JPH0166061U - - Google Patents

Info

Publication number
JPH0166061U
JPH0166061U JP1987161772U JP16177287U JPH0166061U JP H0166061 U JPH0166061 U JP H0166061U JP 1987161772 U JP1987161772 U JP 1987161772U JP 16177287 U JP16177287 U JP 16177287U JP H0166061 U JPH0166061 U JP H0166061U
Authority
JP
Japan
Prior art keywords
component
conveyance path
television camera
passage groove
chip parts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1987161772U
Other languages
Japanese (ja)
Other versions
JPH065614Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987161772U priority Critical patent/JPH065614Y2/en
Priority to KR1019890002517A priority patent/KR0122739B1/en
Publication of JPH0166061U publication Critical patent/JPH0166061U/ja
Application granted granted Critical
Publication of JPH065614Y2 publication Critical patent/JPH065614Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の1実施例による自動外観検査
・選別機の部分的な側面図、第2図は第1図の矢
視F方向からみたチツプ部品搬送路の拡大正面図
、第3図は本考案に係る搬送路の検査部における
シヤツタ機構の正面図、第4図は第3図の―
線に沿つた拡大断面図、第5図は第4図の―
線に沿つた断面図で部品搬送用エアジエツトノズ
ル部分における搬送路凹溝部を示した縦断面図、
第6図a〜cは部品分離機構部を分離ピンの動作
順序にしたがつて示した側面断面図である。 1……チツプ部品、4……搬送路、5……チツ
プフイーダ、6……部品分離機構部、7a,7b
……検査部、8……計数機構部、9……選別機構
部、10……検査機本体、11……凹溝、11a
……エツジ、12……蓋板、20……シヤツタ、
29……サイドガラス、28……円形ガラス。
Fig. 1 is a partial side view of an automatic visual inspection/sorting machine according to an embodiment of the present invention, Fig. 2 is an enlarged front view of the chip parts conveyance path seen from the direction of arrow F in Fig. 1, and Fig. 3 4 is a front view of the shutter mechanism in the inspection section of the conveyance path according to the present invention, and FIG.
An enlarged sectional view along the line, Figure 5 is the same as in Figure 4.
A longitudinal cross-sectional view showing a conveyance path concave groove portion in an air jet nozzle portion for conveying parts in a cross-sectional view along a line;
FIGS. 6a to 6c are side sectional views showing the component separation mechanism section according to the operating order of the separation pins. DESCRIPTION OF SYMBOLS 1... Chip parts, 4... Conveyance path, 5... Chip feeder, 6... Component separation mechanism section, 7a, 7b
... Inspection section, 8 ... Counting mechanism section, 9 ... Sorting mechanism section, 10 ... Inspection machine main body, 11 ... Concave groove, 11a
... Edge, 12 ... Lid plate, 20 ... Shutter,
29...side glass, 28...circular glass.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] チツプ部品を搬送路に沿つて走行させ、この走
行途中で前記搬送路上に設けた斜光・透過照明装
置およびテレビカメラでチツプ部品の外観を検査
する自動外観検査機において、部品投入端から部
品排出端まで伸長した搬送路と、前記搬送路に沿
つて形成された凹形部品通過溝と、前記凹形部品
通過溝の溝内部に開口した複数個のエアジエツト
ノズルとを有し、前記凹形部品通過溝は、少くと
も前記テレビカメラに対応する箇所では、透明部
材でかつ鋭利なエツジを有するように形成され、
かつそのエツジ精度を少くとも前記テレビカメラ
の分解能以下の精度としたことを特徴とするチツ
プ部品自動外観検査機の部品搬送機構。
In an automatic visual inspection machine that runs chip parts along a conveyance path and inspects the external appearance of the chip parts using an oblique light/transmission illumination device and a television camera installed on the conveyance path during the travel, the chip parts are inspected from the component input end to the component discharge end. a concave component passage groove formed along the conveyance path; and a plurality of air jet nozzles opened inside the concave component passage groove. The component passage groove is formed of a transparent member and has sharp edges at least at a portion corresponding to the television camera,
A component transport mechanism for an automatic chip component visual inspection machine, characterized in that the edge accuracy is at least lower than the resolution of the television camera.
JP1987161772U 1987-08-28 1987-10-22 Component transport mechanism for automatic chip component visual inspection machine Expired - Lifetime JPH065614Y2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1987161772U JPH065614Y2 (en) 1987-10-22 1987-10-22 Component transport mechanism for automatic chip component visual inspection machine
KR1019890002517A KR0122739B1 (en) 1987-08-28 1989-02-28 Method and measuring device for classification of chip-type component and checking of chip-type component's aspect by optical

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987161772U JPH065614Y2 (en) 1987-10-22 1987-10-22 Component transport mechanism for automatic chip component visual inspection machine

Publications (2)

Publication Number Publication Date
JPH0166061U true JPH0166061U (en) 1989-04-27
JPH065614Y2 JPH065614Y2 (en) 1994-02-09

Family

ID=31445003

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987161772U Expired - Lifetime JPH065614Y2 (en) 1987-08-28 1987-10-22 Component transport mechanism for automatic chip component visual inspection machine

Country Status (1)

Country Link
JP (1) JPH065614Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002341407A (en) * 2001-05-15 2002-11-27 Shibuya Kogyo Co Ltd Device for photographing object to be inspected
CN113514755A (en) * 2021-06-11 2021-10-19 天津津航计算技术研究所 Automatic detection device and method for electrical performance of PCB (printed circuit board) enclosure frame

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6046055U (en) * 1983-09-06 1985-04-01 村田精工株式会社 Upper and lower surface inspection equipment for parts
JPS60261274A (en) * 1984-06-08 1985-12-24 Seiei Kosan Kk Checking device of integrated circuit or the like

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6046055U (en) * 1983-09-06 1985-04-01 村田精工株式会社 Upper and lower surface inspection equipment for parts
JPS60261274A (en) * 1984-06-08 1985-12-24 Seiei Kosan Kk Checking device of integrated circuit or the like

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002341407A (en) * 2001-05-15 2002-11-27 Shibuya Kogyo Co Ltd Device for photographing object to be inspected
CN113514755A (en) * 2021-06-11 2021-10-19 天津津航计算技术研究所 Automatic detection device and method for electrical performance of PCB (printed circuit board) enclosure frame

Also Published As

Publication number Publication date
JPH065614Y2 (en) 1994-02-09

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