JPH02248020A - Laminated ceramic capacitor - Google Patents
Laminated ceramic capacitorInfo
- Publication number
- JPH02248020A JPH02248020A JP1069677A JP6967789A JPH02248020A JP H02248020 A JPH02248020 A JP H02248020A JP 1069677 A JP1069677 A JP 1069677A JP 6967789 A JP6967789 A JP 6967789A JP H02248020 A JPH02248020 A JP H02248020A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- alloy layer
- electrode
- ceramic capacitor
- alloy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、内部電極と外部電極とに卑金属を用いた積層
セラミックコンデンサに関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a multilayer ceramic capacitor in which base metals are used for internal electrodes and external electrodes.
従来の技術
今日、積層セラミックコンデンサは、軽薄短小化の要望
を満たすため、ますますその需要が高まっており、また
それに伴い改善すべき技術課題も種々上げられている。BACKGROUND OF THE INVENTION Today, the demand for multilayer ceramic capacitors is increasing to meet the demand for smaller, lighter, thinner, and smaller capacitors, and various technical issues to be improved have also been raised accordingly.
その改善すべき項目の一つとして、内部電極に使用され
るパラジュウムなどの材料が高価なため、それを低価格
の材料に置き換え、製品価格を低下させようとの試みが
ある。そして、このような点から、Niを内部電極材料
に使用することが提案されており、一部実施されている
。この内部電極材料にNiを用いた場合、外部電極材料
にもCuなどの卑金属が用いられている。これは通常用
いられるAg外部電極では、Niよりなる内部電極との
十分な接合強度が得られないためである。One of the items that should be improved is that the materials used for the internal electrodes, such as palladium, are expensive, so attempts are being made to replace them with cheaper materials to lower the product price. From this point of view, the use of Ni as an internal electrode material has been proposed and partially implemented. When Ni is used as the internal electrode material, a base metal such as Cu is also used as the external electrode material. This is because the commonly used Ag external electrode does not have sufficient bonding strength with the Ni internal electrode.
発明が解決しようとする課題
しかし、このように内部電極材料にNiを使用し、外部
電極材料にCuを用いた構成では、内部電極と外部電極
との接合がまだまだ不十分であり、そのため容量が抜け
てしまうという問題点を有しているのが実情である。Problems to be Solved by the Invention However, in this configuration in which Ni is used as the internal electrode material and Cu is used as the external electrode material, the bonding between the internal electrode and the external electrode is still insufficient, and as a result, the capacitance is reduced. The reality is that it has the problem of falling through the cracks.
本発明はこのような問題点を解決するもので、Niより
なる内部電極と外部電極との接合強度を十分にとれる構
成とした積層セラミックコンデンサを提供することを目
的するものである。The present invention is intended to solve these problems, and it is an object of the present invention to provide a multilayer ceramic capacitor having a structure that allows sufficient bonding strength between internal electrodes made of Ni and external electrodes.
課題を解決するための手段
この課題を解決するために本発明の積層セラミックコン
デンサは、外部電極が、Niよりなる内部電極と接続さ
れる第1層がCu−Ag合金層、その上に設けられる第
2層がNi金属層、最外部に位置する第3層が5n−P
b合金層よりなる構成としたものである。Means for Solving the Problem In order to solve this problem, the multilayer ceramic capacitor of the present invention has a first layer in which the external electrode is connected to the internal electrode made of Ni, and is provided on a Cu-Ag alloy layer. The second layer is a Ni metal layer, and the outermost third layer is 5n-P.
It has a structure consisting of a b alloy layer.
作用
この構成によれば、所定の焼付温度で第1層のCu−A
g合金層の焼付を行う過程で、状態図によると、Cu−
Ag合金はその比率がかなり広い範囲において溶融状態
にあるため、合金化しやすく、またCu−Ag合金は内
部電極材料であるNiと合金化しやすいため、内部電極
と外部電極(Cu−Ag合金層)との接合が強くなり、
容量が抜けてしまうということがないものとなる。Function: According to this configuration, the first layer of Cu-A is heated at a predetermined baking temperature.
According to the phase diagram, in the process of baking the g-alloy layer, Cu-
Since the Ag alloy is in a molten state in a fairly wide range of ratios, it is easy to alloy, and the Cu-Ag alloy is easy to alloy with Ni, which is the internal electrode material, so the internal electrode and the external electrode (Cu-Ag alloy layer) The bond with the
There is no possibility that the capacity will run out.
実施例 以下、本発明の一実施例について説明する。Example An embodiment of the present invention will be described below.
