JPH021343B2 - - Google Patents
Info
- Publication number
- JPH021343B2 JPH021343B2 JP57088240A JP8824082A JPH021343B2 JP H021343 B2 JPH021343 B2 JP H021343B2 JP 57088240 A JP57088240 A JP 57088240A JP 8824082 A JP8824082 A JP 8824082A JP H021343 B2 JPH021343 B2 JP H021343B2
- Authority
- JP
- Japan
- Prior art keywords
- electron
- electron lens
- lens
- cross
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/50—Electron guns two or more guns in a single vacuum space, e.g. for plural-ray tube
- H01J29/503—Three or more guns, the axes of which lay in a common plane
Description
【発明の詳細な説明】
本発明はインライン型カラー受像管用電子銃の
主電子レンズ構成電極の改善に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement in the main electron lens constituent electrode of an in-line color picture tube electron gun.
電子銃の解像度は主として、バイ・ポテンシヤ
ル型、ユニ・ポテンシヤル型、その他の多段集束
型からなる静電電子レンズの球面収差に制約さ
れ、高解像度特性を得るためには主電子レンズを
構成する電極直径を大きくして、電子レンズの球
面収差をを小さくする必要がある。主電子レンズ
電極直径はカラー受像管の硝子頚部内径に制限さ
れ、三電子銃が一列配列されたインライン型カラ
ー受像管では主電子レンズ電極直径は最大でも硝
子頚部内径の1/3以下となり電子銃構体設計上如
何にこの最大径に近づけるかが重要な点となつて
いる。 The resolution of the electron gun is mainly limited by the spherical aberration of the electrostatic electron lens, which can be of the bi-potential type, uni-potential type, or other multi-stage focusing type. It is necessary to increase the diameter and reduce the spherical aberration of the electron lens. The diameter of the main electron lens electrode is limited to the inner diameter of the glass neck of the color picture tube, and in an in-line color picture tube with three electron guns arranged in a row, the diameter of the main electron lens electrode is at most 1/3 or less of the inner diameter of the glass neck. An important point in designing the structure is how to approach this maximum diameter.
上記要求に基づき出願人は特願昭56−199825、
特願昭57−008433で大口径静電電子レンズを構成
する電極形成法を提案している。 Based on the above request, the applicant filed Japanese Patent Application No. 56-199825,
In Japanese Patent Application No. 57-008433, we proposed a method for forming electrodes for constructing large-diameter electrostatic electron lenses.
第1図、第2図は前述の電極形成法によつて得
られたインライン型一体化構造電子銃の主電子レ
ンズ電極構体の一例を示す断面図と平面図であ
る。 FIGS. 1 and 2 are a cross-sectional view and a plan view showing an example of a main electron lens electrode structure of an in-line integrated structure electron gun obtained by the electrode forming method described above.
即ち、電極構体1は互に開孔間距離Sで隔てら
れた中央及び両外側の三本の電子銃の軸10G,
10R,10B上に中央及び両外側電子ビーム透
過開孔11G,11R,11Bが閉塞面12に穿
設され、閉塞面12に連続して筒側部13が形成
された閉塞筒状体である。上記電子ビーム開孔周
囲は閉塞筒状体内部に突出する突状縁14で囲ま
れ、各開孔部に形成される静電電子レンズの相互
影響を防止すると共に閉塞面12を強化してい
て、その高さhは可能の限り大きく形成されてい
る。電子ビーム透過開孔11R,11G,11B
の孔径Dは互に重ならず、且つ少くとも中央開口
が完全円孔で、隣接開孔11R,11G及び11
G,11Bの間隙部15がほぼ電極構体1の形成
材板厚程度まで狭めることによつて大口径化され
ている。第3図はこの電極構体1と同一構造をし
た電極構体1′とを同一軸上10R,10G,1
0Bに対向配置し、電極構体1に高電圧、電極構
体1′に低電圧を印加した場合、三本の電子銃の
軸10R,10G,10Bを含む断面内(通常は
陰極線管蛍光面に対し水平面)に於ける主電子レ
ンズを形成する静電界を示し、主電子レンズの等
電位面とこの断面との交線である等電位線を線群
16,16′で示す。第4図は前記断面に垂直で
中央の電子銃の軸を含む断面内(通常は蛍光面に
対して垂直面)の主電子レンズ静電界を示し、主
電子レンズの等電位面とこの断面との交線である
等電位線を線群17,17′で示す。 That is, the electrode structure 1 has three electron gun shafts 10G at the center and both outer sides separated by the distance S between the openings.
