JPH02129997A - Manufacture of multilayer ceramic circuit substrate - Google Patents

Manufacture of multilayer ceramic circuit substrate

Info

Publication number
JPH02129997A
JPH02129997A JP28257388A JP28257388A JPH02129997A JP H02129997 A JPH02129997 A JP H02129997A JP 28257388 A JP28257388 A JP 28257388A JP 28257388 A JP28257388 A JP 28257388A JP H02129997 A JPH02129997 A JP H02129997A
Authority
JP
Japan
Prior art keywords
point metal
high melting
metal layer
layer
melting point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28257388A
Other languages
Japanese (ja)
Inventor
Morimichi Kanda
神田 守道
Kyoji Saeki
佐伯 恭二
Hisatomi Taguchi
久富 田口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Noritake Co Ltd
Original Assignee
Noritake Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Noritake Co Ltd filed Critical Noritake Co Ltd
Priority to JP28257388A priority Critical patent/JPH02129997A/en
Publication of JPH02129997A publication Critical patent/JPH02129997A/en
Pending legal-status Critical Current

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  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

PURPOSE:To improve electrical connection between a high melting-point metal layer and a Cu thick-film conductor by printing a junction paste layer of a specific composition on the high melting-point metal layer, connecting a junction layer obtained by calcining it, printing a Cu thick-film conductor, a resistor, and a protection body in sequence, and forming calcination under non-oxidized environment repeatedly. CONSTITUTION:A junction paste layer 5 containing a metal mixture powder including a nickel of 0-80weight% (preferably 40-80weight%) and a palladium of 20-100weight% (preferably 20-60weight%) is printed on a high melting-point metal layer 2 and the high melting-point metal layer 2 obtained by calcining it is connected to the high melting-point metal layer 2. Then, a Cu thick-film conductor 6, a resistor 7, and a protection body 8 are printed on it in sequence and calcined under a non-oxidized environment repeatedly. Thus. electrical connection between the high melting-point metal layer 2 and the Cu thick-film conductor 6 can be maintained fully.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、多層セラミック回路基板の製造方法に関し、
詳しくはセラミック多層基板上にCu厚膜導体、抵抗体
および保護体を印刷形成し、非酸化性雰囲気中で焼成、
焼付けする多層セラミック回路基板の製造方法に関する
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method for manufacturing a multilayer ceramic circuit board,
In detail, Cu thick film conductors, resistors and protectors are printed on a ceramic multilayer substrate, fired in a non-oxidizing atmosphere,
The present invention relates to a method for manufacturing a multilayer ceramic circuit board by baking.

[従来技術および発明が解決しようとする課題1回路の
小型化、高機能化の為に、混成厚膜集積回路基板(以下
、HIC基板という)の高密度化がさらに望まれている
。この要求に答えるシステムの1つとして、W、Mo等
を内部導体とし、アルミナ等を絶縁体とする同時焼成多
層基板上に、Cu厚膜導体を形成する多層セラミック回
路基板が求められている。Cu厚膜導体は、マイグレー
ションが起き難くまた、導電率が高い為、細い線を用い
た間隔の狭い配線が可能となる。また最近はCu厚膜シ
ステムに用いる非酸化性雰囲気焼成用の抵抗体ペースト
の改良も進み、印刷法による抵抗体の形成も実用レベル
に達している。この為デジタル回路とアナログ回路を混
在させた高機能のHIC基板にも高信頓、高機能のCu
厚膜システムの応用が可能となり、ますます、多層基板
上にCu厚膜システムを形成する必要性が増している。
[Problems to be Solved by the Prior Art and the Invention 1] In order to miniaturize circuits and improve functionality, it is further desired to increase the density of hybrid thick film integrated circuit boards (hereinafter referred to as HIC boards). As one system that meets this demand, a multilayer ceramic circuit board is required in which a Cu thick film conductor is formed on a co-fired multilayer board that uses W, Mo, or the like as an internal conductor and alumina or the like as an insulator. Cu thick film conductors are less prone to migration and have high electrical conductivity, making it possible to use thin wires and conduct wiring with narrow intervals. Recently, improvements have been made in resistor pastes for firing in non-oxidizing atmospheres used in Cu thick film systems, and the formation of resistors by printing methods has reached a practical level. For this reason, high-performance HIC boards that mix digital and analog circuits also require high-performance Cu.
As the application of thick film systems becomes possible, there is an increasing need to form Cu thick film systems on multilayer substrates.

Mo5W等の高融点金属層を内部導体とする多層基板上
に、W等の内部導体と電気的、機械的に接続をとるよう
にして、表層にCu厚膜導体を形成する方法は今までに
も幾つかの方法が検討されている。
Until now, there has been no method of forming a Cu thick film conductor on the surface layer of a multilayer substrate using a high-melting point metal layer such as Mo5W as an internal conductor by electrically and mechanically connecting it to the internal conductor such as W. Several methods are also being considered.

