JPH0223519B2 - - Google Patents

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Publication number
JPH0223519B2
JPH0223519B2 JP59182435A JP18243584A JPH0223519B2 JP H0223519 B2 JPH0223519 B2 JP H0223519B2 JP 59182435 A JP59182435 A JP 59182435A JP 18243584 A JP18243584 A JP 18243584A JP H0223519 B2 JPH0223519 B2 JP H0223519B2
Authority
JP
Japan
Prior art keywords
crucible
single crystal
raw material
material melt
partition plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59182435A
Other languages
Japanese (ja)
Other versions
JPS6158884A (en
Inventor
Minoru Nishizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GAKEI DENKI SEISAKUSHO
Original Assignee
GAKEI DENKI SEISAKUSHO
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GAKEI DENKI SEISAKUSHO filed Critical GAKEI DENKI SEISAKUSHO
Priority to JP18243584A priority Critical patent/JPS6158884A/en
Priority to DE8484111305T priority patent/DE3480721D1/en
Priority to EP84111305A priority patent/EP0173764B1/en
Priority to US06/675,409 priority patent/US4874458A/en
Publication of JPS6158884A publication Critical patent/JPS6158884A/en
Priority to US07/102,373 priority patent/US4832922A/en
Publication of JPH0223519B2 publication Critical patent/JPH0223519B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 (発明の利用分野) この発明は、−族等の化合物半導体、とく
にGaAsの単結晶をチヨクラルスキー法にて引上
げる際に用いて好適な、単結晶の育成方法に関す
る。
[Detailed Description of the Invention] (Field of Application of the Invention) The present invention provides a method for growing a single crystal, which is suitable for use in pulling a single crystal of - group compound semiconductors, particularly GaAs, by the Czyochralski method. Regarding.

(従来技術) GaAs単結晶は、同程度の寸法精度で比較した
場合、Si単結晶より電子移動度の大きなことか
ら、電子材料としてその需要が増大している。こ
のGaAs単結晶を得る方法としては水平ブリツジ
マン法が良く知られているが、石英ボートや石英
封管からの不純物汚染の問題や、育成された結晶
の断面形状が円形とならない等の問題があるた
め、最近ではこれをチヨクラルスキー法で育成す
ることがさかんに試みられている。
(Prior Art) GaAs single crystals have higher electron mobility than Si single crystals when compared at the same level of dimensional accuracy, so demand for them as electronic materials is increasing. The horizontal Bridgeman method is well known as a method for obtaining GaAs single crystals, but there are problems such as impurity contamination from quartz boats and quartz sealed tubes, and the cross-sectional shape of the grown crystals is not circular. Therefore, many attempts have been made recently to cultivate this species using the Czyochralski method.

