JPH0166061U - - Google Patents
Info
- Publication number
- JPH0166061U JPH0166061U JP1987161772U JP16177287U JPH0166061U JP H0166061 U JPH0166061 U JP H0166061U JP 1987161772 U JP1987161772 U JP 1987161772U JP 16177287 U JP16177287 U JP 16177287U JP H0166061 U JPH0166061 U JP H0166061U
- Authority
- JP
- Japan
- Prior art keywords
- component
- conveyance path
- television camera
- passage groove
- chip parts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000011179 visual inspection Methods 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims 1
- 238000005286 illumination Methods 0.000 claims 1
- 230000007723 transport mechanism Effects 0.000 claims 1
- 238000007689 inspection Methods 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 2
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
第1図は本考案の1実施例による自動外観検査
・選別機の部分的な側面図、第2図は第1図の矢
視F方向からみたチツプ部品搬送路の拡大正面図
、第3図は本考案に係る搬送路の検査部における
シヤツタ機構の正面図、第4図は第3図の―
線に沿つた拡大断面図、第5図は第4図の―
線に沿つた断面図で部品搬送用エアジエツトノズ
ル部分における搬送路凹溝部を示した縦断面図、
第6図a〜cは部品分離機構部を分離ピンの動作
順序にしたがつて示した側面断面図である。
1……チツプ部品、4……搬送路、5……チツ
プフイーダ、6……部品分離機構部、7a,7b
……検査部、8……計数機構部、9……選別機構
部、10……検査機本体、11……凹溝、11a
……エツジ、12……蓋板、20……シヤツタ、
29……サイドガラス、28……円形ガラス。
Fig. 1 is a partial side view of an automatic visual inspection/sorting machine according to an embodiment of the present invention, Fig. 2 is an enlarged front view of the chip parts conveyance path seen from the direction of arrow F in Fig. 1, and Fig. 3 4 is a front view of the shutter mechanism in the inspection section of the conveyance path according to the present invention, and FIG.
An enlarged sectional view along the line, Figure 5 is the same as in Figure 4.
A longitudinal cross-sectional view showing a conveyance path concave groove portion in an air jet nozzle portion for conveying parts in a cross-sectional view along a line;
FIGS. 6a to 6c are side sectional views showing the component separation mechanism section according to the operating order of the separation pins. DESCRIPTION OF SYMBOLS 1... Chip parts, 4... Conveyance path, 5... Chip feeder, 6... Component separation mechanism section, 7a, 7b
... Inspection section, 8 ... Counting mechanism section, 9 ... Sorting mechanism section, 10 ... Inspection machine main body, 11 ... Concave groove, 11a
... Edge, 12 ... Lid plate, 20 ... Shutter,
29...side glass, 28...circular glass.
Claims (1)
行途中で前記搬送路上に設けた斜光・透過照明装
置およびテレビカメラでチツプ部品の外観を検査
する自動外観検査機において、部品投入端から部
品排出端まで伸長した搬送路と、前記搬送路に沿
つて形成された凹形部品通過溝と、前記凹形部品
通過溝の溝内部に開口した複数個のエアジエツト
ノズルとを有し、前記凹形部品通過溝は、少くと
も前記テレビカメラに対応する箇所では、透明部
材でかつ鋭利なエツジを有するように形成され、
かつそのエツジ精度を少くとも前記テレビカメラ
の分解能以下の精度としたことを特徴とするチツ
プ部品自動外観検査機の部品搬送機構。 In an automatic visual inspection machine that runs chip parts along a conveyance path and inspects the external appearance of the chip parts using an oblique light/transmission illumination device and a television camera installed on the conveyance path during the travel, the chip parts are inspected from the component input end to the component discharge end. a concave component passage groove formed along the conveyance path; and a plurality of air jet nozzles opened inside the concave component passage groove. The component passage groove is formed of a transparent member and has sharp edges at least at a portion corresponding to the television camera,
A component transport mechanism for an automatic chip component visual inspection machine, characterized in that the edge accuracy is at least lower than the resolution of the television camera.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987161772U JPH065614Y2 (en) | 1987-10-22 | 1987-10-22 | Component transport mechanism for automatic chip component visual inspection machine |
| KR1019890002517A KR0122739B1 (en) | 1987-08-28 | 1989-02-28 | Method and measuring device for classification of chip-type component and checking of chip-type component's aspect by optical |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987161772U JPH065614Y2 (en) | 1987-10-22 | 1987-10-22 | Component transport mechanism for automatic chip component visual inspection machine |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0166061U true JPH0166061U (en) | 1989-04-27 |
| JPH065614Y2 JPH065614Y2 (en) | 1994-02-09 |
Family
ID=31445003
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987161772U Expired - Lifetime JPH065614Y2 (en) | 1987-08-28 | 1987-10-22 | Component transport mechanism for automatic chip component visual inspection machine |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH065614Y2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002341407A (en) * | 2001-05-15 | 2002-11-27 | Shibuya Kogyo Co Ltd | Device for photographing object to be inspected |
| CN113514755A (en) * | 2021-06-11 | 2021-10-19 | 天津津航计算技术研究所 | Automatic detection device and method for electrical performance of PCB (printed circuit board) enclosure frame |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6046055U (en) * | 1983-09-06 | 1985-04-01 | 村田精工株式会社 | Upper and lower surface inspection equipment for parts |
| JPS60261274A (en) * | 1984-06-08 | 1985-12-24 | Seiei Kosan Kk | Checking device of integrated circuit or the like |
-
1987
- 1987-10-22 JP JP1987161772U patent/JPH065614Y2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6046055U (en) * | 1983-09-06 | 1985-04-01 | 村田精工株式会社 | Upper and lower surface inspection equipment for parts |
| JPS60261274A (en) * | 1984-06-08 | 1985-12-24 | Seiei Kosan Kk | Checking device of integrated circuit or the like |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002341407A (en) * | 2001-05-15 | 2002-11-27 | Shibuya Kogyo Co Ltd | Device for photographing object to be inspected |
| CN113514755A (en) * | 2021-06-11 | 2021-10-19 | 天津津航计算技术研究所 | Automatic detection device and method for electrical performance of PCB (printed circuit board) enclosure frame |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH065614Y2 (en) | 1994-02-09 |
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