If there is a left intersection group...any one of A, B, or C, right intersection group...any one of D, E, or F (c) If there is no possibility of forming either a left or right semicircle, the above (b) , (b) In the example shown in Fig. 3, the left intersection groups 26, 28, and 30 are type B, and the right intersection groups 27, 29, and 31 are type D.
Since it corresponds to , it is determined that there is a possibility of forming a right semicircle.
なお、探査線の位置によつては、実際、半円で
あつても上記(イ)、(ロ)に判定されない場合もある
が、探査線の位置を順次移動すれば、必ず(イ)、(ロ)
に相当する交点群を検出できる。第5図を用いて
これを説明する。 Depending on the position of the exploration line, it may not be judged as (a) or (b) above even if it is actually a semicircle, but if you move the position of the exploration line one after another, it will definitely be (a), (B)
It is possible to detect a group of intersection points corresponding to . This will be explained using FIG.
第5図は、探査線位置と該探査線により検出さ
れる交点群の関係を示した説明図である。37は
半円、38,39は各々探査線38―1乃至38
―3,39―1乃至39―3からなる探査線群、
40乃至51は探査線と図形線の交点である。 FIG. 5 is an explanatory diagram showing the relationship between the search line position and the group of intersections detected by the search line. 37 is a semicircle, 38 and 39 are exploration lines 38-1 to 38, respectively.
- Exploration line group consisting of 3, 39-1 to 39-3,
40 to 51 are the intersection points of the search line and the figure line.
探査線群38によつて検出される交点群は左交
点組40,42,44と右交点組41,43,4
5となり、各々タイプB、タイプCに該当すると
判定され、半円構成可能性なしとなるが、探査線
群の位置を順次移動し、例えば探査線群39によ
つて検出される交点群は左交点組44,48,5
0と右交点組47,49,51となり、各々タイ
プB、タイプDに該当し、右半円構成可能性有と
判定されることになる。 The intersection groups detected by the search line group 38 are the left intersection group 40, 42, 44 and the right intersection group 41, 43, 4.
5, it is determined that they correspond to type B and type C, respectively, and there is no possibility of forming a semicircle. However, the positions of the exploration line groups are sequentially moved, and for example, the intersection group detected by the exploration line group 39 is on the left. Intersection set 44, 48, 5
0 and right intersection sets 47, 49, and 51, which correspond to type B and type D, respectively, and are determined to have a possibility of forming a right semicircle.
半円構成可能性有と判定された2個の交点組に
ついては、さらに(1)弦を構成する交点組内の3個
の交点から例えば最小自乗法によつて求めた直線
に対し、該3個の交点が予め定めた距離内に存在
すること、(2)円孤を構成する交点組は該交点組内
の3交点によつて定まる円の中心点と(1)で求めた
該直線との距離が予め定めた範囲内にあること、
の2条件を判定する。第3図の場合、左交点組2
6,28,30について条件(1)を、右交点組2
7,29,31について条件(2)を判定し、該2条
件が満足されれば、半円24を決定する情報とし
て、例えば、円孤の中心位置、半径、弦の傾きを
求め、半円を抽出する。なお円孤の半径、弦の傾
きの情報のかわりに、円孤の端点、例えば36の
位置と、該端点から円孤は時計回りに延びている
という情報を用いてもよい。 Regarding the two intersection sets that have been determined to have the possibility of forming a semicircle, (1) the three (2) The set of intersections constituting the arc must be between the center point of the circle determined by the three intersections in the set of intersections and the straight line obtained in (1). the distance is within a predetermined range,
The following two conditions are determined. In the case of Figure 3, left intersection group 2
Condition (1) for 6, 28, 30, right intersection set 2
Condition (2) is determined for 7, 29, and 31, and if the two conditions are satisfied, the center position, radius, and chord slope of the arc are determined as information for determining the semicircle 24, and the semicircle is Extract. Note that instead of the information on the radius of the arc and the inclination of the chord, the position of the end point of the arc, for example 36, and the information that the arc extends clockwise from the end point may be used.