このチヨクラルスキー法による場合には、水平
ブリツジマン法による場合に比して高純度の単結
晶を得られるが、結晶の完全性の点で問題があ
り、より転位密度の小さな結晶を得るべく、種々
の研究開発が日夜重ねられているところである。
この転位があると、この材料を用いた半導体デバ
イスの電気的、光学的特性が悪くなつたり、異常
を示すことがよく知られている。このような転位
は、素子製作のプロセスで発生する場合もある
が、基板となるGaAs単結晶中に始めから存在し
ているものが大多数である。この基板中に存在す
る転位は、主として単結晶の製造時における熱歪
によつて発生するが、この熱歪は結晶内部に、例
えば炉体内を高圧の不活性ガス雰囲気とした場合
に生ずる不活性ガスの対流によつて生ずる急激な
温度勾配が原因となる場合もあるが、原料融液中
に生ずる熱対流によつて、固溶界面の温度分布が
不均一となることがその大きな原因であるとされ
ている。そこで、この熱対流を防止するために、
単結晶引上げに際して原料融液の表面より下方位
置に引上単結晶より若干大の直径を有する熱対流
防止板を浮かべる技術が開発された。この技術は
とくに原料融液中に生ずる中央より外側へ向けて
の熱対流に対しては、有効性が認められるもの
の、外側より中央に向けての熱対流に対しては必
ずしも充分な防止効果を得られないという欠点が
あつた。
When using the Czyochralski method, it is possible to obtain a single crystal with higher purity than when using the horizontal Bridziman method, but there is a problem in terms of crystal integrity, and in order to obtain a crystal with a lower dislocation density, Various research and development efforts are ongoing day and night.
It is well known that when this dislocation exists, the electrical and optical properties of semiconductor devices using this material deteriorate or exhibit abnormalities. Although such dislocations may occur during the device manufacturing process, the majority of dislocations already exist in the GaAs single crystal that serves as the substrate. The dislocations that exist in this substrate are mainly caused by thermal strain during the production of the single crystal, but this thermal strain is caused by inert gas that occurs inside the crystal, for example when a high-pressure inert gas atmosphere is placed inside the furnace. Although the cause may be a sharp temperature gradient caused by gas convection, the main cause is that the temperature distribution at the solid-solution interface becomes uneven due to thermal convection occurring in the raw material melt. It is said that Therefore, in order to prevent this heat convection,
A technique has been developed in which a thermal convection prevention plate having a diameter slightly larger than the pulled single crystal is floated below the surface of the raw material melt during single crystal pulling. Although this technology is particularly effective against heat convection from the center to the outside that occurs in the raw material melt, it is not necessarily effective in preventing heat convection from the outside to the center. The drawback was that it was not available.

これに対して、引上単結晶の直径より大きく、
ルツボの内径より若干小の対流防止板を原料融液
の表面より下方位置に浮力によつて浮べ、原料融
液を対流防止板に設けた細孔、或いは対流防止板
の外周とルツボの内周との間隙より原料融液を対
流防止板の上方へ導く技術があるが、原料融液に
粘性がある場合には、細孔及び間隙から上手く原
料融液が浸透せず、引上げに時間を要する他、う
つかりしていると単結晶引上げ部分に原料融液の
不足をきたすという問題もあつた。
On the other hand, larger than the diameter of the pulled single crystal,
A convection prevention plate slightly smaller than the inner diameter of the crucible is floated by buoyancy below the surface of the raw material melt, and the raw material melt is poured into the pores provided in the convection prevention plate, or between the outer periphery of the convection prevention plate and the inner periphery of the crucible. There is a technique to guide the raw material melt above the convection prevention plate through the gap between the convection plate, but if the raw material melt is viscous, the raw material melt does not penetrate properly through the pores and gaps, and it takes time to pull it up. Another problem was that if the single crystal was allowed to flow, there would be a shortage of raw material melt in the area from which the single crystal was pulled.

(技術的課題) したがつて、この発明においては、原料融液の
熱対流が単結晶引上部分、つまり固溶界面に影響
を及ぼすのを完全に防止できる他、隔板の外周と
ルツボの内壁との間に設けた間隙1を介して原料
融液が過不足なくスムーズに固溶界面上へ送り込
まれるようにすることを技術的課題とする。
(Technical Problem) Therefore, in this invention, it is possible to completely prevent the thermal convection of the raw material melt from affecting the single crystal pulling portion, that is, the solid solution interface, and also to prevent the outer periphery of the partition plate and the crucible from The technical problem is to ensure that the raw material melt is smoothly fed into the solid solution interface in just the right amount and in excess through the gap 1 provided between the inner wall and the inner wall.

