JPH0140004Y2 - - Google Patents

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Publication number
JPH0140004Y2
JPH0140004Y2 JP7670383U JP7670383U JPH0140004Y2 JP H0140004 Y2 JPH0140004 Y2 JP H0140004Y2 JP 7670383 U JP7670383 U JP 7670383U JP 7670383 U JP7670383 U JP 7670383U JP H0140004 Y2 JPH0140004 Y2 JP H0140004Y2
Authority
JP
Japan
Prior art keywords
measured
length measuring
movable rod
movable
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7670383U
Other languages
Japanese (ja)
Other versions
JPS59180609U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to JP7670383U priority Critical patent/JPS59180609U/en
Publication of JPS59180609U publication Critical patent/JPS59180609U/en
Application granted granted Critical
Publication of JPH0140004Y2 publication Critical patent/JPH0140004Y2/ja
Granted legal-status Critical Current

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  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)

Description

【考案の詳細な説明】 この考案は温度補正機能を持つ測長器に関す
る。
[Detailed description of the invention] This invention relates to a length measuring device with a temperature correction function.

〈考案の背景〉 各種の構築物或は建造物等において経年変化或
は温度変化による変形等を調べる上で微小な寸法
の変化を測定することが要求される。
<Background of the invention> In order to investigate deformation due to aging or temperature changes in various structures or structures, it is required to measure minute changes in dimensions.

〈考案の目的〉 この考案はこのような要求に対して満すことが
できる温度補正機能を持つ測長器を提供しようと
するものである。
<Purpose of the invention> The purpose of this invention is to provide a length measuring device with a temperature correction function that can meet these requirements.

〈考案の実施例〉 第1図以下にこの考案の一実施例を示す。第1
図はこの考案による測長器の外観を説明するため
の正面図、第2図は第1図に示す−線上の断
面図、第3図は第1図に示す−線上の断面図
である。図に示す例ではレールの熱膨張による寸
法変化を測定する状態について示している。つま
りレール1に第2図に示すように2つのピン2a,
2bを植設しておき、このピン2a,2b間の寸法を
測定し、そのときのレールの温度と対応させてレ
ール1に蓄積された軸応力を算出するための測長
器を例示して示す。従つてこゝではレール1を被
測定体と称することとする。
<Example of the invention> An example of the invention is shown below in Figure 1. 1st
The figure is a front view for explaining the external appearance of the length measuring instrument according to this invention, FIG. 2 is a sectional view taken along the line - shown in FIG. 1, and FIG. 3 is a sectional view taken along the line - shown in FIG. 1. The example shown in the figure shows a state in which dimensional changes due to thermal expansion of the rail are measured. In other words, as shown in Figure 2, there are two pins 2a on rail 1,
2b is installed, measures the dimension between these pins 2a and 2b, and calculates the axial stress accumulated in the rail 1 by correlating it with the temperature of the rail at that time. show. Therefore, hereinafter, the rail 1 will be referred to as the object to be measured.

図中3は被測定体1に着脱機構によつて取付け
ることができるアタツチメントを示す。つまりア
タツチメント3はツマミナツト3aにより被測定
体1に固定する。アタツチメント3には固定板4
が取付けられる。固定板4はその板面が水平とな
るようにアタツチメント3にツマミネジ5によつ
て締付け固定される。このときツマミネジ5は固
定板4に形成した長孔6(第2図参照)を貫通
し、この長孔6によつて固定板4は被測定体1に
対して進退できるようにし、その先端4aが被測
定体1に接触する状態に調整できる構造になつて
いる。
In the figure, numeral 3 indicates an attachment that can be attached to the object to be measured 1 by a detachable mechanism. That is, the attachment 3 is fixed to the object to be measured 1 by the knob nut 3a. Attachment 3 has a fixing plate 4
is installed. The fixing plate 4 is fastened and fixed to the attachment 3 with a thumb screw 5 so that the plate surface is horizontal. At this time, the thumb screw 5 passes through an elongated hole 6 (see FIG. 2) formed in the fixing plate 4, and the elongated hole 6 allows the fixing plate 4 to move forward and backward with respect to the object to be measured 1. It has a structure that can be adjusted so that it is in contact with the object to be measured 1.