最も単純な方法としては、内部導体上に直接Cu厚膜導
体ペーストを印刷し、非酸化性雰囲気中で焼付けを行な
う方法があるが、この方法では内部導体とCu厚膜導体
を電気的にも機械的にも、安定した状態に接続する事は
難しい。
The simplest method is to print a Cu thick film conductor paste directly on the internal conductor and bake it in a non-oxidizing atmosphere, but this method does not allow electrical contact between the internal conductor and the Cu thick film conductor. Mechanically, it is difficult to connect in a stable state.

このことを解決する方法としては、例えば、特開昭58
−30194号公報においてはW内部導体上に、N l
 s COあるいはCu等の導電性金属よりなるメツキ
層を設けた後この上にCu厚膜導体を形成する方法が開
示されているが、この方法はN2等の中性雰囲気中で繰
り返し焼成すると内部導体とCu厚膜導体の接続部の抵
抗が上昇する等の課題を有する。
As a method to solve this problem, for example,
-30194, on the W inner conductor, N l
A method has been disclosed in which a plating layer made of a conductive metal such as CO or Cu is formed and then a Cu thick film conductor is formed on the plating layer. There are problems such as an increase in resistance at the connection portion between the conductor and the Cu thick film conductor.

また、特公昭59−155995号公報においてはM 
o 。
In addition, in Japanese Patent Publication No. 59-155995, M
o.

W等の内部導体上に、Niメツキを施した後、さらにN
iペーストを印刷、焼付けた上に、表層のCu厚膜導体
を印刷、焼付けする方法が提案されている。また、W内
部導体上にNiメツキを施した後、ざらにCuメツキを
施した上に、Cuペーストを印刷、焼付けする方法も提
案されているが、どちらの方法も工程として湿式のメツ
キ工程を含み、かつ2以上の工程が必要な事から繁雑で
あり、さらにメツキが後のCu厚膜導体形成工程におけ
る非酸化性雰囲気下の焼成での熱応力で、剥れ易くなる
という課題を何する。
After applying Ni plating on the internal conductor such as W, further N
A method has been proposed in which the i-paste is printed and baked, and then a surface Cu thick film conductor is printed and baked. Additionally, a method has been proposed in which Ni plating is applied to the W internal conductor, followed by rough Cu plating, and then a Cu paste is printed and baked, but both methods require a wet plating process. The problem is that the plating is complicated as it requires two or more steps, and the plating tends to peel off due to thermal stress during firing in a non-oxidizing atmosphere in the subsequent Cu thick film conductor formation process. .

Cu厚膜導体を表層に持つ抵抗体付きのHIC基板では
、Cu厚膜導体焼成および抵抗体焼成の少なくとも2回
、非酸化性雰囲気下で焼成を行なう必要があり、内部導
体とCu厚膜導体の機械的、電気的接続は、この工程後
も安定している事が必要である。今までに提案されてい
る方法では、この安定性及び工程の簡素さという点で不
充分であり、より安定な電気的接続が得られ、かつ簡素
な工程が必要とされている。
For HIC boards with resistors that have a Cu thick film conductor on the surface layer, it is necessary to perform firing in a non-oxidizing atmosphere at least twice: firing the Cu thick film conductor and firing the resistor. The mechanical and electrical connections must remain stable after this step. The methods proposed so far are insufficient in terms of stability and process simplicity, and there is a need for a more stable electrical connection and a simpler process.

本発明の目的は、内部導体とCu厚膜導体の電気的、機
械的な接続が優れかつ安価な多層セラミック回路基板の
製造方法を提供する事にある。
An object of the present invention is to provide an inexpensive method for manufacturing a multilayer ceramic circuit board with excellent electrical and mechanical connections between internal conductors and Cu thick film conductors.

[課題を解決するための手段および作用]本発明者等は
上記目的を達成するため、種々検討した結果、内部導体
である高融点金属層上に一定組成のペーストを印刷する
ことによりて、本発明を完成するに至った。
[Means and effects for solving the problem] In order to achieve the above object, the inventors of the present invention have made various studies and have developed the present invention by printing a paste of a certain composition on the high melting point metal layer which is the internal conductor. The invention was completed.

