JPH02109003A - Reflection mirror - Google Patents

Reflection mirror

Info

Publication number
JPH02109003A
JPH02109003A JP26326988A JP26326988A JPH02109003A JP H02109003 A JPH02109003 A JP H02109003A JP 26326988 A JP26326988 A JP 26326988A JP 26326988 A JP26326988 A JP 26326988A JP H02109003 A JPH02109003 A JP H02109003A
Authority
JP
Japan
Prior art keywords
layer
metal
oxide
intermediate layer
light reflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26326988A
Other languages
Japanese (ja)
Other versions
JP2838525B2 (en
Inventor
Tatsuo Ota
達男 太田
Tomohito Nakano
智史 中野
Setsuo Tokuhiro
節夫 徳弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Priority to JP63263269A priority Critical patent/JP2838525B2/en
Publication of JPH02109003A publication Critical patent/JPH02109003A/en
Application granted granted Critical
Publication of JP2838525B2 publication Critical patent/JP2838525B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To make adhesion of a light reflection layer to a base body strongly, to improve the resistance of a reflect mirror to environmental changes and to easily facilitate its production by forming an intermediate layer consisting of metal oxide or metal nitride on the base body, laminating a light reflection layer thereon and laminating, if necessary, a protective layer on the light reflection layer. CONSTITUTION:An intermediate layer consisting of metal oxide or metal nitride is formed on a base body, and a light reflection layer is laminated thereon. If necessary, a protective layer is laminated on the light reflection layer. The base body consists of an inorganic material such as glass, several kinds of ceramic material, or metal, or an org. material such as polystyrene, poly(methyl methacrylate), polycarbonate which is formed by casting, etc. The metal oxide to be used for the intermediate layer is such as chrome oxide, titanium oxide, tungsten oxide, tin oxide. A metal such aluminum, gold, silver, copper, or a metal compd. such as titanium nitride, is used for a material for the light reflection layer.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、光の全反射を行う反射鏡に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a reflecting mirror that totally reflects light.

更に詳しくは、光線反射層の基体への膜付けが強固で、
耐環境性に優れ、そして生産性の優れた反射鏡に関する
。
More specifically, the attachment of the light reflecting layer to the substrate is strong,
This invention relates to a reflecting mirror with excellent environmental resistance and productivity.

[発明の背t1 反射鏡においては、反射率の大きい銀、銅、金、アルミ
ニウム等の金属を反射膜として使用することが一般に知
られている。
[Background of the Invention t1 In a reflective mirror, it is generally known to use a metal having a high reflectance, such as silver, copper, gold, or aluminum, as a reflective film.

このような金属反射膜、例えば銅(Cu)を透明な基体
上に設けるとさ、従来、銅と基体との密着性を良くさせ
るために銅と基体の間に中間層としてクロム、タングス
テン、ニッケル、チタン等を設けることが提案されてい
る。
When such a metal reflective film, such as copper (Cu), is provided on a transparent substrate, conventionally, in order to improve the adhesion between the copper and the substrate, chromium, tungsten, or nickel is used as an intermediate layer between the copper and the substrate. , titanium, etc. have been proposed.

しかしながら、この場合、中間層の厚みを大きくすると
、上層の金属膜の光線反射率が低下するた的中間層の厚
さは5A〜50A程度に薄くせざるを慢ず、そしてこの
ような小さい範囲に膜厚を制限すると、反射鏡の調製が
難かしくなり、また透明な基体として合成樹脂を用いj
;場合は、上記金属膜の膜付けが不充分になる。
However, in this case, if the thickness of the intermediate layer is increased, the light reflectance of the upper metal film decreases, so the thickness of the intermediate layer must be reduced to about 5A to 50A. If the film thickness is limited to
; In this case, the metal film will be insufficiently attached.

更に、反射鏡を使用しているうちに、膜ウキの問題が生
じるため、耐環境性が不十分である。
Furthermore, while using the reflecting mirror, the problem of film fading occurs, resulting in insufficient environmental resistance.