7は固定板4上に支持された測長器本体を示
す。この測長器本体7は第5図に示すように底面
にコロ8を有し、このコロ8によつて固定板4の
上で可及的に小さい摩擦抵抗で被測定体1と平行
する方向に移動できるようになつている。
Reference numeral 7 indicates a length measuring instrument main body supported on the fixed plate 4. This length measuring device main body 7 has rollers 8 on the bottom surface as shown in FIG. It is now possible to move to

次に測長器本体7の内部構造について第4図及
び第5図を用いて説明する。
Next, the internal structure of the length measuring device main body 7 will be explained using FIGS. 4 and 5.

第4図及び第5図において9は測長器本体7を
支持する基板を示す。11は基板9の上を被うカ
バーを示す。12は固定測長片である。この固定
測長片12は基板9に固定され、その先端が被測
定体1に接触できるようにカバー11に形成した
窓11aを通じて外部に突出する。13は可動測
長片を示す。この可動測長片13は可動ロツド1
4に取付けられ、可動ロツド14を移動させるこ
とにより被測定体1と平行する方向に移動できる
構造となつている。
In FIGS. 4 and 5, reference numeral 9 indicates a substrate that supports the length measuring device main body 7. As shown in FIG. Reference numeral 11 indicates a cover that covers the substrate 9. 12 is a fixed length measuring piece. This fixed length measuring piece 12 is fixed to the substrate 9, and its tip protrudes to the outside through a window 11a formed in the cover 11 so that it can come into contact with the object to be measured 1. 13 indicates a movable length measuring piece. This movable length measuring piece 13 is connected to the movable rod 1
4, and can be moved in a direction parallel to the object to be measured 1 by moving the movable rod 14.

可動ロツド14は付勢手段15を介して微少変
位センサ16に連結される。付勢手段15はシリ
ンダ17と、可動ロツド14の遊端に取付けたフ
ランジ18と、このフランジ18とシリンダ17
の端部との間に介挿したスプリング19とによつ
て構成することができる。この付勢手段15によ
れば可動ロツド14は図示の状態において右方向
に偏倚力を受ける。この偏倚力はストツパ20に
よつて受け止められ、ストツパ20によつて固定
測長片12と可動測長片13の面12aと13a
の距離Lが予め決めた規定値となるようにしてい
る。距離Lはピン2a,2bの内側の間隔よりわ
ずかに大きい値に設定する。この設定はストツパ
20によつて標準温度20℃において行なう。尚2
1は円筒形のシリンダ17を基板9上に固定する
ためのアタツチメントを示す。つまりこのアタツ
チメント21は外形が角形をなし、その中心にシ
リンダ17が貫通する孔を有し、この孔にシリン
ダ17を嵌着する。角形アタツチメント21はそ
の一つの面を基板9に接触させ、基板9の裏側か
ら角形アタツチメント21をビス止めする。
The movable rod 14 is connected to a minute displacement sensor 16 via a biasing means 15. The biasing means 15 includes a cylinder 17, a flange 18 attached to the free end of the movable rod 14, and the flange 18 and the cylinder 17.
A spring 19 is inserted between the end of the spring 19 and the end of the spring 19. According to this biasing means 15, the movable rod 14 receives a biasing force in the right direction in the illustrated state. This biasing force is received by the stopper 20, and the stopper 20 pushes the surfaces 12a and 13a of the fixed length measuring piece 12 and the movable length measuring piece 13.
The distance L is set to a predetermined value. The distance L is set to a value slightly larger than the inner distance between the pins 2a and 2b. This setting is performed using the stopper 20 at a standard temperature of 20°C. Sho 2
1 indicates an attachment for fixing a cylindrical cylinder 17 on the substrate 9. That is, this attachment 21 has a rectangular outer shape and has a hole in the center thereof through which the cylinder 17 passes, and the cylinder 17 is fitted into this hole. One surface of the square attachment 21 is brought into contact with the substrate 9, and the square attachment 21 is screwed from the back side of the substrate 9.