(技術的手段) 上記した技術的課題を達成するためにこの発明
は、ルツボ内に収容された原料融液から液体カプ
セル法で単結晶を引上げるに当り、炉体内を高圧
ガス雰囲気下におき、原料融液の表面より下方の
所定位置にルツボの内径よりも若干小の外径を有
し、かつ少なくとも外周に単数または複数の液切
翼を設けた隔板を上下動自在に浮かべ、単結晶の
引上げの間中ルツボを回転させつつ液切翼を介し
て隔板下方の原料融液を隔板上面の固溶界面へ導
き、さらに隔板と原料融液の表面との間が単結晶
引上げの間を通して常に所定間隔を保つように移
動制御すると共に、ルツボを囲んで同軸上に複数
の加熱手段を設け、この加熱手段を独立に制御さ
せるものである。
(Technical Means) In order to achieve the above-mentioned technical problem, the present invention aims to create a furnace under a high-pressure gas atmosphere when pulling a single crystal from a raw material melt contained in a crucible by a liquid capsule method. , a partition plate having an outer diameter slightly smaller than the inner diameter of the crucible and having at least one or more liquid cutting blades on the outer periphery is floated at a predetermined position below the surface of the raw material melt so as to be movable up and down. While the crucible is being rotated throughout the crystal pulling process, the raw material melt below the partition plate is guided to the solid solution interface on the top surface of the partition plate through liquid cutting blades, and furthermore, a single crystal is formed between the partition plate and the surface of the raw material melt. The movement is controlled so that a predetermined interval is always maintained throughout the pulling process, and a plurality of heating means are provided coaxially surrounding the crucible, and these heating means are independently controlled.

この発明はまた、隔板がルツボ上部より上下動
可能に垂下された複数の移動棒によつて押圧され
つつ移動制御されるものである。
In the present invention, the movement of the partition plate is controlled while being pressed by a plurality of moving rods that are vertically movably suspended from the upper part of the crucible.

(作用) この発明は上記のごとくに構成することによつ
て、隔板の外径がルツボの内径より若干小である
ので、原料融液中に発生する熱対流が固溶界面に
影響を及ぼすことがなく、この領域の温度変動及
び温度分布を平担な均一なものとすることができ
る他、隔板の外周とルツボの内壁との間隔が小さ
くても、ルツボが回転することにより液切翼で原
料融液を隔板の下面側よりスムースに隔板上面の
固溶界面へ導くことができるものである。
(Function) By configuring this invention as described above, the outer diameter of the partition plate is slightly smaller than the inner diameter of the crucible, so that thermal convection generated in the raw material melt affects the solid solution interface. In addition, even if the distance between the outer periphery of the partition plate and the inner wall of the crucible is small, liquid drainage can be achieved by rotating the crucible. The blades can smoothly guide the raw material melt from the lower surface of the partition plate to the solid solution interface on the upper surface of the partition plate.

実施例 1 図面に依れば第1図において、1は例えば電気
炉体、2は軸方向に四分割された発熱体2a,2
b,2c,2dから成る加熱手段である。この加
熱手段2の中心部には、回転及び昇降自在に炉体
1内へ機密に挿入されたルツボ支持棒3上に載置
固定されたルツボ4が収納されている。このルツ
ボ4は、例えばグラフアイト製の外ルツボ4aと
石英製の内ルツボ4bから成り、その内部に例え
ばGaAsの原料融液5を収納させている。この
GaAsの原料融液の上面には、例えばB2O3等の液
体封止剤6が比重の関係で浮かべられている。ル
ツボ4上部からは炉体1を機密に貫通して回転及
び昇降自在に構成された単結晶引上棒7が垂下さ
れており、その先端に取りつけられた種結晶8か
らは、先端を液体封止剤6を介して原料融液5中
に浸漬させた単結晶が育成されつつある。
Embodiment 1 According to the drawings, in FIG. 1, 1 is, for example, an electric furnace body, and 2 is a heating element 2a, 2 divided into four parts in the axial direction.
The heating means consists of b, 2c, and 2d. A crucible 4 is housed in the center of the heating means 2 and is mounted and fixed on a crucible support rod 3 which is inserted in a confidential manner into the furnace body 1 so as to be rotatable and movable up and down. This crucible 4 consists of an outer crucible 4a made of, for example, graphite and an inner crucible 4b made of quartz, and a raw material melt 5 of, for example, GaAs is stored therein. this
A liquid sealant 6 such as B 2 O 3 is floated on the upper surface of the GaAs raw material melt depending on its specific gravity. A single-crystal pulling rod 7 is suspended from the top of the crucible 4, penetrating the furnace body 1 in a confidential manner and configured to rotate and move up and down freely. A single crystal immersed in the raw material melt 5 via the inhibitor 6 is being grown.