なお、条件(2)の判定方法としては、はじめに該
3交点27,29,31を通る円の中心点を求
め、該中心点と条件(1)で定められる直線との距離
が予め定めた範囲内にあるか否かを判定してもよ
いが、はじめに2交点27,31を両端とする線
分の垂直二等分線と条件(1)で定められる該直線と
の交点を求め、該交点を円孤の中心点と設定し、
該中心点と交点27あるいは交点29の距離と、
該中心点と交点28の距離の差が予め定めた範囲
内にあるか否かを判定してもよい。 Note that the method for determining condition (2) is to first find the center point of a circle passing through the three intersection points 27, 29, and 31, and then find the distance between the center point and the straight line defined by condition (1) within a predetermined range. Although it may be determined whether the two intersection points 27 and 31 are at both ends, first find the intersection of the perpendicular bisector of the line segment whose ends are the two intersection points 27 and 31 and the straight line defined by condition (1), and then find the intersection point. Set as the center point of the arc,
The distance between the center point and the intersection 27 or 29,
It may be determined whether the difference in distance between the center point and the intersection point 28 is within a predetermined range.
第6図は本方式を実現する装置の一構成例であ
る。52はフアクシミリ送信機などの図面入力装
置、53は図面データを格納するフレームメモ
リ、54は制御部、55は交点検出部、56は交
点情報を記憶する交点レジスタであり、探査線上
の画素数に相当するアドレスを持つラインレジス
タ3個によつて構成され、各ラインレジスタの内
容が3本の探査線の交点情報に各々対応するも
の、57は交点群検出部、58は交点組判定部、
59は半円判定部、60は出力部である。 FIG. 6 shows an example of the configuration of a device that implements this method. 52 is a drawing input device such as a facsimile transmitter, 53 is a frame memory for storing drawing data, 54 is a control unit, 55 is an intersection detection unit, and 56 is an intersection register for storing intersection information, which is based on the number of pixels on the search line. Consisting of three line registers having corresponding addresses, the contents of each line register correspond to the intersection information of the three search lines, 57 is an intersection group detection section, 58 is an intersection group judgment section,
59 is a semicircle determining section, and 60 is an output section.
これを動作するには、まず図面を図面入力装置
52により入力し、フレームメモリ53に格納す
る。制御部54は交点検出部55に対し、探査線
位置の指示を送る。交点検出部55はこれを受
け、まず、交点レジスタ56をクリアしたのち、
探査線上の画素データをフレームメモリ53から
読込み、該探査線上の黒ラインを検出し、該黒ラ
ンの中心画素、あるいは中心に近い画素を交点と
して検出する。交点情報は、例えば、探査線方向
をx軸にとれば、該交点のx座標に相当するライ
ンレジスタのアドレスに“1”をたてることで記
憶される。かかる操作を3本の探査線上の画素デ
ータに対して行い、交点情報は各探査線ごとに、
交点レジスタ56内の3個のラインレジスタに
各々記憶される。交点群検出部57は交点レジス
タ56に交点情報が格納完了した指示を制御部5
4から受けたのち、交点レジスタ56内の交点情
報つまりラインレジスタ中“1”であるアドレス
値、から上記第3図で説明した手順に基づき、半
円構成候補となる6個の交点からなる交点群を検
出し、該6個の交点のアドレス値を交点組判定部
58へ送る。交点組判定部58はこれを受け、該
交点群を各探査線つまりラインレジスタごとに該
交点のアドレス値を比較することによつて左交点
組、右交点組に分ける。次に該2交点組内の各々
3交点のアドレス値を比較することによつて上記
第4図に示した分類テーブルに基づき、当該交点
組のタイプを検出し、該2交点組のタイプの組合
せが半円を構成する可能性があるか否かを判定す
る。可能性無と判定された場合には交点群検出部
57に対して、新たな交点群を検出するように指
示を出す。また可能性有りと判定された場合に
は、該交点組情報を半円判定部59に送る。半円
判定部59は該交点組情報から得られる交点のx
座標値と制御部54から送られた探査線の位置情
報から得られる該交点のy座標値に基づき、該2
個の交点組内の6個の交点が同一半円上に存在す
るか否かの判定を行う。否と判定された場合には
交点群検出部57に対して、新たな交点群を検出
するように指示を出す。また半円であると判定さ
れた場合には、半円情報として当該半円の円孤の
中心点座標値および孤の始点座標値および孤が延
びる方向つまり時計回りか反時計回りかの情報を
算出し、出力部60へ送る。出力部60はこれを
受け、例えば外部の記憶装置に格納するなどの出
力処理を行うと同時に交点群検出部57に新たな
交点群を検出するように指示を出す。交点群検出
部57は新たな交点群を検出する指示を受けると
交点レジスタ55内の交点情報を対象に交点群検
出処理を行い、交点群が検出できた場合には、上
記処理を繰り返して行い、半円を抽出する。一
方、新たな交点群が検出できない場合には制御部
54に交点群無しの指示を送る。制御部54はこ
れを受け、探査線を移動し、新たな探査線位置の
指示を交点検出部55へ送る。以下、上記処理を
新たな探査線上の画素データを対象に行う。 To operate this, a drawing is first inputted using the drawing input device 52 and stored in the frame memory 53. The control unit 54 sends an instruction of the search line position to the intersection detection unit 55. Upon receiving this, the intersection detection unit 55 first clears the intersection register 56, and then