まl;、合成樹脂部材からなる基体と金属膜との密着性
を良くするため、この基体の上にSiJ、 Crおよび
A1の各層を順次形成させ、更にその上に低屈折材料(
Sins)と高屈折材料(TiOl、 Ce0z+Ta
*OsまたはZrO!とTie、の混合物)をこの順で
繰り返し最低6層形成させた後、最上層に表面層(Si
02)を形成させて成る反射鏡が提案されている。
In order to improve the adhesion between the base made of a synthetic resin member and the metal film, layers of SiJ, Cr and A1 are sequentially formed on this base, and a low refractive material (
Sins) and high refractive materials (TiOl, Ce0z+Ta
*Os or ZrO! After repeatedly forming at least 6 layers of Si and Tie in this order, a surface layer (Si
02) has been proposed.

しかしながら、この反射鏡は金属膜が2層構造となって
いるため製造コストが嵩み、また金属クロムを用いてい
るため膜厚に制限があり、更にSiO3を合成樹脂部材
と金属膜との接触部に用いているが、合成樹脂としてポ
リカーボネートを用いた場合は膜付けが不十分で、反射
鏡に粘着テープを貼着しf二のち、引き剥がした場合に
膜の一部が剥離する。
However, this reflecting mirror has a two-layer metal film structure, which increases the manufacturing cost, and since it uses metallic chromium, there is a limit to the film thickness. However, when polycarbonate is used as the synthetic resin, the coating is insufficient, and when an adhesive tape is attached to the reflective mirror and then peeled off, part of the coating peels off.

[発明の目的1 本発明は上記のような従来の問題点を解決して光線反射
層の基体への膜付けが強固であって、耐環境性に優れ、
かつその製造が容易で、生産性が高い反射鏡を提供する
ことを目的とするものである。
[Objective of the Invention 1] The present invention solves the above-mentioned conventional problems and provides a light reflecting layer that is firmly attached to a substrate, has excellent environmental resistance,
It is an object of the present invention to provide a reflecting mirror that is easy to manufacture and has high productivity.

【発明の構成] そして、このような目的は基体上に金属酸化物または金
属窒化物からなる中間層を設け、その上に光反射層を積
層し、更に必要に応じて、この光反射層の上に保護層を
積層して成る本発明の反射鏡によって達成することがで
きる。
[Structure of the invention] Such an object is to provide an intermediate layer made of a metal oxide or metal nitride on a substrate, to laminate a light-reflecting layer thereon, and to further layer this light-reflecting layer as necessary. This can be achieved by the reflective mirror of the present invention, which has a protective layer laminated thereon.

本発明の反射鏡に用いられる基体としては、例えば、ガ
ラス、各種セラミックス材料および金属のような無機材
料、或はポリスチレン、ポリメチルメタクリレート、ポ
リカーボネート、アクリルニトリル−スチレン共重合体
のような有機高分子材料からなり、キャスティング、イ
ンジェクションその他の成形法により成形された精密部
材を例示す5ことができる。
Substrates used in the reflective mirror of the present invention include, for example, inorganic materials such as glass, various ceramic materials, and metals, or organic polymers such as polystyrene, polymethyl methacrylate, polycarbonate, and acrylonitrile-styrene copolymers. Precision parts made of materials and molded by casting, injection, or other molding methods can be exemplified.

そ1.て、これらを基体とする本発明の反射鏡は例/l
ば、レーザービームプリンター、特にレーザー光学系に
おける45″  ミラー ポリゴンミラー自動車の反射
ミラー、液晶デイスプレーにおける背面光源用ミラーと
して有用である。
Part 1. Therefore, the reflecting mirror of the present invention using these as a base is shown in Example/l.
For example, it is useful as a 45'' mirror in a laser beam printer, especially in a laser optical system, a polygon mirror in an automobile, and a rear light source mirror in a liquid crystal display.

本発明の反射鏡において、中間層として用いられs金a
酸化物としては、たとえば、酸化クロム、酸化チタン、
酸化タングステン、酸化錫、酸化インジューム、酸化ア
ルミニウムのようなりロム、チタン、タングステン、錫
、インジュームおよびアルミニウム等の金属の酸化物が
挙げられるが、好ましいものとして、クロムの酸化物ま
たは錫の酸化物を例示することができる。
In the reflective mirror of the present invention, gold a is used as the intermediate layer.
Examples of oxides include chromium oxide, titanium oxide,
Examples include oxides of metals such as tungsten oxide, tin oxide, indium oxide, aluminum oxide, chromium oxide, titanium, tungsten, tin, indium and aluminum, but preferred are chromium oxide or tin oxide. Can give examples of things.