そして、原料融液5の上面より下方の所定位置
には、隔板9が上方より炉体1を機密に貫通して
挿入された、例えば(BN)製の移動棒11,1
1,11によつて押さえつけられることにより浮
かべられている。
At a predetermined position below the upper surface of the raw material melt 5, a partition plate 9 is inserted from above through the furnace body 1 in a confidential manner, and movable rods 11 and 1 made of, for example, (BN) are inserted.
1 and 11, it is floating.

この隔板9は、例えばAl2O3(アルミナ)、
Si3N4(窒化シリコン)、BN(ボロンナイトライ
ド)、或いはPBN(パイロリテイツクボロンナイ
トライド)製のもので、内ルツボ4bより若干小
さめの外径を有し、その外周より上方に向けて波
形状を呈したに複数の凹凸部から成る液切翼9a
を設けてあり、この液切翼9aを設けた外周と内
ルツボ4bの内壁との間には、小さなな間隙10
が設けられている。
This partition plate 9 is made of, for example, Al 2 O 3 (alumina),
It is made of Si 3 N 4 (silicon nitride), BN (boron nitride), or PBN (pyrolytic boron nitride), has an outer diameter slightly smaller than the inner crucible 4b, and is oriented upward from its outer periphery. A liquid cutting blade 9a consisting of a plurality of concave and convex portions exhibiting a wavy shape.
A small gap 10 is provided between the outer periphery on which the liquid cutting blades 9a are provided and the inner wall of the inner crucible 4b.
is provided.

したがつて、単結晶引上げ中に隔板9より下方
の原料融液5中に生ずる熱対流は、それが中央よ
り外側に向けたもの(第1図において点線で表
示)は勿論のこと、外側より中央に向けもの(第
1図において実線で表示)であつても隔板9によ
つて阻止され、この隔板9より上の固溶界面領域
へ影響を及ぼすことがない。第3図はこの隔板9
を用いた場合のルツボ4内のGaAs原料融液の温
度変動を模式的に示したものであり、第1図に示
した発熱体2a,2b,2cの温度を例えば1400
℃とし、発熱体2dの温度を1200℃とした場合、
この隔板9がある場合には、ない場合に比して温
度勾配はルツボ4内底部で約30℃高く維持でき、
一方、原料融液5の表面では逆に30℃低く維持で
き、液体封止剤の上面ではさらに約40℃低く維持
できた。
Therefore, the heat convection that occurs in the raw material melt 5 below the partition plate 9 during single crystal pulling is not only directed outward from the center (indicated by the dotted line in FIG. 1), but also directed toward the outside. Even if it is directed toward the center (indicated by a solid line in FIG. 1), it is blocked by the partition plate 9 and does not affect the solid-solution interface region above the partition plate 9. Figure 3 shows this partition plate 9.
This figure schematically shows the temperature fluctuation of the GaAs raw material melt in the crucible 4 when using
℃ and the temperature of the heating element 2d is 1200℃,
When this partition plate 9 is present, the temperature gradient can be maintained approximately 30°C higher at the inner bottom of the crucible 4 than when it is not present.
On the other hand, the surface of the raw material melt 5 could be maintained 30°C lower, and the upper surface of the liquid sealant could be maintained even lower by about 40°C.

そして、とくに、固溶界面の単結晶育成領域に
おいては、その拡大図(A視)に示したように温
度変動がほとんどない平坦な安定した温度分布を
示した。
In particular, the single crystal growth region at the solid solution interface showed a flat and stable temperature distribution with almost no temperature fluctuations, as shown in the enlarged view (view A).