まず、CulOO重量部に対して、Ag1〜45重量部
となるようにCu金属粉、Ag金属粉を配合し、それに
バインダ、溶剤、ガラスフリットを入れて混合し、Cu
−Agペーストを作製した。First, Cu metal powder and Ag metal powder are blended in an amount of 1 to 45 parts by weight based on the weight part of CulOO, and a binder, a solvent, and a glass frit are added thereto and mixed.
-Ag paste was produced.
次に、このペーストを素体の両端面に塗布し、乾燥し、
900℃中性雰囲気中で焼付を行った。次いで、電解メ
ツキ法によりその上にNiメツキを行い、Niの金属層
を形成し、その後電解メツキ法によりNi金属層の上に
5n−Pbメツキを行い、5n−Pb合金層を形成し、
積層セラミックコンデンサとした。Next, apply this paste to both end faces of the element, dry it,
Baking was performed at 900°C in a neutral atmosphere. Next, Ni plating is performed thereon by an electrolytic plating method to form a Ni metal layer, and then 5n-Pb plating is performed on the Ni metal layer by an electrolytic plating method to form a 5n-Pb alloy layer,
It is a multilayer ceramic capacitor.
ここで、前記素体とは、本実施例により得られた積層セ
ラミックコンデンサを示す第1図に示される通り、誘電
体1とNiよりなる内部電極2とが交互に積層されてな
るものであり、かつ前記内部電極2は相異なる端面のC
u−Ag合金層3に一層おきに接続されている。また、
4はNi金属層、5は5n−Pb合金層である。Here, the element body is one in which dielectric material 1 and internal electrodes 2 made of Ni are alternately laminated, as shown in FIG. 1 showing the multilayer ceramic capacitor obtained in this example. , and the internal electrodes 2 have different end faces C
It is connected to the u-Ag alloy layer 3 every other layer. Also,
4 is a Ni metal layer, and 5 is a 5n-Pb alloy layer.
ここで、本発明において外部電極として、第2層のNi
金属層、第3層の5n−Pb合金層を設けている理由は
、従来と同様に半田付は性向上のために第3層の5n−
Pb合金層を設けており、また第2層のNi金属層は第
1層のCu−Ag合金層のうちのCuが5n−Pb合金
層中に移行して起こる半田喰われを防止するために設け
られている。Here, in the present invention, the second layer of Ni is used as the external electrode.
The reason for providing the metal layer and the third 5n-Pb alloy layer is to improve soldering properties, as in the past.
A Pb alloy layer is provided, and the second Ni metal layer is used to prevent solder erosion caused by Cu in the first Cu-Ag alloy layer migrating into the 5n-Pb alloy layer. It is provided.
次に、内部電極と外部電極との接合を評価するために実
験を行った。ここでは、誘電体1として一般に用いられ
ているBaTiOs系材料を使用し、有効誘電体層を1
2層として実験を行った。Next, an experiment was conducted to evaluate the bond between the internal electrode and the external electrode. Here, a commonly used BaTiOs material is used as the dielectric 1, and the effective dielectric layer is 1.
The experiment was conducted using two layers.
その結果を下記の第1表に示す。また、測定は外部電極
の第1層にCu金属を用いた従来の積層セラミックコン
デンサと、Cu−Ag合金層を用いた積層セラミックコ
ンデンサにおける熱衝撃試験(85℃、−45℃)20
0サイクル後の容量変化率(試料数10個の平均値)で
調べた。ここで、もちろん実験は外部電極を構成する第
2層のNi金属層、第3層の5n−Pb合金層を設けた
状態でのものである。The results are shown in Table 1 below. In addition, measurements were conducted on a conventional multilayer ceramic capacitor using Cu metal in the first layer of the external electrode, and on a multilayer ceramic capacitor using a Cu-Ag alloy layer (85°C, -45°C) for 20
The rate of change in capacity after 0 cycles (average value of 10 samples) was investigated. Here, of course, the experiment was performed with a second Ni metal layer and a third 5n-Pb alloy layer constituting the external electrode.
(以 下 余 白)
第1表
この第1表に示す通り、本実施例のように外部電極の第
1層にCu−Ag合金層を用いた場合、容量変化がほと
んどなくなり、従ってNi内部電極と外部電極(Cu−
Ag合金層)七の接合が強(なっていることは明らかで
ある。しかし、Cu100重量部に対してAgが45重
量部を超えると、Cu−Ag合金層が溶融し、容量を持
たなくなる。(Left below) Table 1 As shown in Table 1, when a Cu-Ag alloy layer is used as the first layer of the external electrode as in this example, there is almost no change in capacitance, and therefore the Ni internal electrode and external electrode (Cu-
It is clear that the bond between the Ag alloy layer and the Ag alloy layer is strong. However, if the amount of Ag exceeds 45 parts by weight relative to 100 parts by weight of Cu, the Cu--Ag alloy layer melts and loses its capacity.
