JPH0146818B2 - - Google Patents
Info
- Publication number
- JPH0146818B2 JPH0146818B2 JP55055993A JP5599380A JPH0146818B2 JP H0146818 B2 JPH0146818 B2 JP H0146818B2 JP 55055993 A JP55055993 A JP 55055993A JP 5599380 A JP5599380 A JP 5599380A JP H0146818 B2 JPH0146818 B2 JP H0146818B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- frequency
- voltage converter
- level threshold
- particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 claims description 78
- 239000007788 liquid Substances 0.000 claims description 20
- 238000001514 detection method Methods 0.000 claims description 16
- 238000004458 analytical method Methods 0.000 claims description 2
- 230000035945 sensitivity Effects 0.000 description 26
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 14
- 238000006243 chemical reaction Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 8
- 230000001186 cumulative effect Effects 0.000 description 7
- 238000005259 measurement Methods 0.000 description 5
- 239000011780 sodium chloride Substances 0.000 description 5
- 230000002159 abnormal effect Effects 0.000 description 3
- 239000000725 suspension Substances 0.000 description 3
- 210000000601 blood cell Anatomy 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 210000003743 erythrocyte Anatomy 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000011109 contamination Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000002504 physiological saline solution Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
- G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
- G01N15/131—Details
- G01N15/132—Circuits
Landscapes
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Dispersion Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Description
〔産業上の利用分野〕
本発明は、液体に浮懸する血球などの粒子を微
細孔に通過させ、液と粒子との電気インピーダン
スの差異に基づいて粒子を検出する形式の粒子分
析装置、詳しくは、3種類の閾値回路を使用し
て、粒子の濃度に関係なく自動的に感度を正確に
調整することができる粒子分析装置に関するもの
である。
〔従来の技術〕
従来から、血球などの粒子を生理食塩水などの
液体に浮懸させ、粒子が通過できる程度に狭あい
に形成された微細孔に通過させ、液と粒子との電
気インピーダンスの差異に基づいて粒子を検出
し、さらに検出信号の大きさから粒子の大きさを
分析する装置が用いられているが、この粒子分析
装置においては、液の温度や食塩などの電解質濃
度により液自体のインピーダンスが変化し、した
がつて検出感度が変化し、このため異なつた液に
おける粒子の経時変化の対比や種々の薬品に対す
る変化特性を試験する際には、予め感度変化分を
計算して補正するとか、あるいは液のインピーダ
ンス測定用の電極を付設して、別途感度を調整す
る方法などがとられている。
〔発明が解決しようとする問題点〕
しかし前者の方法(予め感度変化分を計算して
補正する方法)を採用して、たとえば自動演算装
置を内蔵させて補正演算を行い、補正後の分析結
果が出力されるようにしても、異なつた液にする
都度データをインプツトする必要があり、また後
者の方法(液のインピーダンス測定用の電極を付
設する方法)は、装置が複雑化する上に試料の付
着などによる試料相互間の汚染が生じるなどの問
題があつた。上記のいずれの方法を採用するにし
ても、電気インピーダンスが異なる液に変更する
際には前もつて次に使用する液で検出装置を十分
に洗浄する必要がある。
つぎに本発明者が行つた実験結果について説明
する。第1図および第2図は同一粒子で食塩水濃
度を変えたときの粒子検出装置の出力信号波形で
ある。本測定例は、比抵抗の差異に基づく定電流
源からの電圧変化を検出することによつて得られ
た結果である。すなわち第1図は、通常の生理食
塩水(0.9%食塩水)の濃度で測定した例であり、
第2図は0.4%食塩水に同一粒子を浮懸した例で
ある。電流が一定であるためにインピーダンス変
化分の絶対値が高い0.4%食塩水中の方が大きい
パルスとなり、検出感度が第2図に示すように増
大する。以上の差を粒度分布曲線で表わしたもの
が第3図および第4図である。第3図は0.9%食
塩水の場合、第4図は0.4%食塩水の場合で、実
線は累積の粒度分布曲線を示し、破線は通常の粒
度分布曲線を示している。
なお標準粒子を用いて装置の感度を調整する方
法を実施する場合、かなり粒径の揃つた粒子を用
いても、必ず粒径の差が生じて通常は正規分布を
示す。そのために1つの方法として、平均粒子体
積を積分回路と割算回路とを用いて求め、常に一
定の平均粒子体積となるように感度を調整する方
法が考えられる。しかしながら、検出パルスを高
速でAD変換する回路、それらのパルスを積分す
る回路および積分した値を検出パルス数で割算す
る回路など複雑な回路構成が必要であり、たとえ
