JPH0227607B2 - ICHISOKUTEISOCHI - Google Patents

ICHISOKUTEISOCHI

Info

Publication number
JPH0227607B2
JPH0227607B2 JP20385983A JP20385983A JPH0227607B2 JP H0227607 B2 JPH0227607 B2 JP H0227607B2 JP 20385983 A JP20385983 A JP 20385983A JP 20385983 A JP20385983 A JP 20385983A JP H0227607 B2 JPH0227607 B2 JP H0227607B2
Authority
JP
Japan
Prior art keywords
light
spot
light receiving
optical axis
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP20385983A
Other languages
Japanese (ja)
Other versions
JPS6095307A (en
Inventor
Yasutomo Fujimori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP20385983A priority Critical patent/JPH0227607B2/en
Publication of JPS6095307A publication Critical patent/JPS6095307A/en
Publication of JPH0227607B2 publication Critical patent/JPH0227607B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は、例えばレーザ加工装置において加工
対象物の加工面の位置を測定するために使用され
る位置測定装置の改良に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an improvement in a position measuring device used, for example, in a laser processing apparatus to measure the position of a processing surface of a workpiece.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

従来、この種の装置として、光源から発生した
光を集束レンズで集光して被測定対象物に照射
し、その反射光を上記照射光の光軸に対し任意の
角度を隔てて配設した受光系で受光検出すること
により上記被測定対象物の位置を測定する、いわ
ゆる三角測量法を応用した装置が知られている。
Conventionally, this type of device condenses light generated from a light source with a condenser lens and irradiates it onto the object to be measured, and the reflected light is placed at an arbitrary angle with respect to the optical axis of the irradiated light. 2. Description of the Related Art There is known an apparatus that uses a so-called triangulation method, which measures the position of the object to be measured by detecting light received by a light receiving system.

ところで、この種の装置では、測定分解能を高
めようとすると、照射光の照射スポツトをできる
だけ小さくする必要がある。しかし、この照射ス
ポツトを小さくすると、スポツト径を小さく保て
る光軸方向の範囲が狭くなつて測定可能範囲が小
範囲に限定されるといつた不具合を生じる。例え
ば、半導体レーザを用いて0.1mmの照射スポツト
を得ようとすると、この0.1mmのスポツトを保て
る範囲はわずかに±1mm程度となる。そこで、従
来では、例えばHe−Neレーザ等の拡がり角の小
さな光を用いて測定を行なう試みがなされてい
る。He−Neレーザの場合、照射スポツト0.5mm
で±200mmの測定範囲を実現できる。しかしなが
ら、このHe−Neレーザを用いたとしても、レー
ザ自体が持つ性能以上の測定精度の向上および測
定範囲の拡大は当然不可能であり、しかもこの
He−Neレーザを用いると装置が大形化し、かつ
高価になる欠点があり、実用に適さなかつた。
By the way, in this type of device, in order to improve the measurement resolution, it is necessary to make the irradiation spot of the irradiation light as small as possible. However, when this irradiation spot is made smaller, the range in the optical axis direction in which the spot diameter can be kept small becomes narrower, resulting in problems such as the measurable range being limited to a small range. For example, when trying to obtain an irradiation spot of 0.1 mm using a semiconductor laser, the range in which this 0.1 mm spot can be maintained is only about ±1 mm. Therefore, in the past, attempts have been made to perform measurements using light with a small divergence angle, such as a He--Ne laser. For He-Ne laser, the irradiation spot is 0.5mm
A measurement range of ±200mm can be achieved. However, even if this He-Ne laser is used, it is naturally impossible to improve measurement accuracy beyond the performance of the laser itself and expand the measurement range.
When a He-Ne laser is used, the device becomes large and expensive, making it unsuitable for practical use.

〔発明の目的〕[Purpose of the invention]

本発明は、装置の大形化を招くことなく広範囲
にわたつて高精度の測定を行なえるようにし、小
形かつ安価で測定性能が著しく高い位置測定装置
を提供することを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a position measuring device that is small, inexpensive, and has extremely high measurement performance, allowing highly accurate measurement over a wide range without increasing the size of the device.

〔発明の概要〕[Summary of the invention]

本発明は、上記目的を達成するために、光源と
集束レンズとの間にその光軸方向に移動可能な可
動レンズを配設するとともに、集束制御回路を設
け、この集束制御回路により、上記受光部に結像
された反射像の結像位置と予め設定してある基準
位置との差を検出し、この差に応じて上記可動レ
ンズの光軸位置を移動させるようにしたものであ
る。
In order to achieve the above object, the present invention disposes a movable lens movable in the optical axis direction between the light source and the focusing lens, and also provides a focusing control circuit. The difference between the imaging position of the reflected image formed on the lens and a preset reference position is detected, and the optical axis position of the movable lens is moved in accordance with this difference.

