JPH02257687A - Manufacture of semiconductor laser chip - Google Patents

Manufacture of semiconductor laser chip

Info

Publication number
JPH02257687A
JPH02257687A JP1076752A JP7675289A JPH02257687A JP H02257687 A JPH02257687 A JP H02257687A JP 1076752 A JP1076752 A JP 1076752A JP 7675289 A JP7675289 A JP 7675289A JP H02257687 A JPH02257687 A JP H02257687A
Authority
JP
Japan
Prior art keywords
cleavage
semiconductor laser
crystal substrate
flaw
along
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1076752A
Other languages
Japanese (ja)
Inventor
Akihiko Saka
阪 昭彦
Hideo Takeuchi
英雄 竹内
Haruyoshi Yamanaka
山中 晴義
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1076752A priority Critical patent/JPH02257687A/en
Publication of JPH02257687A publication Critical patent/JPH02257687A/en
Pending legal-status Critical Current

Links

Landscapes

  • Dicing (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To reduce the generation of fine stepped cracks, and to improve yield by bending a semiconductor-laser crystal substrate along the linear edge section of a jig in the direction of cleavage along a cleavage flaw formed on the end face of the substrate and communicating with a rear from a surface. CONSTITUTION:A cleavage flaw 2 communicating with a rear from a surface is shaped to the end face of the crystal substrate 1 of a GaAlAs semiconductor laser, and held and fixed from both surfaces by an extensible sheet 3, the flaw 2 is formed along the linear edge section of a jig 4 along the direction of cleavage of the cleavage flaw 2, and the semiconductor laser crystal substrate 1 is bent vertically in the direction of cleavage. An optical axis is hardly displaced in a semiconductor laser chip acquired in this manner, and the displacement of the optical axis is concentrated near a central optical axis. Accordingly, fine stepped cracks are drastically reduced, thus improving characteristics.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、半導体レーザチップの製造方法に関する。[Detailed description of the invention] (Industrial application field) The present invention relates to a method for manufacturing a semiconductor laser chip.

(従来の技術) 小型で堅牢、且つ光の波長純度および空間的均一性に優
れた半導体レーザは、コンパクトディスク(CD)やビ
デオディスク(VD)用ピックアップ光源として、読み
取りに利用され、実用化されている。また、光ファイル
用光源として書き込み用としても実用化されつつある。
(Prior art) Semiconductor lasers, which are small, robust, and have excellent wavelength purity and spatial uniformity of light, are used for reading compact discs (CDs) and video discs (VDs) as pickup light sources, and have been put into practical use. ing. It is also being put into practical use as a light source for optical files for writing purposes.

一方、半導体レーザの光出力密度や単一性、高速応答性
を利用して、レーザプリンタや光通信用光源として利用
されている。
On the other hand, semiconductor lasers are used as light sources for laser printers and optical communications by taking advantage of their optical output density, unity, and high-speed response.

第4図に従来の半導体レーザチップの製造方法を示す。FIG. 4 shows a conventional method for manufacturing a semiconductor laser chip.

従来は、半導体レーザ結晶基板41を、鋭利な刃物(手
術用メス)42を用いて、劈開傷43から、劈開方向4
4に向って、竹を割るように結晶基板を裂いて、レーザ
チップ41aを得ている。
Conventionally, a semiconductor laser crystal substrate 41 is cut in a cleavage direction 4 from a cleavage wound 43 using a sharp knife (surgical scalpel) 42.
4, the crystal substrate is torn like splitting bamboo to obtain a laser chip 41a.

なお、第4図において、45は半導体レーザ結晶基板4
1の端面、46は表面、47は裏面、48はカット方向
、49は襞間面、50はレーザ側断面、51はレーザ光
出力方向を示す。
In addition, in FIG. 4, 45 is a semiconductor laser crystal substrate 4.
1, an end surface 46, a front surface, 47 a back surface, 48 a cutting direction, 49 an inter-fold surface, 50 a laser side cross section, and 51 a laser beam output direction.