ば血球計数装置などに内蔵するにはあまりにもコ
ストアツプとなる。
本出願人は、本願と同日付で高レベル(Hレベ
ル)の閾値回路と低レベル(Lレベル)の閾値回
路とを備えた粒子分析装置を、特願昭55−55991
号、特願昭55−55992号として特許出願している
が、これらはLレベルを基準レベルとするので、
Lレベルは本願の第9図に示されるように、累積
粉度分布の平坦な部分(以下、平坦部という)に
あり、しかも安定な状態になければならない。す
なわち、長くのびた平坦部の中にLレベルがなけ
ればならない。もし本願の第10図のような状態
にあれば、Lレベルはノイズを数え込んでしまう
し、第11図の状態では、わずかな感度変化でL
レベルが平坦部からはずれてしまうので、計数が
不安定となる。ところが、基準レベルが1つしか
ないと、第9図〜第11図のどの状態にあるのか
判別できない。そのため感度調整が正確にできな
いことがあるという問題点がある。
本発明は上記の諸点に鑑みなされたもので、粒
子浮懸液の濃度に無関係に感度を自動的に正確に
調整することができ、かつ回路構成が簡単な粒子
分析装置の提供を目的とするものである。
〔問題点を解決するための手段〕
本発明の粒子分析装置は、図面を参照して説明
すれば、液体中に浮懸する粒子を微細孔に通過さ
せ粒子と粒子浮懸液との電気的差異に基づいて粒
子を検出し粒子の大きさに比例した電気信号を発
生する粒子検出装置1と、この粒子検出装置に接
続された可変増幅器2と、この可変増幅器に並列
に接続された高レベル閾値回路3、中レベル閾値
回路4および低レベル閾値回路5と、高レベル閾
値回路に接続された第1周波数・電圧変換装置6
と、中レベル閾値回路に接続された第2周波数・
電圧変換装置7および計数回路17と、低レベル
閾値回路に接続された第3周波数・電圧変換装置
8と、第1周波数・電圧変換装置に接続された増
幅器10と、この増幅器および第2周波数・電圧
変換装置に接続された第1比較回路11と、第2
周波数・電圧変換装置および第3周波数・電圧変
換装置に接続された第2比較回路12と、第1比
較回路および第2比較回路に接続された比較増幅
器13と、この比較増幅器と前記可変増幅器との
間に設けられたフイードバツク回路とを包含する
ことを特徴としている。
フイードバツク回路としては、サーボモータ1
4によりフイードバツク抵抗15を調節する機構
からなるもの、AD変換回路16でAD変換され
たフイードバツク信号で抵抗を調節する機構から
なるものなどが用いられる。
〔作用〕
粒子検出装置1で粒子と液とのインピーダンス
の差異に基づいて検出されパルスに変換された信
号は、可変増幅器2に入力される。可変増幅器2
の出力は、閾値回路3,4,5へ送られ、それぞ
れ周波数・電圧変換装置6,7,8で単位時間当
りの粒子数としてアナログ電圧に変換される。中
レベル閾値回路4を出た信号は後属の計数回路1
7またはその他の処理回路へ送られる。高レベル
側のアナログ電圧は増幅器10で増幅されて第1
比較回路11に送られ、ここで中レベル側のアナ
ログ電圧との割合が比較される。また中レベル側
のアナログ電圧および低レベル側のアナログ電圧
は第2比較回路12へ送られて割合が比較され
る。第1比較回路11および第2比較回路12を
出た信号は比較増幅器13で比較され、フイード
バツク回路で可変増幅器2にフイードバツクされ
る。ここでかりに、浮懸液濃度たとえば食塩水濃
度が変わつて第2図および第4図に示すように感
度が変化したときには、LレベルとHレベルとの
間に差がなくなり、設定した割合にならないため
に、フイードバツク回路から感度を下げるように
信号が伝達され、可変増幅器2の感度を下げるよ
うに動作する。このように高レベル、中レベル、
低レベルの3つの系により監視を行つて常に最適
なレベルで粒子測定を行う。
〔実施例〕
以下、本発明の実施例を図面に基づいて説明す
る。本例の粒子分析装置は第5図に示すように、
液体中に浮懸する粒子を微細孔に通過させ粒子と
粒子浮懸液との電気的差異に基づいて粒子を検出
し粒子の大きさに比例した電気信号を発生する粒
子検出装置1と、この粒子検出装置1に接続され
た可変増幅器2と、この可変増幅器2に並列に接
続された高レベル閾値回路3、中レベル閾値回路
4および低レベル閾値回路5と、高レベル閾値回
路3に接続された第1周波数・電圧変換装置6
と、中レベル閾値回路4に接続された第2周波
数・電圧変換装置7および計数回路17と、低レ
ベル閾値回路5に接続された第3周波数・電圧変
換装置8と、第1周波数・電圧変換装置6に接続
された増幅器10と、この増幅器10および第2
周波数・電圧変換装置7に接続された第1比較回
路11と、第2周波数・電圧変換装置7および第
3周波数・電圧変換装置8に接続された第2比較
回路12と、第1比較回路11および第2比較回
路12に接続された比較増幅器13と、この比較
増幅器13と前記可変増幅器2との間に設けられ
たフイードバツク回路とを包含し、比較回路1
1,12の出力が一定の値にならないときにフイ
ードバツク回路により可変増幅器2に信号が伝達
されて、可変増幅器2の感度を自動的に調整する
ように構成されている。フイードバツク回路とし
ては、サーボモータ14によりフイードバツク抵
抗15を調節する機構、またはAD変換回路16
によりAD変換されたフイードバツク信号で抵抗
を調節する機構などが用いられる。
上記のように構成された装置において、粒子検
出装置1で粒子と液とのインピーダンスの差異に
基づいて検出されパルスに変換された信号は、可
変増幅器2に入力される。可変増幅器2の出力
は、閾値回路3,4,5へ送られ、それぞれ周波
数・電圧変換装置6,7,8で単位時間当りの粒
子数としてアナログ電圧に変換される。中レベル
閾値回路4を出た信号は後属の計数回路17また
はその他の処理回路へ送られる。高レベル側のア
ナログ電圧は増幅器10で増幅されて第1比較回
路11に送られ、ここで中レベル側のアナログ電
圧との割合が比較される。また中レベル側のアナ
ログ電圧および低レベル側のアナログ電圧は第2
比較回路12へ送られて割合が比較される。第1
比較回路11および第2比較回路12を出た信号
は比較増幅器13で比較され、フイードバツク回
路で可変増幅器2にフイードバツクされる。ここ
でかりに、浮懸液濃度たとえば食塩水濃度が変わ
つて第2図および第4図に示すように感度が変化
したときには、LレベルとHレベルとの間に差が
なくなり、設定した割合にならないために、フイ
ードバツク回路から感度を下げるように信号が伝
達され、可変増幅器2の感度を下げるように動作
する。このように高レベル、中レベル、低レベル
の3つの系により監視を行つて常に最適なレベル
で粒子測定を行うことができる。たとえば赤血球
を計数する場合に、検出感度が高すぎるときに
は、第7図のようにノイズやその他の不要なパル
スを検出してしまう。一方、感度が低すぎる場合
には、比較的大きい赤血球しか測定しないことに
なる。最適な測定を行うためには、累積粒度分布
