JPH02278111A - Measuring apparatus of position of light point - Google Patents

Measuring apparatus of position of light point

Info

Publication number
JPH02278111A
JPH02278111A JP9934089A JP9934089A JPH02278111A JP H02278111 A JPH02278111 A JP H02278111A JP 9934089 A JP9934089 A JP 9934089A JP 9934089 A JP9934089 A JP 9934089A JP H02278111 A JPH02278111 A JP H02278111A
Authority
JP
Japan
Prior art keywords
light
light spot
reflection
image
receiving surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9934089A
Other languages
Japanese (ja)
Other versions
JP2883627B2 (en
Inventor
Tetsuo Hizuka
哲男 肥塚
Giichi Kakigi
柿木 義一
Shinji Hashinami
伸治 橋波
Masahito Nakajima
雅人 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP1099340A priority Critical patent/JP2883627B2/en
Publication of JPH02278111A publication Critical patent/JPH02278111A/en
Application granted granted Critical
Publication of JP2883627B2 publication Critical patent/JP2883627B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To enable measurement of the position of a light point relating to the first reflection by intercepting an image light from a light point relating to the second reflection. CONSTITUTION:A light-position detector (PSD) 1 outputs a pair of signals corresponding to a position of a light on a light-sensing surface and the intensity of a sensed light. Next, an image-forming optical means 2 forms an image of a light point on a surface 3 to be inspected, on a light-sensing surface of the PSD 1. A light-intercepting means 4 constructed of a light-intercepting plate and a mechanism for sliding the light- intercepting plate, or of a liquid-crystal shutter, is disposed on the light-sensing surface of the PSD 1 and intercepts a part of an image light. Moreover, a light-interception control means 5 controls the light-intercepting means 4 for intercepting the image light from a virtual light point L'2 outside a prescribed area, adjusting the sphere of interception. Even when an incident light flux is reflected twice on the surface 3 to be inspected and two light points L1 and L2 are formed, the image light from the light point L2 relating to the second reflection, e.g. the virtual light point L'2 located below a point of the lower limit of the surface 3 and not existing actually, is intercepted according to this constitution. On the light-sensing surface of the PSD 1, therefore, only an image of the light point L1 relating to the first reflection is formed.

Description

【発明の詳細な説明】 [概要コ 外観検査装置等に用いられ、検査面に光を照射して形成
された光点の位置を測定する光点位置測定装置に関し、 第1回目の反射に係る光点位置を測定できるようにする
ことを目的とし、 光位置検出器と、検査面上の光点を該光位置検出器の受
光面に結像させる結像光学手段と、該受光面上に配置さ
れ、結像光の一部を遮光する遮光手段と、規定範囲外の
虚光点からの結像光を遮光するために該遮光手段を制御
して遮光範囲を調整する遮光制御手段と、を備えて第1
発明を構成し、第1光位置検出器と、検査面上の光点を
該第1光位置検出器の受光而に結像させる第1結像光学
手段と、第2光位置検出器と、該検査面上の該光点を該
第2光位置検出器の受光面に結像させ、かつ、該光点の
うら1回[]の反射による光点を該受光面の特定位置に
結像させる第2結像光学手段と、該第2光位置検出器の
該受光面の該特定位置しに配置され該特定位置への結像
光を遮光する遮光部材と、該第1光位置検出器の出力に
含まれている2回目の反射に係る成分を該第2光位置検
出器の出力を用いて除去することにより該第1回目の反
射に係る光点位置を求める光点位置演算手段と、を備え
て第2発明を構成する。
[Detailed description of the invention] [Summary] This invention relates to a light spot position measuring device that is used in a visual inspection device, etc. and measures the position of a light spot formed by irradiating light onto an inspection surface. In order to be able to measure the position of a light spot, there is provided an optical position detector, an imaging optical means for forming an image of the light spot on the inspection surface on the light receiving surface of the light position detector, and a light spot on the light receiving surface. a light blocking means arranged to block a part of the imaged light; a light blocking control means controlling the light blocking means to adjust the light blocking range in order to block the imaged light from the virtual light point outside the specified range; First with
The invention comprises a first optical position detector, a first imaging optical means for forming an image of a light spot on the inspection surface onto a light receiving body of the first optical position detector, and a second optical position detector; The light spot on the inspection surface is imaged on the light-receiving surface of the second optical position detector, and the light spot by one reflection [ ] behind the light spot is imaged at a specific position on the light-receiving surface. a light shielding member disposed at the specific position on the light-receiving surface of the second optical position detector to block imaging light to the specific position, and the first optical position detector. a light spot position calculation means for calculating a light spot position related to the first reflection by removing a component related to the second reflection included in the output of the second optical position detector using the output of the second optical position detector; , constitutes the second invention.