Pixel data on the search line is read from the frame memory 53, a black line on the search line is detected, and the center pixel of the black run or a pixel close to the center is detected as an intersection. For example, if the direction of the search line is taken as the x-axis, the intersection information is stored by setting "1" to the address of the line register corresponding to the x-coordinate of the intersection. This operation is performed on the pixel data on the three search lines, and the intersection information is obtained for each search line.
Each is stored in three line registers within the intersection register 56. The intersection point group detection unit 57 sends an instruction to the control unit 5 that the intersection information has been stored in the intersection register 56.
4, and from the intersection information in the intersection register 56, that is, the address value "1" in the line register, an intersection consisting of six intersections that becomes a semicircle configuration candidate is determined based on the procedure explained in FIG. 3 above. The group is detected, and the address values of the six intersections are sent to the intersection set determining section 58. In response to this, the intersection set determining unit 58 divides the intersection group into a left intersection group and a right intersection group by comparing the address values of the intersection points for each search line, that is, for each line register. Next, by comparing the address values of each of the three intersections in the two-intersection set, the type of the intersection set is detected based on the classification table shown in FIG. Determine whether or not there is a possibility of forming a semicircle. If it is determined that there is no possibility, an instruction is issued to the intersection point group detection unit 57 to detect a new intersection point group. If it is determined that there is a possibility, the intersection set information is sent to the semicircle determining section 59. The semicircle determination unit 59 determines the x of the intersection obtained from the intersection set information.
Based on the y-coordinate value of the intersection obtained from the coordinate value and the position information of the exploration line sent from the control unit 54,
It is determined whether the six intersection points in the intersection set are on the same semicircle. If it is determined no, an instruction is issued to the intersection point group detection unit 57 to detect a new intersection point group. If it is determined to be a semicircle, the semicircle information includes the coordinates of the center point of the arc of the semicircle, the coordinates of the starting point of the arc, and the direction in which the arc extends, ie, clockwise or counterclockwise. It is calculated and sent to the output section 60. Upon receiving this, the output unit 60 performs output processing such as storing it in an external storage device, and at the same time issues an instruction to the intersection point group detection unit 57 to detect a new intersection group. When the intersection point group detection unit 57 receives an instruction to detect a new intersection point group, it performs an intersection point group detection process on the intersection information in the intersection point register 55, and if an intersection point group can be detected, repeats the above process. , extract a semicircle. On the other hand, if a new group of intersections cannot be detected, an instruction indicating that there is no group of intersections is sent to the control unit 54. In response to this, the control unit 54 moves the search line and sends an instruction of the new search line position to the intersection detection unit 55. Hereinafter, the above processing is performed on pixel data on a new exploration line.
