JPH0158444B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for continuously measuring the thickness of a thin plate rolled in a rolling process.

Generally, the thickness of a thin plate or the like is measured at the center of the plate to be measured, and the rolling equipment is adjusted based on this measurement value to manage the thickness. However, recently, requirements for the quality of plate materials have become stricter, and it has become necessary to measure the thickness of the entire plate width, not just the thickness at the center of the plate width, to maintain and manage the plate thickness within an allowable range. Therefore, there are crown amount, wedge amount, and edge drop amount as indicators for controlling the cross-sectional shape in the width direction of the plate to be measured, and when these are expressed using the symbols in FIG. 1, they are expressed by the following equation.

Crown amount = C-(A+E)/2...(1) Wedge amount = |A-E|...(2) Edge drop amount = A-B or D-E...(3) Therefore, calculate these quantities Since it is necessary to obtain each measurement value of A to E, conventionally, the following method has been used. In other words, you can temporarily stop the rolling line and manually move the radiation thickness meter in the width direction of the plate to be measured to obtain each necessary measurement value, or you can manually scan the thickness gauge in the width direction of the plate to be measured during rolling. This method uses a scanning radiation thickness meter. However, in the former method, the rolling line had to be temporarily stopped, which not only reduced the efficiency of the rolling line but also caused the problem that measurement results could not be fed back to the line. Furthermore, since the radiation thickness meter was moved manually, the measurement required a great deal of time and manpower. Next, in the latter case, the scanning speed is limited by the response speed of the radiation thickness meter, so the thickness of a long diagonal cross section of the plate to be measured is measured in the longitudinal direction, so if the plate thickness changes in the longitudinal direction, had the disadvantage that accurate measurements could not be made.

The present invention has been made in consideration of the above-mentioned drawbacks, and involves continuously measuring the thickness of a cross section perpendicular to the longitudinal direction of the plate to be measured while the rolling line is in operation, and feeding back the measurement results to the rolling line. The purpose of the present invention is to provide a plate thickness measuring device that can measure plate thickness. The plate thickness measuring device according to the present invention includes a non-contact type thickness gauge that measures the thickness of the central part in the width direction of a rolled object to be measured while progressing in the longitudinal direction, and Each non-contact multi-point thickness gauge is placed at each end and has a plurality of thickness gauges lined up in the width direction of the object to be measured, and the non-contact multi-point thickness gauge is attached to these non-contact multi-point thickness gages. A moving mechanism that moves each multi-point thickness gauge in the width direction of the object to be measured, a non-contact thickness gauge, and measurement of the object based on measurement signals obtained from each non-contact multi-point thickness gauge. The cross-sectional shape of the entire surface in the width direction of the object to be measured is determined by calculating the thickness other than the points, and the terminal position in the width direction of the object to be measured is detected and a terminal position detection signal is sent to the moving mechanism to detect each non-contact type multi-point. The apparatus is equipped with a calculation processing section that moves the thickness gauge to a predetermined measurement position, and a display section that displays the measurement results transmitted from the calculation processing section. Therefore, it is possible to provide a plate thickness measuring device that achieves the above-mentioned objectives.

