JPH0227524A - Production of perpendicular magnetic recording film - Google Patents

Production of perpendicular magnetic recording film

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Publication number
JPH0227524A
JPH0227524A JP17662788A JP17662788A JPH0227524A JP H0227524 A JPH0227524 A JP H0227524A JP 17662788 A JP17662788 A JP 17662788A JP 17662788 A JP17662788 A JP 17662788A JP H0227524 A JPH0227524 A JP H0227524A
Authority
JP
Japan
Prior art keywords
cobalt
film
magnetic recording
aluminum
saturation magnetization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17662788A
Other languages
Japanese (ja)
Inventor
Atsushi Kamijo
敦 上條
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP17662788A priority Critical patent/JPH0227524A/en
Publication of JPH0227524A publication Critical patent/JPH0227524A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PURPOSE:To obtain the perpendicular magnetic recording film having large saturation magnetization by specifying the base vacuum degree of a vapor deposition device and a substrate temp. and alternately laminating cobalt and aluminum by vapor deposition, thereby forming the recording film. CONSTITUTION:The base vacuum degree of the vapor deposition device is set at 10<-7>Torr or higher vacuum and thereafter, the cobalt layers 9 and the aluminum layers 10 are alternately laminated by vapor deposition on the substrate at >=-50 deg.C and <=+300 deg.C substrate temp. Further, the compsn. modulated cobalt/aluminum films are heat-treated at >=150 deg.C and <=450 deg.C. The perpendicularly magnetized films having the larger saturation magnetization than the saturation magnetization of the conventional cobalt/chromium alloy film is obtd. and the larger signals at the time of reading out than the conventional cobalt/chromium alloy film are taken. In addition, the magnetic recording density can be increased.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、組成変調構造を有する垂直磁気記録膜の製造
方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for manufacturing a perpendicular magnetic recording film having a composition modulation structure.

(従来の技術) 垂直磁気記録は、従来の長手記録方式に比べ磁気記録密
度を飛躍的に高める記録方式として注目されさかんに研
究されている。特にコバルト・クロム合金膜は垂直磁気
記録膜としてすぐれた特性を有しているが、垂直磁化膜
は、コバルトの濃度が20%の近傍のみでしか得られず
、そのために飽和磁化の値が小さく、読み出し時のS/
N等を考えた場合、磁気記録密度に限界がでてくる。こ
のため飽和磁化の値の大きな垂直磁気記録膜が必要とな
っている。1つの方法として、2つの金属を交互に積層
して形成した組成変調構造を有する膜の垂直磁気記録膜
の研究も行なわれている(例えば、ジャーナルオブアプ
ライドフィジクス(J、 Appl、 Phys、)第
61巻、第8号、4317頁から4319頁参照)。
(Prior Art) Perpendicular magnetic recording is attracting attention and being actively researched as a recording method that dramatically increases magnetic recording density compared to conventional longitudinal recording methods. In particular, cobalt-chromium alloy films have excellent properties as perpendicular magnetic recording films, but perpendicularly magnetized films can only be obtained when the cobalt concentration is around 20%, and as a result, the saturation magnetization value is small. , S/ when reading
When considering N, etc., there is a limit to the magnetic recording density. For this reason, a perpendicular magnetic recording film with a large saturation magnetization value is required. As one method, research is being conducted on a perpendicular magnetic recording film, which is a film with a composition modulation structure formed by alternately laminating two metals (for example, Journal of Applied Physics (J, Appl., Phys.)). (See Vol. 61, No. 8, pp. 4317-4319).

(発明が解決しようとする課題) コバルト・クロム合金垂直磁気記録膜は、飽和磁化の値
が必ずしも大きくなくそのために磁気記録密度に限界が
あった。
(Problems to be Solved by the Invention) Cobalt-chromium alloy perpendicular magnetic recording films do not necessarily have a large saturation magnetization value, which limits the magnetic recording density.

本発明の目的は飽和磁化の大きなコバルトlアルミニウ
ム組成変調構造の垂直磁気記録膜の製造方法を提供する
ことにある。
An object of the present invention is to provide a method for manufacturing a perpendicular magnetic recording film having a cobalt-aluminum composition modulation structure with large saturation magnetization.