かかる操作を例えば、はじめに探査線を水平方
向に設定し、図面の上から下へと順次移動しなが
ら行つたのちに、探査線を垂直方向に設定して、
図面の左から右へと順次移動しながら行うことに
よつて、1枚の図面の処理が完了する。 For example, this operation is performed by first setting the search line in the horizontal direction, moving sequentially from the top to the bottom of the drawing, and then setting the search line in the vertical direction.
By sequentially moving from left to right in the drawing, processing for one drawing is completed.
第7図aおよび第7図bは、第6図に示した装
置構成を計算機でシミユレーシヨンした本半円抽
出処理の実験結果を示したものであり、第7図a
は処理対象のA1版図面の一部分、第7図bは該
部分の抽出結果である。 Figures 7a and 7b show the experimental results of this semicircle extraction process, which is a computer simulation of the device configuration shown in Figure 6.
is a part of the A1 drawing to be processed, and FIG. 7b is the extraction result of this part.
本実験では、原図面上、円弧の半径が2〜3mm
で任意の傾きで書かれている半円を抽出対象とし
ている。また実験は、図面をフアクシミリ送信機
から8本/mmの解像度で読み込んだ2値図面デー
タを処理したものである。 In this experiment, the radius of the arc was 2 to 3 mm in the original drawing.
The extraction target is a semicircle drawn with an arbitrary slope. In addition, the experiment processed binary drawing data that was read from a facsimile transmitter at a resolution of 8 lines/mm.
(5) 効果の説明
以上説明したように、本発明によれば、3本の
探査線を用いて図面を走査し、該3本の探査線と
図形線との交点情報を用いて半円を抽出するよう
にしたため、第7図a、第7図bに示すように傾
きや大きさにバラツキのある半円を高速にかつ精
度よく抽出することができ、種々の傾きや大きさ
の半円が書かれている図面からの半円の自動抽出
が可能である利点がある。(5) Explanation of Effects As explained above, according to the present invention, a drawing is scanned using three search lines, and a semicircle is drawn using the intersection information of the three search lines and the figure line. As shown in Figures 7a and 7b, semicircles with varying inclinations and sizes can be extracted quickly and accurately. This method has the advantage that it is possible to automatically extract semicircles from drawings in which they are written.
第1図は本方式の原理説明図、第2図は探査線
方向と抽出対象半円の傾き範囲の説明図、第3図
は交点群検出処理説明図、第4図は交点組の分類
テーブルの説明図、第5図は探査線位置と交点群
の関係の説明図、第6図は本方式を実現する装置
構成例のブロツク図、第7図aおよび第7図bは
本方式の計算機シミユレーシヨンによる実験結果
の説明図である。
図中、1は半円、2は探査線群、3乃至8は図
形線と探査線の交点、9は半円、10乃至11は
探査線群、12乃至23は図形線と探査線の交
点、24は半円、25は探査線群、26乃至31
は図形線と探査線の交点、32乃至35は探査線
上の範囲、36は孤の端点、37は半円、38乃
至39は探査線群、40乃至51は図形線と探査
線の交点、52は図面入力端子、53はフレーム
メモリ、54は制御部、55は交点検出部、56
は交点レジスタ、57は交点群検出部、58は交
点組判定部、59は半円判定部、60は出力部で
ある。
Figure 1 is an illustration of the principle of this method, Figure 2 is an illustration of the direction of the search line and the range of inclination of the semicircle to be extracted, Figure 3 is an illustration of the intersection group detection process, and Figure 4 is a classification table of intersection groups. , FIG. 5 is an explanatory diagram of the relationship between the search line position and the group of intersections, FIG. 6 is a block diagram of an example of a device configuration that implements this method, and FIGS. 7 a and 7 b are computer diagrams of this method. FIG. 2 is an explanatory diagram of experimental results based on simulation. In the figure, 1 is a semicircle, 2 is a group of exploration lines, 3 to 8 are the intersections of the figure line and the exploration line, 9 is a semicircle, 10 to 11 are the group of exploration lines, and 12 to 23 are the intersections of the figure line and the exploration line. , 24 is a semicircle, 25 is a group of exploration lines, 26 to 31