他方、隔板9の外周上方に設けた液切翼9aは
ルツボ4の回転につれて隔板9下方の原料融液を
外周に生じた間隙10より該隔板9上面へ導き、
さらに若干温度の高い原料融液を周辺より中央部
の単結晶育成領域へ導く作用を果たすので、特別
な操作上の工夫を凝らさなくとも常に過不足なく
原料融液が単結晶育成領域へ補充されると共に、
原料融液が中央部へ導かれる間に若干の温度低下
をきたし、単結晶育成領域の温度分布を乱すこと
を極力押さえることができることが解つた。
On the other hand, liquid cutting blades 9a provided above the outer circumference of the partition plate 9 guide the raw material melt below the partition plate 9 to the upper surface of the partition plate 9 through a gap 10 formed on the outer circumference as the crucible 4 rotates.
Furthermore, it serves to guide the raw material melt, which has a slightly higher temperature, from the periphery to the central single crystal growth region, so that the raw material melt can always be replenished to the single crystal growth region in just the right amount without any special operational measures. Along with
It has been found that the temperature of the raw material melt decreases slightly while it is being guided to the center, and that disturbance of the temperature distribution in the single crystal growth region can be suppressed as much as possible.

この発明は、原料融液を収納したルツボ4の内
ルツボ4bの内壁との間に若干の間隙10を設け
て浮かべた隔板9によつて、該隔板9より下方の
領域に発生する熱対流が結晶育成中の固溶界面領
域に影響を及ぼすことを皆無とすることができる
ので、この固溶界面領域での温度の変動を極めて
小さく押さえることができる他、ルツボ4上部に
向けての温度勾配も従来のものに比べて大きくな
つており、これは液体封止剤6を通しての輻射熱
が減少することを意味し、この面から転位が生ず
るのを可及的に防止できるものである。
This invention uses a partition plate 9 floating with a slight gap 10 between it and the inner wall of the inner crucible 4b of the crucible 4 containing the raw material melt to generate heat in a region below the partition plate 9. Since convection can have no effect on the solid solution interface region during crystal growth, temperature fluctuations in this solid solution interface region can be kept to an extremely small level. The temperature gradient is also larger than in the conventional case, which means that radiant heat through the liquid sealant 6 is reduced, making it possible to prevent dislocations from occurring from this surface as much as possible.

さらに、この発明は、隔板9の外周とルツボ4
内壁との間隙10を小さくしても、隔板9或いは
ルツボ4の回転と該隔板9の外周に波状に設けた
凹凸状の液切翼9aによつて原料融液12を切り
隔板9下方の原料融液を上面固溶界面領域へスム
ーズに導くことができるので、隔板9に設けた細
孔、或いは隔板とルツボ内壁との間に設けた単な
る間隙より原料融液を浸漬させるものよりは、引
上げに時間を要することがなく、かつ隔板9の上
面に原料融液の不足をきたす心配もない。
Furthermore, the present invention provides an arrangement between the outer periphery of the partition plate 9 and the crucible 4.
Even if the gap 10 between the inner wall and the inner wall is small, the raw material melt 12 can be cut by the rotation of the partition plate 9 or the crucible 4 and the uneven liquid cutting blades 9a provided in a wavy manner on the outer circumference of the partition plate 9. Since the lower raw material melt can be smoothly guided to the upper solid solution interface region, the raw material melt can be immersed through the pores provided in the partition plate 9 or the simple gap provided between the partition plate and the inner wall of the crucible. Moreover, it does not take much time to pull up the material, and there is no fear that the raw material melt will run out on the upper surface of the partition plate 9.

この液切翼9aは、凹部の代わりに透孔を設け
ても良く、隔板の外周上面方向以外にも外周の半
径方向に設けられても良い。また、凹凸部或いは
透孔のへりに刃を設けるとより液切効果は増大す
ると共に、液切翼の形状、構造によつては、単結
晶の育成を促進する原料融液の撹拌効果が出てく
るものである。
The liquid cutting blade 9a may be provided with a through hole instead of the recess, and may be provided in the radial direction of the outer periphery other than in the upper surface direction of the outer periphery of the partition plate. In addition, if a blade is provided on the edge of the uneven part or through-hole, the liquid cutting effect will be further increased, and depending on the shape and structure of the liquid cutting blade, the effect of stirring the raw material melt to promote the growth of single crystals can be produced. It's something that comes.