すなわち、本発明の多層セラミック回路基板の製造方法
は、アルミナセラミックスを絶縁体とし、高融点金属層
を内部導体として構成した多層配線基板上にCu厚膜導
体、抵抗体および保護体を非酸化性雰囲気中で焼成、焼
付するセラミック回路基板の製造方法において、前記高
融点金属層上に、パラジウム粉末またはパラジウムを2
0重量%以上、ニッケルを80重量%以下含む混合粉末
を含有する接合ペースト層を印刷し、これを焼成した接
合層を高融点金属層と接続した後に、この上にCu厚膜
導体、抵抗体および保護体を順次、印刷と非酸化性雰囲
気下の焼成を繰り返して形成するものである。
That is, the method for manufacturing a multilayer ceramic circuit board of the present invention is to form a Cu thick film conductor, a resistor, and a protector in a non-oxidizing manner on a multilayer wiring board composed of alumina ceramics as an insulator and a high melting point metal layer as an internal conductor. In a method for manufacturing a ceramic circuit board in which firing and baking is performed in an atmosphere, palladium powder or palladium is added to the high melting point metal layer.
After printing a bonding paste layer containing a mixed powder containing 0% by weight or more and 80% by weight or less of nickel, and connecting the bonding layer by firing this with a high melting point metal layer, a Cu thick film conductor and a resistor are placed on top of this. and a protective body are formed by sequentially repeating printing and firing in a non-oxidizing atmosphere.

本発明で用いられる接合用ペーストは、ニッケルを0〜
80重量%、好ましくは40〜80重量%、パラジウム
を20〜100重量%、好ましくは20〜60重量%含
む金属粉末または金属混合粉末(以下、金属粉末と総称
する)を含をするものである。
The bonding paste used in the present invention contains 0 to 0 nickel.
Contains metal powder or metal mixed powder (hereinafter collectively referred to as metal powder) containing 80% by weight, preferably 40 to 80% by weight, and 20 to 100% by weight, preferably 20 to 60% by weight of palladium. .

Niの含有量が80重量%を超えると高融点金属層と接
合ペーストを焼成して得られる接合層の接合が弱くなり
、高融点金属層から接合層が容易に剥れ易くなり、接続
抵抗の変化率が高くなり過ぎ、焼成回数に対して早く抵
抗値が上昇する。このため、非酸化性雰囲気下、約90
0℃で繰り返し焼成を行なうと、電気的接続が失われて
しまう。
If the Ni content exceeds 80% by weight, the bond between the high-melting point metal layer and the bonding layer obtained by firing the bonding paste will become weak, the bonding layer will easily peel off from the high-melting point metal layer, and the connection resistance will decrease. The rate of change becomes too high, and the resistance value increases quickly with respect to the number of firings. Therefore, under a non-oxidizing atmosphere, approximately 90
Repeated firing at 0°C results in loss of electrical connection.

また、Niの含有量が0〜40重量%、Pdの含有量が
60〜100重量%の範囲では、接合ペーストがガラス
粉末、アルミナ粉末を含有する場合、高融点金属層と接
合層の接合が形成される以前に、高融点金属が凝集して
玉のようになりがちで高融点金属層と接合層の接合が形
成され難い時がある。
In addition, when the Ni content is in the range of 0 to 40% by weight and the Pd content is in the range of 60 to 100% by weight, when the bonding paste contains glass powder or alumina powder, the bonding between the high melting point metal layer and the bonding layer is difficult. Before the high melting point metal layer is formed, the high melting point metal tends to aggregate into beads, making it difficult to form a bond between the high melting point metal layer and the bonding layer.

これら各成分の粒径範囲は、NiO,1〜1μm1Pd
O,2〜 1μmが好ましい。
The particle size range of each of these components is NiO, 1 to 1 μm, 1 Pd
O, 2 to 1 μm is preferable.

また、本発明に用いられるペーストには、上記金属粉末
成分に加えて、ガラス粉末、アルミナ粉末またはエチル
セルロース系樹脂、アクリル系樹脂等のを機バインダー
やブチルカルピトールアセテート、α−ターピネオール
、石油系高沸点溶剤等の有機溶剤が好ましく含有される
In addition to the above-mentioned metal powder components, the paste used in the present invention also contains binders such as glass powder, alumina powder, ethyl cellulose resin, acrylic resin, butyl carpitol acetate, α-terpineol, petroleum-based high Organic solvents such as boiling point solvents are preferably contained.