It is a closed cylindrical body in which center and both outer electron beam transmission apertures 11G, 11R, 11B are bored in the closed surface 12 on the closed surfaces 10R and 10B, and a cylinder side portion 13 is formed continuously to the closed surface 12. The periphery of the electron beam aperture is surrounded by a protruding edge 14 that protrudes into the inside of the closed cylindrical body, which prevents mutual influence of the electrostatic electron lenses formed in each of the apertures and strengthens the closed surface 12. , the height h thereof is made as large as possible. Electron beam transmission apertures 11R, 11G, 11B
The diameters D of the holes do not overlap with each other, and at least the central opening is a completely circular hole, and the adjacent openings 11R, 11G, and 11
The gap 15 between G and 11B is made large in diameter by narrowing it to approximately the thickness of the material forming the electrode structure 1. Figure 3 shows this electrode assembly 1 and an electrode assembly 1' having the same structure on the same axis 10R, 10G, 1.
0B, and when a high voltage is applied to the electrode assembly 1 and a low voltage is applied to the electrode assembly 1', within the cross section including the axes 10R, 10G, and 10B of the three electron guns (usually with respect to the fluorescent screen of the cathode ray tube). The electrostatic field forming the main electron lens in the horizontal plane (horizontal plane) is shown, and the equipotential lines that are the intersections of the equipotential surface of the main electron lens and this cross section are shown by line groups 16 and 16'. Figure 4 shows the electrostatic field of the main electron lens in a cross section that is perpendicular to the above cross section and includes the axis of the central electron gun (usually a plane perpendicular to the phosphor screen), and shows the equipotential surface of the main electron lens and this cross section. Equipotential lines, which are the intersection lines of , are shown by line groups 17 and 17'.
第3図に示す断面内では図から明らかなよう
に、電極構体1,1′の対向部側では各電子ビー
ム透過開孔には夫々独立した静電電子レンズが形
成されている。然るに、本構成電極構体では構造
上の制約から突状縁14の高さhは通常開孔直径
Dの1/2以下となり、電極構体1,1′の内部では
静電電子レンズを構成する等電位線群16,1
6′は各開孔部を経由しないで共通の等電位線と
なつていて、中央開孔11G,11G′の電子レ
ンズ電界の曲率は両外側開孔11R,11R′,
11B,11B′のそれより小さくなつている。
従つて中央開孔11G,11G′に形成される静
電電子レンズは両外側開孔11R,11R′,1
1B,11B′に形成される静電電子レンズより
弱く、この断面内(水平面)での電子ビームは中
央電子ビーム径が、両外側電子ビーム径より大き
くなる。更に第4図に示す断面内では(図では中
央開孔部11G,11G′面のみ示す)中央及び
両外側開孔部に形成される等電位線群17,1
7′は夫々独立した静電電子レンズを構成し、且
つ電子銃の軸に対称で、各電子レンズは大略同一
電子レンズ強度を持つている。 In the cross section shown in FIG. 3, as is clear from the figure, independent electrostatic electron lenses are formed in each electron beam transmission aperture on the opposite side of the electrode structures 1 and 1'. However, in the present electrode assembly, the height h of the protruding edge 14 is usually 1/2 or less of the aperture diameter D due to structural constraints, and an electrostatic electron lens is formed inside the electrode assembly 1, 1'. Potential line group 16,1
6' is a common equipotential line without passing through each aperture, and the curvature of the electron lens electric field of the central aperture 11G, 11G' is the same as that of the outer aperture 11R, 11R',
It is smaller than that of 11B and 11B'.