微少変位センサ16は例えば差動トランス或は
マグネスケール(商品名)等の変位センサを用い
ることができる。図の例ではマグネスケールを用
いた場合を示す。16aは検出ヘツド部分を示
す。検出ヘツド部分16aは貫通孔を有し、この
貫通孔に可動素子、つまり磁気スケール16bが
挿通される。磁気スケール16bの端部はアタツ
チメント22を介して可動ロツド14の端部に連
結される。
As the minute displacement sensor 16, for example, a differential transformer or a displacement sensor such as Magnescale (trade name) can be used. The example in the figure shows the case where Magnescale is used. 16a indicates a detection head portion. The detection head portion 16a has a through hole into which a movable element, that is, a magnetic scale 16b is inserted. The end of the magnetic scale 16b is connected to the end of the movable rod 14 via an attachment 22.

微少変位センサ16を保持するボデイはシリン
ダ17の端部に挿入しておくだけの構造であるた
め、この例では微少変位センサ16のボデイを板
バネ23により押圧し、微少変位センサ16をシ
リンダ17に対してガタツキなく保持するように
している。
Since the body holding the minute displacement sensor 16 is simply inserted into the end of the cylinder 17, in this example, the body of the minute displacement sensor 16 is pressed by the leaf spring 23, and the minute displacement sensor 16 is inserted into the cylinder 17. It is designed to be held without wobbling.

24は可動測長片13を矢印X方向に移動させ
るための操作レバーを示す。この操作レバー24
はバネ25によつて反時計方向に回動偏倚されそ
の先端24aは可動測長片13から離れる方向に
偏倚されている。レバー24の回動支持軸26は
減速手段27に連結される。減速手段27は例え
ば多段結合された歯車輪列によつて構成すること
ができる。レバー24を時計方向に回動操作し、
回動操作状態から解放すると、レバー24がバネ
25の偏倚力により反時計方向に回転する。この
とき減速手段27によりレバー24の回転速度が
制限され、一定の低速度で元の位置まで戻るよう
に動作する。
Reference numeral 24 indicates an operating lever for moving the movable length measuring piece 13 in the direction of arrow X. This operating lever 24
is rotated and biased counterclockwise by a spring 25, and its tip 24a is biased in a direction away from the movable length measuring piece 13. A rotation support shaft 26 of the lever 24 is connected to a deceleration means 27. The speed reduction means 27 can be constructed, for example, by a gear train connected in multiple stages. Rotate the lever 24 clockwise,
When the lever 24 is released from the rotational operation state, the lever 24 is rotated counterclockwise by the biasing force of the spring 25. At this time, the rotational speed of the lever 24 is limited by the deceleration means 27, and the lever 24 operates to return to its original position at a constant low speed.

28は操作レバー24を時計方向に回動させた
場合、その最大回動位置において操作レバー24
をロツクしておくためのロツク用レバーを示す。
操作レバー24の回動支持軸26には円板29が
取付けられ、円板29に円弧状の長溝31を形成
し、長溝31の端部に凹部32を形成する。ロツ
ク用レバー28はバネ33の偏倚力によつて軸3
4を中心に反時計方向に付勢されている。よつて
操作レバー24を時計方向に回動操作し、最大回
動位置に達するとロツク用レバー28の先端に取
付けたピン35が凹部32に係合し、操作レバー
24が反時計方向に回動することを阻止し、その
状態に保持する。このロツク状態を解くにはロツ
ク用レバー28の遊端を押圧操作すればよい。こ
のようにしてロツク用レバー28を軸34を中心
に時計方向に回動させ、ピン35を凹部32から
外すことにより操作レバー24はロツク状態から
外れ低速度で反時計方向に回動を始める。
Reference numeral 28 indicates that when the operating lever 24 is rotated clockwise, the operating lever 24 is at its maximum rotation position.
Shows the locking lever for keeping it locked.
A disk 29 is attached to the rotation support shaft 26 of the operating lever 24, and a circular arc-shaped long groove 31 is formed in the disk 29, and a recess 32 is formed at the end of the long groove 31. The locking lever 28 is moved to the shaft 3 by the biasing force of the spring 33.
It is biased counterclockwise around point 4. Therefore, the operating lever 24 is rotated clockwise, and when the maximum rotation position is reached, the pin 35 attached to the tip of the locking lever 28 engages with the recess 32, and the operating lever 24 is rotated counterclockwise. prevent it from happening and keep it in that state. To release this locked state, the free end of the locking lever 28 can be pressed. In this manner, the locking lever 28 is rotated clockwise about the shaft 34 and the pin 35 is removed from the recess 32, whereby the operating lever 24 is released from the locked state and begins to rotate counterclockwise at a low speed.