の平坦な部分に閾値回路のレベルを設定すること
が必要である。たとえば第6図および第9図を正
常適正な状態(状態Aという)、第7図および第
10図を感度が高すぎる状態(状態Bという)、
第8図および第11図を感度が低すぎる状態(状
態Cという)とすると、状態Bの場合は感度を下
げ、状態Cの場合は感度を上げるなどの操作を自
動的に行う。これらの事項を表に示すと次のよう
になる。
[Industrial Application Field] The present invention relates to a particle analyzer that detects particles based on the difference in electrical impedance between the liquid and the particles by passing particles such as blood cells suspended in a liquid through micropores. relates to a particle analyzer that uses three types of threshold circuits to automatically and accurately adjust sensitivity regardless of particle concentration. [Conventional technology] Conventionally, particles such as blood cells are suspended in a liquid such as physiological saline, and passed through micropores formed narrow enough to allow the particles to pass through, thereby reducing the electrical impedance between the liquid and the particles. A device is used that detects particles based on the difference, and then analyzes the size of the particles based on the size of the detection signal.In this particle analyzer, the temperature of the solution and the concentration of electrolytes such as salt can be used to determine the size of the solution itself. The impedance of the particle changes, and therefore the detection sensitivity changes. Therefore, when comparing changes in particles over time in different liquids or testing change characteristics for various chemicals, it is necessary to calculate and correct the sensitivity change in advance. Alternatively, a method is used in which the sensitivity is adjusted separately by attaching an electrode for measuring the impedance of the liquid. [Problem to be solved by the invention] However, by adopting the former method (a method in which sensitivity changes are calculated and corrected in advance), for example, an automatic calculation device is built in to perform correction calculations, and the analysis results after correction are Even if it were possible to output the data, it would be necessary to input the data each time a different liquid was used, and the latter method (method of attaching an electrode for measuring the impedance of the liquid) would complicate the equipment and increase the sample size. There were problems such as contamination between samples due to adhesion of substances. Regardless of which of the above methods is adopted, it is necessary to thoroughly clean the detection device with the liquid to be used next before changing to a liquid with a different electrical impedance. Next, the results of experiments conducted by the present inventor will be explained. FIGS. 1 and 2 show the output signal waveforms of the particle detection device when the saline solution concentration is changed using the same particles. This measurement example is a result obtained by detecting a voltage change from a constant current source based on a difference in specific resistance. In other words, Figure 1 is an example of measurement using the concentration of normal saline (0.9% saline).