(課題を解決するための手段) 本発明は、(1)蒸着装置のベース真空度を1O−7t
orr、あるいはこれより高真空にした後、基板温度が
一50℃以上、+300℃以下でコバルトとアルミニウ
ムを交互に積層して形成したことを特徴とする垂直磁気
記録膜の製造方法および、(2)コバルトとアルミニウ
ムを交互に積層して形成したコバルトlアルミニウム組
成変調膜を150℃以上、450℃以下の温度で熱処理
する工程を備えたことを特徴とする垂直磁気記録膜の製
造方法である。
(Means for Solving the Problems) The present invention provides (1) a base vacuum degree of the vapor deposition apparatus of 1O-7t;
A method for manufacturing a perpendicular magnetic recording film, characterized in that it is formed by alternately laminating cobalt and aluminum at a substrate temperature of 150° C. or more and +300° C. or less after applying a vacuum of ) A method for producing a perpendicular magnetic recording film, comprising the step of heat-treating a cobalt-aluminum composition modulation film formed by alternately laminating cobalt and aluminum at a temperature of 150° C. or more and 450° C. or less.

(実施例) 以下本発明について実施例により説明する。第1図は本
発明の垂直磁気記録膜断面の模式図で、基板上にコバル
ト層9とアルミニウム層10が交互に積層したいわゆる
組成変調構造をもっている。本発明の実施にあたっては
第2図に示した交互蒸着装置を用いて成膜を行なった。
(Example) The present invention will be described below with reference to Examples. FIG. 1 is a schematic cross-sectional view of the perpendicular magnetic recording film of the present invention, which has a so-called composition modulation structure in which cobalt layers 9 and aluminum layers 10 are alternately laminated on a substrate. In carrying out the present invention, film formation was performed using the alternate vapor deposition apparatus shown in FIG.

第2図の蒸着装置の真空チャンバー内にはコバルトとア
ルミニウムを充填した2つの電子ビーム蒸着源1,1′
、基板2、基板加熱ならびに冷却ステージ3、二つの電
子ビーム蒸着源の蒸着レートをモニターするための水晶
振動子膜厚計4,4′、二つの蒸着源がら出た分子線束
の開閉を行なうためのシャッター5,5′、真空ゲージ
6があり、ゲートバルブ7を通してクライオポンプ8に
より真空排気される。また10=torrより高い真空
度を得るためにチャンバーの外周にはヒーターがとりつ
けられ、ベーキングができるようになっている。10=
torrより高い超高真空のもとての成膜は、チャンバ
ーを150℃で10時間ベーキングした後行なっタカ、
1O−8torrより低い真空度のもとての成膜は、チ
ャンバーベークをせずに行なった。組成変調膜は、二つ
の電子ビーム蒸着源からの蒸着レートが一定になるよう
電子ビーム蒸着源のパワーを調整した後、2つのシャッ
ターを交互に開閉することによって、コバルトとアルミ
ニウムを所望の膜厚で交互に積層して形成される。比較
例とするため、この蒸着装置を用いアルミニウムのがわ
りにクロムを電子ビーム蒸着源に入れ、共蒸着によりC
0aoCr2oの合金膜を作製したが、その飽和磁化の
値は410emu/cm3の垂直磁化膜が得られた。な
お、磁気的な測定は室温で振動試料型磁力計(VSM)
により行なった。
In the vacuum chamber of the evaporation apparatus shown in Fig. 2, there are two electron beam evaporation sources 1 and 1' filled with cobalt and aluminum.
, a substrate 2, a substrate heating and cooling stage 3, a crystal oscillator film thickness gage 4, 4' for monitoring the evaporation rate of the two electron beam evaporation sources, and for opening and closing the molecular beam fluxes emitted from the two evaporation sources. shutters 5 and 5', and a vacuum gauge 6, and is evacuated by a cryopump 8 through a gate valve 7. Furthermore, in order to obtain a degree of vacuum higher than 10 torr, a heater is attached to the outer periphery of the chamber to enable baking. 10=
The original film formation in an ultra-high vacuum higher than torr was performed after baking the chamber at 150°C for 10 hours.
The original film formation at a vacuum level lower than 10-8 torr was performed without chamber baking. The composition modulation film is produced by adjusting the power of the electron beam evaporation source so that the evaporation rate from the two electron beam evaporation sources is constant, and then by alternately opening and closing two shutters to deposit cobalt and aluminum into the desired film thickness. It is formed by laminating alternately. As a comparative example, using this evaporation apparatus, chromium was put into the electron beam evaporation source instead of aluminum, and C was co-deposited.
An alloy film of 0aoCr2o was produced, and a perpendicular magnetization film with a saturation magnetization value of 410 emu/cm3 was obtained. The magnetic measurements were performed using a vibrating sample magnetometer (VSM) at room temperature.
This was done by