また、金属酸化物と同様に中間膜として用いられる金属
窒化物としては、たとえば窒化クロム、窒化チタン、窒
化タングステンクのようなりロム、チタンおよびタング
ステン等の金属の窒化物が挙げられるが、好ましいもの
として、クロムの窒化物を例示することができる。
In addition, metal nitrides that can be used as intermediate films in the same way as metal oxides include, for example, chromium nitride, titanium nitride, tungsten nitride, and nitrides of metals such as chromium nitride, titanium nitride, tungsten nitride, titanium, and tungsten. An example of this is chromium nitride.

本発明においてはこの中間膜の厚みを従来よりも大きく
しても特に弊害が認められないので、その許容領域を従
来よりも広くすることができる。
In the present invention, no particular adverse effects are observed even if the thickness of the intermediate film is made larger than before, so the allowable range can be made wider than before.

この中間膜の厚さの範囲は通常50A〜2000 Aで
あり、好ましくは100人〜1000 Aである。
The thickness range of this interlayer film is usually 50A to 2000A, preferably 100A to 1000A.

本発明の反射鏡において、前記中間層の上に積層する光
反射層としては、例えばアルミニウム、金、銀、銅のよ
うな金属まj:は窒化チタンのような金属化合物が用い
られる。この光反射層の膜厚は、通常500A〜300
0人であり、好ましくは700〜2000人である。
In the reflecting mirror of the present invention, the light reflecting layer laminated on the intermediate layer is made of, for example, a metal such as aluminum, gold, silver, or copper, or a metal compound such as titanium nitride. The thickness of this light reflective layer is usually 500A to 300A.
0 people, preferably 700 to 2000 people.

本発明においては、光反射層の上に、必要に応じて保護
層を設けるが、この層は酸化シリコ7 (SiOx、 
l≦X≦2)からなり、その先学膜厚(nd)を反射光
波長(λ)の1/2に設定することにより、増反射効果
が生じるので好ましい。
In the present invention, a protective layer is provided on the light reflective layer as necessary, but this layer is made of silicon oxide 7 (SiOx,
l≦X≦2), and by setting the film thickness (nd) to 1/2 of the reflected light wavelength (λ), an increased reflection effect is produced, which is preferable.

また、本発明においては保護層として、低屈折層(L層
)と高屈折層(H層)の交互層から成り、少なくとも6
の偶数層が積層されている層を設けることもでき、各層
の光学膜厚(nd)は、それぞれ反射光波長(λ)の1
/2にすることが好ましい。
Further, in the present invention, the protective layer is composed of alternating layers of low refractive layers (L layers) and high refractive layers (H layers), and has at least 6
It is also possible to provide a layer in which an even number of layers are laminated, and the optical thickness (nd) of each layer is 1 of the reflected light wavelength (λ).
/2 is preferable.

この際、L層としては、通常、sio、mgp、等を用
いるのが好ましく、またH層としてはTiO2、Ce0
1、Ta□0、またはZrO,とT10.との混合物を
用いるのが好ましい。
At this time, it is usually preferable to use sio, mgp, etc. as the L layer, and TiO2, Ce0, etc. as the H layer.
1, Ta□0, or ZrO, and T10. It is preferable to use a mixture with

[発明の効果] 次に、本発明の効果Iこついて説明すると、ガラスのよ
うな透明基材の上に、中間層としてチタン(Ti)層ま
たはクロム(C「)層を形成させ、その上に光反射層と
して銅(Cu)ffl(膜厚2000人)を積層させて
成る従来の反射鏡lこおいては、中間層の厚みが増加す
ると、既に述べたように反射率の低下が生じる。
[Effects of the Invention] Next, to explain the effect I of the present invention in detail, a titanium (Ti) layer or a chromium (C'') layer is formed as an intermediate layer on a transparent substrate such as glass, and then In a conventional reflector made by laminating copper (Cu) ffl (film thickness: 2,000 yen) as a light reflecting layer on a mirror, as the thickness of the intermediate layer increases, the reflectance decreases as already mentioned. .