ガラス粉末は、ホウケイ酸ガラス粉末、ホウケイ酸バリ
ウムガラス粉末、アルミノホウケイ酸カルシウムガラス
粉末等が望ましく用いられ、ガラス中の金属酸化物がW
等によって還元されないものが良く、例えば、PbOや
ZnOを多量に含むものは好ましくない。ペースト中に
ガラス粉末とアルミナ粉末が同時に存在するとペースト
加熱時にアルミナ粉末とガラス粉末中のSiO2、Ca
O等が反応し、ガラスの一部が結晶化してアノーサイト
を生じ、強度が増加する。このガラス粉末の含有量は、
前記した金属粉末100重量部に対して10〜20重量
部が好ましい。ガラス粉末の含有量が10重量部未満で
は、セラミック基板製造時に接合層の周辺部がアルミナ
絶縁層から剥離し易くなり、また20重量部を超えると
、接合層上に形成される厚膜導体の半田濡れ性が悪化す
る等の可能性が高まる。ガラス粉末の軟化点は約800
〜900℃、平均粒径は2〜3μmが好ましい。
As the glass powder, borosilicate glass powder, barium borosilicate glass powder, calcium aluminoborosilicate glass powder, etc. are preferably used, and the metal oxide in the glass is W.
It is preferable to use a material that cannot be reduced by, for example, a material containing a large amount of PbO or ZnO. If glass powder and alumina powder are present in the paste at the same time, SiO2 and Ca in the alumina powder and glass powder will be removed when the paste is heated.
O, etc. react, and a portion of the glass crystallizes to form anorthite, increasing its strength. The content of this glass powder is
It is preferably 10 to 20 parts by weight based on 100 parts by weight of the metal powder described above. If the glass powder content is less than 10 parts by weight, the periphery of the bonding layer will easily peel off from the alumina insulating layer during the production of the ceramic substrate, and if it exceeds 20 parts by weight, the thick film conductor formed on the bonding layer will peel off easily. There is an increased possibility that solder wettability will deteriorate. The softening point of glass powder is approximately 800
~900°C and an average particle size of 2 to 3 μm are preferred.

アルミナ粉末は、平均粒径2〜4μmのものが望ましく
用いられる。このアルミナ粉末の含有量は、前記した金
属粉末100重量部に対して1〜5重量部が好ましい。
The alumina powder preferably has an average particle size of 2 to 4 μm. The content of this alumina powder is preferably 1 to 5 parts by weight based on 100 parts by weight of the metal powder.

アルミナ粉末の含有量がITII量部未構部未満アルミ
ナ絶縁層と接合層との接着強度が低下し、また5重量部
を超えると、ガラスの結晶化が進み過ぎ、接合層と高融
点金属層、アルミナ絶縁層との応力緩和がうまく出来な
くなり、接合層が剥離したり、接合層に亀裂が入ったり
する等の可能性が生じる。
If the alumina powder content is less than the ITII part unstructured part, the adhesive strength between the alumina insulating layer and the bonding layer will decrease, and if it exceeds 5 parts by weight, the glass will crystallize too much, and the bonding layer and high melting point metal layer will , stress relaxation with the alumina insulating layer cannot be achieved properly, and there is a possibility that the bonding layer may peel off or cracks may appear in the bonding layer.

次に、本発明の多層セラミック回路基板の製造方法を図
面に基づいて詳しく説明する。
Next, a method for manufacturing a multilayer ceramic circuit board according to the present invention will be explained in detail based on the drawings.

第1図は、本発明に係る多層セラミック回路基板の縦断
面図を示し、 第2図は厚膜導体印刷パターン図を示す。
FIG. 1 shows a longitudinal cross-sectional view of a multilayer ceramic circuit board according to the present invention, and FIG. 2 shows a thick film conductor printed pattern.

第1図において、1はアルミナグリーンシート、2は高
融点金属層、3はアルミナペースト印刷層(焼成後はア
ルミナ絶縁層となる)、4は開口部−15は接合ペース
ト層(焼成後は接合層となる)、6はCu厚膜導体、7
は抵抗体、8は保護体、BOは厚膜導体印刷パターン図
をそれぞれ示す。
In Fig. 1, 1 is an alumina green sheet, 2 is a high melting point metal layer, 3 is an alumina paste printed layer (becomes an alumina insulating layer after firing), 4 is an opening, and 15 is a bonding paste layer (becomes a bonding layer after baking). layer), 6 is Cu thick film conductor, 7
8 shows a resistor, 8 shows a protector, and BO shows a printed pattern of a thick film conductor.

本発明の製造方法においては、まず通常のアルミナグリ
ーンシート1上に、必要な層数骨のWlMo等からなる
高融点金属層2およびアルミナペースト印刷層3を形成
後、還元性雰囲気中で焼成し、内部で互いに接続された
多層の導体を有する多層基板を得る。
In the manufacturing method of the present invention, first, a requisite number of high melting point metal layers 2 made of WlMo etc. and an alumina paste printed layer 3 are formed on a regular alumina green sheet 1, and then fired in a reducing atmosphere. , obtaining a multilayer substrate having multiple layers of conductors connected to each other inside.