ここで、Cuの融点は1083℃であり、Agの融点は
それより低い961℃であるため、前記実施例における
焼付温度より低い温度で焼付を行うこととすると、Cu
とAgの比率は前記実施例の時よりもAgの割合を増や
すことが理論上可能であるが、その反面、その焼付温度
におけるCu−Ag合金の溶融状態にある範囲(量)が
減り、Niとの合金ができにくいという側面が現れてく
る。したがって、Niを内部電極材料に使用した場合に
おける誘電体の焼成温度(通常1200℃前後)と、前
記Ni内部電極との合金化のしやすさとの両面から見た
場合、前記実施例における焼付温度の付近でCu−Ag
合金層の焼付を行うのがよいと思われるので、CulO
O重量部に対するAgの割合は1〜40重量部が好まし
いと考えられる。Here, the melting point of Cu is 1083°C, and the melting point of Ag is 961°C, which is lower than that, so if baking is performed at a temperature lower than the baking temperature in the above example, Cu
Although it is theoretically possible to increase the ratio of Ag to that in the above example, on the other hand, the range (amount) of the Cu-Ag alloy in the molten state at the baking temperature decreases, and the Ni It appears that it is difficult to form an alloy with. Therefore, when looking at both the firing temperature of the dielectric (usually around 1200°C) when Ni is used as the internal electrode material and the ease of alloying with the Ni internal electrode, the firing temperature in the example above is Cu-Ag near
It seems better to bake the alloy layer, so CulO
It is considered that the ratio of Ag to O weight parts is preferably 1 to 40 weight parts.
発明の効果
以上のように本発明によれば、Niを内部電極材料に使
用した積層セラミックコンデンサにおける外部電極にC
uに代えてCu−Ag合金層を用いることにより、内部
電極と外部電極との接合が強くなり、容量が抜けるとい
うことを防止できる効果が得られる。Effects of the Invention As described above, according to the present invention, C is added to the outer electrode of a multilayer ceramic capacitor using Ni as the inner electrode material.
By using a Cu--Ag alloy layer instead of u, the bond between the internal electrode and the external electrode becomes stronger, and the effect of preventing loss of capacitance can be obtained.
第1図は本発明の一実施例にかかる積層セラミックコン
デンサを示す断面図である。
■・・・・・・誘電体、2・・・・・・内部電極、3・
・・・・・CuAg合金層、4・・・・・・Ni金属層
、5・・・・・・5n−Pb合金層。
代理人の氏名 弁理士 粟野重孝 ほか1名第1図
/
1−一一誘覧俸
2− 内部電極
3−Qに−A2合金1
4−一−〜l′食7L層
5°−SルーFb合金層FIG. 1 is a sectional view showing a multilayer ceramic capacitor according to an embodiment of the present invention. ■・・・Dielectric material, 2・・・Internal electrode, 3・
...CuAg alloy layer, 4...Ni metal layer, 5...5n-Pb alloy layer. Name of agent: Patent attorney Shigetaka Awano and one other person Figure 1 / 1-11 Guideline 2- Internal electrode 3-Q -A2 alloy 1 4-1-~l' Eclipse 7L layer 5° -S-Fb alloy layer
Claims (2)
内部電極と接続される外部電極を両端面部に有する構成
を具備し、かつ前記外部電極が、Niよりなる前記内部
電極と接続される第1層がCu−Ag合金層、その上に
設けられる第2層がNi金属層、最外部に位置する第3
層がSn−Pb合金層よりなる積層セラミックコンデン
サ。(1) A structure in which dielectrics and internal electrodes are alternately laminated, and external electrodes connected to the internal electrodes are provided on both end surfaces, and the external electrodes are connected to the internal electrodes made of Ni. The first layer is a Cu-Ag alloy layer, the second layer provided thereon is a Ni metal layer, and the outermost third layer is a Cu-Ag alloy layer.
A multilayer ceramic capacitor whose layers are made of Sn-Pb alloy layers.