この関係を第1図および第1表を用いて示すと、第1図
は、中間層としてCrを用い、光反射層としてCu(膜
厚200OA)を用いた従来の反射鏡に、波長1゜3μ
lの半導体レーザー光線を入射した場合、その入射角4
5″における反射率を示したものであって、図の横軸は
C「中間層の膜厚(人)を、縦軸は光反射率(%)を表
す。m1表はこの場合において、Cr中間層の膜厚が1
0人と100人のときの反射鏡の光線反射率を表したも
のである。
This relationship is shown using Fig. 1 and Table 1. Fig. 1 shows that a conventional reflecting mirror using Cr as an intermediate layer and Cu (film thickness 200 OA) as a light reflecting layer has a wavelength of 1°. 3μ
When a semiconductor laser beam of l is incident, its angle of incidence is 4
5", the horizontal axis of the figure represents the film thickness (layer) of the C" intermediate layer, and the vertical axis represents the light reflectance (%). The thickness of the intermediate layer is 1
It shows the light reflectance of the reflecting mirror when there are 0 people and 100 people.

第1表から明らかなように、Cr中間層の膜厚が増加す
ると、P偏光、S偏光いずれの場合においても光線反射
率が大きく低下する。
As is clear from Table 1, when the film thickness of the Cr intermediate layer increases, the light reflectance decreases significantly for both P-polarized light and S-polarized light.

そしてこの反射鏡において、基体としてポリカーボネー
トを用いた場合、Cr中間層の膜厚が10人では粘着テ
ープを貼着したのち引き剥がす剥離テストにおいて、膜
の一部剥離が生じて膜付けは不十分であった。一方、膜
厚が100人では膜付けは良好であるが、反射率の低下
が問題となっている。
In this reflector, when polycarbonate is used as the base, when the thickness of the Cr intermediate layer is 10 people, part of the film peels off in a peel test in which adhesive tape is applied and then peeled off, resulting in insufficient film attachment. Met. On the other hand, when the film thickness is 100 mm, the film adhesion is good, but a decrease in reflectance becomes a problem.

そして、この傾向は波長780nn+のレーザー光線を
用いた場合にも同様であった。
This tendency was also the same when a laser beam with a wavelength of 780 nn+ was used.

これに対し、基体上に中間層として、例えば窒化クロム
(CrN)層を設け、その上に光線反射層としてアルミ
ニウム(AI)層を膜厚1000人〜2000人で積層
して成る本発明の反射鏡について、波長780nmのレ
ーザー光線を入射角45°で入射させた場合メこおける
CrN中間層の膜厚と反射鏡の光線反射率との関係を第
2図および第2表に示す。
On the other hand, in the reflector of the present invention, a chromium nitride (CrN) layer is provided as an intermediate layer on the substrate, and an aluminum (AI) layer is laminated thereon as a light reflecting layer with a thickness of 1,000 to 2,000 layers. FIG. 2 and Table 2 show the relationship between the thickness of the CrN intermediate layer and the light reflectance of the mirror when a laser beam with a wavelength of 780 nm is incident at an incident angle of 45 degrees.

第2表(本発明の反射鏡) 許容限界を従来よりも大きい領域メこ広げることが可能
である。
Table 2 (Reflector of the present invention) It is possible to extend the allowable limit to a much larger area than before.

このため、本発明にしたがえば反射鏡の光線反射率を低
下させることなく、光反射層の基体への膜付けの向上を
図ることができると共に反射鏡の耐環境性の向上を実現
させることができる。
Therefore, according to the present invention, it is possible to improve the attachment of the light reflecting layer to the substrate without reducing the light reflectance of the reflecting mirror, and it is also possible to improve the environmental resistance of the reflecting mirror. Can be done.

なお、本発明の反射鏡において、基体としてポリカーボ
ネートを用いた場合のCrN中間層の膜厚と既述の粘着
テープによる膜の剥離との関係は次の第3表の通りであ
った。
In addition, in the reflecting mirror of the present invention, the relationship between the film thickness of the CrN intermediate layer and the peeling of the film by the above-mentioned adhesive tape when polycarbonate was used as the base was as shown in Table 3 below.

この第2表と第1表の対比から明らかなように、本発明
の反射鏡においては、中間層の膜厚を増加させても光線
反射率の低下率が第1表(従来)の場合に比べて格段に
少ない。
As is clear from the comparison between Table 2 and Table 1, in the reflecting mirror of the present invention, even if the thickness of the intermediate layer is increased, the rate of decrease in light reflectance is the same as in Table 1 (conventional). It's much less compared to that.