〔発明の実施例〕[Embodiments of the invention]

第1図は、本発明の一実施例における位置測定
装置の概略構成図である。この装置は、被測定対
象物1に測定用の光を集束照射する投光系2と、
上記被測定対象物1による反射光を受光検出する
受光系3と、集束制御回路4とから構成されてい
る。
FIG. 1 is a schematic configuration diagram of a position measuring device according to an embodiment of the present invention. This device includes a light projection system 2 that focuses and irradiates measurement light onto an object to be measured 1;
It is composed of a light receiving system 3 that receives and detects the light reflected by the object to be measured 1, and a focusing control circuit 4.

投光系2は、例えば半導体レーザ装置からなる
光軸21を有し、この光源21から発生された光
22をコリメートレンズ23で平行光にしたの
ち、可動レンズ24および集束レンズ26をそれ
ぞれ介して被測定対象物1に照射するものであ
る。ここで上記可動レンズ24は、移動機構25
により光軸方向(矢印A方向)に移動可能となつ
ている。
The light projecting system 2 has an optical axis 21 made of, for example, a semiconductor laser device, and collimates light 22 generated from this light source 21 with a collimating lens 23, and then collimates the light 22 through a movable lens 24 and a focusing lens 26, respectively. The object to be measured 1 is irradiated with the light. Here, the movable lens 24 is moved by a moving mechanism 25.
It is possible to move in the optical axis direction (arrow A direction).

一方受光系3は、上記投光系2の光軸に対し所
定角度隔てて被測定対象物1における照射スポツ
ト形成位置の斜め上方に配設されている。そし
て、上記被測定対象物1の反射光31を、結像レ
ンズ32を介して受光器33で受光している。こ
の受光器33は、反射像の受光スポツトの光量分
布を検出するもので、例えば受光面上の受光スポ
ツトの中心位置を座標値として出力する光点位置
検出器や固体撮像素子を用いたラインセンサが使
用される。
On the other hand, the light receiving system 3 is arranged at a predetermined angle with respect to the optical axis of the light projecting system 2, diagonally above the irradiation spot formation position on the object to be measured 1. Then, reflected light 31 from the object to be measured 1 is received by a light receiver 33 via an imaging lens 32. This light receiver 33 detects the light intensity distribution of the light receiving spot of the reflected image, and is, for example, a light spot position detector that outputs the center position of the light receiving spot on the light receiving surface as a coordinate value, or a line sensor using a solid-state image sensor. is used.

さて、集束制御回路4は、前記受光器33の受
光出力信号からそのピーク位置、つまり受光スポ
ツトの中心位置を検出するスポツト位置検出回路
41と、マイクロプロセツサを主制御部として有
する制御回路本体(CPU)42と、このCPU4
2から出力された制御信号に応じて前記可動レン
ズ24の移動機構25を駆動する移動制御回路4
3とから構成されている。上記CPU42は、上
記スポツト位置検出回路41で検出された受光ス
ポツトの中心位置情報と予め内部メモリに記憶し
てある基準位置情報との差を求め、この差に基づ
いて被測定対象物1上の照射スポツト径を最小に
するための制御信号を発生し、これにより可動レ
ンズ24を移動制御するものである。
The focusing control circuit 4 includes a spot position detection circuit 41 that detects the peak position of the light receiving output signal of the light receiver 33, that is, the center position of the light receiving spot, and a control circuit main body (having a microprocessor as the main control section). CPU) 42 and this CPU4
a movement control circuit 4 that drives the movement mechanism 25 of the movable lens 24 in accordance with the control signal output from the movable lens 24;
It is composed of 3. The CPU 42 calculates the difference between the center position information of the light-receiving spot detected by the spot position detection circuit 41 and the reference position information stored in the internal memory in advance, and based on this difference, the center position information of the light receiving spot detected by the spot position detection circuit 41 is determined. A control signal is generated to minimize the diameter of the irradiation spot, and the movement of the movable lens 24 is thereby controlled.

次に、以上のように構成された装置の作用を説
明する。いま、可動レンズ24が第1図に示す位
置に設定され、この状態で被測定対象物1上に形
成される照射スポツトの径が最小となり、その反
射光が受光器33の受光面上の中心位置に結像さ
れているものと仮定する。CPU42の内部メモ
リには、このときの受光器33のスポツト位置情
報を基準位置情報BSとして記憶しておく。
Next, the operation of the device configured as above will be explained. Now, the movable lens 24 is set at the position shown in FIG. Assume that the image is focused on the position. The spot position information of the light receiver 33 at this time is stored in the internal memory of the CPU 42 as the reference position information BS.

