JPH022604U - - Google Patents
Info
- Publication number
- JPH022604U JPH022604U JP8156788U JP8156788U JPH022604U JP H022604 U JPH022604 U JP H022604U JP 8156788 U JP8156788 U JP 8156788U JP 8156788 U JP8156788 U JP 8156788U JP H022604 U JPH022604 U JP H022604U
- Authority
- JP
- Japan
- Prior art keywords
- optical information
- information recording
- eccentricity
- measuring
- measuring element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims description 9
- 230000003287 optical effect Effects 0.000 claims description 5
- 230000037431 insertion Effects 0.000 claims 2
- 238000003780 insertion Methods 0.000 claims 2
Landscapes
- Length-Measuring Instruments Using Mechanical Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Description
第１図は本考案の実施例としての基板偏心量測
定装置の縦断面図、第２図は光学式情報記録デイ
スクの平面図、第３図及び第４図は円錐体状測定
子を基板中心孔に嵌入せしめた状態を示す断面図
、第５図は第１図に示した基板偏心量測定装置の
一部を変形した基板偏心量測定装置の縦断面図、
第６図は従来の基板偏心量測定装置の一部断面を
含む正面図である。
主要部分の符号の説明、２１……測定台、２２
……光学式情報記録デイスク、２３，２４……円
形基板、２３ａ，２４ａ……中心孔、２６……案
内部材、２９……円錐体状測定子、３０……ダイ
ヤルゲージ。
Fig. 1 is a longitudinal sectional view of a substrate eccentricity measuring device as an embodiment of the present invention, Fig. 2 is a plan view of an optical information recording disk, and Figs. 3 and 4 show a conical measuring element centered on the substrate. 5 is a longitudinal sectional view of the board eccentricity measuring device which is a partially modified version of the board eccentricity measuring device shown in FIG. 1;
FIG. 6 is a partially sectional front view of a conventional substrate eccentricity measuring device. Explanation of symbols of main parts, 21... Measuring table, 22
... Optical information recording disk, 23, 24 ... Circular substrate, 23a, 24a ... Center hole, 26 ... Guide member, 29 ... Conical measuring tip, 30 ... Dial gauge.
Claims (1)
方が中心孔を有する一対の円形基板を前記信号記
録層が内側となるように係着して成る光学式情報
記録デイスクの前記円形基板相互の偏心量を測定
する基板偏心量測定装置であつて、前記光学式情
報記録デイスクを固定するデイスク固定手段と、
前記中心孔に嵌入し得る円錐体状測定子と、前記
測定子の前記光学式情報記録デイスクの主面に対
して垂直に案内する案内手段と、前記測定子の嵌
入量を検出する嵌入量検出手段とから成ることを
特徴とする基板偏心量測定装置。 An amount of eccentricity between the circular substrates of an optical information recording disk comprising a pair of circular substrates, at least one of which has a signal recording layer and both of which have a center hole, and which are attached so that the signal recording layer is on the inside. A substrate eccentricity measuring device for measuring substrate eccentricity, the disk fixing means for fixing the optical information recording disk;
a conical measuring element that can be fitted into the center hole; a guide means for guiding the measuring element perpendicularly to the main surface of the optical information recording disk; and a insertion amount detector that detects the insertion amount of the measuring element. 1. A substrate eccentricity measuring device comprising: means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8156788U JPH022604U (en) | 1988-06-20 | 1988-06-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8156788U JPH022604U (en) | 1988-06-20 | 1988-06-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH022604U true JPH022604U (en) | 1990-01-09 |
Family
ID=31306345
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8156788U Pending JPH022604U (en) | 1988-06-20 | 1988-06-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH022604U (en) |
-
1988
- 1988-06-20 JP JP8156788U patent/JPH022604U/ja active Pending
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