このとき可動測長片13は操作レバー24の回
動に追従して矢印X′方向に低速度で移動する。
At this time, the movable length measuring piece 13 follows the rotation of the operating lever 24 and moves at a low speed in the direction of arrow X'.

35は基板9に取付けた温度センサを示す。こ
の温度センサ35は主に基板9とカバー11内の
温度を測定し、電気信号としてコネクタ36から
外部に送出する。またコネクタ36には微少変位
センサ16の検出信号も供給され、外部に取出す
ことができるようになつている。
35 indicates a temperature sensor attached to the substrate 9. This temperature sensor 35 mainly measures the temperature inside the board 9 and cover 11 and sends it to the outside from the connector 36 as an electrical signal. A detection signal from the minute displacement sensor 16 is also supplied to the connector 36, and can be taken out to the outside.

第6図はこの考案による測長器の電気的な構成
を示す。第6図において16は微少変位センサを
示す。この微少変位センサ16として上記したよ
うにマグネスケールを用いたとすると可動素子1
6bが磁気ヘツド部分16aに対して相対的に位
置ずれを生じるとパルスが出力される。このパル
スを計数することにより可動ロツド14の移動量
を知ることができる。パルスは多相パルスで出力
され、移動方向に応じて多数パルスの位相が逆転
する。よつてこの多相パルスの位相により移動方
向を知ることができ、パルスの数を計数すること
により移動量を検知できる。37はアツプダウン
カウンタを示し、このアツプダウンカウンタ37
により微少変位センサ16から出力される多相パ
ルスをその位相に応じてアツプカウント及びダウ
ンカウントする。つまり可動測長片13が矢印X
方向に移動するときアツプダウンカウンタ37は
ダウンカウントし、可動測長片13が矢印X′方
向に移動するときアツプカウントする。アツプダ
ウンカウント37の数計値と距離定数回路39か
ら距離に変換する信号を距離算出回路38に与
え、この算出回路38において距離値に変換しこ
の距離値を補正回路40に与える。補正回路40
では温度センサ35から出力された温度に対応し
た信号をA−D変換器41によつてデイジタル信
号に変換し、このデイジタル信号を補正値算出回
路42に与える。この補正値算出回路42には距
離定数回路39から距離値Lに相当する信号を与
える。また線膨張係数設定器43から線膨張係数
に相当する信号を与え、温度補正信号を算出す
る。この温度補正信号は主に基板9と可動ロツド
14の温度変化に伴なつて生じる伸縮量を補正す
るものである。その補正値Δlは Δl=Lα(t2−t1) (1) で求められる。こゝでLは測長片12−13間の
最大距離の値、αは基板9及び可動ロツド14の
線膨張係数、t1は標準温度(例えば20℃)、t2
測定温度である。
FIG. 6 shows the electrical configuration of the length measuring device according to this invention. In FIG. 6, 16 indicates a minute displacement sensor. If Magnescale is used as this minute displacement sensor 16 as described above, the movable element 1
A pulse is output when the magnetic head 6b is displaced relative to the magnetic head portion 16a. By counting these pulses, the amount of movement of the movable rod 14 can be determined. Pulses are output as multiphase pulses, and the phases of multiple pulses are reversed depending on the direction of movement. Therefore, the direction of movement can be determined by the phase of this multiphase pulse, and the amount of movement can be detected by counting the number of pulses. 37 indicates an up-down counter, and this up-down counter 37
The multiphase pulses output from the minute displacement sensor 16 are up-counted and down-counted according to their phases. In other words, the movable length measuring piece 13 is
When the movable length measuring piece 13 moves in the direction of the arrow X', the up/down counter 37 counts down, and when the movable length measuring piece 13 moves in the direction of the arrow X', it counts up. The numerical value of the up-down count 37 and a signal to be converted into a distance from the distance constant circuit 39 are supplied to a distance calculation circuit 38, which converts it into a distance value, and this distance value is supplied to a correction circuit 40. Correction circuit 40
Then, the signal corresponding to the temperature output from the temperature sensor 35 is converted into a digital signal by the A/D converter 41, and this digital signal is provided to the correction value calculation circuit 42. A signal corresponding to the distance value L is supplied to the correction value calculation circuit 42 from the distance constant circuit 39. Further, a signal corresponding to the linear expansion coefficient is given from the linear expansion coefficient setting device 43, and a temperature correction signal is calculated. This temperature correction signal is mainly used to correct the amount of expansion and contraction that occurs in the substrate 9 and the movable rod 14 due to temperature changes. The correction value Δl is obtained by Δl=Lα(t 2 −t 1 ) (1). Here, L is the value of the maximum distance between the measuring pieces 12-13, α is the coefficient of linear expansion of the substrate 9 and the movable rod 14, t1 is the standard temperature (for example, 20°C), and t2 is the measurement temperature.