したがって、本発明においては、中間層の膜厚の×・・
・・剥離  ○・・・・・剥離なしこの種の反射鏡にお
いては、光線反射率は通常85%以上を得ることが必要
とされている。そのためには、本発明の反射鏡に8ける
CrN中間層の膜厚は、第3表におけるテープ剥離性も
考慮して、通常50人〜1500人の範囲内で適宜選択
することが好ましい。
Therefore, in the present invention, the film thickness of the intermediate layer is
...Peeling ○...No peeling In this type of reflecting mirror, it is usually necessary to obtain a light reflectance of 85% or more. To this end, the thickness of the CrN intermediate layer in the reflector of the present invention in 8 is preferably selected appropriately within the range of 50 to 1500, taking into account the tape removability shown in Table 3.

以上、中間層として窒化クロム(Cr?J)を用いた場
合の本発明の効果について説明したが、中間層として他
の金属窒化物や金属酸化物を用い、上記窒化クロム(C
rN)の場合と同様のテストをした場合のそれぞれの最
適膜厚、は次の第4表の通りであ・ンtこ 。
The effects of the present invention when chromium nitride (Cr?J) is used as the intermediate layer have been explained above.
The optimum film thickness for each test conducted in the same manner as in the case of rN) is shown in Table 4 below.

第4表(本発明の反射鏡) 本発明に従い、基体上に金属酸化物または金属窒化物か
らなる中間層を設け、その上に光反射層を積層した後、
この光反射層の上に更に酸化シリコン(SiOx、1≦
X≦2)からなる保護膜を設け、その光学膜厚(ad)
を反射光波長(λ)、例えば780n+nの1./2に
設定することにより、この保護膜が設けられない場合に
比べて、光反射率を3〜5%増加させることができる。
Table 4 (Reflector of the present invention) According to the present invention, after providing an intermediate layer made of a metal oxide or metal nitride on a substrate and laminating a light reflecting layer thereon,
On top of this light-reflecting layer, silicon oxide (SiOx, 1≦
A protective film consisting of X≦2) is provided, and its optical film thickness (ad)
is the reflected light wavelength (λ), for example 1.780n+n. /2, the light reflectance can be increased by 3 to 5% compared to the case where this protective film is not provided.

また、この場合には反射鏡の耐環境性を向上させること
もでさる。
Further, in this case, it is also possible to improve the environmental resistance of the reflecting mirror.

更に、本発明においては、光反射層の上に、低屈折材料
(Sin!またはMgFz)からなる低屈折層(L層、
)と高屈折材料(Ti0z、Ce01、Tazogまた
はZnO2とTiO3の混合物)からなる低屈折層(H
層)の繰り返しから構成される保護膜を設けることによ
っても反射鏡の光反射率を増加させることができる。
Furthermore, in the present invention, a low refractive layer (L layer,
) and a low refractive layer (H
The light reflectance of the mirror can also be increased by providing a protective film consisting of repeated layers.

したがって、本発明においては、光反射層の上に、必要
に応じて更にこのような保護膜を設けることもできる。
Therefore, in the present invention, such a protective film can be further provided on the light reflecting layer, if necessary.

[実施例1 次に、実施例により本発明を具体的に説明するが、これ
により本発明が限定されるものではないことはいうまで
もない。
[Example 1] Next, the present invention will be specifically explained with reference to Examples, but it goes without saying that the present invention is not limited to these.

なお、以下の各実施例においては、中間層、光反射層お
よび保:J層等の製膜に高周波イオンプレーテ(フグ法
を適用させたが、本発明においてはこの製膜法だけに限
定されず、他の製膜法、例えばスパッタリング法を適用
させることもできる。
In each of the following examples, a high frequency ion plate (Fugu method) was applied to form the intermediate layer, light reflective layer, protective layer, etc., but the present invention is limited to this film forming method. However, other film forming methods such as sputtering can also be applied.

実施例1 ポリカーポ半一ド樹脂の成型部材を基体とし、この基体
の上に、中間層として窒化クロム層を高周波イオンプレ
ーテ(フグ法により、クロム蒸発源を電子銃で加熱蒸発
させて製膜した。a膜条性は以下の通りであった。
Example 1 A molded polycarbonate resin member was used as a base, and a chromium nitride layer was formed as an intermediate layer on this base using a high-frequency ion plate (Fugu method) by heating and evaporating a chromium evaporation source with an electron gun. The membrane striae properties were as follows.