さて、この状態で、被測定対象物1が第2図に
示す二点鎖線1′の位置に移動したとすると、こ
のときの反射光31′は焦点がボケ、かつ受光器
33の受光中心から偏移して受光されることにな
る。このとき、上記反射光31′の偏位量Cは、
前記被測定対象物1の移動量Lに対応する。上記
反射光31′が受光されると、受光器33からは
その受光位置要素を含む受光信号が出力され、こ
の信号はスポツト位置検出回路41に導かれる。
第3図イはこの受光信号の波形の一例を示すもの
である。この受光信号が導入されるとスポツト位
置検出回路41は、上記受光信号イのピークを検
出してその位置を受光スポツトの中心位置情報
DSとしてCPU42に出力する。そうするとCPU
42は、第4図に示す制御手順に従つて先ず上記
受光スポツトの位置情報DSを入力するとともに、
内部メモリから基準位置情報BSを読出し、次に
これらの位置情報DS,BSの差CSを求める。そ
して、この差CSに所定の定数を乗算して移動制
御信号を作成し、この移動制御信号を移動制御回
路43に与える。そうすると、移動制御回路43
により移動機構25が駆動され、この結果可動レ
ンズ24が上記移動制御信号で指定された量だけ
光軸方向に移動する。したがつて、前記差CSに
乗算する定数を適宜選定すれば、可動レンズ24
は被測定対象物1と1′との移動量Lに対応する
量だけ移動することになり、この結果被測定対象
物1′上の照射スポツトの径は最小となる。
Now, in this state, if the object to be measured 1 moves to the position indicated by the two-dot chain line 1' shown in FIG. The light will be received with a shift. At this time, the amount of deviation C of the reflected light 31' is:
This corresponds to the amount of movement L of the object to be measured 1. When the reflected light 31' is received, the light receiver 33 outputs a light reception signal including the light reception position element, and this signal is guided to the spot position detection circuit 41.
FIG. 3A shows an example of the waveform of this light reception signal. When this light reception signal is introduced, the spot position detection circuit 41 detects the peak of the light reception signal A and uses the peak position as center position information of the light reception spot.
Output to CPU 42 as DS. Then the CPU
42 first inputs the position information DS of the light receiving spot according to the control procedure shown in FIG.
The reference position information BS is read from the internal memory, and then the difference CS between these position information DS and BS is determined. Then, this difference CS is multiplied by a predetermined constant to create a movement control signal, and this movement control signal is given to the movement control circuit 43. Then, the movement control circuit 43
The moving mechanism 25 is driven, and as a result, the movable lens 24 is moved in the optical axis direction by an amount specified by the movement control signal. Therefore, if the constant to be multiplied by the difference CS is appropriately selected, the movable lens 24
moves by an amount corresponding to the amount of movement L between the objects to be measured 1 and 1', and as a result, the diameter of the irradiation spot on the object to be measured 1' becomes minimum.

このように本実施例によれば、たとえスポツト
径を小さく保てる範囲の狭いレーザを用いたとし
ても、受光スポツトの位置と基準位置との差に対
応して可動レンズ24の光軸位置を可変するよう
にしたので、被測定対象物1が如何なる位置にあ
ろうともこの対象物1上に焦点を結んで照射スポ
ツト径を最小にすることができる。すなわち、結
果的にスポツト径を小さく保てる範囲を大幅に拡
げることができる。したがつて、広範囲にわたつ
て高精度の位置測定を行なうことができる。しか
も、半導体レーザを用いることができるので、
He−Neレーザを用いる場合に比べて装置を小形
化することができ、かつ安価にて提供可能とな
る。
In this way, according to this embodiment, even if a laser with a narrow range in which the spot diameter can be kept small is used, the optical axis position of the movable lens 24 can be varied in accordance with the difference between the position of the light receiving spot and the reference position. This makes it possible to focus on the object 1 to be measured and minimize the diameter of the irradiation spot, no matter where the object 1 is located. That is, as a result, the range in which the spot diameter can be kept small can be greatly expanded. Therefore, highly accurate position measurement can be performed over a wide range. Moreover, since a semiconductor laser can be used,
Compared to the case where a He--Ne laser is used, the device can be made smaller and can be provided at a lower cost.

なお、本発明は上記実施例に限定されるもので
はない。例えば、コリメートレンズは可動レンズ
と一体化するようにしてもよい。また集束制御回
路のCPUの代わりにROM等を用いたデコーダを
設け、差CSに対応する移動制御情報を読出して
移動制御回路43に供給するようにしてもよい。
その他、受光器や光源、集束制御回路の構成等に
ついても、本発明の要旨を逸脱しない範囲で種々
変形して実施できる。
Note that the present invention is not limited to the above embodiments. For example, the collimating lens may be integrated with the movable lens. Further, instead of the CPU of the focusing control circuit, a decoder using a ROM or the like may be provided to read movement control information corresponding to the difference CS and supply it to the movement control circuit 43.
In addition, the configurations of the light receiver, the light source, the focusing control circuit, etc. can be modified in various ways without departing from the gist of the present invention.