Figure 2 shows an example of the same particles suspended in 0.4% saline. Since the current is constant, the pulse is larger in 0.4% saline, where the absolute value of the impedance change is higher, and the detection sensitivity increases as shown in Figure 2. FIGS. 3 and 4 show the above differences using particle size distribution curves. FIG. 3 shows the case of 0.9% saline solution, and FIG. 4 shows the case of 0.4% saline solution. The solid line shows the cumulative particle size distribution curve, and the broken line shows the normal particle size distribution curve. Note that when carrying out a method of adjusting the sensitivity of the device using standard particles, even if particles with fairly uniform particle sizes are used, differences in particle size always occur and normally a normal distribution is shown. One possible method for this purpose is to obtain the average particle volume using an integration circuit and a division circuit, and adjust the sensitivity so that the average particle volume is always constant. However, this requires a complex circuit configuration, such as a circuit that performs high-speed AD conversion of detected pulses, a circuit that integrates these pulses, and a circuit that divides the integrated value by the number of detected pulses. The cost would be too high. The applicant filed Japanese Patent Application No. 55-55991 on the same date as the present application for a particle analyzer equipped with a high-level (H-level) threshold circuit and a low-level (L-level) threshold circuit.
A patent application has been filed as Japanese Patent Application No. 55-55992, but since these use the L level as the reference level,
As shown in FIG. 9 of the present application, the L level must be in a flat portion (hereinafter referred to as flat portion) of the cumulative fineness distribution and must be in a stable state. That is, the L level must exist within the long flat area. If the situation is as shown in Fig. 10 of this application, the L level will include noise, and in the situation shown in Fig. 11, the L level will be affected by a slight change in sensitivity.
Since the level deviates from the flat area, counting becomes unstable. However, if there is only one reference level, it is impossible to determine which state in FIGS. 9 to 11 the object is in. Therefore, there is a problem that sensitivity adjustment may not be accurate. The present invention has been made in view of the above points, and aims to provide a particle analyzer that can automatically and accurately adjust sensitivity regardless of the concentration of a particle suspension, and that has a simple circuit configuration. It is something. [Means for Solving the Problems] The particle analyzer of the present invention will be described with reference to the drawings. The particle analyzer of the present invention allows particles suspended in a liquid to pass through micropores and generates an electric connection between the particles and a particle suspension liquid. A particle detection device 1 that detects particles based on the difference and generates an electrical signal proportional to the size of the particles, a variable amplifier 2 connected to this particle detection device, and a high level connected in parallel to this variable amplifier. A first frequency/voltage conversion device 6 connected to the threshold circuit 3, the middle level threshold circuit 4, the low level threshold circuit 5, and the high level threshold circuit.
and a second frequency signal connected to the medium level threshold circuit.