実施例 2 第1図乃至第2図に示した装置を用いて、
GaAs単結晶を引上げた。
Example 2 Using the apparatus shown in FIGS. 1 and 2,
GaAs single crystal was pulled.

まず、内径が90m/m深さ100m/mを有するル
ツボ4内へGaAs多結晶を1.700g、その上に、
B2O3を300g入れ、さらにその上面に隔板9を置
いた。隔板9はBN製のものを用いた。
First, 1.700 g of GaAs polycrystal was placed in a crucible 4 having an inner diameter of 90 m/m and a depth of 100 m/m, and then
300 g of B 2 O 3 was added, and a partition plate 9 was placed on top of it. The partition plate 9 was made of BN.

次いで、ルツボ4を加熱手段2内に置き、炉体
1内部を真空排気させた後、炉体1をアルルゴン
等の不活性ガスで百気圧まで加圧し、発熱体2
a,2b,2cを1400℃にまで昇温させ、発熱体
2dを1200℃にまで昇温させてGaAsを溶融させ
た。すると、まず、B2O3が溶け、次いでGaAs多
結晶が溶けて隔板9は比重の関係で約11m/mの
厚さとなつたB2O3の下で、かつ原料融液5上へ
浮かんだ状態となつた。この状態を図示してない
覗き眼鏡で見ていて溶融を確認し、次いで、上方
より移動棒を垂下させて隔板9を原料融液5中へ
埋没させ、その表面より下方の隔板9の上面と
B2O3の下面との間が約17m/mとなる位置にまで
沈めた。
Next, the crucible 4 is placed in the heating means 2, the inside of the furnace body 1 is evacuated, the furnace body 1 is pressurized to 100 atmospheres with an inert gas such as arurgone, and the heating element 2 is heated.
A, 2b, and 2c were heated to 1400°C, and the heating element 2d was heated to 1200°C to melt GaAs. Then, first, B 2 O 3 melts, then the GaAs polycrystal melts, and the partition plate 9 has a thickness of about 11 m/m due to its specific gravity.It flows under the B 2 O 3 and onto the raw material melt 5. I was in a floating state. This state is observed through a viewing glass (not shown) to confirm melting, and then the moving rod is suspended from above to bury the partition plate 9 in the raw material melt 5, and the partition plate 9 below the surface thereof is immersed in the raw material melt 5. top surface and
It was sunk to a position where the distance between it and the bottom surface of B 2 O 3 was approximately 17 m/m.

次いで、単結晶引上棒7を降下させてその先端
に取りつけた種結晶8をB2O3を通して原料融液
5中へ浸漬させ、これを約8rpmで回転させてな
じませると共に、ルツボを逆方向へ同じく8rpm
で回転させ、約15mm/Hrの速度で<111>方向へ
引き上げた。
Next, the single crystal pulling rod 7 is lowered, and the seed crystal 8 attached to the tip thereof is immersed in the raw material melt 5 through B 2 O 3 , and it is rotated at about 8 rpm to blend, and the crucible is turned upside down. Same 8rpm in direction
It was rotated at a speed of approximately 15 mm/Hr and pulled in the <111> direction.

この引上げの間を通じて隔板9は移動棒11,
11,11によつて下方へ移動させられ、原料融
液表面との間が常に一定間隔を保つよう維持され
た。
During this pulling up, the diaphragm 9 is moved by the moving rod 11,
11, 11, and was kept at a constant distance from the surface of the raw material melt.