is the intersection of the figure line and the exploration line, 32 to 35 is the range on the exploration line, 36 is the end point of the arc, 37 is a semicircle, 38 to 39 are the exploration line group, 40 to 51 are the intersections of the figure line and the exploration line, 52 is a drawing input terminal, 53 is a frame memory, 54 is a control section, 55 is an intersection detection section, 56
is an intersection register, 57 is an intersection group detection section, 58 is an intersection set determination section, 59 is a semicircle determination section, and 60 is an output section.
Claims (1)
おいて、平行で等間隔な3本の探査線を組として
図面上を走査して該探査線と図形線の交点を求め
る手段と、該交点の中で予め定めた距離の範囲内
にある6個の交点を該探査線上から各2個づつ選
び出す手段と、3個の点を通る円の中心及び半径
を求める手段を有し、該6個の交点の内で各探査
線上で左側にある3個の交点の第1の組と右側の
3個の交点の第2の組について、各組の2個の交
点で定まる直線と他の1個の交点との距離が予め
定めた範囲内にあるか否かを調べ、どちらか一方
の組の交点のみが此に該当する場合に、該直線あ
るいは該組の交点から最小自乗法で決められた直
線と、他の組の交点で決まる円の中心との距離が
予め定めた範囲内にあるとき、該円の中心位置、
半径、該直線の傾き、および該直線と円孤の向き
を半円情報として抽出することを特徴とする半円
抽出処理方式。1. In a semicircle extraction processing method for extracting a semicircle on a drawing, means for scanning the drawing with a set of three parallel and equally spaced exploration lines to find the intersection of the exploration line and the figure line, and the intersection means for selecting six intersection points within a predetermined distance range from the search line, two each, and means for determining the center and radius of a circle passing through the three points, For the first set of three intersection points on the left side and the second set of three intersection points on the right side among the intersection points of each search line, the straight line defined by the two intersection points of each set and the other one Check to see if the distance to the intersection of is within a predetermined range, and if only one of the intersection points falls under this condition, the distance from the intersection of the straight line or the intersection of the pair is determined by the method of least squares. When the distance between the straight line and the center of the circle determined by the intersections of other pairs is within a predetermined range, the center position of the circle,
A semicircle extraction processing method characterized by extracting the radius, the slope of the straight line, and the direction of the straight line and the arc as semicircle information.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59010757A JPS60153576A (en) | 1984-01-23 | 1984-01-23 | Processing method of semicircle extraction |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59010757A JPS60153576A (en) | 1984-01-23 | 1984-01-23 | Processing method of semicircle extraction |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60153576A JPS60153576A (en) | 1985-08-13 |
| JPH0136149B2 true JPH0136149B2 (en) | 1989-07-28 |
Family
ID=11759194
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59010757A Granted JPS60153576A (en) | 1984-01-23 | 1984-01-23 | Processing method of semicircle extraction |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60153576A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4886723B2 (en) * | 2008-03-25 | 2012-02-29 | 富士フイルム株式会社 | Similar semicircle detection device and similar semicircle detection program |
-
1984
- 1984-01-23 JP JP59010757A patent/JPS60153576A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60153576A (en) | 1985-08-13 |
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