JPH0237305A - Optical waveguide and its manufacturing method - Google Patents
Optical waveguide and its manufacturing methodInfo
- Publication number
- JPH0237305A JPH0237305A JP18761088A JP18761088A JPH0237305A JP H0237305 A JPH0237305 A JP H0237305A JP 18761088 A JP18761088 A JP 18761088A JP 18761088 A JP18761088 A JP 18761088A JP H0237305 A JPH0237305 A JP H0237305A
- Authority
- JP
- Japan
- Prior art keywords
- refractive index
- waveguide
- layer
- optical waveguide
- cladding layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims description 33
- 238000004519 manufacturing process Methods 0.000 title claims description 8
- 239000004065 semiconductor Substances 0.000 claims abstract description 19
- 239000000758 substrate Substances 0.000 claims abstract description 19
- 238000005253 cladding Methods 0.000 claims description 21
- 150000001875 compounds Chemical class 0.000 claims description 16
- 238000000034 method Methods 0.000 claims description 15
- 229910001218 Gallium arsenide Inorganic materials 0.000 abstract description 7
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 abstract 2
- 238000010030 laminating Methods 0.000 abstract 1
- 229910052984 zinc sulfide Inorganic materials 0.000 description 12
- 239000002994 raw material Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 230000005693 optoelectronics Effects 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000001741 metal-organic molecular beam epitaxy Methods 0.000 description 2
- 150000002894 organic compounds Chemical class 0.000 description 2
- 229910052711 selenium Inorganic materials 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 229910007709 ZnTe Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000003955 hot wall epitaxy Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- WGPCGCOKHWGKJJ-UHFFFAOYSA-N sulfanylidenezinc Chemical compound [Zn]=S WGPCGCOKHWGKJJ-UHFFFAOYSA-N 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Landscapes
- Optical Integrated Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野1
本発明は、光集積回路或いは光電子集積回路等の構成要
素として用いられるII −Vl族化合物半導体の光導
波路に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field 1] The present invention relates to an optical waveguide of a II-Vl group compound semiconductor used as a component of an optical integrated circuit or an optoelectronic integrated circuit.
[従来の技術]
従来報告されているII〜Vl族化合物半導体の光導波
路は、トシャ・ヨコガフ5アプライド・フィジックス・
レター(Toshiya Yokogawa、 App
lPhys、 Leff) Vol、 52. No
、2 f1988) 120に記載されている構造のも
のである。第3図は該光導波路の概絡図であり、5はG
aAs基板、6はZnSより成るクラッド層、7はZn
5e−ZnS超格子より成る導波路層、8はSiO□の
ストライブである。この光導波路はSin、のストライ
ブ幅が6μm、導波路層の厚さが0.4〜124umの
時、波長が0.633μmの光に対してシングルモード
となり、又伝ma ts失は0.71dB/cmである
と報告されている。[Prior art] The optical waveguides of group II to Vl compound semiconductors that have been reported so far are based on Tosha Yokogaff 5 Applied Physics.
Letter (Toshiya Yokogawa, App
lPhys, Leff) Vol, 52. No
, 2 f1988) 120. FIG. 3 is a schematic diagram of the optical waveguide, and 5 is a G
aAs substrate, 6 is a cladding layer made of ZnS, 7 is Zn
5 is a waveguide layer made of an e-ZnS superlattice, and 8 is a stripe of SiO□. This optical waveguide becomes a single mode for light with a wavelength of 0.633 μm when the sin stripe width is 6 μm and the thickness of the waveguide layer is 0.4 to 124 μm, and the transmission loss is 0. It is reported to be 71 dB/cm.
(発明が解決しようとする課題)
しかし、前述の従来技術の光導波路は導波路層上にスト
ライブ状のSiO□を形成することにより、界面と平行
な方向の実効的な屈折率段差をつけている為、この方向
における導波路領域とクラッド域との屈折率の段差が小
さく光の閉じ込めが有効に行われないといつ課題を有す
る。そこで本発明はこの様な課題を解決するもので、そ
の目的とするところは光を有効に閉じ込める構造のIf
−Vl族化合物半導体の光導波路及びその製造方法を
提供するところにある。(Problem to be Solved by the Invention) However, the optical waveguide of the prior art described above creates an effective refractive index step in the direction parallel to the interface by forming striped SiO□ on the waveguide layer. Therefore, there is a problem when the step in the refractive index between the waveguide region and the cladding region in this direction is small and light confinement cannot be performed effectively. Therefore, the present invention is intended to solve such problems, and its purpose is to create an If structure that effectively confines light.