A voltage converter 7 and a counting circuit 17, a third frequency/voltage converter 8 connected to the low level threshold circuit, an amplifier 10 connected to the first frequency/voltage converter, this amplifier and a second frequency/voltage converter 8. A first comparison circuit 11 connected to the voltage converter, and a second comparison circuit 11 connected to the voltage conversion device.
a second comparison circuit 12 connected to the frequency/voltage conversion device and the third frequency/voltage conversion device; a comparison amplifier 13 connected to the first comparison circuit and the second comparison circuit; and this comparison amplifier and the variable amplifier. It is characterized in that it includes a feedback circuit provided between the two. As a feedback circuit, servo motor 1
4, or a mechanism that adjusts the resistance using a feedback signal AD-converted by an AD conversion circuit 16. [Operation] A signal detected by the particle detection device 1 based on the impedance difference between the particles and the liquid and converted into a pulse is input to the variable amplifier 2. variable amplifier 2
The outputs are sent to threshold circuits 3, 4, and 5, and converted into an analog voltage as the number of particles per unit time by frequency/voltage converters 6, 7, and 8, respectively. The signal output from the intermediate level threshold circuit 4 is sent to the subsequent counting circuit 1.
7 or other processing circuits. The analog voltage on the high level side is amplified by the amplifier 10 and the first
The voltage is sent to the comparison circuit 11, where the ratio with the analog voltage on the middle level side is compared. Further, the analog voltage on the middle level side and the analog voltage on the low level side are sent to the second comparison circuit 12 and their ratios are compared. The signals output from the first comparison circuit 11 and the second comparison circuit 12 are compared by a comparison amplifier 13, and fed back to the variable amplifier 2 by a feedback circuit. Here, if the concentration of the suspended liquid, for example, the concentration of the saline solution changes, and the sensitivity changes as shown in Figures 2 and 4, there will be no difference between the L level and the H level, and the set ratio will not be reached. Therefore, a signal is transmitted from the feedback circuit to lower the sensitivity, and the variable amplifier 2 operates to lower the sensitivity. In this way, high level, medium level,
Monitoring is performed using three low-level systems to ensure particle measurements are always performed at the optimum level. [Example] Hereinafter, an example of the present invention will be described based on the drawings. As shown in Figure 5, the particle analyzer of this example has the following features:
A particle detection device 1 that detects particles by passing particles suspended in a liquid through micropores based on the electrical difference between the particles and the particle suspension liquid, and generates an electric signal proportional to the size of the particles; A variable amplifier 2 connected to the particle detection device 1, a high level threshold circuit 3, a middle level threshold circuit 4 and a low level threshold circuit 5 connected in parallel to the variable amplifier 2, and a high level threshold circuit 3 connected to the high level threshold circuit 3. first frequency/voltage converter 6
, a second frequency/voltage converter 7 and a counting circuit 17 connected to the middle level threshold circuit 4, a third frequency/voltage converter 8 connected to the low level threshold circuit 5, and a first frequency/voltage converter. an amplifier 10 connected to the device 6; this amplifier 10 and a second
A first comparison circuit 11 connected to the frequency/voltage conversion device 7 , a second comparison circuit 12 connected to the second frequency/voltage conversion device 7 and the third frequency/voltage conversion device 8 , and the first comparison circuit 11 and a comparison amplifier 13 connected to the second comparison circuit 12, and a feedback circuit provided between the comparison amplifier 13 and the variable amplifier 2, and the comparison circuit 1
When the outputs of the amplifiers 1 and 12 do not reach a constant value, a signal is transmitted to the variable amplifier 2 by the feedback circuit, and the sensitivity of the variable amplifier 2 is automatically adjusted. The feedback circuit may include a mechanism that adjusts the feedback resistance 15 using a servo motor 14, or an AD conversion circuit 16.