(発明が解決しようとする課題) 従来は、半導体レーザ結晶基板を刃物で裂くのであるか
ら、力が一点に集中し、また均一に連続して力を加える
ことが困這であり、さらに横方向に力が加わるため、微
小段−差のクラックが発生し、それが光軸ずれの原因と
なっている。
(Problem to be solved by the invention) Conventionally, since the semiconductor laser crystal substrate was torn with a knife, the force was concentrated at one point, and it was difficult to apply force uniformly and continuously. Due to the force applied to the optical axis, cracks with minute differences in level occur, which causes the optical axis to shift.

本発明は、前記問題点を解決する方法を提供するもので
あり、半導体レーザチップの形成を容易に行なうことが
可能であり、かつ微小段差クラックを大幅に減少させ、
特性向上を図るものである。
The present invention provides a method for solving the above-mentioned problems, which makes it possible to easily form a semiconductor laser chip, significantly reduces microstep cracks, and
The purpose is to improve the characteristics.

(課題を解決するための手段) 本発明は、半導体レーザ結晶基板表面上の端面に、裏面
まで到達する劈開傷を付げ、伸縮自在なシートで両面よ
り挟持して固定し、それを劈開傷の劈開方向に沿って治
具の直線縁部に沿わせ、半導体レーザ結晶基板を劈開方
向と垂直に折り曲げるものである。
(Means for Solving the Problems) The present invention provides a semiconductor laser crystal substrate with a cleavage scratch reaching the back surface on the front surface thereof, and fixing the cleavage scratch by sandwiching it from both sides with a stretchable sheet. The semiconductor laser crystal substrate is bent along the straight edge of the jig along the cleavage direction perpendicular to the cleavage direction.

(作 用) 半導体レーザ結晶基板の端面に1表面から裏面に通ずる
劈開傷を設け、その劈開傷に沿った剪開方向で、治具の
直線縁部に沿って一気に折曲して襞間されるので、微小
段差クラックの発生が著しく減少する。
(Function) A cleavage scar is provided on the end face of the semiconductor laser crystal substrate, extending from the first surface to the back surface, and in the shearing direction along the cleavage scar, the substrate is bent all at once along the straight edge of the jig to form the pleats. As a result, the occurrence of micro step cracks is significantly reduced.

(実施例) 次に、本発明による襞間法について、第4図を一部参照
しながら、第1図ないし第3図に基づいて説明する。
(Example) Next, the interfold method according to the present invention will be described based on FIGS. 1 to 3, with some reference to FIG. 4.

第2図は、本願発明を適用するG a A Q A s
半導体レーザの構造断面図を示すもので1通常の液相エ
ピタキシャル法(L P E)を用いて、基板であるp
−GaAs層11上に、電流狭窄層12、p−クラッド
層13.活性層14.n−クラッド層15およびコンタ
クト層16がそれぞれ形成されている。
FIG. 2 shows G a A Q A s to which the present invention is applied.
This figure shows a cross-sectional view of the structure of a semiconductor laser.
- On the GaAs layer 11, a current confinement layer 12, a p-cladding layer 13. Active layer 14. An n-cladding layer 15 and a contact layer 16 are each formed.

各層のA f2 A s混晶比は、x = Or 0.
5y 0.08tO,5,0,64であり、膜厚はそれ
ぞれt =l、Q、 0.2゜0008.2.0.2.
0戸程度である。n側電極17としてA u G eま
たはAuを真空蒸着し、襞間の目安となるパターンを形
成する。襞間を容易にするため、p−GaAs層を10
0/ffi程度にまで薄くする。n側電極18としてA
 u Z nを真空蒸着し、400℃の高温でオーミッ
ク電極を形成する。
The A f2 As mixed crystal ratio of each layer is x = Or 0.
5y 0.08tO, 5, 0, 64, and the film thicknesses are t = l, Q, 0.2°0008.2.0.2, respectively.
There are approximately 0 households. AuGe or Au is vacuum-deposited as the n-side electrode 17, and a pattern serving as a guide between the folds is formed. To facilitate inter-folding, the p-GaAs layer was
Thin to about 0/ffi. A as the n-side electrode 18
UZn is vacuum deposited to form an ohmic electrode at a high temperature of 400°C.