まず蒸着基板としてシリコウェハーを用い、基板温度を
一100℃〜400℃1蒸着レート1.OA/secの
条件でコバルト15人、アルミニウム10人、繰り返し
数100回、すなわち、総膜厚250OAのコバルトl
アルミニウム組成変調膜を、チャンバーのベース真空度
を変えて作製し、VSMにより、それぞれの膜の飽和磁
化と垂直磁化膜がどうがを調べた。垂直磁化膜かどうか
の判定はVSMで測定される、磁場が5kOeより小さ
いときのM−Hループで膜面に垂直に磁場を印加したと
きのM−Hループが、膜面に平行に磁場を印加したとき
のそれより大きい場合を垂直磁化膜であるとする。第3
図がら第7図は、それぞれチャンバーのベース真空度が
2X10−6torr。
First, a silicon wafer is used as a deposition substrate, and the substrate temperature is set to 100°C to 400°C, 1% deposition rate. Under the conditions of OA/sec, 15 people for cobalt, 10 people for aluminum, 100 repetitions, that is, a total film thickness of 250OA
Aluminum composition-modulated films were fabricated by changing the base vacuum of the chamber, and the saturation magnetization and perpendicular magnetization of each film were examined using VSM. The determination of whether or not the film is perpendicularly magnetized is determined by the M-H loop when the magnetic field is smaller than 5 kOe. If it is larger than that when the voltage is applied, it is assumed that the film is perpendicularly magnetized. Third
In FIG. 7, the base vacuum degree of the chamber is 2×10 −6 torr.

IX1叶7torr 、3X10−8torr 、 5
X10−9torr7×1叶”torrの場合の基板温
度と飽和磁化の関係を示している。これらの図中、○印
は垂直磁化膜、x印は面内磁化膜を意味する。これらの
結果から、ベース真空度が1O−7torrより高い真
空度で、基板温度が一50℃以上+3000C以下の場
合に、比較例の共蒸着C05oCr2o膜より大きな飽
和磁化をもつ垂直磁化膜が得られることがわかる。ここ
ではコバルト層が5人〜30人、アルミニウム層が2.
5A〜20人の範囲で試料を作製した。
IX1 Kano 7torr, 3X10-8torr, 5
It shows the relationship between substrate temperature and saturation magnetization in the case of X10-9torr7×1"torr. In these figures, the ○ mark means a perpendicular magnetization film, and the x mark means an in-plane magnetization film.From these results, It can be seen that a perpendicularly magnetized film having a larger saturation magnetization than the co-deposited C05oCr2o film of the comparative example can be obtained when the base vacuum degree is higher than 1O-7 torr and the substrate temperature is 150° C. or more and +3000° C. or less. Here, the cobalt layer has 5 to 30 people, and the aluminum layer has 2.
Samples were prepared in a range of 5A to 20 people.