次に前記多層基板の焼成により得られたアルミナ絶縁層
3の開口部4より露出した高融点金属層2上に、上記し
た組成からなる接合ペーストをスクリーン印刷法にて乾
燥後の厚さが10〜30μm程度になる様に印刷し、9
00〜1100℃の温度で、N2ガスまたは必要に応じ
てN2ガスを含む非酸化性雰囲気中で、3〜15分間熱
処理を行ない接合層5を形成する。
Next, on the high melting point metal layer 2 exposed through the opening 4 of the alumina insulating layer 3 obtained by firing the multilayer substrate, a bonding paste having the above composition is applied by screen printing to a thickness of 10 mm after drying. Print so that it is about ~30μm, 9
The bonding layer 5 is formed by heat treatment at a temperature of 00 to 1100° C. for 3 to 15 minutes in N2 gas or a non-oxidizing atmosphere containing N2 gas as necessary.

N2ガスの必要量は焼成炉の構造等によって異なるが、
炉内に混入する02ガスと反応して、H,Oになる以上
のN2ガスが必要であり、通常はN2ガスとN2ガスの
体積比は0くN2ガス/N2ガス≦3の範囲が採用され
る。N2ガスを用いれば、高融点金属や接合層中のNi
の表面が酸化されていても、N2ガスによって熱処理時
に還元され、高融点金属層と接合層の接合が良好に形成
される。
The required amount of N2 gas varies depending on the structure of the kiln, etc.
It is necessary to have more N2 gas than reacts with the 02 gas mixed in the furnace to form H and O, and usually the volume ratio of N2 gas to N2 gas is 0 and a range of N2 gas/N2 gas ≦3 is adopted. be done. If N2 gas is used, Ni in high melting point metals and bonding layers can be removed.
Even if the surface is oxidized, it is reduced by N2 gas during heat treatment, and a good bond between the high melting point metal layer and the bonding layer is formed.

また、N2ガスのみで雰囲気を形成する場合は、N2ガ
ス中の酸素濃度はlOppm以下が好ましい。
Further, when forming an atmosphere using only N2 gas, the oxygen concentration in the N2 gas is preferably 1Oppm or less.

LQppiを超えると、高融点金属や接合層中のNiの
表面が酸化され、高融点金属層と接合層の電気的接続が
不充分となり、後のCu厚膜回路形成時に接続が失われ
る事がある。
If LQppi is exceeded, the surface of the high melting point metal and the Ni in the bonding layer will be oxidized, resulting in insufficient electrical connection between the high melting point metal layer and the bonding layer, and the connection may be lost during subsequent Cu thick film circuit formation. be.

熱処理温度は、900〜1100℃の範囲が好ましく、
900℃未満であると、高融点金属層と接合層の接合が
不充分となり、1100℃を超えると、高融点金属層と
接合層が反応し過ぎて、高融点金属層の体棲変化が大き
くなり、高融点金属層内に歪みが生じ、接合強度がかえ
って低下することになる。
The heat treatment temperature is preferably in the range of 900 to 1100°C,
If the temperature is less than 900°C, the bonding between the high-melting point metal layer and the bonding layer will be insufficient, and if it exceeds 1100°C, the high-melting point metal layer and the bonding layer will react too much, resulting in large changes in the body structure of the high-melting point metal layer. As a result, distortion occurs in the high melting point metal layer, and the bonding strength actually decreases.

次に、このようにして形成された接合層5の上に通常の
方法に従い、Cu厚膜導体6、抵抗体7および保護体8
の各層を形成する。
Next, a Cu thick film conductor 6, a resistor 7 and a protector 8 are deposited on the bonding layer 5 formed in this way according to a normal method.
Form each layer.

ここにおいて、Cu厚膜導体6は厚膜導体印刷パターン
60により印刷後、非酸化性雰囲気下、約900℃で焼
成される。
Here, the Cu thick film conductor 6 is printed with the thick film conductor print pattern 60 and then fired at about 900° C. in a non-oxidizing atmosphere.

また、抵抗体7は、ランタンホウ化物系や酸化スズ系の
ペーストが用いられ、約900℃で焼成される。
Further, the resistor 7 is made of a lanthanum boride paste or a tin oxide paste, and is fired at about 900°C.

保護体8は、低融点のガラスペーストや、樹脂が使用さ
れ、低融点ガラスペーストは500〜700℃程度の非
酸化性雰囲気中で焼成され、樹脂は、80〜180℃で
硬化されるか、または紫外線硬化される。
The protector 8 is made of a low melting point glass paste or resin, and the low melting point glass paste is fired in a non-oxidizing atmosphere at about 500 to 700°C, and the resin is hardened at 80 to 180°C. or UV cured.

このような製造方法により、多層セラミ・ツク回路基板
が製造される。
A multilayer ceramic circuit board is manufactured by such a manufacturing method.

[実施例コ 以下実施例および比較例により、本発明をさらに詳しく
説明する。
[Examples] The present invention will be explained in more detail with reference to Examples and Comparative Examples.