次いで、この窒化クロム中間層の上に光反射層(A1層
)と保護層(Si03層)を以下に示す条件で順次形成
させて本発明の反射鏡を作成した。
Next, a light reflecting layer (A1 layer) and a protective layer (Si03 layer) were sequentially formed on this chromium nitride intermediate layer under the conditions shown below to create a reflecting mirror of the present invention.

このようにして作成した反射鏡に、波長7800人の半
導体レーザー光線を入射角45″で入射した場合の光線
反射率は、88%〜86%(P偏光)、89%〜87%
(S偏光)であった。
When a semiconductor laser beam with a wavelength of 7,800 wavelengths is incident on the reflector made in this way at an incident angle of 45'', the light reflectance is 88% to 86% (P polarized light) and 89% to 87%.
(S polarized light).

そして、反射鏡に粘着テープを貼著しI;後、引き剥が
す剥離テストにおいても膜の剥離は全く認められず、膜
付けは良好であった。
Also, in a peel test in which adhesive tape was pasted on the reflective mirror and then peeled off, no peeling of the film was observed, indicating that the film was well attached.

また、反射鏡を温度60°C1湿度90%の環境下に2
4時間放置した場合(耐環境性テスト)においても上記
剥離性の劣化は認められなかった。
In addition, the reflector was placed in an environment with a temperature of 60°C and humidity of 90%.
Even when the film was left for 4 hours (environmental resistance test), no deterioration in the releasability was observed.

実施例2 ポリメチルメタクリレート樹脂の成型部材を基体とし、
この基体の上メこ、中間層として酸化錫層を高周波イオ
ンブレーティング法により、錫蒸発源を電子銃で加熱蒸
発させて製膜した。製膜条件は以境性テストを実施例1
と同じ条件で行ったところ、実施例1と同様の良好な結
果が得られた。
Example 2 A molded member of polymethyl methacrylate resin is used as a base,
A tin oxide layer was formed as an intermediate layer on the upper surface of this substrate by high-frequency ion blasting, by heating and evaporating a tin evaporation source with an electron gun. The film forming conditions were as per the boundary test in Example 1.
When conducted under the same conditions as in Example 1, good results similar to those in Example 1 were obtained.

実施例3 ポリカーボネーi・樹脂の成型部材を基体とし、この基
体の上に、中間層として窒化チタン層を高周波イオンプ
レーテ(フグ法により、チタン蒸発源を電子銃で加熱蒸
発させて製膜した。製膜条件はおよび保護層(Sin、
層)を実施例1の場合と全く同じ条件で順次形成させて
、本発明の反射鏡を作成した。このようにして作成した
反射鏡に、波長7800Aの半導体レーザー光線を入射
角45″で入射した場合の光線反射率は、87%〜85
%(P偏光)、88%〜85%(S偏光)であった。
Example 3 A polycarbonate I/resin molded member was used as a base, and a titanium nitride layer was formed as an intermediate layer on this base by high-frequency ion plate (Fugu method) by heating and evaporating a titanium evaporation source with an electron gun. The film forming conditions were as follows: and protective layer (Sin,
layers) were sequentially formed under exactly the same conditions as in Example 1 to create a reflective mirror of the present invention. When a semiconductor laser beam with a wavelength of 7800A is incident on the reflector thus prepared at an incident angle of 45'', the light reflectance is 87% to 85%.
% (P polarized light) and 88% to 85% (S polarized light).

そして、実施例1に示した剥離テストおよび耐環(A1
層)と保護層(Sin、層)を実施例1の場合と全く同
じ条件で順次形成させて、本発明の反射鏡を作成した。
Then, the peel test and ring resistance (A1
A reflective mirror of the present invention was produced by sequentially forming a protective layer (Sin layer) and a protective layer (Sin layer) under exactly the same conditions as in Example 1.

このようにして作成した反射鏡に、波長7800 Aの
半導体レーザー光線を入射角45°で入射しI;場合の
光線反射率は、89%〜85%(P偏光)、89%〜8
6%(S偏光)であった。
When a semiconductor laser beam with a wavelength of 7800 A is incident at an incident angle of 45° on the reflector thus created, the light reflectance is 89% to 85% (P polarized light), 89% to 8
It was 6% (S polarized light).

そして、実施例1に示した剥離テストおよび耐環境性テ
ストを実施例1と同じ条件で行ったところ、実施例1と
同様の良好な結果が得られた。
Then, when the peel test and environmental resistance test shown in Example 1 were conducted under the same conditions as in Example 1, good results similar to those in Example 1 were obtained.