得られたGaAs単結晶は直径50m/長さ250m/
m/で、エツチビツト密度も外周から10m/mの部
分で1.2×104cm-2、外周から15m/mで4.2×103cm
-2、さらには外周から20m/mで6.7×104-2cmであ
つた。これは、水平ブリツジマン法で育成したも
のに較べても、転位等の欠陥の極めて少ないもの
で、この発明方法による単結晶育成方法は極めて
優れていることが解つた。
The obtained GaAs single crystal has a diameter of 50 m and a length of 250 m.
m/, and the etchibit density is 1.2 x 10 4 cm -2 at 10 m/m from the outer periphery and 4.2 x 10 3 cm at 15 m/m from the outer periphery.
-2 , and furthermore, it was 6.7×10 4-2 cm at 20 m/m from the outer circumference. This shows that the single crystal growth method according to the present invention has extremely fewer defects such as dislocations than those grown by the horizontal Bridgeman method, and it has been found that the single crystal growth method according to the present invention is extremely superior.

尚、上述した実施例ではGaAs単結晶引上げの
場合につき説明したが、この発明方法は、他の化
合物半導体、例えばSi、Ge、GaP、IaP等の単結
晶引上げにも同様に実施し得ることは勿論であ
る。
In addition, although the above-mentioned embodiment explained the case of pulling a GaAs single crystal, the method of the present invention can be similarly implemented for pulling a single crystal of other compound semiconductors, such as Si, Ge, GaP, IaP, etc. Of course.

また、隔板は上方より移動棒で押さえるもの
と、移動棒と隔板とを一体に固定させてしまうも
のとがある。前者は隔板は予じめルツボ内へ収納
されていることから覗き眼鏡の取付位置によつて
もこれの視界の邪魔とならないという利点がある
が、隔板がルツボ内に残つて残留原料融液と共に
固まつてしまうので、一製造工程毎に無駄となる
という欠点がある。後者は溶融前にはルツボ外へ
隔板を引上げておくことを要することから、覗き
眼鏡の取付位置によつてはその視界が妨げられる
という欠点があるが、引上げが終了したらこれを
ルツボ外へ引上げておくことができるので隔板を
何回も使用できるという利点がある。
In addition, there are those in which the partition plate is held down from above by a moving bar, and those in which the moving bar and the partition plate are fixed together. The former has the advantage that the diaphragm is stored in the crucible in advance, so the view is not obstructed by the mounting position of the viewing glasses. Since it solidifies with the liquid, it has the disadvantage that each manufacturing process is wasted. The latter method requires the separation plate to be pulled up outside the crucible before melting, which has the disadvantage of obstructing the view depending on the mounting position of the viewing glasses. The advantage is that the diaphragm can be used many times since it can be pulled up.

また、移動棒はこれが一本であると、隔板が不
安定となるので、複数本であることが望ましいこ
とが解つた。
In addition, it has been found that if there is only one moving rod, the partition plate becomes unstable, so it is desirable to have a plurality of moving rods.

(効果) この発明は単結晶引上中の熱歪の発生を極力防
止できるので、これが原因となる転位を押さえ、
より格子欠陥の少ない単結晶を得ることができる
他、ルツボ内径にほぼ達する隔板を用いても原料
融液をスムーズに隔板上面へ導くことができ、さ
らに原料融液の撹拌効果も生ずることから、単結
晶引上げに余分な時間を要しないという効果を奏
する。
(Effect) This invention can prevent the occurrence of thermal strain during single crystal pulling as much as possible, suppressing dislocations caused by this, and
In addition to being able to obtain a single crystal with fewer lattice defects, the material melt can be smoothly guided to the top surface of the partition plate even when using a partition plate that almost reaches the inner diameter of the crucible, and the material melt can also be stirred. This has the effect that no extra time is required for pulling the single crystal.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明を概略的に示す説明図であ
り、第2図は隔板の斜視図、第3図は隔板を使用
した場合と使用しない場合の温度変動を説明する
ための模式図である。 1…電気炉体、2…加熱手段、3…ルツボ支持
棒、4…ルツボ、5…原料融液、6…液体封止
剤、7…単結晶引上棒、8…種結晶、9…隔板、
9a…液切翼。
Fig. 1 is an explanatory diagram schematically showing the present invention, Fig. 2 is a perspective view of a partition plate, and Fig. 3 is a schematic diagram for explaining temperature fluctuations when the partition plate is used and when it is not used. It is. DESCRIPTION OF SYMBOLS 1... Electric furnace body, 2... Heating means, 3... Crucible support rod, 4... Crucible, 5... Raw material melt, 6... Liquid sealant, 7... Single crystal pulling rod, 8... Seed crystal, 9... Interval board,
9a...Liquid cutting blade.