次に第1図および第4図について本発明の襞間法につい
て説明すると、P  GaAs層の成長層側から、カッ
タを用いて1〜2nafl開傷43を基板のp−GaA
s層の成長層(表)から、裏面に到達するようにつける
(裏面に到達しないとよくない)5次に基板1(第4図
の41)を、2枚の湾曲自在なシート3の間に挟持し、
治具4の半径5+m+程度の曲率半径の縁に、基板の劈
開傷2および劈開方向を一致させ、基板を折り曲げるよ
うにして劈開傷から劈開方向に一気に襞間する。
Next, the inter-fold method of the present invention will be explained with reference to FIGS.
Attach the s-layer from the growth layer (front side) to the back side (it is not good if it does not reach the back side) 5. Next, place the substrate 1 (41 in Figure 4) between the two bendable sheets 3. sandwiched between
The cleavage scar 2 and the cleavage direction of the substrate are made to coincide with the edge of the jig 4 having a radius of curvature of about 5+m+, and the substrate is folded to form pleats from the cleavage scratch in the cleavage direction at once.

このようにして製造した半導体レーザチップは第3図(
a)に示すように、同図(b)に比べて、光軸ずれが少
なく、中心光軸付近に集中している。なお、N=163
はテストに供したチップ数を示す。
The semiconductor laser chip manufactured in this way is shown in Figure 3 (
As shown in a), compared to the figure (b), the optical axis deviation is smaller and concentrated near the central optical axis. Note that N=163
indicates the number of chips tested.

本発明は、G a A 12 A S系結晶系基板につ
いて述べたが、InGaAsP系、Pb5nTe系結晶
等、その他の結晶材料についても適用できることは言う
までもない。
Although the present invention has been described with respect to a Ga A 12 A S crystalline substrate, it goes without saying that it can also be applied to other crystalline materials such as InGaAsP type and Pb5nTe type crystals.

(発明の効果) 以上のように、本発明では、半導体レーザ結晶基板の端
面に1表面から裏面に通ずる劈開傷を設け、その劈開傷
に沿った劈開方向で、治具の直線縁部に沿って一気に折
曲して襞間するので、微小段差クラックの発生が従来の
ほぼ1/10に減少し、作業が迅速に行なわれるばかり
でなく、製品の歩留りが著しく向上する。
(Effects of the Invention) As described above, in the present invention, a cleavage scar is provided on the end face of a semiconductor laser crystal substrate that extends from one surface to the back surface, and in the cleavage direction along the cleavage scar, the cleavage is performed along the straight edge of the jig. Since the sheet is folded and folded all at once, the occurrence of minute step cracks is reduced to about 1/10 of the conventional method, and not only is the work carried out quickly, but the yield of the product is significantly improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明による襞間法を示す図、第2図は半導体
レーザの構造断面図、第3図は光軸ずれの比較を示す図
、第4図は従来法を示す図である。 1 ・・・半導体レーザ結晶基板、 2・・・劈開傷、
 3 ・・・シート、 4 ・・・治具。 11・・・ p−GaAs層、12・・・電流狭窄層。 13・・・P−クラッド層、14・・・活性層。 15・・・n−クラッド層、16・・・コンタクト層、
17・・・n側電極、18・・・ p側電極。 特許出願人 松下電器産業株式会社 第 図 第 図
FIG. 1 is a diagram showing the inter-fold method according to the present invention, FIG. 2 is a cross-sectional view of the structure of a semiconductor laser, FIG. 3 is a diagram showing a comparison of optical axis deviations, and FIG. 4 is a diagram showing the conventional method. 1... Semiconductor laser crystal substrate, 2... Cleavage scratch,
3...Sheet, 4...Jig. 11... p-GaAs layer, 12... current confinement layer. 13...P-cladding layer, 14...active layer. 15...n-cladding layer, 16... contact layer,
17... n-side electrode, 18... p-side electrode. Patent applicant: Matsushita Electric Industrial Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 半導体レーザ結晶基板表面上の端面に、裏面まで到達す
る劈開傷を付げ、伸縮自在なシートで両面より挟持して
固定し、それを劈開傷の劈開方向に沿って治具の直線縁
部に沿わせ、半導体レーザ結晶基板を劈開方向と垂直に
折り曲げることを特徴とする半導体レーザチップの製造
方法。
A cleavage wound that reaches the back surface is made on the front surface of the semiconductor laser crystal substrate, and it is held and fixed from both sides with a stretchable sheet, and then it is attached to the straight edge of the jig along the cleavage direction of the cleavage wound. A method for manufacturing a semiconductor laser chip, comprising bending a semiconductor laser crystal substrate perpendicular to a cleavage direction.
JP1076752A 1989-03-30 1989-03-30 Manufacture of semiconductor laser chip Pending JPH02257687A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1076752A JPH02257687A (en) 1989-03-30 1989-03-30 Manufacture of semiconductor laser chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1076752A JPH02257687A (en) 1989-03-30 1989-03-30 Manufacture of semiconductor laser chip