〔発明の効果〕〔Effect of the invention〕

以上詳述したように本発明は、光源と集束レン
ズとの間にその光軸方向に移動可能な可動レンズ
を配設するとともに、集束制御回路を設け、この
集束制御回路により、上記受光部に結像された反
射像の結像位置と予め設定してある基準位置との
差を検出し、この差に応じて可動レンズの光軸位
置を可変するようにしたものである。
As described in detail above, the present invention provides a movable lens movable in the direction of the optical axis between the light source and the focusing lens, and also a focusing control circuit. The difference between the image formation position of the formed reflected image and a preset reference position is detected, and the optical axis position of the movable lens is varied according to this difference.

したがつて、本発明によれば、装置の大形化を
招くことなく広範囲にわたつて高精度の測定を行
なうことができ、小形かつ安価で測定性能が著し
く高い位置測定装置を提供することができる。
Therefore, according to the present invention, it is possible to provide a position measuring device that is small, inexpensive, and has extremely high measurement performance, which can perform highly accurate measurements over a wide range without increasing the size of the device. can.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例における位置測定装
置の概略構成図、第2図〜第4図は同装置の作用
説明に用いるためのもので、第2図は照明光と反
射光の軌跡を説明するための模式図、第3図は受
光出力波形を示す図、第4図は制御手順を示すフ
ローチヤートである。 1,1′……被測定対象物、2……投光系、3
……受光系、4……集束制御回路、21……光
源、24……可動レンズ、25……移動機構、3
3……受光器、41……スポツト位置検出回路、
42……CPU、43……移動制御回路。
Fig. 1 is a schematic configuration diagram of a position measuring device according to an embodiment of the present invention, Figs. 2 to 4 are used to explain the operation of the device, and Fig. 2 is a trajectory of illumination light and reflected light. FIG. 3 is a diagram showing the received light output waveform, and FIG. 4 is a flowchart showing the control procedure. 1, 1'...Object to be measured, 2...Light projection system, 3
... Light receiving system, 4 ... Focusing control circuit, 21 ... Light source, 24 ... Movable lens, 25 ... Movement mechanism, 3
3... Light receiver, 41... Spot position detection circuit,
42...CPU, 43...Movement control circuit.

Claims (1)

【特許請求の範囲】[Claims] 1 光源から発生された光を集束レンズにより集
光して被測定対象に照射し、その反射像を上記照
射光の光軸に対し任意の角度を隔てて配設された
受光系で受光検出することにより被測定対象物の
位置を測定する位置測定装置において、前記光源
と集束レンズとの間にその光軸方向に移動可能に
配設された可動レンズと、前記受光系の受光部に
結像される反射像のスポツト径が最小となつてい
るときの上記反射像の結像位置を基準とし、前記
受光部における反射像の結像位置を検出してこの
検出位置と上記基準位置との差に対応する量だけ
前記可動レンズの光軸位置を移動させる集束制御
回路とを具備したことを特徴とする位置測定装
置。
1. Light generated from a light source is focused by a focusing lens and irradiated onto the object to be measured, and the reflected image is received and detected by a light receiving system arranged at an arbitrary angle with respect to the optical axis of the irradiated light. A position measuring device for measuring the position of an object to be measured by means of a movable lens disposed between the light source and the focusing lens so as to be movable in the direction of the optical axis thereof, and an image forming part on the light receiving section of the light receiving system. The image forming position of the reflected image when the spot diameter of the reflected image is the minimum is used as a reference, and the image forming position of the reflected image in the light receiving section is detected, and the difference between this detected position and the above reference position is determined. a focusing control circuit that moves the optical axis position of the movable lens by an amount corresponding to .
JP20385983A 1983-10-31 1983-10-31 ICHISOKUTEISOCHI Expired - Lifetime JPH0227607B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20385983A JPH0227607B2 (en) 1983-10-31 1983-10-31 ICHISOKUTEISOCHI

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20385983A JPH0227607B2 (en) 1983-10-31 1983-10-31 ICHISOKUTEISOCHI

Publications (2)

Publication Number Publication Date
JPS6095307A JPS6095307A (en) 1985-05-28
JPH0227607B2 true JPH0227607B2 (en) 1990-06-19

Family

ID=16480873

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20385983A Expired - Lifetime JPH0227607B2 (en) 1983-10-31 1983-10-31 ICHISOKUTEISOCHI

Country Status (1)

Country Link
JP (1) JPH0227607B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0658204B2 (en) * 1985-08-30 1994-08-03 株式会社東芝 Sample plane position measuring device

Also Published As

Publication number Publication date
JPS6095307A (en) 1985-05-28

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