補正値算出回路42から得られた補正値Δlを
補正回路40に与え、測定距離値に加えて測定距
離値を温度補正する。補正された距離信号を表示
器44に与えその値を表示する。
The correction value Δl obtained from the correction value calculation circuit 42 is given to the correction circuit 40, and in addition to the measured distance value, the measured distance value is subjected to temperature correction. The corrected distance signal is given to the display 44 and its value is displayed.

〈考案の作用〉 上述した測長器の操作順序は以下の如くであ
る。
<Operation of the device> The operation sequence of the length measuring device described above is as follows.

(1) 固定板4を予め後退させた状態でアタツチメ
ント3を被測定体1に取付ける。
(1) Attach the attachment 3 to the object to be measured 1 with the fixing plate 4 retracted in advance.

(2) アタツチメント3を被測定体1に取付けた後
に固定板を前進させ先端4aを被測定体1に接
触させる。このとき操作レバー24を最大回動
位置まで回動偏倚させロツク状態にしておく。
この状態で測長片12及び13を被測定体1に
植設したピン2a,2bの互に対向する間に挿
入する。このとき固定測長片12をピン2aの
内側の面に接触させておく。
(2) After attaching the attachment 3 to the object to be measured 1, move the fixing plate forward to bring the tip 4a into contact with the object to be measured 1. At this time, the operating lever 24 is rotated to the maximum rotation position and kept in a locked state.
In this state, the length measuring pieces 12 and 13 are inserted between the mutually opposing pins 2a and 2b implanted in the object to be measured 1. At this time, the fixed length measuring piece 12 is kept in contact with the inner surface of the pin 2a.

(3) 準備が完了したらロツク用レバー28の遊端
部を押圧操作し、操作レバー24のロツクを解
除する。
(3) When preparations are complete, press the free end of the locking lever 28 to release the lock of the operating lever 24.

(4) ロツク用レバー28は減速手段27の作用に
よりゆつくりと回動し、測長片13をゆつくり
とピン2bに向つて移動させる。測長片13が
ピン2bに当接すると、可動ロツド14の移動
が停止する。
(4) The locking lever 28 is rotated slowly by the action of the deceleration means 27, and the length measuring piece 13 is slowly moved toward the pin 2b. When the length measuring piece 13 comes into contact with the pin 2b, the movement of the movable rod 14 is stopped.