次にチャンバーの真空度が2X10−9torrのもと
でサファイヤ基板上にコバルト30人、アルミニウム2
5人、繰り返し50回、すなわち総膜厚2750人のコ
バルト/アルミニウム組成変調膜を、基板温度80℃1
蒸着レート1.OA/secの条件で作製し、100℃
から500℃の温度で30分間の熱処理を5X10−6
torrの真空中で行ない、VSMにより飽和磁化とそ
れぞれの膜が垂直磁化かどうかを調べた。第8図に、熱
処理温度と飽和磁化の関係を示している。図中○印は垂
直磁化膜、X印は面内磁化膜を意味する。これらの結果
から熱処理温度が150℃以上450℃以下で行なうこ
とによってコバルト・クロム合金膜より大きな飽和磁化
をもつ垂直磁化膜が得られることがわかる。
Next, under a chamber vacuum of 2X10-9 torr, 30 pieces of cobalt and 2 pieces of aluminum were placed on the sapphire substrate.
The cobalt/aluminum composition modulation film was made by 5 people repeatedly 50 times, that is, with a total film thickness of 2750, at a substrate temperature of 80°C.
Vapor deposition rate 1. Produced under the conditions of OA/sec and 100℃
Heat treatment for 30 minutes at a temperature of 500℃ from 5X10-6
This was carried out in a vacuum of Torr, and the saturation magnetization and whether or not each film had perpendicular magnetization were investigated using VSM. FIG. 8 shows the relationship between heat treatment temperature and saturation magnetization. In the figure, the ○ mark means a perpendicularly magnetized film, and the X mark means an in-plane magnetized film. These results show that a perpendicularly magnetized film having a larger saturation magnetization than a cobalt-chromium alloy film can be obtained by performing the heat treatment at a temperature of 150° C. or higher and 450° C. or lower.

る。Ru.

さらに、チャンバーの真空度が2X10−9torrの
もとてサファイヤ基板上にコバルト5人、アラルミニラ
ム20人繰り返し数100回すなわち総膜厚2500人
のコバルトlアルミニウム組成変調膜を室温で、蒸着レ
ート0.5A/seeの条件で作製し、100℃から5
00℃の温度で40分間の熱処理を5X10=torr
の真空中で行ない、VSMにより飽和磁化と垂直異方性
かどうかを調べた。第9図に熱処理温度と飽和磁化の関
係を示す。○、およびX印は第8図と同様である。これ
らの結果から150℃以上450℃以下の熱処理により
コバルト・クロム合金膜より大きな飽和磁化をもつ垂直
磁化膜が得られることがわかる。第8図ならびに第9図
は熱処理時間を30分および40分としたが1時間の場
合も同様の結果を得た。また、熱処理の雰囲気は真空の
場合について述べたが、窒素あるいはアルゴンガスでも
同様の結果を得た。
Furthermore, under a chamber vacuum of 2X10-9 torr, a cobalt-aluminum composition-modulated film was deposited on a sapphire substrate by 5 cobalt and 20 Aralminilam 100 times, or a total film thickness of 2500, at room temperature and at a evaporation rate of 0. Produced under the conditions of 5A/see, and heated from 100°C to 5
Heat treatment for 40 minutes at a temperature of 00℃ to 5X10=torr
This was carried out in a vacuum, and the saturation magnetization and perpendicular anisotropy were investigated using VSM. FIG. 9 shows the relationship between heat treatment temperature and saturation magnetization. The O and X marks are the same as in FIG. These results show that a perpendicularly magnetized film having a larger saturation magnetization than a cobalt-chromium alloy film can be obtained by heat treatment at 150° C. or more and 450° C. or less. In FIG. 8 and FIG. 9, the heat treatment time was 30 minutes and 40 minutes, but similar results were obtained when the heat treatment time was 1 hour. Moreover, although the case where the heat treatment atmosphere was a vacuum was described, similar results were obtained when nitrogen or argon gas was used.

第8・図に示した実施例のように、蒸着直後は、垂直磁
化膜でなかったものが150℃以上450℃以下の熱処
理により垂直磁化膜となる場合と、第9図に示した実施
例のように、蒸着直後は垂直磁化膜ではあるが飽和磁化
が比較例のCo8oCr2o合金と同程度のものが15
0℃以上450℃以下の熱処理で垂直磁化を維持しなが
ら飽和磁化が大きくなる場合があるが、熱処理によりC
o8oCr2oよりも垂直磁化膜としての特性が向上す
るのはコバルトの膜厚が5人から40人でアルミニウム
の膜厚が2.5人から30人の組成変調膜であった。
As in the embodiment shown in Figure 8, a film that was not perpendicularly magnetized immediately after vapor deposition becomes a perpendicularly magnetized film by heat treatment at 150°C or higher and 450°C or lower, and as shown in the embodiment shown in Figure 9. Although it is a perpendicularly magnetized film immediately after evaporation, the saturation magnetization is similar to that of the Co8oCr2o alloy of the comparative example.
Heat treatment at temperatures above 0°C and below 450°C may increase saturation magnetization while maintaining perpendicular magnetization;
The properties of perpendicularly magnetized films that are better than those of o8oCr2o are composition modulated films with a cobalt thickness of 5 to 40 and an aluminum thickness of 2.5 to 30.