【図面の簡単な説明】 第1図は、従来の反射鏡におけるクロム中間層(Cr層
)の膜厚と反射鏡の光反射率の関係を表す図であって、
図の横軸はクロム中間層(Cr層)の膜厚(人)を、縦
軸は反射鏡の光反射率(%)を表す。 第2図は、本発明の反射鏡における中間層の膜厚と反射
鏡の光反射率の関係を表す図であって、図の横軸は中間
層の膜厚(人)を、縦軸は反射鏡の光反射率(%)を表
す。
[Brief Description of the Drawings] Fig. 1 is a diagram showing the relationship between the film thickness of the chromium intermediate layer (Cr layer) and the light reflectance of the reflecting mirror in a conventional reflecting mirror,
The horizontal axis of the figure represents the film thickness (in thickness) of the chromium intermediate layer (Cr layer), and the vertical axis represents the light reflectance (%) of the reflecting mirror. FIG. 2 is a diagram showing the relationship between the film thickness of the intermediate layer and the light reflectance of the reflective mirror in the reflective mirror of the present invention. Represents the light reflectance (%) of a reflecting mirror.

Claims (6)

【特許請求の範囲】[Claims] (1)基体上に金属酸化物からなる中間層を設け、その
上に光反射層を積層し、更に必要に応じて、この光反射
層の上に保護層を積層して成る反射鏡。
(1) A reflecting mirror comprising an intermediate layer made of a metal oxide provided on a substrate, a light reflecting layer laminated thereon, and, if necessary, a protective layer laminated on the light reflecting layer.
(2)金属酸化物として、クロム、チタン、タングステ
ン、錫、インジュームおよびアルミニウムからなる群か
ら選ばれた金属の酸化物を用いる特許請求の範囲第(1
)項記載の反射鏡。
(2) Claim 1 uses an oxide of a metal selected from the group consisting of chromium, titanium, tungsten, tin, indium, and aluminum as the metal oxide.
Reflector described in ).
(3)光反射層として、アルミニウム、金、銀、銅また
は窒化チタンを用いる特許請求の範囲第(1)項または
第(2)項記載の反射鏡。
(3) The reflecting mirror according to claim (1) or (2), in which the light reflecting layer is made of aluminum, gold, silver, copper, or titanium nitride.
(4)基体上に金属窒化物からなる中間層を設け、その
上に光反射層を積層し、更に必要に応じて、この光反射
層の上に保護層を積層して成る反射鏡。
(4) A reflecting mirror comprising an intermediate layer made of metal nitride provided on a base, a light reflecting layer laminated thereon, and further a protective layer laminated on this light reflecting layer as required.
(5)金属窒化物として、クロム、チタンおよびタング
ステンからなる群から選ばれた金属の窒化物を用いる特
許請求の範囲第(4)項記載の反射鏡。
(5) The reflecting mirror according to claim (4), wherein the metal nitride is a metal nitride selected from the group consisting of chromium, titanium, and tungsten.
(6)光反射層として、アルミニウム、金、銀、銅また
は窒化チタンを用いる特許請求の範囲第(4)項または
第(5)項記載の反射鏡。
(6) The reflecting mirror according to claim (4) or (5), in which the light reflecting layer is made of aluminum, gold, silver, copper, or titanium nitride.
JP63263269A 1988-10-18 1988-10-18 Reflector Expired - Lifetime JP2838525B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63263269A JP2838525B2 (en) 1988-10-18 1988-10-18 Reflector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63263269A JP2838525B2 (en) 1988-10-18 1988-10-18 Reflector

Publications (2)

Publication Number Publication Date
JPH02109003A true JPH02109003A (en) 1990-04-20
JP2838525B2 JP2838525B2 (en) 1998-12-16