Claims (1)

【特許請求の範囲】 1 ルツボ内に収容された原料融液から液体カプ
セル法で単結晶を引上げるに当り、炉体内を高圧
ガス雰囲気下におき、原料融液の表面より下方の
所定位置にルツボの内径よりも若干小の外径を有
し、かつ少なくとも外周に単数または複数の液切
翼を設けた隔板を上下動自在に浮かべ、単結晶の
引上げの間中ルツボを回転させつつ液切翼を介し
て隔板下方の原料融液を隔板上面の固溶界面へ導
き、さらに隔板と原料融液の表面との間が単結晶
引上げの間を通して常に所定間隔を保つように移
動制御すると共に、ルツボを囲んで同軸上に複数
の加熱手段を設け、この加熱手段を独立に制御さ
せることを特徴とする、単結晶の育成方法。 2 隔板がルツボ上部より上下動可能に垂下され
た複数の移動棒によつて押圧されつつ移動制御さ
れることを特徴とする、特許請求の範囲第1項記
載の単結晶の育成方法。
[Claims] 1. When pulling a single crystal from a raw material melt contained in a crucible by the liquid capsule method, the furnace body is placed in a high-pressure gas atmosphere, and the single crystal is placed at a predetermined position below the surface of the raw material melt. A diaphragm having an outer diameter slightly smaller than the inner diameter of the crucible and having at least one or more liquid cutting blades on its outer periphery is floated so as to be able to move up and down, and the crucible is rotated while the single crystal is being pulled. The raw material melt below the diaphragm is guided to the solid solution interface on the top surface of the diaphragm through the cutting blades, and the diaphragm and the surface of the raw material melt are moved so that a predetermined distance is always maintained throughout the single crystal pulling process. 1. A method for growing a single crystal, the method comprising controlling the crucible, providing a plurality of heating means coaxially surrounding a crucible, and controlling the heating means independently. 2. The method for growing a single crystal according to claim 1, wherein the partition plate is pressed and controlled by a plurality of moving rods that are vertically movably suspended from the top of the crucible.
JP18243584A 1984-08-31 1984-08-31 Process for growing single crystal Granted JPS6158884A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP18243584A JPS6158884A (en) 1984-08-31 1984-08-31 Process for growing single crystal
DE8484111305T DE3480721D1 (en) 1984-08-31 1984-09-21 METHOD AND DEVICE FOR PRODUCING SINGLE CRYSTALS.
EP84111305A EP0173764B1 (en) 1984-08-31 1984-09-21 Single crystal growing method and apparatus
US06/675,409 US4874458A (en) 1984-08-31 1984-11-27 Single crystal growing method having improved melt control
US07/102,373 US4832922A (en) 1984-08-31 1987-09-29 Single crystal growing method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18243584A JPS6158884A (en) 1984-08-31 1984-08-31 Process for growing single crystal

Publications (2)

Publication Number Publication Date
JPS6158884A JPS6158884A (en) 1986-03-26
JPH0223519B2 true JPH0223519B2 (en) 1990-05-24

Family

ID=16118216

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18243584A Granted JPS6158884A (en) 1984-08-31 1984-08-31 Process for growing single crystal

Country Status (1)

Country Link
JP (1) JPS6158884A (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8307023D0 (en) * 1983-03-15 1983-04-20 Minnesota Mining & Mfg Dye bleach system

Also Published As

Publication number Publication date
JPS6158884A (en) 1986-03-26

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