(発明の効果) 以上実施例にて説明したように本発明によれば、従来の
コバルト・クロム合金膜より大きな飽和磁化をもつ垂直
磁化膜が得られ、そのために従来のコバルト・クロム合
金より読み出し時のシグナルが大きくとれるばかりでな
く、磁気記録密度を高くすることができるものである。
(Effects of the Invention) As explained above in the embodiments, according to the present invention, a perpendicularly magnetized film having a larger saturation magnetization than a conventional cobalt-chromium alloy film can be obtained, which makes it easier to read than a conventional cobalt-chromium alloy film. Not only can a large time signal be obtained, but also the magnetic recording density can be increased.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の垂直磁気記録膜の構造を示す模式図。 第2図は本発明の実施例で用いた蒸着装置の概略図。第
3図から第7図は、チャンバーの真空度を変えて作製し
たコバルトlアルミニウム組成変調膜の飽和磁化と基板
温度の関係を示す図。第8図および第9図はコバルトl
アルミニウム組成変調膜の飽和磁化と熱処理温度の関係
を示す図。図において1゜1′は蒸着源、2は基板、5
,5′はシャッター、9はコバルト層、10はアルミニ
ウム層。
FIG. 1 is a schematic diagram showing the structure of the perpendicular magnetic recording film of the present invention. FIG. 2 is a schematic diagram of a vapor deposition apparatus used in an example of the present invention. FIGS. 3 to 7 are diagrams showing the relationship between the saturation magnetization and substrate temperature of cobalt-aluminum composition-modulated films produced by changing the vacuum degree of the chamber. Figures 8 and 9 show cobalt
FIG. 3 is a diagram showing the relationship between saturation magnetization and heat treatment temperature of an aluminum composition modulated film. In the figure, 1°1' is the evaporation source, 2 is the substrate, and 5
, 5' is a shutter, 9 is a cobalt layer, and 10 is an aluminum layer.

Claims (2)

【特許請求の範囲】[Claims] (1)蒸着装置のベース真空度を10^−^7torr
、あるいはこれより高真空にした後、基板温度が−50
℃以上+300℃以下で、コバルトとアルミニウムを交
互に蒸着し積層して形成することを特徴とする垂直磁気
記録膜の製造方法。
(1) The base vacuum level of the evaporation equipment is 10^-^7 torr.
, or after applying a higher vacuum than this, the substrate temperature is -50
A method for manufacturing a perpendicular magnetic recording film, characterized in that cobalt and aluminum are alternately deposited and laminated at a temperature of not less than 0.degree. C. and not more than +300.degree.
(2)コバルトとアルミニウムを交互に積層して形成し
たコバルト/アルミニウム組成変調膜を150℃以上4
50℃以下の温度で熱処理する工程を備えたことを特徴
とする垂直磁気記録膜の製造方法。
(2) Cobalt/aluminum composition modulation film formed by alternately laminating cobalt and aluminum at temperatures above 450°C
1. A method for manufacturing a perpendicular magnetic recording film, comprising a step of heat treatment at a temperature of 50° C. or lower.
JP17662788A 1988-07-14 1988-07-14 Production of perpendicular magnetic recording film Pending JPH0227524A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17662788A JPH0227524A (en) 1988-07-14 1988-07-14 Production of perpendicular magnetic recording film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17662788A JPH0227524A (en) 1988-07-14 1988-07-14 Production of perpendicular magnetic recording film

Publications (1)

Publication Number Publication Date
JPH0227524A true JPH0227524A (en) 1990-01-30

Family

ID=16016888

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17662788A Pending JPH0227524A (en) 1988-07-14 1988-07-14 Production of perpendicular magnetic recording film

Country Status (1)

Country Link
JP (1) JPH0227524A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5717138A (en) * 1993-09-03 1998-02-10 Hofmann Werkstatt-Technik Gmbh Arrangement for driving a measuring spindle of a balancing machine

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5717138A (en) * 1993-09-03 1998-02-10 Hofmann Werkstatt-Technik Gmbh Arrangement for driving a measuring spindle of a balancing machine

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