U産業上の利用分野] 本発明は外観検査装置等に用いられ、検査面に光を照射
して形成された光点の位置を測定する光点位置測定装置
に関する。
U Field of Industrial Application] The present invention relates to a light spot position measuring device that is used in a visual inspection device or the like and measures the position of a light spot formed by irradiating light onto an inspection surface.

U従来の技術] 第6図はチップ部品実装済みプリント配線板の外観検査
装置に用いられる従来の光点高さ位置測定装置を示す。
U Prior Art] FIG. 6 shows a conventional light spot height position measuring device used in an appearance inspection device for a printed wiring board on which chip components are mounted.

検査面10(第6図ではチップ部品の端子の上面)の真
上から入射光束が収束照射されて、検査面10−ヒに形
成された光点り、は、結像レンズI2で光位置検出器(
PSD) l 4の受光面上に結像され、光点像Slが
形成される。PSDI4の一対の端子からは、光電効果
により、受光強度及び受光面上の結像位置に応じた電流
1.、 l、が取り出される。電流夏、1.は、それぞ
れ電流/mm圧変器16、1Bにより電圧v1、■!に
変換されて演算回路2oへ供給され、演算回路20 t
j: X = (V、 −L)/(V、 、+−v、)
を算出する。この位置Xは、PSD14の一対の出力端
子の一端から他端へ向けて座標軸Xをとり、受光面の中
点を原点とし、Xの範囲を−1〜+1に規格化したとき
の受光面−Lの光点像S、の位置であり、検査面10上
の光点し、の高さに対応している。入射光束を検査面1
0上に走査して高さデータをメモリに書き込み、そのデ
ータの処理を行うことにより高さ欠陥が検知される。
The incident light beam is convergently irradiated from directly above the inspection surface 10 (the top surface of the terminal of the chip component in FIG. 6), and the light spot formed on the inspection surface 10-A is detected by the imaging lens I2. vessel(
PSD) l 4 is imaged on the light receiving surface to form a light spot image Sl. From a pair of terminals of PSDI4, due to the photoelectric effect, a current of 1. , l, is retrieved. Current summer, 1. are the voltages v1 and ■! due to the current/mm pressure transformers 16 and 1B, respectively. is converted into and supplied to the arithmetic circuit 2o, and the arithmetic circuit 20t
j: X = (V, -L)/(V, , +-v,)
Calculate. This position This is the position of the light spot image S, of L, and corresponds to the height of the light spot image S, on the inspection surface 10. Inspection surface 1
Height defects are detected by scanning over 0, writing height data into memory, and processing the data.

1発明が解決し、ようとする課題] しか(,5、第6図に示す如く、入射光束が検査面10
上で2回反射されて光点L 、 、[、tが形成され、
光点1.いり、がPSD14の受光面に結像されて2p
!の光点像S1、S、が形成された場合には、演算回路
20+こより求められた光点位置Xは光点像S、と光点
像S、の中間位置を示すことになり、正確な高さを測定
することかできない。
1. Problems to be Solved and Attempted by the Invention] Only (, 5, As shown in FIG. 6, the incident light beam is
is reflected twice to form a light spot L, ,[,t,
Light spot 1. The image is formed on the light-receiving surface of PSD 14, and the 2p
! When the light spot images S1 and S are formed, the light spot position X obtained from the arithmetic circuit 20+ indicates the intermediate position between the light spot images S and It is not possible to measure height.

本発明の目的は、上記問題点に鑑み、1回[Jの反射に
係る光点位置を測定することが可能な光点位置測定装置
を提供することにある。
SUMMARY OF THE INVENTION In view of the above-mentioned problems, an object of the present invention is to provide a light spot position measuring device that can measure the light spot position related to the reflection of [J] once.

[課題を解決するための手段1 (1)第1発明 第1図は本第1発明の原理構成を示すブロック図である
[Means for Solving the Problems 1 (1) First Invention FIG. 1 is a block diagram showing the principle configuration of the first invention.

図中、■は先位(n検出器(PSD)であり、その受光
面1.の光位置及び受光強度に応じた一対の信号を出力
する。
In the figure, ■ is a front-end (n detector) (PSD), which outputs a pair of signals corresponding to the light position and received light intensity on its light-receiving surface 1.

2は結像光学手段であり、検査面31−の光点を光位置
検出器lの受光而に結像させる。
Reference numeral 2 denotes an imaging optical means, which forms an image of a light spot on the inspection surface 31- on the light-receiving device of the optical position detector 1.