An embodiment of the present invention shown in FIG. 2 will be described below. In the figure, reference numeral 1 indicates a plate to be measured, and the rate of change in plate thickness is large at the ends in the width direction of the plate. A non-contact thickness gauge 2 (hereinafter simply referred to as a thickness gauge), such as a radiation thickness gauge, is provided at the center in the width direction of the plate 1 to be measured. In addition, a non-contact multi-point thickness gauge equipped with, for example, a plurality of sets of radiation thickness gauges is installed at both ends in the width direction on the measurement cross section perpendicular to the longitudinal direction of the plate 1 to be measured in the same cross section as the thickness gauge. A total of three gauges (hereinafter simply referred to as multi-point thickness gauges) are provided, and are configured to be able to measure changes in plate thickness at both ends in the width direction where the rate of change in plate thickness on the measurement cross section is large. A moving mechanism 3A is attached to the multi-point thickness gauges 3 , and moves the multi-point thickness gauges 3 in the width direction of the plate 1 to be measured. and an arithmetic processing section 4 that arithmetic processes the measurement signals from each of the thickness gauges;
A display section 5 for displaying signals from the arithmetic processing section 4 is provided. Measurement signals from the thickness gauge 2 and the multi-point thickness gauge 3 are transmitted to the arithmetic processing section 4. The arithmetic processing unit 4 calculates the above-mentioned crown amount, wedge amount, and edge drop amount, and calculates the thickness of the plate 1 other than the measurement point by calculating the above-mentioned measurement signal by means such as function approximation. Find the cross-sectional shape of. The signal from the arithmetic processing section 4 is transmitted to the display section 5, and the display section 5 not only provides the wedge amount, etc., but also displays the cross-sectional shape of the entire board width of the board 1 to be measured using a method such as a CRT. Further, the arithmetic processing unit detects the end face in the width direction of the plate 1 to be measured, and transmits this signal to the moving mechanism 3A to move the multi-point thickness gage 3 to a predetermined measurement position. Therefore, in one embodiment of the present invention, the thickness and cross-sectional shape of the entire board width can be determined with the minimum necessary number of measurement points. Furthermore, since measurements can be made continuously on the measurement cross section perpendicular to the longitudinal direction of the plate to be measured without stopping the rolling line, there is an advantage that the measurement results can be fed back to the rolling line. Furthermore, the multi-point thickness gauge 3 ... is the moving mechanism 3A.
... and the arithmetic processing unit 4 can move the plate 1 to be measured to a predetermined measurement position.

The present invention is not limited to the above embodiment, and can measure the thickness and cross-sectional shape of an object whose cross-sectional shape changes continuously.

As explained above, according to the present invention, the thickness gauge is provided in the central part of the plate to be measured, where the rate of change in plate thickness is small;
This is necessary because a multi-point thickness gauge is installed at the edge of the sheet width where the rate of change in sheet thickness is large, a calculation processing unit is installed to process the measurement signals from these gauges, and a display unit is installed to display the signals from the calculation processing unit. The thickness and cross-sectional shape of the entire board width can be measured with a minimum number of measurement points. In addition, the multi-point thickness gauge is equipped with a moving mechanism, and the multi-point thickness gauge can be moved to a predetermined measurement position by a signal from the processing section, so even if the width of the plate changes, the thickness of the plate will change. It is possible to measure the edges in the width direction where the ratio is large. Furthermore, since the measurement cross section perpendicular to the longitudinal direction of the plate to be measured can be continuously measured, there is no need to stop the rolling line, and the measurement results can be fed back to the rolling line, which has great effects.

[Brief explanation of drawings]

FIG. 1 is an explanatory diagram showing measurement positions, and FIG. 2 is a configuration diagram showing an embodiment of the present invention. 1...Plate to be measured, 2...(non-contact type) thickness gauge,
3... (non-contact type) multi-point thickness gauge, 4... Arithmetic processing section, 5... Display section.

Claims (1)

[Claims] 1. A non-contact thickness gage that measures the thickness of the center part in the width direction of the object to be measured that has been rolled in the longitudinal direction; Each non-contact multi-point thickness gage has a plurality of thickness gages arranged in the width direction of the object to be measured, and each non-contact multi-point thickness gage attached to the non-contact multi-point thickness gage A moving mechanism that moves the object to be measured in the width direction, and a thickness of the object to be measured other than the measurement points based on measurement signals obtained from the non-contact thickness gage and each non-contact multi-point thickness gage. is calculated to obtain the cross-sectional shape of the entire widthwise direction of the object to be measured, detect the end position of the object to be measured in the width direction, and send an end position detection signal to the moving mechanism to determine the thickness of each non-contact type multi-point. 1. A plate thickness measuring device comprising: a calculation processing section that moves a thickness gauge to a predetermined measurement position; and a display section that displays measurement results transmitted from the calculation processing section.