Therefore, the electrostatic electron lenses formed in the central apertures 11G, 11G' are formed in the both outer apertures 11R, 11R', 1
It is weaker than the electrostatic electron lens formed at 1B and 11B', and the center electron beam diameter of the electron beam within this cross section (horizontal plane) is larger than the diameters of both outer electron beams. Furthermore, in the cross section shown in FIG. 4 (only the planes of the central opening 11G and 11G' are shown in the figure), equipotential line groups 17 and 1 formed at the center and both outer openings are shown.
Each of the electron lenses 7' constitutes an independent electrostatic electron lens, which is symmetrical about the axis of the electron gun, and each electron lens has approximately the same electron lens strength.
然るに第3図と第4図との静電電子レンズと比
較すると、第3図の蛍光面に対する水平面内の等
電位線群16,16′の電極構体内部の曲率は第
4図の蛍光面に対する垂直面内の等電位線群1
7,17′の電極構体内部の曲率より小さく、従
つて第3図の水平面内より第4図の垂直面内の電
子レンズは強く、垂直面内では各電子ビームは水
平面内より強く集束され、電子ビーム径は第3図
の水平面より小さくなり、従つてこの電子レンズ
は水平、垂直面での等電位線の曲率の差により非
点収差が大きい。 However, when comparing the electrostatic electron lenses shown in FIG. 3 and FIG. Group of equipotential lines in the vertical plane 1
7, 17', the electron lens is stronger in the vertical plane of FIG. 4 than in the horizontal plane of FIG. 3, and each electron beam is more strongly focused in the vertical plane than in the horizontal plane; The diameter of the electron beam is smaller than that of the horizontal plane in FIG. 3, and therefore, this electron lens has large astigmatism due to the difference in the curvature of the equipotential lines in the horizontal and vertical planes.
以上の様な静電電子レンズにより各電子ビーム
開孔部通過電子ビームは三つの開孔配列方向(水
平軸上)に横長な電子ビーム断面となつて、更に
中央電子ビームは両外側電子ビームより横長とな
り、蛍光面水平方向と垂直方向の解像度が相違
し、加えて中央電子銃・解像度は両外側電子銃の
解像度より悪くなる。この様に陰極線管蛍光面上
には収差の大きな電子ビーム断面が得られ、この
ため高輝度画像となる陰極放出電流が大きくて、
電子ビーム開孔部での電子ビーム束の占有率が大
きくなると特に顕著になり、解像度を劣化させる
欠点が認められる。 Due to the electrostatic electron lens described above, each electron beam passing through the aperture becomes a horizontally elongated electron beam cross section in the direction of the three apertures (on the horizontal axis), and furthermore, the central electron beam is smaller than both outer electron beams. It is horizontally long, and the resolution in the horizontal and vertical directions of the phosphor screen is different.In addition, the resolution of the central electron gun is worse than that of both outer electron guns. In this way, an electron beam cross section with large aberrations is obtained on the fluorescent screen of the cathode ray tube, and therefore the cathode emission current resulting in a high brightness image is large.
This becomes particularly noticeable when the occupancy of the electron beam flux in the electron beam aperture increases, and the disadvantage of degrading resolution is observed.
本発明は上述の欠点を改善するためになされた
もので、インライン型電子銃の主電子レンズ開孔
が大口径化され、互に極めて接近しても、開孔配
列方向とこれに垂直な方向で電子レンズ曲率を実
質的に等しくし、非点収差の小さい電子ビームが
得られる電子銃電極構体を提供することを目的と
する。 The present invention was made in order to improve the above-mentioned drawbacks, and the main electron lens apertures of the in-line electron gun are made large in diameter, and even if they are very close to each other, the apertures are arranged in the aperture direction and in the direction perpendicular to this. It is an object of the present invention to provide an electron gun electrode structure in which electron lens curvatures are made substantially equal and an electron beam with small astigmatism can be obtained.