4は遮光手段であり、例えば、遮光板とこれをスライド
させる機構とで、または液晶シャッターで構成され、P
SD lの受光面一■−に配置されて結像光の一部を遮
光ケる。
4 is a light shielding means, for example, it is composed of a light shielding plate and a mechanism for sliding it, or a liquid crystal shutter;
It is placed on the light-receiving surface of the SD1 to block a portion of the imaging light.

5は遮光制御手段であり、規定範囲外の虚光点り、’か
らの結像光を遮光するために遮光手段4を制御して遮光
範囲を調整する。
Reference numeral 5 denotes a light-shielding control means, which controls the light-shielding means 4 to adjust the light-shielding range in order to shield the imaging light from the virtual light spot outside the specified range.

(2)第2発明 第2図は本第2発明の原理構成を示すブロック図である
(2) Second invention FIG. 2 is a block diagram showing the principle configuration of the second invention.

図中、1A及び1Bは第1及び第2の光位置検出器(P
SD)であり、それぞれ、その受光面上の光位置及び受
光強度に応じた一対の信号を出力する。
In the figure, 1A and 1B are the first and second optical position detectors (P
SD), and each outputs a pair of signals corresponding to the light position on the light receiving surface and the received light intensity.

2Δ及び2Bは第1及び第2の結像光学手段であり、そ
れぞれ検査面3上の光点を第1及び第2のPSD1A、
2Aの受光面に結像させる。この第2結像光学手段2B
はさらに、光点l43、L、のうち1回目の反射による
光点り、をPSD1Bの受光面の特定位置に結像させる
2Δ and 2B are first and second imaging optical means, which direct the light spot on the inspection surface 3 to the first and second PSDs 1A and 2B, respectively.
The image is formed on the 2A light receiving surface. This second imaging optical means 2B
Further, the light spot L43, L, which is caused by the first reflection, is imaged at a specific position on the light receiving surface of the PSD 1B.

6は遮光部材であり、第2 PSDの受光面のこの特定
位置上に配置され、該特定位置への結像光を遮光する。
Reference numeral 6 denotes a light shielding member, which is disposed on this specific position on the light receiving surface of the second PSD, and blocks the imaging light directed to the specific position.

7は光位置演算手段であり、第1PSD1Aの出力に含
まれている2回目の反射に係る成分を、第2PSD1B
の出力を用いて除去することにより、第1回目の反射に
係る光点位置を求める。
7 is a light position calculation means, which calculates the component related to the second reflection included in the output of the first PSD 1A,
By removing the output using the output of , the light spot position related to the first reflection is determined.

[作用] 入射光束が検査面3上で2回反射されて2個の光点り、
、 L、が形成されても、第1発明では、2回目の反射
に係る光点し、からの、すなわち、規定範囲外、例えば
検査面3の下限の点より下にある実際には存在しない虚
光点I4.′からの結像光を遮光するので、PSD I
の受光面には第1回目の反射に係る光点L1の像S、の
みが形成される。
[Function] The incident light beam is reflected twice on the inspection surface 3, resulting in two light spots,
, L, is formed, in the first invention, the light spot related to the second reflection is not actually present, which is outside the specified range, for example, below the lower limit point of the inspection surface 3. Imaginary light point I4. Since the imaging light from ′ is blocked, PSD I
Only the image S of the light spot L1 related to the first reflection is formed on the light receiving surface of the light receiving surface.

また、第2発明では、これら光点り、、1.、のうち1
回目の反射による光点L1が第2PSD1Bの受光面に
形成されず、第2PSD1Bの出力には2回目の反射に
よる光点り、の情報のみが含まれている。
Further, in the second invention, these light spots: 1. , 1 of
The light spot L1 due to the second reflection is not formed on the light receiving surface of the second PSD 1B, and the output of the second PSD 1B includes only information about the light spot due to the second reflection.

第1PSD1Aの出力に含まれている2回目の反射に係
る成分は、この第2PSD1Bの出力を用いて除去され
る。
The component related to the second reflection included in the output of the first PSD 1A is removed using the output of the second PSD 1B.

したがって、これらいずれの発明も、従来測定できなか
った1回目の反射のみに係る光点位置を測定することが
できる。
Therefore, in any of these inventions, it is possible to measure the light spot position related to only the first reflection, which could not be measured conventionally.

[実施例] 以下、図面に基づいて本発明の詳細な説明する。[Example] Hereinafter, the present invention will be described in detail based on the drawings.

(1)第1実施例 第3図は光点高さ位置測定装置の光学系を示す。(1) First example FIG. 3 shows the optical system of the light spot height position measuring device.