A mechanism is used that adjusts the resistance using a feedback signal that has been AD converted. In the apparatus configured as described above, a signal detected by the particle detection device 1 based on the impedance difference between the particles and the liquid and converted into a pulse is input to the variable amplifier 2. The output of the variable amplifier 2 is sent to threshold circuits 3, 4, and 5, and is converted into an analog voltage as the number of particles per unit time by frequency/voltage converters 6, 7, and 8, respectively. The signal leaving the intermediate level threshold circuit 4 is sent to a subsequent counting circuit 17 or other processing circuit. The analog voltage on the high level side is amplified by the amplifier 10 and sent to the first comparison circuit 11, where the ratio with the analog voltage on the middle level side is compared. In addition, the analog voltage on the middle level side and the analog voltage on the low level side are
The signals are sent to the comparison circuit 12 and the ratios are compared. 1st
The signals output from the comparator circuit 11 and the second comparator circuit 12 are compared by a comparator amplifier 13, and fed back to the variable amplifier 2 by a feedback circuit. Here, if the concentration of the suspended liquid, for example, the concentration of the saline solution changes, and the sensitivity changes as shown in Figures 2 and 4, there will be no difference between the L level and the H level, and the set ratio will not be reached. Therefore, a signal is transmitted from the feedback circuit to lower the sensitivity, and the variable amplifier 2 operates to lower the sensitivity. In this way, monitoring can be carried out using the three systems of high level, medium level, and low level, and particle measurement can always be performed at the optimum level. For example, when counting red blood cells, if the detection sensitivity is too high, noise and other unnecessary pulses will be detected as shown in FIG. On the other hand, if the sensitivity is too low, only relatively large red blood cells will be measured. For optimal measurements, it is necessary to set the level of the threshold circuit in the flat part of the cumulative particle size distribution. For example, Figs. 6 and 9 are in a normal and appropriate state (referred to as state A), Figs. 7 and 10 are in a state where the sensitivity is too high (referred to as state B),
If the sensitivity is too low in FIGS. 8 and 11 (referred to as state C), operations such as lowering the sensitivity in state B and increasing the sensitivity in state C are automatically performed. These matters are shown in the table below.
本発明の粒子分析装置は上記のように、高レベ
ル閾値回路、低レベル閾値回路に中レベル閾値回
路を追加して設けているので、第9図〜第11図
のいずれの状態にあるかが確実に判別できるよう
になり、第9図に示す状態に感度調整できれば、
LレベルもMレベルも平坦部にあるので、充分な
長さの平坦部が確保され、Mレベルにおいて安定
な計数ができる。したがつて、粒子の濃度に関係
なく自動的に感度を正確に調整することができ、
かつ回路構成が簡単であるので従来の粒子計数装
置などに容易に内蔵することができるなどの効果
が奏せられる。
As described above, the particle analyzer of the present invention is provided with a medium-level threshold circuit in addition to the high-level threshold circuit and the low-level threshold circuit, so it is possible to determine which state it is in from FIGS. 9 to 11. If we can reliably discriminate and adjust the sensitivity to the state shown in Figure 9,
Since both the L level and the M level are on the flat part, a sufficiently long flat part is ensured, and stable counting can be performed at the M level. Therefore, the sensitivity can be automatically and precisely adjusted regardless of the particle concentration,
Moreover, since the circuit configuration is simple, it can be easily incorporated into a conventional particle counting device.
第1図および第2図は同一粒子で食塩水濃度を
変えたときの粒子検出装置の出力信号波形を示す
もので、第1図は0.9%食塩水の場合の波形図、
第2図は0.4%食塩水の場合の波形図、第3図は
第1図に示す0.9%食塩水の場合の累積粒度分布
曲線(実線)および粒度分布曲線(破線)を示す
曲線図、第4図は第2図に示す0.4%食塩水の場
合の累積粒度分布曲線(実線)および粒度分布曲
線(破線)を示す曲線図、第5図は本発明の粒子
分析装置の一実施例を示す系統的説明図、第6図
は正常カウントの場合の波形図、第7図は異常ノ
イズカウントの場合の波形図、第8図は異常数え
おとしの場合の波形図、第9図は第6図の場合の
累積粒度分布曲線図、第10図は第7図の場合の
累積粒度分布曲線図、第11図は第8図の場合の
累積粒度分布曲線図である。
1……粒子検出装置、2……可変増幅器、3…
…高レベル閾値回路、4……中レベル閾値回路、
5……低レベル閾値回路、6……第1周波数・電
圧変換装置、7……第2周波数・電圧変換装置、
8……第3周波数・電圧変換装置、10……増幅
器、11……第1比較回路、12……第2比較回
路、13……比較増幅器、14……サーボモー
タ、15……フイードバツク抵抗、16……AD
変換回路、17……計数回路。
Figures 1 and 2 show the output signal waveforms of the particle detection device when the saline concentration is changed using the same particles, and Figure 1 is a waveform diagram for 0.9% saline;
Figure 2 is a waveform diagram for 0.4% saline, Figure 3 is a curve diagram showing the cumulative particle size distribution curve (solid line) and particle size distribution curve (dashed line) for 0.9% saline shown in Figure 1; Figure 4 is a curve diagram showing the cumulative particle size distribution curve (solid line) and particle size distribution curve (broken line) in the case of 0.4% saline shown in Figure 2, and Figure 5 shows an embodiment of the particle analyzer of the present invention. Systematic explanatory diagram, Figure 6 is a waveform diagram for normal counting, Figure 7 is a waveform diagram for abnormal noise counting, Figure 8 is a waveform diagram for abnormal counting, and Figure 9 is the waveform diagram for abnormal counting. FIG. 10 is a cumulative particle size distribution curve diagram for the case of FIG. 7, and FIG. 11 is a cumulative particle size distribution curve diagram for the case of FIG. 1... Particle detection device, 2... Variable amplifier, 3...
