JPH0193548U - - Google Patents

Info

Publication number
JPH0193548U
JPH0193548U JP19104787U JP19104787U JPH0193548U JP H0193548 U JPH0193548 U JP H0193548U JP 19104787 U JP19104787 U JP 19104787U JP 19104787 U JP19104787 U JP 19104787U JP H0193548 U JPH0193548 U JP H0193548U
Authority
JP
Japan
Prior art keywords
tube
visual inspection
semiconductor devices
divided
appearance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19104787U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19104787U priority Critical patent/JPH0193548U/ja
Publication of JPH0193548U publication Critical patent/JPH0193548U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例による外観検査用
チユーブを示す断面正面図、第2図は従来の外観
検査用チユーブを示す斜視図である。 図において、1は半導体装置、2は外観検査用
チユーブ、4はかん合部、5は突起、6は穴を示
す。なお、図中、同一符号は同一、又は相当部分
を示す。
FIG. 1 is a sectional front view showing a tube for visual inspection according to an embodiment of the present invention, and FIG. 2 is a perspective view showing a conventional tube for visual inspection. In the figure, 1 is a semiconductor device, 2 is a tube for visual inspection, 4 is a fitting part, 5 is a protrusion, and 6 is a hole. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体装置を収納した状態で半導体装置の外観
を検査し選別する為の透明の外観検査用チユーブ
において、複数個に分割でき、前記分割した複数
個の外観検査用チユーブがそれぞれ相互に着脱可
能な構造としたことを特徴とする外観検査用チユ
ーブ。
A transparent visual inspection tube for inspecting and sorting the external appearance of semiconductor devices in a state in which the semiconductor devices are housed has a structure that can be divided into a plurality of parts, and each of the divided plurality of visual inspection tubes can be attached to and detached from each other. A tube for appearance inspection characterized by the following.
JP19104787U 1987-12-15 1987-12-15 Pending JPH0193548U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19104787U JPH0193548U (en) 1987-12-15 1987-12-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19104787U JPH0193548U (en) 1987-12-15 1987-12-15

Publications (1)

Publication Number Publication Date
JPH0193548U true JPH0193548U (en) 1989-06-20

Family

ID=31481975

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19104787U Pending JPH0193548U (en) 1987-12-15 1987-12-15

Country Status (1)

Country Link
JP (1) JPH0193548U (en)

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