検査面IOは、X−Yステージ22上に載置されたプリ
ント配線板10aの表面と、このプリント配線板10a
に実装された多数のチップ部品10bの表面とで構成さ
れている。
The inspection surface IO includes the surface of the printed wiring board 10a placed on the X-Y stage 22, and the surface of the printed wiring board 10a placed on the XY stage 22.
The surface of a large number of chip components 10b is mounted on the surface of the chip component 10b.

レーザ24から放射されたレーザ光は、ガルバノミラ−
26で反射され、fθレンズ28を通ってプリント配線
板10aに略垂直に検査面lO上に照射されて、光点り
が形成される。電流力計型の角振動器30によりガルバ
ノミラ−26を一定角度範囲で角振動させると、この先
点りが検査面10上を走査して光切断線32が形成され
る。
The laser beam emitted from the laser 24 is transmitted through a galvano mirror.
26, and is irradiated onto the inspection surface 1O through the fθ lens 28 substantially perpendicularly to the printed wiring board 10a, thereby forming a light spot. When the galvanometer mirror 26 is angularly vibrated within a certain angle range by a current force meter type angular vibrator 30, the tip of the galvanometer mirror 26 scans over the inspection surface 10 to form a light cutting line 32.

光点しは、結像レンズ12により、PSDI4の受光面
に結像される。光点りの高さ方向に対応したPSDI4
の受光面上の方向をX軸方向とすると、PSDI4のX
軸方向端部側には、その受光面に向き合った遮光板34
A、34Bが配置されている。
The light spot is imaged on the light receiving surface of the PSDI 4 by the imaging lens 12. PSDI4 corresponding to the height direction of the light spot
If the direction on the light-receiving surface of PSDI4 is the X-axis direction,
On the axial end side, there is a light shielding plate 34 facing the light receiving surface.
A and 34B are arranged.

遮光板34A、34Bの基端にはそれぞれアーム36Δ
、36Bが突設されており、これらに形成されたラック
38A、38Bは、それぞれパルスモータ40A、40
Bの回転軸に取り付けられたビニオン42A、42Bと
噛合している。したがって、パルスモータ40A、40
Bを駆動することにより、遮光板34 A、 34 B
IJ(PSDI 4の受光面に平行に移動し、PSDI
4の受光面の面積が変化する。
Arms 36Δ are provided at the base ends of the light shielding plates 34A and 34B, respectively.
, 36B are protruded, and the racks 38A, 38B formed on these are connected to pulse motors 40A, 40, respectively.
It meshes with the binions 42A and 42B attached to the rotating shaft of B. Therefore, the pulse motors 40A, 40
By driving the light shielding plates 34A, 34B
Move parallel to the receiving surface of IJ (PSDI 4,
The area of the light receiving surface of No. 4 changes.

第4図に示す如く、入射光束が検査面10上で2回反射
されて光点り、、 I7.が形成されると、遮光板34
Aが無ければPSDI4の受光面には光点146、L、
の像S、、 S、が形成される。この光点像S、の位置
は、光点り、の真下の実際には存在しない虚光点14.
As shown in FIG. 4, the incident light beam is reflected twice on the inspection surface 10, resulting in a light spot, I7. is formed, the light shielding plate 34
If there is no A, the light receiving surface of PSDI4 will have a light spot 146, L,
An image S,, S, is formed. The position of this light spot image S is the virtual light spot 14. which does not actually exist directly below the light spot S.
.

の高さ位置に対応している。虚光点L2°はプリント配
線板+Oa上の点L3よりも下方にあり、光点り、の結
像レンズ12による結像光を遮光板34Aで遮光しても
なんら問題はない。
It corresponds to the height position. The imaginary light point L2° is located below the point L3 on the printed wiring board +Oa, and there is no problem even if the light spot formed by the imaging lens 12 is blocked by the light shielding plate 34A.

そこで、プリント配線板10aの小領域内での高さ変動
を見込んで、点し、に対応するPSDI4の受光面上の
点S3より僅かX軸正方向側に遮光板34Aの先端が位
置するように、遮光板34Aを配置する。
Therefore, in consideration of the height fluctuation within a small area of the printed wiring board 10a, the tip of the light shielding plate 34A is positioned slightly on the positive side of the X axis from the point S3 on the light receiving surface of the PSDI 4 corresponding to the point S3. A light-shielding plate 34A is placed there.