実施例1〜13 アルミナ(Ajll 203 ) 94重量%およびM
gO。
Examples 1-13 Alumina (Ajll 203) 94% by weight and M
gO.

Ca OSS io 2からなるフラックス成分6重量
%の合計100重量%の無機成分と、ポリビニルブチラ
ール(バインダー)、ジオクチルフタレート(可塑剤)
、ソルビタントリオレエート(分散剤)からなる有機成
分およびエタノール、トルエン混合溶剤から調製、混練
されたスラリーを用い、ドクターブレード法でキャリア
フィルム上に厚さ約0 、635 mmのアルミナグリ
ーンシートを形成した。
A total of 100% by weight of inorganic components including 6% by weight of a flux component consisting of Ca OSS io 2, polyvinyl butyral (binder), and dioctyl phthalate (plasticizer)
Using a slurry prepared and kneaded from an organic component consisting of sorbitan trioleate (dispersant) and a mixed solvent of ethanol and toluene, an alumina green sheet with a thickness of approximately 0.635 mm was formed on a carrier film using a doctor blade method. .

次に、粒径1〜5μmのW金属粉末とエチルセルロース
、ターピネオール等を主成分としたビヒクルから高融点
金属ペーストを調製し、アルミナグリーンシート上にス
クリーン印刷法で乾燥後の厚さが約20μmになるよう
印刷した。
Next, a high melting point metal paste was prepared from W metal powder with a particle size of 1 to 5 μm and a vehicle mainly composed of ethyl cellulose, terpineol, etc., and screen printed onto an alumina green sheet to a thickness of about 20 μm after drying. I printed it to look like this.

この高融点金属層ペーストを乾燥後、アルミナグリーン
シートと同じ無機成分および有機成分から調製したアル
ミナペーストを乾燥後の厚さが約50μmになるように
印刷して高融点金属層およびアルミナ絶縁層から形成さ
れる積層体を得た。
After drying this high melting point metal layer paste, an alumina paste prepared from the same inorganic and organic components as the alumina green sheet is printed so that the thickness after drying is approximately 50 μm, and the high melting point metal layer and alumina insulating layer are separated. A laminate was obtained.

前記積層体を乾燥後、N2ガス:N2ガスの体積比が1
:3程度、露点が40℃の還元性雰囲気中で、約155
0℃で焼成してセラミック回路基板を得た。
After drying the laminate, the volume ratio of N2 gas:N2 gas is 1.
: About 3, in a reducing atmosphere with a dew point of 40℃, about 155
A ceramic circuit board was obtained by firing at 0°C.

このセラミック回路基板の開口部の高融点金属層上に、
第1表に示す成分のペーストを用いて乾燥後の接合ペー
スト層の厚さが約20μmとなるように印刷し、乾燥後
、N2ガス雰囲気中またはN2ガス二N2ガスの体積比
がに3程度の乾燥した混合ガス雰囲気中、900〜10
00℃で10分間熱処理をした。
On the high melting point metal layer in the opening of this ceramic circuit board,
Print using a paste with the components shown in Table 1 so that the thickness of the bonding paste layer after drying is approximately 20 μm, and after drying, either in an N2 gas atmosphere or at a volume ratio of about 3 to 3. in a dry mixed gas atmosphere of 900-10
Heat treatment was performed at 00°C for 10 minutes.

このペーストに用いられたNi金属粉末の粒径は0.1
〜0.5 μm、 P d金属粉末の粒径は0.3〜0
.8μmsガラス粉末(SL0255重量%、B20、
 9重量%、AJ20,14重量%、Ca020重量%
、Mg02重量%、軟化魚釣840℃)の平均粒径は2
〜3μmおよびアルミナ粉末の平均粒径は2〜4μmの
ものを用い、ヒビクルとしてはアクリル系樹脂とターピ
ネオールを用いた。
The particle size of the Ni metal powder used in this paste was 0.1
~0.5 μm, Pd metal powder particle size is 0.3~0
.. 8μms glass powder (SL0255% by weight, B20,
9% by weight, AJ20, 14% by weight, Ca020% by weight
, Mg02% by weight, softened fish at 840°C) has an average particle size of 2
~3 μm and alumina powder having an average particle size of 2 to 4 μm, and acrylic resin and terpineol were used as vehicles.

このようにして得られた基板上に、Cu厚膜導体を第2
図に示されるパターンを用いて印刷し、900℃の非酸
化性雰囲気中で焼成した。
A second Cu thick film conductor is placed on the substrate thus obtained.
The pattern shown in the figure was printed and baked in a non-oxidizing atmosphere at 900°C.

この後、第2図の端子AB間の電気抵抗を測定した。ま
た2回〜5回焼成後の電気抵抗も測定し、それらの結果
を第1表に示した。
After this, the electrical resistance between terminals AB in FIG. 2 was measured. The electrical resistance after firing 2 to 5 times was also measured, and the results are shown in Table 1.