- An optical waveguide made of a Vl group compound semiconductor and a method for manufacturing the same are provided.
[課題を解決するための手段]
本発明の光導波路は、基板上にII −Vl族化合物半
導体より成るクラッド層と、該クラッド層上の一部に該
クラッド層よりも大きな屈折率を有するII −Vl族
化合物半導体より成る導波路層を積層した構造を有する
ことを特徴とする。さらに該光導波路の製造方法は、基
板上にクラッド層を形成する工程と、該クラッド層上に
マスクを形成する工程と、該マスクを用いて導波路層を
クラッド層上の一部に選択的に形成する工程と、マスク
を除去する工程とを含むことを特徴とする。[Means for Solving the Problems] The optical waveguide of the present invention includes a cladding layer made of a II-Vl group compound semiconductor on a substrate, and a portion of the cladding layer having a II-Vl compound semiconductor having a larger refractive index than the cladding layer. - It is characterized by having a structure in which waveguide layers made of a Vl group compound semiconductor are laminated. Furthermore, the method for manufacturing the optical waveguide includes a step of forming a cladding layer on a substrate, a step of forming a mask on the cladding layer, and a step of selectively applying the waveguide layer to a part of the cladding layer using the mask. and a step of removing the mask.
(実 施 例〕
第1図は本発明の実施例におけるII −Vl族化合物
半導体の光導波路の概略断面図である。1はGaAs基
板、2はZnSより成るクラッド層、3はZn5eより
成る導波路層である。この構造番トおいて、界面と垂直
な方向は導波路層のZn5eの屈折率が2.34に対し
て下部のクラッド層のZnSの屈折率が2.31及び上
部は屈折率が1.0の大気である為屈折率の段差は十分
に大きく、又界面と平行な方向においても屈折率が2゜
34の導波路層を屈折率が1.0の大気で挟んだ構造の
為屈折率の段差は十分に大きい。この様に導波路層とそ
の周囲との屈折率の段差が大きい為、導波路層への光の
閉じ込めが有効に行われる。0.6328μmの波長の
光を用いて該光導波路の伝搬損失を測定したところ0
、5 dB/Cm以下と低損失なものであった。これは
、前述した様に光が導波路層内に有効に閉じ込められて
いる為、GaAs基板中への光のしみ出しが小さくGa
As基板内での吸収が小さいことを示す。又、後述する
様に光導波路の製造工程において導波路層のエツチング
をする必要がない為、導波路層の表面が平坦であり散乱
損が小さいことも低損失の一因である。ZnS及びZn
5e等のII −Vl族化合物半導体は、基板のGaA
sと同じ閃亜鉛鉱型の結晶構造である為GaAs基板上
に容易にエピタキシャル成長できる。又、発光素子及び
受光素子等の光デバイスや電子デバイスもGaAs基板
上に作製することができる為、本発明の光導波路はこれ
らのデバイスを集積化した光集積回路或いは光電子集積
回路等に容易に応用することができる。又基板としてG
aAS以外にもInP等のIII−V族半導体基板も用
いることができる。又導波路層及びクラッド層の材料と
して表1に示した様なII −Vl族化合物半導体を用
いることもできる。(Embodiment) FIG. 1 is a schematic cross-sectional view of an optical waveguide made of a II-Vl group compound semiconductor in an embodiment of the present invention. 1 is a GaAs substrate, 2 is a cladding layer made of ZnS, and 3 is a guide made of Zn5e. In this structure number, in the direction perpendicular to the interface, the refractive index of Zn5e in the waveguide layer is 2.34, whereas the refractive index of ZnS in the lower cladding layer is 2.31, and the refractive index in the upper part is 2.34. Since the atmosphere has a refractive index of 1.0, the difference in refractive index is sufficiently large, and even in the direction parallel to the interface, the waveguide layer with a refractive index of 2°34 is sandwiched between the atmosphere with a refractive index of 1.0. Therefore, the difference in refractive index is sufficiently large.As the difference in refractive index between the waveguide layer and its surroundings is large, the light is effectively confined in the waveguide layer.At a wavelength of 0.6328 μm, When the propagation loss of the optical waveguide was measured using light, it was 0.