のCu−Ag比率が重量部にして100:1〜100:
40である請求項1記載の積層セラミックコンデンサ。(2) The Cu-Ag ratio of the first Cu-Ag alloy layer constituting the external electrode is 100:1 to 100:
40. The multilayer ceramic capacitor according to claim 1, wherein the multilayer ceramic capacitor has a diameter of 40.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1069677A JPH02248020A (en) | 1989-03-22 | 1989-03-22 | Laminated ceramic capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1069677A JPH02248020A (en) | 1989-03-22 | 1989-03-22 | Laminated ceramic capacitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02248020A true JPH02248020A (en) | 1990-10-03 |
Family
ID=13409724
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1069677A Pending JPH02248020A (en) | 1989-03-22 | 1989-03-22 | Laminated ceramic capacitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02248020A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0777242A2 (en) | 1995-11-29 | 1997-06-04 | Matsushita Electric Industrial Co., Ltd | A ceramic electronic component and its manufacturing method |
| WO1998024953A1 (en) * | 1996-12-03 | 1998-06-11 | Seydel Research, Inc. | Sulfoaryl modified water-soluble or water-dispersible resins from polyethylene terephthalate or terephthalates |
| EP4553870A1 (en) * | 2023-11-10 | 2025-05-14 | Samsung Electro-Mechanics Co., Ltd. | External electrodes for a multilayer ceramic capacitor comprising a first copper-based electrode followed by a weakly porous intermediate layer made of a silver-copper based alloy coated with an silver-based intermediate electrode |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02150010A (en) * | 1988-11-30 | 1990-06-08 | Taiyo Yuden Co Ltd | Laminated porcelain capacitor |
-
1989
- 1989-03-22 JP JP1069677A patent/JPH02248020A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02150010A (en) * | 1988-11-30 | 1990-06-08 | Taiyo Yuden Co Ltd | Laminated porcelain capacitor |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0777242A2 (en) | 1995-11-29 | 1997-06-04 | Matsushita Electric Industrial Co., Ltd | A ceramic electronic component and its manufacturing method |
| EP0777242A3 (en) * | 1995-11-29 | 1999-12-01 | Matsushita Electric Industrial Co., Ltd | A ceramic electronic component and its manufacturing method |
| WO1998024953A1 (en) * | 1996-12-03 | 1998-06-11 | Seydel Research, Inc. | Sulfoaryl modified water-soluble or water-dispersible resins from polyethylene terephthalate or terephthalates |
| AU732414B2 (en) * | 1996-12-03 | 2001-04-26 | Seydel Companies, Inc. USA | Sulfoaryl modified water-soluble or water-dispersible resins from polyethylene terephthalate or terephthalates |
| EP4553870A1 (en) * | 2023-11-10 | 2025-05-14 | Samsung Electro-Mechanics Co., Ltd. | External electrodes for a multilayer ceramic capacitor comprising a first copper-based electrode followed by a weakly porous intermediate layer made of a silver-copper based alloy coated with an silver-based intermediate electrode |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH04171912A (en) | Ceramic capacitor | |
| JPH02248020A (en) | Laminated ceramic capacitor | |
| JPH0394409A (en) | Electronic component and electrode paste; formation of terminal electrode | |
| JP2692250B2 (en) | Monolithic ceramic capacitors | |
| JP2949714B2 (en) | Multilayer ceramic capacitors | |
| JP2692249B2 (en) | Monolithic ceramic capacitors | |
| JPH06151183A (en) | Ceramic electronic part | |
| JPH04188813A (en) | Composite ceramic capacitor and manufacture thereof | |
| JP2021027195A (en) | Electronic component and mounting structure | |
| JP2969716B2 (en) | Multilayer ceramic capacitors | |
| JPH03218613A (en) | Laminated ceramic capacitor | |
| JPH0568085B2 (en) | ||
| JPH04334007A (en) | Ceramic capacitor | |
| JPS5916323A (en) | Ceramic laminated condenser | |
| JPH0897527A (en) | Conductive paste | |
| JPH07192528A (en) | Conductive paste | |
| JPS63169348A (en) | Amorphous alloy foil for jointing ceramics | |
| JPH11329892A (en) | Composite ceramic capacitor and manufacture thereof | |
| JPH03145109A (en) | Multilayer ceramic capacitor | |
| JPH04273417A (en) | Laminated ceramic capacitor | |
| JPH06342734A (en) | Ceramic electronic component | |
| JPS5969906A (en) | Method of forming terminal electrode of laminated ceramic condenser | |
| JPH04273418A (en) | Laminated ceramic capacitor | |
| JPH06215981A (en) | Ceramic electronic component | |
| JPH07141914A (en) | Silver paste and ceramic electronic parts |