本発明により製造される多層セラミック回路基板は、高
密度化を目的とするため、基板の両面に回路を形成する
場合が多く、この場合、表面の厚膜導体、抵抗体、裏面
の厚膜導体、抵抗体をそれぞれ約900℃で焼成後、両
面のガラス(保護体)を約850℃で同時または個別に
焼成する。よって焼成同数は最も多くて900℃4回、
650℃2回の合計6回である。このため900℃4回
、650℃2回の焼成に耐えれば充分であるが、試験条
件の統一性を欠くため、900℃焼成に耐える回数で評
価した。この時、900℃焼成4回よりも多くの焼成に
耐える必要があるとの判断により、900℃5回焼成後
の通電性をもって評価を行なった。
The purpose of the multilayer ceramic circuit board manufactured by the present invention is to achieve high density, so circuits are often formed on both sides of the board. After firing the resistors at approximately 900°C, the glasses (protectors) on both sides are fired simultaneously or separately at approximately 850°C. Therefore, the maximum number of firings is 4 times at 900℃.
A total of 6 times, 2 times at 650°C. For this reason, it would be sufficient to withstand firing at 900°C four times and 650°C twice, but since the test conditions lacked uniformity, the evaluation was made based on the number of times the product could withstand firing at 900°C. At this time, it was determined that it was necessary to endure more firing than four times at 900°C, so the evaluation was performed based on the electrical conductivity after firing at 900°C five times.

さらに実施例5の接合層ペーストを用いて接合層とアル
ミナ絶縁層との接着強度評価試験を行なった。約100
0℃で熱処理したところ、通常LKg/履2以上、少な
くとも0.5に’J/an2以上のビーリング強度が得
られた。
Further, using the bonding layer paste of Example 5, an adhesive strength evaluation test between the bonding layer and the alumina insulating layer was conducted. Approximately 100
When heat treated at 0° C., a bealling strength of usually LKg/an2 or more and at least 0.5'J/an2 or more was obtained.

比較例1〜3  。Comparative Examples 1 to 3.

第1表に示す組成の接合層ペーストを用いた以外は、実
施例1〜13と同様にして、供試試料を作成し、実施例
1〜13と同様の測定を行ない、その結果を第1表に示
した。
Test samples were prepared in the same manner as in Examples 1 to 13, except that the bonding layer paste having the composition shown in Table 1 was used, and the same measurements as in Examples 1 to 13 were performed. Shown in the table.

比較例4 実施例1〜13と同様にして、高融点金属層(タングス
テン)およびアルミナ絶縁層から成るセラミック回路基
板を作成した後、開口部の高融点金属層上に市販のホウ
素系Ni化学メツキ液を用いてホウ素を約1%含むN1
−B膜を形成し、H2ガス二N2ガスの体積比が1:3
程度の炉中で約850℃で10分間熱処理した。さらに
この上にCuの厚膜回路形成を行ない、実施例1〜13
と同様の測定を行ない、その結果を第1表に示した。
Comparative Example 4 After creating a ceramic circuit board consisting of a high melting point metal layer (tungsten) and an alumina insulating layer in the same manner as in Examples 1 to 13, commercially available boron-based Ni chemical plating was applied on the high melting point metal layer in the opening. N1 containing approximately 1% boron using liquid
-B film is formed, and the volume ratio of H2 gas and N2 gas is 1:3.
The sample was heat-treated at about 850° C. for 10 minutes in a high-temperature oven. Furthermore, a thick film circuit of Cu was formed on this, and Examples 1 to 13
The same measurements as above were carried out and the results are shown in Table 1.

第1表から明らかなように、N2ガス雰囲気下、900
℃での焼成を5回繰り返した後でも、実施例1〜13の
ペーストを用いて形成される多層セラミック回路基板は
良好な通電性を示している。
As is clear from Table 1, under N2 gas atmosphere, 900
Even after repeating the firing at °C five times, the multilayer ceramic circuit boards formed using the pastes of Examples 1 to 13 exhibit good electrical conductivity.

しかし、ペースト組成が本発明の範囲外の比較例1〜3
は5回の焼成で、いずれも抵抗値が]kΩを超えた。ま
た、N1−B膜を形成した比較例4においても1回の焼
成で抵抗値が1にΩを超えてしまった。
However, Comparative Examples 1 to 3 in which the paste composition was outside the range of the present invention
After firing five times, the resistance value exceeded [kΩ] in all cases. Further, in Comparative Example 4 in which the N1-B film was formed, the resistance value exceeded 1Ω after one firing.