ここで、プリント配線板10aの表面の高さは、その反
りにより最大2mm程度変化する。一方、チップ部品1
0bの高さは[1,4〜2ma+程度である。したがっ
て、光走査位置におけるプリント配線板10aの高さに
応じて、遮光板34Aをスライドさせる必要がある。そ
こで、次のようにして1< )レスモータ40Aを制御
している。
Here, the height of the surface of the printed wiring board 10a changes by about 2 mm at most due to its warpage. On the other hand, chip part 1
The height of 0b is about [1.4 to 2 ma+]. Therefore, it is necessary to slide the light shielding plate 34A depending on the height of the printed wiring board 10a at the optical scanning position. Therefore, the 1<)less motor 40A is controlled as follows.

すなわち、PSDI4の一対の端子から出力される電流
信号18、l、を高さ位置演算回路44へ供給してPS
DI4の受光面上の光点像位置Xを求める。
That is, the current signal 18, l output from a pair of terminals of the PSDI 4 is supplied to the height position calculation circuit 44 to calculate the PS
The light spot image position X on the light receiving surface of DI4 is determined.

この位置Xは第6図で説明した位置Xと同一であり、ま
た、高さ位置演算回路44は、第6図に示ずl/V変換
器16.18及び演算回路20で構成されている。検査
面lO上の光点りの像位置x1ずなわら光点高さ位置X
は、プリント配線fc1Oa上の光走査位置に対応して
、高さメモリ46に古き込まれる。プリント配線板10
aの反りによるその表面高さの変化は緩やかであるので
、例えば、プリント配線板10aのチップ部品10b力
く実装されていない端部(各走査ラインの始端)の高さ
を、基準高さデータ選択回路48により高さメモリ46
から読み出し、これをこの走査ラインの基準高さX。と
じて遮光板制御回路50へ供給する。
This position X is the same as the position X explained in FIG. 6, and the height position calculation circuit 44 is not shown in FIG. . Image position of the light spot on the inspection surface lO x 1 Height position of the light spot
is stored in the height memory 46 in accordance with the optical scanning position on the printed wiring fc1Oa. Printed wiring board 10
Since the change in the surface height due to the warpage of a is gradual, for example, the height of the end of the printed wiring board 10a where the chip component 10b is not strongly mounted (the starting end of each scanning line) is set as the reference height data. Height memory 46 by selection circuit 48
, and set this as the reference height X of this scanning line. It is then supplied to the light shielding plate control circuit 50.

遮光板制御回路50は、パルスモータ40Aを駆動して
遮光板34Aをスライドさせ、遮光板34Aの先端を、
PSDI 4の受光面上のこの基準高さX。
The light shielding plate control circuit 50 drives the pulse motor 40A to slide the light shielding plate 34A, so that the tip of the light shielding plate 34A is
This reference height X above the photosensitive surface of PSDI 4.

に対応した位置よりも僅かX軸止方向側に位置させる。It is located slightly closer to the X-axis stop direction than the position corresponding to .

一方、部品最大高さ設定器52には、チップFl(品1
0bの最大高さり、が設定されており、この設定値は遮
光板制御回路50へ供給される。Xo+hmより高い位
置にある光点は、1回目の反射により形成されないので
、遮光板制御回路50はパルスモータ40Bを駆動して
遮光板34Bをスライドさせ、上記同様に、その先端を
(xo+ha)に対応した位置よりも僅かX軸負方向側
に位置させる。
On the other hand, the component maximum height setting device 52 has a chip Fl (product 1
A maximum height of 0b is set, and this set value is supplied to the light shielding plate control circuit 50. Since a light spot located at a position higher than Xo+hm is not formed by the first reflection, the light shielding plate control circuit 50 drives the pulse motor 40B to slide the light shielding plate 34B, and similarly to the above, the light spot is moved to (xo+ha). It is located slightly on the negative side of the X-axis from the corresponding position.

なお、本発明は、遮光板34B、ピニオン42B及び部
品最大高さ設定器52を設けない構成であってらよい。
Note that the present invention may be configured without providing the light shielding plate 34B, the pinion 42B, and the component maximum height setting device 52.

また、上記遮光機構の代わりに、液晶ンヤッターを用い
、その電圧印加範囲を変えて遮光範囲をa!1整する構
成であってもよい。
Also, instead of the above-mentioned light-shielding mechanism, a liquid crystal display is used and the voltage application range is changed to change the light-shielding range to a! It may be a configuration in which all the components are adjusted.

(2)第2実施例 第5図は第2実施例の光点高さ位置測定装置を示す。(2) Second embodiment FIG. 5 shows a light spot height position measuring device according to a second embodiment.