以下図面に従つて本発明の実施例を説明する。 Embodiments of the present invention will be described below with reference to the drawings.
第5図は本発明の一実施例によるインライン型
一体化構造電子銃の主電子レンズ電極構体2の斜
視図であり、第6図はこの電極構体2と同一構造
をした電極構体2′とを同一軸上20R,20G,
20B上に対向配置し、電極構体2に高電圧、電
極構体2′に低電圧を印加した場合、三本の電子
銃の軸20R,20G,20Bを含む断面内に於
ける主電子レンズを形成する静電界を示し、主電
子レンズの等電位面とこの断面との交線である等
電位線を線群26,26′で示す。 FIG. 5 is a perspective view of the main electron lens electrode structure 2 of an in-line integrated structure electron gun according to an embodiment of the present invention, and FIG. 6 shows an electrode structure 2' having the same structure as this electrode structure 2. 20R, 20G on the same axis,
20B, and when a high voltage is applied to the electrode structure 2 and a low voltage is applied to the electrode structure 2', a main electron lens is formed in a cross section including the axes 20R, 20G, and 20B of the three electron guns. Equipotential lines, which are lines of intersection between the equipotential surface of the main electron lens and this cross section, are shown by line groups 26 and 26'.
電極構体2は従来の電極構体1と同様に、開孔
間距離Sを持つた三本の電子銃の軸20R,20
G,20B上にある三つの電子ビーム透過開孔2
1R,21G,21Bが閉塞面22に穿設され、
閉塞面22に連続して筒側部23が形成された閉
塞筒状体であり、開孔径Dは互に重ならず、且つ
少くとも中央開孔が完全円孔で、隣接開孔21
R,21G及び21G,21Bの間隙部25がほ
ぼ電極構体2の形成材板厚程度まで狭めることに
よつて大口径化され、開孔周囲は電極内部に突出
する突状縁24で囲まれている。然るに隣接開孔
21R,21G及び21G,21Bの間隙部25
は電極内部に突出し、閉塞面22より高さdだけ
凹状にくぼんでいる。 Similar to the conventional electrode structure 1, the electrode structure 2 has three electron gun shafts 20R, 20 with a distance S between the openings.
Three electron beam transmission apertures 2 on G, 20B
1R, 21G, 21B are drilled in the closed surface 22,
It is a closed cylindrical body in which a cylindrical side part 23 is formed continuously to a closed surface 22, the diameters D of the openings do not overlap with each other, and at least the central opening is completely circular, and the adjacent openings 21
The gap portions 25 of R, 21G and 21G, 21B are made large in diameter by narrowing to approximately the thickness of the material forming the electrode structure 2, and the periphery of the opening is surrounded by a protruding edge 24 protruding into the electrode. There is. However, the gap 25 between the adjacent openings 21R, 21G and 21G, 21B
protrudes inside the electrode and is recessed in a concave shape by a height d from the closed surface 22.