Publications (1)

Publication Number Publication Date
JPH02257687A true JPH02257687A (en) 1990-10-18

Family

ID=13614323

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1076752A Pending JPH02257687A (en) 1989-03-30 1989-03-30 Manufacture of semiconductor laser chip

Country Status (1)

Country Link
JP (1) JPH02257687A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011155092A1 (en) * 2010-06-08 2011-12-15 住友電気工業株式会社 Group iii nitride semiconductor laser element, and method of manufacturing group iii nitride semiconductor laser element

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011155092A1 (en) * 2010-06-08 2011-12-15 住友電気工業株式会社 Group iii nitride semiconductor laser element, and method of manufacturing group iii nitride semiconductor laser element
JP2011258716A (en) * 2010-06-08 2011-12-22 Sumitomo Electric Ind Ltd Group iii nitride semiconductor laser element, method of manufacturing the same
US8420419B2 (en) 2010-06-08 2013-04-16 Sumitomo Electric Industries, Ltd. Group-III nitride semiconductor laser device, and method for fabricating group-III nitride semiconductor laser device
US8594145B2 (en) 2010-06-08 2013-11-26 Sumitomo Electric Industries, Ltd. Group-III nitride semiconductor laser device, and method for fabricating group-III nitride semiconductor laser device
US8929416B2 (en) 2010-06-08 2015-01-06 Sumitomo Electric Industries, Ltd. Group-III nitride semiconductor laser device, and method for fabricating group-III nitride semiconductor laser device

Similar Documents

Publication Publication Date Title
KR20120099124A (en) Group-iii nitride semiconductor laser element, and method of manufacturing group-iii nitride semiconductor laser element
JP5206699B2 (en) Group III nitride semiconductor laser device and method of manufacturing group III nitride semiconductor laser device
KR20110094275A (en) Method of fabricating a group III nitride semiconductor laser device, and a group III nitride semiconductor laser device
JPH03285380A (en) Manufacture of semiconductor laser element
EP1248335B1 (en) Nitride semiconductor laser device and method for manufacturing the same
JPH02257687A (en) Manufacture of semiconductor laser chip
JP2836822B2 (en) Method for manufacturing waveguide type semiconductor optical device
JP2516953B2 (en) Method for manufacturing semiconductor laser device
JPS603182A (en) Manufacture of semiconductor laser element
JP2011211244A (en) Group iii nitride semiconductor laser element, and method of fabricating group iii nitride semiconductor laser element
JPH1187764A (en) Semiconductor light emitting device and method of manufacturing the same
JP3833814B2 (en) Protective film forming spacer for semiconductor laser semi-finished product and manufacturing method thereof
JPS6215879A (en) Semiconductor laser arrays device
JPH09266347A (en) Method for manufacturing semiconductor device
JPH01227485A (en) Semiconductor laser device
JP2949927B2 (en) Semiconductor laser and method of manufacturing the same
JP2002064247A (en) Semiconductor laser and method of manufacturing the same
JP2822470B2 (en) Semiconductor laser
JPS62296580A (en) Cleavage of semiconductor laser
JPH084181B2 (en) Semiconductor laser manufacturing method
JP3049916B2 (en) Semiconductor laser
JP3185239B2 (en) Semiconductor laser device
JPS61265888A (en) Manufacture of semiconductor laser
JPS63116485A (en) Semiconductor laser element
JPH01272177A (en) Semiconductor laser