...High level threshold circuit, 4...Medium level threshold circuit,
5...Low level threshold circuit, 6...First frequency/voltage converter, 7...Second frequency/voltage converter,
8... Third frequency/voltage converter, 10... Amplifier, 11... First comparison circuit, 12... Second comparison circuit, 13... Comparison amplifier, 14... Servo motor, 15... Feedback resistor, 16...A.D.
Conversion circuit, 17... Counting circuit.
Claims (1)
子と粒子浮懸液との電気的差異に基づいて粒子を
検出し粒子の大きさに比例した電気信号を発生す
る粒子検出装置と、この粒子検出装置に接続され
た可変増幅器と、この可変増幅器に並列に接続さ
れた高レベル閾値回路、中レベル閾値回路および
低レベル閾値回路と、高レベル閾値回路に接続さ
れた第1周波数・電圧変換装置と、中レベル閾値
回路に接続された第2周波数・電圧変換装置およ
び計数回路と、低レベル閾値回路に接続された第
3周波数・電圧変換装置と、第1周波数・電圧変
換装置に接続された増幅器と、この増幅器および
第2周波数・電圧変換装置に接続された第1比較
回路と、第2周波数・電圧変換装置および第3周
波数・電圧変換装置に接続された第2比較回路
と、第1比較回路および第2比較回路に接続され
た比較増幅器と、この比較増幅器と前記可変増幅
器との間に設けられたフイードバツク回路とを包
含することを特徴とする粒子分析装置。 2 フイードバツク回路がサーボモータによりフ
イードバツク抵抗を調節する機構からなる特許請
求の範囲第1項記載の粒子分析装置。 3 フイードバツク回路がAD変換されたフイー
ドバツク信号で抵抗を調節する機構からなる特許
請求の範囲第1項記載の粒子分析装置。[Claims] 1. Particles suspended in a liquid are passed through micropores, and the particles are detected based on the electrical difference between the particles and the liquid in which the particles are suspended, and an electrical signal proportional to the size of the particles is generated. A particle detection device, a variable amplifier connected to the particle detection device, a high level threshold circuit, a medium level threshold circuit and a low level threshold circuit connected in parallel to the variable amplifier, and a high level threshold circuit connected to the high level threshold circuit. a first frequency/voltage converter, a second frequency/voltage converter and counting circuit connected to the medium level threshold circuit, a third frequency/voltage converter connected to the low level threshold circuit, and a first frequency/voltage converter and a counting circuit connected to the medium level threshold circuit; an amplifier connected to the voltage converter; a first comparator circuit connected to the amplifier and the second frequency/voltage converter; and a first comparator circuit connected to the second frequency/voltage converter and the third frequency/voltage converter. A particle analysis device comprising two comparison circuits, a comparison amplifier connected to the first comparison circuit and the second comparison circuit, and a feedback circuit provided between the comparison amplifier and the variable amplifier. . 2. The particle analyzer according to claim 1, wherein the feedback circuit comprises a mechanism for adjusting feedback resistance using a servo motor. 3. The particle analyzer according to claim 1, wherein the feedback circuit comprises a mechanism for adjusting resistance using an AD-converted feedback signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5599380A JPS56151341A (en) | 1980-04-25 | 1980-04-25 | Particle analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5599380A JPS56151341A (en) | 1980-04-25 | 1980-04-25 | Particle analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56151341A JPS56151341A (en) | 1981-11-24 |
| JPH0146818B2 true JPH0146818B2 (en) | 1989-10-11 |
Family
ID=13014599
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5599380A Granted JPS56151341A (en) | 1980-04-25 | 1980-04-25 | Particle analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56151341A (en) |
-
1980
- 1980-04-25 JP JP5599380A patent/JPS56151341A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS56151341A (en) | 1981-11-24 |
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