(5) このとき表示器44に表示される表示値がピ
ン2a,2b間の距離値である。操作レバー2
4を再び付勢し再度測定を行なう。この測定操
作を所要回行なつて測定値を確認する。
(5) The display value displayed on the display 44 at this time is the distance value between the pins 2a and 2b. Operation lever 2
4 is energized again and the measurement is performed again. Repeat this measurement operation as many times as necessary to confirm the measured value.

つまり操作レバー24を回動操作したときは、
ストツパ20によつて予め決められた基準距離L
からその移動量X1に対応した量のパルス数が減
算され、移動量X1が計測される。
In other words, when the operating lever 24 is rotated,
Reference distance L predetermined by stopper 20
The number of pulses corresponding to the amount of movement X1 is subtracted from the amount of movement X1, and the amount of movement X1 is measured.

その位置で操作レバー24のロツクを解除する
と、可動測長片13がゆつくりと元の位置に向つ
て移動する。このとき可動測長片13がピン2a
に係合するまでパルスを加算し移動量X2を計測
する。可動測長片13がピン2aに係合して停止
した状態で表示器にはL−(X1−X2)が表示さ
れ、ピン2aと2bの間の距離値が表示される。
When the operating lever 24 is unlocked at that position, the movable length measuring piece 13 slowly moves toward its original position. At this time, the movable length measuring piece 13 is connected to the pin 2a.
Pulses are added until it engages, and the amount of movement X 2 is measured. When the movable length measuring piece 13 is engaged with the pin 2a and stopped, L-( X1 - X2 ) is displayed on the display, and the distance value between the pins 2a and 2b is displayed.

この測定操作を所要回行なつて測定値を確認す
る。
Repeat this measurement operation as many times as necessary to confirm the measured value.

〈考案の効果〉 以上説明したようにこの考案によれば基板9の
温度及びその周囲温度を測定し、その温度値に応
じて測長片12及び13間の距離値を補正するよ
うに構成したから、温度が変わつて基板9及び可
動ロツド14の熱膨張により測長片12及び13
間の距離値が変化しても、その変動を補正し、常
に初期値を保つことができる。よつて温度変動に
関係なく、常に正しい微少変形を測定できる。
<Effects of the invention> As explained above, according to this invention, the temperature of the substrate 9 and its surrounding temperature are measured, and the distance value between the length measuring pieces 12 and 13 is corrected according to the measured temperature values. As the temperature changes, the length measuring pieces 12 and 13 expand due to thermal expansion of the substrate 9 and the movable rod 14.
Even if the distance value between them changes, the change can be corrected and the initial value can always be maintained. Therefore, accurate minute deformation can always be measured regardless of temperature fluctuations.

更に測長器本体7をコロ8によつて固定板4の
上に摩擦抵抗を少なくして支持したから可動測長
片13が被測定物1のピン2bに当接したとき、
この当接力を他方の固定測長片12にも与えるこ
とができる。よつてピン2a,2bに均等に圧接
力を与えることができ、この点でも正確な精密測
定が可能である。
Furthermore, since the length measuring device main body 7 is supported on the fixed plate 4 by the rollers 8 with reduced frictional resistance, when the movable length measuring piece 13 comes into contact with the pin 2b of the object to be measured 1,
This contact force can also be applied to the other fixed length measuring piece 12. Therefore, pressure contact force can be applied equally to the pins 2a and 2b, and accurate and precise measurements can be made in this respect as well.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案による測長器の外観の一例を
示す正面図、第2図は第1図の−線上の断面
図、第3図は第1図の−線上の断面図、第4
図はこの考案の要部の内部構造を説明するための
一部を断面とした平面図、第5図はその側面図、
第6図はこの考案による測長器の電気回路の構成
を説明するためのブロツク図である。 1:被測定体、2a,2b:ピン、3:アタツ
チメント、4:固定板、7:測長器本体、8:コ
ロ、9:基板、12:固定測長片、13:可動測
長片、14:可動ロツド、15:付勢手段、1
6:微少変位センサ、16b:可動素子、20:
ストツパ、24:操作レバー、27:減速手段、
40:温度補正回路。
Fig. 1 is a front view showing an example of the external appearance of the length measuring instrument according to this invention, Fig. 2 is a sectional view taken along the - line in Fig. 1, Fig. 3 is a sectional view taken along the - line in Fig. 1, and Fig. 4 is a sectional view taken along the - line in Fig. 1.
The figure is a partially sectional plan view to explain the internal structure of the main part of this invention, and Figure 5 is a side view thereof.
FIG. 6 is a block diagram for explaining the configuration of the electric circuit of the length measuring device according to this invention. 1: object to be measured, 2a, 2b: pin, 3: attachment, 4: fixed plate, 7: length measuring device body, 8: roller, 9: board, 12: fixed length measuring piece, 13: movable length measuring piece, 14: Movable rod, 15: Biasing means, 1
6: minute displacement sensor, 16b: movable element, 20:
Stopper, 24: Operation lever, 27: Deceleration means,
40: Temperature correction circuit.