入射光束はハーフミラ−12Cを透過して検査面10F
に照射され、2回反射されて検査面10上に光点し5、
L、が形成され、これらは結像レンズ+2AによりPS
DI4Aの受光面に結像されて光点像Sll、SINが
形成される。また、光点り、、 I5.からの反射光は
、ハーフミラ−12Gで反射され結像レンズ12Bを通
ってPSDI4r3上に結像される。
The incident light beam passes through the half mirror 12C and reaches the inspection surface 10F.
is irradiated, is reflected twice and becomes a light spot on the inspection surface 105,
L, are formed, and these are converted into PS by the imaging lens +2A.
The light is focused on the light receiving surface of DI4A to form light spot images Sll and SIN. Also, light spots, I5. The reflected light is reflected by the half mirror 12G, passes through the imaging lens 12B, and is imaged on the PSDI 4r3.

PSD!4Bの受光面中央部には遮光片54が配置され
ている。光点L1が検査面+ 01のどの位置にあって
も、光点15.の像Sy+は必ず遮光片54上に形成さ
れる。すなわち、光点り、の結像光はPSD14Bの受
光面に到達しない。これに対し、光点I1.の像Set
はこの受光面に形成される。
PSD! A light shielding piece 54 is arranged at the center of the light receiving surface of 4B. No matter where the light spot L1 is located on the inspection surface +01, the light spot 15. The image Sy+ is always formed on the light shielding piece 54. That is, the imaging light of the light spot does not reach the light receiving surface of the PSD 14B. On the other hand, the light spot I1. Statue Set
is formed on this light-receiving surface.

PSD14Δの一対の出力端子から取り出される電流信
号は、それぞれI/V変換器+6A、+8Aに供給され
て電圧VI、 Lに変換され、これらが加算器56A及
び減算器58Aに供給されて(V++V*)及び(v、
−v、)が得られる。
The current signals taken out from the pair of output terminals of the PSD 14Δ are supplied to I/V converters +6A and +8A, respectively, and converted into voltages VI and L, which are supplied to an adder 56A and a subtracter 58A to obtain (V++V* ) and (v,
−v, ) is obtained.

ここで、光点像S 11% 5its S1Fの位置で
の受光強度をそれぞれPl、PltSpatとし、PS
D14A。
Here, the light receiving intensities at the position of the light spot image S 11% 5its S1F are respectively Pl and PltSpat, and PS
D14A.

14Bの受光面に第1実施例と同様にX軸をとって光点
像S1.5lffi、Sx*(’)位置をそれぞれXl
、Xt。
Similarly to the first embodiment, the light spot images S1.5lffi and Sx*(') positions are Xl on the light receiving surface of 14B,
, Xt.

x3とすると、重ね合わせの原理により次式が成立する
When x3, the following equation holds true according to the principle of superposition.

L+ Vt= a (P+++ P+t)      
 ’  ”  ”  (1)L  V*= a(P++
X++ P+tXt)    ”  ”  ’  (2
)Vs+ V4= b Ptt           
   ・ ’  (3)Vs−Va= b’ Pt2X
*          ・ ・ ・ (4)ここに、3
、bは定数である。また、htとPt。
L+ Vt= a (P+++ P+t)
' ” ” (1) L V*= a(P++
X++ P+tXt) ” ” ' (2
) Vs+ V4= b Ptt
・' (3) Vs-Va= b' Pt2X
* ・ ・ ・ (4) Here, 3
, b are constants. Also, ht and Pt.

はほぼ比例し、X、とX、はほぼ比例する。したがって
、定数に1、K、を適当にとると、次式が成立する。
are almost proportional, and X and X are almost proportional. Therefore, by appropriately setting 1 and K as constants, the following equation holds true.

L+L  K+(Vs+Va)=aP++   ”  
(5)V、−L−L(X、−V、)−a P、、X、 
 −−−(6)よって、検査面10−1:、の1回反射
による光点りの像Sl+の位置xIは次式で表される。
L+L K+(Vs+Va)=aP++”
(5) V, -LL(X, -V,)-a P,,X,
---(6) Therefore, the position xI of the image Sl+ of the light spot due to one reflection of the inspection surface 10-1: is expressed by the following equation.

L = [L + Vt−L(Vs +V4))/(V
+ −Vt−Kt(V、+V4))そこで、加算器56
B、減算器58Bの出力値をそれぞれ定数倍器60.6
2へ供給してに3倍、K2倍し、加算器56A及び定数
倍器60の出力値を減算器64に供給して上式(5)の
値を求め、減算器58A、定数倍器62の出力値を減算
器66に供給して上式(6)の値を求める。さらに、減
算′a64.66の出力値を除算器68へ供給して上式
(7)で示される光点高さ位置x、を求める。
L = [L + Vt-L(Vs +V4))/(V
+ −Vt−Kt(V, +V4)) Then, the adder 56
B, the output value of the subtracter 58B is converted to a constant multiplier 60.6, respectively.
The output values of the adder 56A and the constant multiplier 60 are supplied to the subtracter 64 to obtain the value of the above equation (5), The output value of is supplied to the subtracter 66 to obtain the value of the above equation (6). Further, the output value of the subtraction 'a64.66 is supplied to the divider 68 to obtain the light spot height position x expressed by the above equation (7).