第6図から明らかなように、間隙部25が閉塞
面22に対し凹状にくぼんでいるため三本の電子
銃軸20R,20G,20Bを含む断面内(蛍光
面に対する水平面)では、主電子レンズ形成静電
界となる等電位線群26,26′は各開孔部を経
由しない共通の等電位線の発生は最小限に抑えら
れ、各開孔部ごとに独立した、ほぼ等しい静電電
子レンズを形成している。従つて水平面内での各
電子レンズの強さはほぼ等しくなり、中央及び両
外側開孔の電子ビーム径は等しくなる。更に第6
図に示す面内の三つの電子レンズと、三本の電子
銃の軸20R,20G,20Bを含む面に垂直な
断面(垂直面)内の静電電子レンズの等電位線を
示す面と等価な第4図と比較すると、等電線群2
6,26′の曲率は第3図に於ける等電位線群1
6,16′の場合より、第4図に示す垂直面内の
等電位線群17,17′の曲率によく近似し、電
子ビーム透過開孔が配列される蛍光面に対する水
平面、及びこれに垂直な蛍光面に対する垂直面で
の電子レンズ電界の曲率の差がなくなり、非点収
差は極めて小さくなり、蛍光面上にはビーム断面
の縦、横径が一致した収差のないビームスポツト
が得られる。 As is clear from FIG. 6, since the gap 25 is concave with respect to the closed surface 22, the main electron lens The equipotential line groups 26 and 26', which form the electrostatic field, are created by minimizing the occurrence of common equipotential lines that do not pass through each aperture, and forming an independent and almost equal electrostatic electron lens for each aperture. is formed. Therefore, the strength of each electron lens in the horizontal plane is approximately equal, and the electron beam diameters of the central and both outer apertures are equal. Furthermore, the sixth
Equivalent to the plane showing the equipotential lines of the three electron lenses in the plane shown in the figure and the electrostatic electron lens in the cross section (vertical plane) perpendicular to the plane containing the axes 20R, 20G, and 20B of the three electron guns. When compared with Fig. 4, isoelectric line group 2
The curvature of 6,26' is the equipotential line group 1 in Figure 3.
6 and 16', the curvature of the equipotential lines 17 and 17' in the vertical plane shown in FIG. There is no difference in the curvature of the electron lens electric field in a plane perpendicular to the phosphor screen, and astigmatism becomes extremely small, resulting in a beam spot on the phosphor screen with no aberrations in which the longitudinal and lateral diameters of the beam cross section match.
上述の様に本発明の実施例によれば電子ビーム
透過孔の大口径化により、主電子レンズの球面収
差を減少させ、且つ非点収差を軽減出来るため、
陰極線管蛍光面に対する水平、垂直面内の電子ビ
ーム径の縦、横径を一致させ、蛍光面水平、垂直
方向の解像度を一致させ、中央電子ビームと両外
側電子ビームの解像度の差を除去出来るため各電
子ビームによる解像度は一様に改善される。更に
電子レンズの大口径化による球面収差低減を非点
収差を軽減させることで実現出来るため高輝度画
像となる陰極放出電流が大きくて、電子ビーム透
過開孔部での電子ビーム束の電子レンズに対する
占有率が大きくなつても解像度を劣化させること
はなくなる。 As described above, according to the embodiment of the present invention, the spherical aberration of the main electron lens can be reduced and the astigmatism can be reduced by increasing the diameter of the electron beam transmission aperture.
By matching the vertical and horizontal diameters of the electron beam in the horizontal and vertical planes with respect to the cathode ray tube fluorescent screen, the resolution in the horizontal and vertical directions of the fluorescent screen can be matched, and the difference in resolution between the central electron beam and both outer electron beams can be eliminated. Therefore, the resolution of each electron beam is uniformly improved. Furthermore, since the reduction of spherical aberration by increasing the diameter of the electron lens can be achieved by reducing astigmatism, the cathode emission current resulting in a high-brightness image is large, and the electron beam flux at the electron beam transmission aperture is reduced relative to the electron lens. Even if the occupation rate increases, the resolution will not deteriorate.
上記実施例では電極構体閉塞面よりの間隙部の
凹状くぼみを突状縁内部まで同時にくぼませた
が、単に三つの電子ビーム透過開孔隣接間隙部の
み凹状にくぼませて、突状縁の電極内部高さを間
隙部以外の高さと同一に保つたままでも上述した
と同様の効果が得られることは云うまでもない。 In the above embodiment, the concave depression in the gap from the closed surface of the electrode structure was simultaneously depressed to the inside of the protruding edge. It goes without saying that the same effect as described above can be obtained even if the internal height is kept the same as the height other than the gap.