Claims (1)

【実用新案登録請求の範囲】 A 被測定体に着脱機構によつて固定される固定
板と、 B この固定板上に可及的に小さい摩擦抵抗で被
測定体と平行する方向に摺動できるように支持
された基板と、 C この基板に固定され遊端が上記被測定体に向
つて突出した固定測長片と、 D 上記基板に固定された微少変位センサと、 E この微少変位センサの可動素子と連結され、
上記被測定体と平行する方向に移動自在に支持
された可動ロツドと、 F この可動ロツドの他端側に取付けられた可動
測長片と、 G 上記可動ロツドにその遊端方向に向う偏倚力
を与える付勢手段と、 H この付勢手段によつて偏倚される上記可動ロ
ツドの遊端と衝合し、上記可動測長片を基準点
で支持するストツパと、 I 上記可動ロツドを上記付勢手段の偏倚力に抗
して移動させ、その状態から解放させたとき上
記可動ロツドを低速度で元の位置に戻す減速手
段と、 J 上記基板に取付けられ主に上記基板及び可動
ロツド周縁の温度を測定する温度センサと、 K この温度センサによつて測定した温度により
上記測長センサで測定した距離の値を補正する
補正回路と、 から成る温度補正機能を持つ測長器。
[Claims for Utility Model Registration] A. A fixed plate that is fixed to the object to be measured by an attachment/detachment mechanism, and B. A device that can slide on this fixed plate in a direction parallel to the object to be measured with as little frictional resistance as possible. C. A fixed length measuring piece fixed to this substrate and having a free end protruding toward the object to be measured; D. A minute displacement sensor fixed to the substrate; E. connected to a movable element;
A movable rod supported movably in a direction parallel to the object to be measured; F A movable length measuring piece attached to the other end of the movable rod; G A biasing force directed toward the free end of the movable rod. H a stopper that abuts the free end of the movable rod biased by the biasing means and supports the movable length measuring piece at a reference point; a deceleration means for moving the movable rod against the biasing force of the biasing means and returning the movable rod to its original position at a low speed when released from that state; A length measuring device having a temperature correction function, comprising: a temperature sensor that measures temperature; and a correction circuit that corrects the distance value measured by the length measurement sensor based on the temperature measured by the temperature sensor.
JP7670383U 1983-05-20 1983-05-20 Length measuring device with temperature correction function Granted JPS59180609U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7670383U JPS59180609U (en) 1983-05-20 1983-05-20 Length measuring device with temperature correction function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7670383U JPS59180609U (en) 1983-05-20 1983-05-20 Length measuring device with temperature correction function

Publications (2)

Publication Number Publication Date
JPS59180609U JPS59180609U (en) 1984-12-03
JPH0140004Y2 true JPH0140004Y2 (en) 1989-12-01

Family

ID=30206751

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7670383U Granted JPS59180609U (en) 1983-05-20 1983-05-20 Length measuring device with temperature correction function

Country Status (1)

Country Link
JP (1) JPS59180609U (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0614065B2 (en) * 1988-10-19 1994-02-23 本田技研工業株式会社 Gas rate sensor

Also Published As

Publication number Publication date
JPS59180609U (en) 1984-12-03

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