この第2実施例装置は特に、第1実施例装置において測
定領域を遮光板により限定することが困難な程度に、第
1回目の反射に係る光点と第2回目の反射に係る光点と
が接近して現れる場合に有効である。
In particular, the device of the second embodiment has a light spot related to the first reflection and a light spot related to the second reflection to such an extent that it is difficult to limit the measurement area with a light shielding plate in the device of the first embodiment. This is effective when they appear close together.

なお、マイクロコンピュータを用いて上記演算をソフト
ウェア構成により実行してもよいことは勿論である。
It goes without saying that the above calculations may be executed by a software configuration using a microcomputer.

また、光学系の配置により位置x、とXsが比例関係に
ならなくても、両者が一定の関係にあればよい。
Furthermore, even if the positions x and Xs do not have a proportional relationship due to the arrangement of the optical system, it is sufficient if they have a constant relationship.

[発明の効果] 以上説明したように、入射光束が検査面上で2回反射さ
れて2個の光点が形成されても、本第1発明に係る光点
位置測定装置では、2回目の反射に係る光点からの結像
光が遮光されるので、PSDの受光面には第1回目の反
射に係る光点の像のみが形成され、本第2発明に係る光
点位置測定装置では、第2 PSDの出力には2回目の
反射による光点の情報のみが含まれ、第1 PSDの出
力に含まれている2回目の反射に係る成分はこの第2 
PSDの出力を用いて除去されるので、いずれの発明も
、従来測定できなかった1回目の反射のみに係る光点位
置を測定することができるという優れた効果を奏し、外
観検査装置等における検査面の高さ測定の正確化に寄与
するところが大きい。
[Effects of the Invention] As explained above, even if the incident light beam is reflected twice on the inspection surface and two light spots are formed, the light spot position measuring device according to the first invention Since the imaging light from the light spot related to the reflection is blocked, only the image of the light spot related to the first reflection is formed on the light receiving surface of the PSD, and the light spot position measuring device according to the second invention , the output of the second PSD includes only the information of the light spot due to the second reflection, and the component related to the second reflection included in the output of the first PSD is from this second reflection.
Since it is removed using the output of the PSD, both inventions have the excellent effect of being able to measure the position of the light spot related to only the first reflection, which could not be measured conventionally. It greatly contributes to the accuracy of surface height measurement.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は第1発明の原理構成図、 第2図は第2発明の原理構成図である。 第3図及び第4図は本発明の第1実施例に係り、第3図
は光点高さ位置測定装置の光学系構成図、第4図はこの
光点高さ位置測定装置の全体構成図である。 第5図は本発明の第2実施例に係る光点高さ位置測定装
置の構成図である。 第6図は従来の光点高さ位置測定装置の構成図である。 6A、56Bは加算器 8A、58B、64.66は減算器 0.62は定数倍器 8は除算器 図中、 10は検査面 12.12A、12Bは結像レンズ 14、+4A、14BはPSD 34A、34Bは遮光板 38A138Bはラック 40A、40Bはパルスモータ 42A、42Bはビニオン 50は遮光板制御回路 54は遮光片 L2 第1発明の原理l!L或図 第 図 角橡1器30 t、φ、鳥、!俊1測足隻1の光学翫構へ図(第1笑杷
例)第3図 高2発明の原理構成図 第2図 高さ測定装置の構成図〈従来技術〉 第6図
FIG. 1 is a diagram of the principle of the first invention, and FIG. 2 is a diagram of the principle of the second invention. 3 and 4 relate to the first embodiment of the present invention, FIG. 3 is an optical system configuration diagram of a light spot height position measuring device, and FIG. 4 is an overall configuration of this light spot height position measuring device. It is a diagram. FIG. 5 is a configuration diagram of a light spot height position measuring device according to a second embodiment of the present invention. FIG. 6 is a configuration diagram of a conventional light spot height position measuring device. 6A, 56B are adders 8A, 58B, 64.66 are subtractors 0.62 is constant multiplier 8 is divider In the diagram, 10 is inspection surface 12. 12B is imaging lens 14, +4A, 14B is PSD 34A, 34B are light shielding plates 38A, 38B are rack 40A, 40B is pulse motor 42A, 42B is binion 50, light shielding plate control circuit 54 is light shielding piece L2 Principle of the first invention l! L/Figure Figure 1 Corner 30 t, φ, bird,! A diagram of the optical rod structure of the Shun 1 footing boat 1 (1st example) Figure 3 A diagram of the principle of the height measuring device 1 Figure 2 A diagram of the configuration of the height measuring device (prior art) Figure 6

