JPH0220176U - - Google Patents
Info
- Publication number
- JPH0220176U JPH0220176U JP9878888U JP9878888U JPH0220176U JP H0220176 U JPH0220176 U JP H0220176U JP 9878888 U JP9878888 U JP 9878888U JP 9878888 U JP9878888 U JP 9878888U JP H0220176 U JPH0220176 U JP H0220176U
- Authority
- JP
- Japan
- Prior art keywords
- component
- parts
- rotary table
- measuring section
- hand
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第1図は、この考案による実施例の構成図、第
2図は、第1図の部品台4だけに部品10を載せ
て温度試験をする場合の説明図、第3図は第1図
の部品台4と部品台5に部品10を載せて温度試
験をする場合の説明図、第4図は従来装置の構成
図、第5図は他の従来装置の構成図である。
1……恒温槽、2……測定部、3……回転台、
4……部品台、5……部品台、6……ハンド、7
……チヤツキング機構、8……部品台、9……ハ
ンド、10……部品、11……出入口、12……
シヤツタ、13……ハンド、14,15……チヤ
ツキング機構、21〜55……部品。
FIG. 1 is a configuration diagram of an embodiment according to this invention, FIG. 2 is an explanatory diagram of a case where a temperature test is carried out with components 10 placed only on the component table 4 of FIG. 1, and FIG. An explanatory diagram of a case where a temperature test is carried out by placing a component 10 on a component table 4 and a component table 5, FIG. 4 is a configuration diagram of a conventional device, and FIG. 5 is a configuration diagram of another conventional device. 1... Constant temperature chamber, 2... Measuring section, 3... Rotating table,
4... Parts stand, 5... Parts stand, 6... Hand, 7
...Chatting mechanism, 8...Parts stand, 9...Hand, 10...Parts, 11...Entrance/exit, 12...
Shutter, 13...hand, 14, 15...chucking mechanism, 21-55...parts.
Claims (1)
定部2と、 測定部2を中心に回転する回転台3と、 回転台3の内周に配置される第1の部品台4と
、 回転台3の外周に配置される第2の部品台5と
、 恒温槽1の外から第1の部品台4または第2の
部品台5に部品10を運ぶハンド13と、 第1の部品台4または第2の部品台5から測定
部2に部品10を運ぶハンド6とを備え、 部品10の加熱または冷却時間に応じて、回転
台3が1周または2周するまで部品10を第1の
部品台4または第2の部品台5に載せておくこと
を特徴とする部品の温度試験装置。[Claims for Utility Model Registration] A measuring section 2 disposed in a thermostatic chamber 1 to measure a component 10, a rotary table 3 rotating around the measuring section 2, and a rotary table 3 disposed on the inner periphery of the rotary table 3. 1 parts table 4, a second parts table 5 arranged around the outer periphery of the rotary table 3, and a hand 13 that carries the parts 10 from outside the constant temperature oven 1 to the first parts table 4 or the second parts table 5. and a hand 6 that carries the component 10 from the first component table 4 or the second component table 5 to the measuring section 2, and the rotary table 3 rotates once or twice depending on the heating or cooling time of the component 10. A component temperature testing apparatus characterized in that a component 10 is placed on a first component stand 4 or a second parts stand 5 until the temperature is reached.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9878888U JPH0635188Y2 (en) | 1988-07-26 | 1988-07-26 | Parts temperature test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9878888U JPH0635188Y2 (en) | 1988-07-26 | 1988-07-26 | Parts temperature test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0220176U true JPH0220176U (en) | 1990-02-09 |
| JPH0635188Y2 JPH0635188Y2 (en) | 1994-09-14 |
Family
ID=31325362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9878888U Expired - Lifetime JPH0635188Y2 (en) | 1988-07-26 | 1988-07-26 | Parts temperature test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0635188Y2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006029944A (en) * | 2004-07-15 | 2006-02-02 | Toyoda Mach Works Ltd | Electric trimming system |
| JP2010133716A (en) * | 2008-12-02 | 2010-06-17 | Ueno Seiki Kk | Temperature raising/lowering device, and test handler including the same |
| JP2014070918A (en) * | 2012-09-27 | 2014-04-21 | Orion Mach Co Ltd | Environmental test equipment |
-
1988
- 1988-07-26 JP JP9878888U patent/JPH0635188Y2/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006029944A (en) * | 2004-07-15 | 2006-02-02 | Toyoda Mach Works Ltd | Electric trimming system |
| JP2010133716A (en) * | 2008-12-02 | 2010-06-17 | Ueno Seiki Kk | Temperature raising/lowering device, and test handler including the same |
| JP2014070918A (en) * | 2012-09-27 | 2014-04-21 | Orion Mach Co Ltd | Environmental test equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0635188Y2 (en) | 1994-09-14 |
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