Family

ID=17387114

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2838525B2 (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4104735A1 (en) * 1990-02-16 1992-02-27 Asahi Optical Co Ltd FLAECHENREFLEKTOR
US6535336B2 (en) 2000-06-02 2003-03-18 Canon Kabushiki Kaisha High reflection mirror
US6916101B2 (en) * 1999-12-24 2005-07-12 Canon Kabushiki Kaisha Metallic mirror, metallic rotary polygonal mirror, and process for their production
JP2006515681A (en) * 2002-10-10 2006-06-01 グラヴルベル Hydrophilic reflective article
JP2007247166A (en) * 2006-03-14 2007-09-27 Sumitomo Chemical Co Ltd Road mirror
US7452604B2 (en) 2003-07-07 2008-11-18 Kabushiki Kaisha Kobe Seiko Sho Reflective Ag alloy film for reflectors and reflector provided with the same
JP2008541366A (en) * 2005-05-11 2008-11-20 ナムローゼ・フェンノートシャップ・ベーカート・ソシエテ・アノニム Reflectors for infrared radiating elements
JP2013102046A (en) * 2011-11-08 2013-05-23 Nikkeikin Aluminium Core Technology Co Ltd Manufacturing method of aluminum circuit substrate and aluminum circuit substrate
CN108196329A (en) * 2017-12-19 2018-06-22 中国航空工业集团公司洛阳电光设备研究所 A kind of preparation method of medium-wave infrared medium enhancing metal high-reflecting film
US10444493B2 (en) 2014-08-01 2019-10-15 Seiko Epson Corporation Electro-optical device, manufacturing method for electro-optical device, and electronic apparatus
CN114933422A (en) * 2022-05-17 2022-08-23 长兴旗滨节能玻璃有限公司 Antireflection coated glass and preparation method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61219004A (en) * 1985-03-25 1986-09-29 Canon Inc multilayer reflector
JPS62165601A (en) * 1986-01-17 1987-07-22 Kobe Steel Ltd Reflecting mirror for laser beam
JPS62183401A (en) * 1986-02-07 1987-08-11 Minolta Camera Co Ltd Reflecting mirror
JPS6484215A (en) * 1987-09-28 1989-03-29 Seiko Epson Corp Plastic optical parts
JPH01300202A (en) * 1988-05-27 1989-12-04 Sharp Corp Reflector and interference device using said reflector

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61219004A (en) * 1985-03-25 1986-09-29 Canon Inc multilayer reflector
JPS62165601A (en) * 1986-01-17 1987-07-22 Kobe Steel Ltd Reflecting mirror for laser beam
JPS62183401A (en) * 1986-02-07 1987-08-11 Minolta Camera Co Ltd Reflecting mirror
JPS6484215A (en) * 1987-09-28 1989-03-29 Seiko Epson Corp Plastic optical parts
JPH01300202A (en) * 1988-05-27 1989-12-04 Sharp Corp Reflector and interference device using said reflector

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4104735A1 (en) * 1990-02-16 1992-02-27 Asahi Optical Co Ltd FLAECHENREFLEKTOR
DE4104735C2 (en) * 1990-02-16 1998-01-29 Asahi Optical Co Ltd surface reflector
US6916101B2 (en) * 1999-12-24 2005-07-12 Canon Kabushiki Kaisha Metallic mirror, metallic rotary polygonal mirror, and process for their production
US6535336B2 (en) 2000-06-02 2003-03-18 Canon Kabushiki Kaisha High reflection mirror
JP2006515681A (en) * 2002-10-10 2006-06-01 グラヴルベル Hydrophilic reflective article
US7452604B2 (en) 2003-07-07 2008-11-18 Kabushiki Kaisha Kobe Seiko Sho Reflective Ag alloy film for reflectors and reflector provided with the same
JP2008541366A (en) * 2005-05-11 2008-11-20 ナムローゼ・フェンノートシャップ・ベーカート・ソシエテ・アノニム Reflectors for infrared radiating elements
JP2007247166A (en) * 2006-03-14 2007-09-27 Sumitomo Chemical Co Ltd Road mirror
JP2013102046A (en) * 2011-11-08 2013-05-23 Nikkeikin Aluminium Core Technology Co Ltd Manufacturing method of aluminum circuit substrate and aluminum circuit substrate
US10444493B2 (en) 2014-08-01 2019-10-15 Seiko Epson Corporation Electro-optical device, manufacturing method for electro-optical device, and electronic apparatus
CN108196329A (en) * 2017-12-19 2018-06-22 中国航空工业集团公司洛阳电光设备研究所 A kind of preparation method of medium-wave infrared medium enhancing metal high-reflecting film
CN114933422A (en) * 2022-05-17 2022-08-23 长兴旗滨节能玻璃有限公司 Antireflection coated glass and preparation method thereof
CN114933422B (en) * 2022-05-17 2024-05-24 长兴旗滨节能玻璃有限公司 Anti-reflection coated glass and preparation method thereof

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