Claims (1)

【特許請求の範囲】 1)、光位置検出器(1)と、 検査面(3)上の光点を該光位置検出器(1)の受光面
に結像させる結像光学手段(2)と、 該受光面上に配置され、結像光の一部を遮光する遮光手
段(4)と、 規定範囲外の虚光点(L_2′)からの結像光を遮光す
るために該遮光手段(4)を制御して遮光範囲を調整す
る遮光制御手段(5)と、 を有することを特徴とする光点位置測定装置。 2)、第1光位置検出器(1A)と、 検査面(3)上の光点を該第1光位置検出器(1A)の
受光面に結像させる第1結像光学手段(2A)と、第2
光位置検出器(1B)と、 該検査面(3)上の該光点を該第2光位置検出器(1B
)の受光面に結像させ、かつ、該光点のうち1回目の反
射による光点(L_1)を該受光面の特定位置に結像さ
せる第2結像光学手段(2B)と、該第2光位置検出器
(1B)の該受光面の該特定位置上に配置され、該特定
位置への結像光を遮光する遮光部材(6)と、 該第1光位置検出器(1A)の出力に含まれている2回
目の反射に係る成分を、該第2光位置検出器(1B)の
出力を用いて除去することにより、該第1回目の反射に
係る光点位置を求める光点位置演算手段(7)と、 を有することを特徴とする光点位置測定装置。
[Claims] 1) An optical position detector (1), and an imaging optical means (2) that images a light spot on the inspection surface (3) onto the light receiving surface of the optical position detector (1). and a light shielding means (4) disposed on the light receiving surface to shield a part of the imaged light, and the light shielding means to shield the imaged light from the virtual light point (L_2') outside the specified range. A light spot position measuring device comprising: (4) a light shielding control means (5) for controlling the light shielding range and adjusting the light shielding range. 2), a first optical position detector (1A), and a first imaging optical means (2A) that images a light spot on the inspection surface (3) onto the light receiving surface of the first optical position detector (1A). and the second
an optical position detector (1B), and a second optical position detector (1B) that detects the light spot on the inspection surface (3);
), and a second imaging optical means (2B) that forms an image on a light receiving surface of the light receiving surface, and a light spot (L_1) resulting from the first reflection among the light spots, on a specific position of the light receiving surface; a light shielding member (6) disposed on the specific position of the light receiving surface of the two-light position detector (1B) and blocking imaging light to the specific position; By removing the component related to the second reflection included in the output using the output of the second optical position detector (1B), the light spot position related to the first reflection is determined. A light spot position measuring device comprising: a position calculation means (7);
JP1099340A 1989-04-19 1989-04-19 Light spot position measuring device Expired - Lifetime JP2883627B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1099340A JP2883627B2 (en) 1989-04-19 1989-04-19 Light spot position measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1099340A JP2883627B2 (en) 1989-04-19 1989-04-19 Light spot position measuring device

Publications (2)

Publication Number Publication Date
JPH02278111A true JPH02278111A (en) 1990-11-14
JP2883627B2 JP2883627B2 (en) 1999-04-19

Family

ID=14244896

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1099340A Expired - Lifetime JP2883627B2 (en) 1989-04-19 1989-04-19 Light spot position measuring device

Country Status (1)

Country Link
JP (1) JP2883627B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0569607U (en) * 1992-02-25 1993-09-21 和泉電気株式会社 Photoelectric sensor
JPH0783617A (en) * 1993-09-10 1995-03-28 Nec Corp Lead height measuring system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57211008A (en) * 1981-06-22 1982-12-24 Omron Tateisi Electronics Co Distance measuring device
JPS6362710U (en) * 1986-10-14 1988-04-25

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57211008A (en) * 1981-06-22 1982-12-24 Omron Tateisi Electronics Co Distance measuring device
JPS6362710U (en) * 1986-10-14 1988-04-25

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0569607U (en) * 1992-02-25 1993-09-21 和泉電気株式会社 Photoelectric sensor
JPH0783617A (en) * 1993-09-10 1995-03-28 Nec Corp Lead height measuring system

Also Published As

Publication number Publication date
JP2883627B2 (en) 1999-04-19

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