[発明の効果] 以上説明したように、一定組成のペーストを多層セラミ
ック回路基板の接合層とする本発明の製造方法によって
、非酸化性雰囲気下で繰り返し焼成を行なった後も、高
融点金属層とCu厚膜導体との電気的接続は良好な状態
を保つことができる。
[Effects of the Invention] As explained above, by the manufacturing method of the present invention in which a paste with a certain composition is used as a bonding layer of a multilayer ceramic circuit board, the high melting point metal layer remains intact even after repeated firing in a non-oxidizing atmosphere. The electrical connection between the conductor and the Cu thick film conductor can be maintained in good condition.

また、高融点金属層とCu厚膜導体との間に一層しか必
要としないため工程が簡便であり、コストの上昇を抑さ
えることができる。
Further, since only one layer is required between the high melting point metal layer and the Cu thick film conductor, the process is simple and an increase in cost can be suppressed.

さらに、接合層をアルミナ絶縁層に確実かつ強固に接着
させることが可能である。
Furthermore, it is possible to reliably and firmly adhere the bonding layer to the alumina insulating layer.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明に係る多層セラミック回路基板の縦断
面図、 第2図は厚膜導体印刷パターン図を示す。 1・・・アルミナグリーンシート、 2・・・高融点金属層、 3・・・アルミナペースト印刷層(アルミナ絶縁層)、 4・・・開口部、 5・・・接合ペースト層(接合層)、 6・・・Cu厚膜導体、 7・・・抵抗体、8・・・保
護体、 80・・・厚膜導体層印刷パターン図。 特許出願人 株式会社 ノリタケ カンパニーリミテド
FIG. 1 is a longitudinal sectional view of a multilayer ceramic circuit board according to the present invention, and FIG. 2 is a thick film conductor printed pattern. DESCRIPTION OF SYMBOLS 1... Alumina green sheet, 2... High melting point metal layer, 3... Alumina paste printing layer (alumina insulation layer), 4... Opening, 5... Bonding paste layer (bonding layer), 6... Cu thick film conductor, 7... Resistor, 8... Protector, 80... Thick film conductor layer printing pattern diagram. Patent applicant Noritake Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 1.アルミナセラミックスを絶縁体とし、高融点金属層
を内部導体として構成した多層配線基板上にCu厚膜導
体、抵抗体および保護体を非酸化性雰囲気中で焼成、焼
付するセラミック回路基板の製造方法において、前記高
融点金属層上に、パラジウム粉末またはパラジウムを2
0重量%以上、ニッケルを80重量%以下含む混合粉末
を含有する接合ペースト層を印刷し、これを焼成した接
合層を高融点金属層と接続した後に、この上にCu厚膜
導体、抵抗体および保護体を順次、印刷と非酸化性雰囲
気下の焼成を繰り返して形成することを特徴とする多層
セラミック回路基板の製造方法。
1. A method for manufacturing a ceramic circuit board, in which a Cu thick film conductor, a resistor, and a protector are fired and baked in a non-oxidizing atmosphere on a multilayer wiring board composed of alumina ceramics as an insulator and a high melting point metal layer as an internal conductor. , on the high melting point metal layer, palladium powder or palladium 2
After printing a bonding paste layer containing a mixed powder containing 0% by weight or more and 80% by weight or less of nickel, and connecting the bonding layer by firing this with a high melting point metal layer, a Cu thick film conductor and a resistor are placed on top of this. A method for manufacturing a multilayer ceramic circuit board, comprising sequentially forming a protective body by repeatedly printing and firing in a non-oxidizing atmosphere.
JP28257388A 1988-11-10 1988-11-10 Manufacture of multilayer ceramic circuit substrate Pending JPH02129997A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28257388A JPH02129997A (en) 1988-11-10 1988-11-10 Manufacture of multilayer ceramic circuit substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28257388A JPH02129997A (en) 1988-11-10 1988-11-10 Manufacture of multilayer ceramic circuit substrate

Publications (1)

Publication Number Publication Date
JPH02129997A true JPH02129997A (en) 1990-05-18

Family

ID=17654246

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28257388A Pending JPH02129997A (en) 1988-11-10 1988-11-10 Manufacture of multilayer ceramic circuit substrate

Country Status (1)

Country Link
JP (1) JPH02129997A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04127496A (en) * 1990-09-18 1992-04-28 Ngk Insulators Ltd Manufacture of ceramic multilayer wiring board
JPH04127495A (en) * 1990-09-18 1992-04-28 Ngk Insulators Ltd Ceramic multilayer wiring board and manufacture thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04127496A (en) * 1990-09-18 1992-04-28 Ngk Insulators Ltd Manufacture of ceramic multilayer wiring board
JPH04127495A (en) * 1990-09-18 1992-04-28 Ngk Insulators Ltd Ceramic multilayer wiring board and manufacture thereof

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