第1図、第2図は出願人が特願昭56−199825、
特願昭57−008433で述べた二つの隣接開孔間隙部
を狭ることによつて大口径化されたインライン型
一体化構造電子銃の主電子レンズ電極構体の断面
図と平面図を、第3図、第4図は前記一対の電極
を互に対向させ夫々高電圧と低電圧を印加した場
合、三本の電子銃の軸を含む断面、及びこの断面
に垂直で中央の電子銃の軸を含む断面内での主電
子レンズ静電界を、第5図は本発明の一実施例を
示すインライン型一体化構造電子銃の主電子レン
ズ電極構体の斜視図を、第6図は前記一対の電極
を互に対向させ夫々高電圧と低電圧を印加した場
合、三本の電子銃の軸を含む断面内での主電子レ
ンズ静電界を夫々示す。
10R,10G,10B;20R,20G,2
0B……電子銃の軸、11R,11G,11B;
21R,21G,21B……電子ビーム透過開
孔、12,22……閉塞面、13,23……筒側
部、14,24……突状縁、15,25……間隙
部、16,16′,17,17′,26,26′…
…等電位線群。
Figures 1 and 2 were filed by the applicant in Japanese Patent Application No. 56-199825.
The cross-sectional view and plan view of the main electron lens electrode structure of the in-line integrated structure electron gun, which has a larger diameter by narrowing the gap between two adjacent openings described in Japanese Patent Application No. 57-008433, are shown in Section 1. Figures 3 and 4 show a cross section including the axes of the three electron guns, and the axis of the central electron gun perpendicular to this cross section, when the pair of electrodes are opposed to each other and high and low voltages are applied, respectively. FIG. 5 is a perspective view of the main electron lens electrode assembly of an in-line integrated structure electron gun showing an embodiment of the present invention, and FIG. The main electron lens electrostatic fields in a cross section including the axes of the three electron guns are shown when the electrodes face each other and high and low voltages are applied, respectively. 10R, 10G, 10B; 20R, 20G, 2
0B...electron gun axis, 11R, 11G, 11B;
21R, 21G, 21B... Electron beam transmission aperture, 12, 22... Closed surface, 13, 23... Cylinder side part, 14, 24... Projected edge, 15, 25... Gap part, 16, 16 ', 17, 17', 26, 26'...
...Equipotential line group.
Claims (1)
開孔がインライン配列された閉塞筒状体電極構体
において、前記突状縁を含んだ二つの隣接開孔間
隙部を局部的に開孔穿設閉塞面より凹状に窪ぼま
せたことを特徴とするインライン型電極構体。1 In a closed cylindrical electrode structure in which three independent apertures surrounded by a protruding edge are arranged in-line on a closed surface, the gap between two adjacent apertures including the protruding edge is locally opened. An in-line electrode structure characterized by having a concave depression from the hole drilling and closing surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8824082A JPS58206030A (en) | 1982-05-25 | 1982-05-25 | Inline type electrode structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8824082A JPS58206030A (en) | 1982-05-25 | 1982-05-25 | Inline type electrode structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58206030A JPS58206030A (en) | 1983-12-01 |
| JPH021343B2 true JPH021343B2 (en) | 1990-01-11 |
Family
ID=13937330
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8824082A Granted JPS58206030A (en) | 1982-05-25 | 1982-05-25 | Inline type electrode structure |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58206030A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5027043A (en) * | 1989-08-11 | 1991-06-25 | Zenith Electronics Corporation | Electron gun system with dynamic convergence control |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5449862U (en) * | 1977-09-14 | 1979-04-06 | ||
| US4370592A (en) * | 1980-10-29 | 1983-01-25 | Rca Corporation | Color picture tube having an improved inline electron gun with an expanded focus lens |
-
1982
- 1982-05-25 JP JP8824082A patent/JPS58206030A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58206030A (en) | 1983-12-01 |
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