, 5 dB/Cm or less, resulting in low loss. This is because, as mentioned above, light is effectively confined within the waveguide layer, so light seepage into the GaAs substrate is small.
This shows that absorption within the As substrate is small. Further, as will be described later, since there is no need to etch the waveguide layer in the manufacturing process of the optical waveguide, the surface of the waveguide layer is flat and the scattering loss is small, which also contributes to the low loss. ZnS and Zn
II-Vl group compound semiconductors such as 5e have a GaA substrate.
Since it has the same zincblende crystal structure as s, it can be easily epitaxially grown on a GaAs substrate. Furthermore, since optical devices and electronic devices such as light emitting elements and light receiving elements can be fabricated on GaAs substrates, the optical waveguide of the present invention can be easily integrated into optical integrated circuits or optoelectronic integrated circuits that integrate these devices. It can be applied. Also, as a substrate
In addition to aAS, a III-V group semiconductor substrate such as InP can also be used. Further, II-Vl group compound semiconductors as shown in Table 1 can also be used as materials for the waveguide layer and the cladding layer.
表1
以下に本発明の光導波路の製造方法を第2図(a)〜(
d)を用いて説明する。初めに、GaAs基板上に下部
のクラッド層となるZnS層をMOCVD法によりエピ
タキシャル成長し、次に熱CVD法等によりマスク4の
8102を堆積する。この状態が第2図(a)である。Table 1 The method for manufacturing the optical waveguide of the present invention is shown below in Figures 2(a) to (
This will be explained using d). First, a ZnS layer to be a lower cladding layer is epitaxially grown on a GaAs substrate by MOCVD, and then mask 4 8102 is deposited by thermal CVD or the like. This state is shown in FIG. 2(a).
ZnSのエピタキシャル成長方法には、他にMBE法、
MOMBE法或いはホットウォールエピタキシー法等が
有り、これ等の方法によってもZnSのクラッド層を同
様に形成することが可能である。次にフォトリソグラフ
ィ技術によりS i 02のバターニングを行う、この
場合導波路層を形成する部分のSiO□膜をエツチング
により除去する。この状態が第2図(b)である。バタ
ーニングされた5iO=をマスクとして選択エピタキシ
ャル成長によりZn5eの導波路層を形成し第2図(c
)の様にする。Zn5eの選択エピタキシャル成長は以
下の様な方法で行うことができる。原料としてZn及び
Seの有機化合物を用い、成長圧力が100Torr以
下、成長温度が400℃以上700℃以下、Vl族原料
とII族原料の原料供給モル比が6以下の条件の下で減
圧MOCVD法或いはMOMBE法により行う、導波路
層であるZn5eを形成した後、沸酸系のエッチャント
により5102を除去し第2図(d)の様に光導波路が
完成する。上記の例ではマスクとしてSiO□を用いた
例について示したが、5i=N、等の他の誘電体薄膜或
いはW等も同様に用いることができる。Other epitaxial growth methods for ZnS include MBE method,
There are MOMBE method, hot wall epitaxy method, etc., and it is possible to form a ZnS cladding layer in the same way by these methods as well. Next, the SiO2 film is patterned by photolithography, and in this case, the SiO□ film in the portion where the waveguide layer is to be formed is removed by etching. This state is shown in FIG. 2(b). A waveguide layer of Zn5e was formed by selective epitaxial growth using the patterned 5iO= as a mask, as shown in Fig. 2(c).
). Selective epitaxial growth of Zn5e can be performed by the following method. Organic compounds of Zn and Se are used as raw materials, the growth pressure is 100 Torr or less, the growth temperature is 400°C or more and 700°C or less, and the raw material supply molar ratio of Group Vl raw material and Group II raw material is 6 or less. Alternatively, after forming a waveguide layer of Zn5e using the MOMBE method, 5102 is removed using a hydrofluoric acid-based etchant to complete an optical waveguide as shown in FIG. 2(d). In the above example, SiO□ was used as the mask, but other dielectric thin films such as 5i=N, W, etc. can be used in the same way.
又、CdS、ZnTe、CdSe等の選択エピタキシャ
ル成長する場合、Cd、S、Zn、Te、Seのそれぞ
れの有機化合物を原料として用いる。Further, in the case of selective epitaxial growth of CdS, ZnTe, CdSe, etc., each organic compound of Cd, S, Zn, Te, and Se is used as a raw material.
[発明の効果1
以上述べた様に本発明のII −VI族化合物半導体の
光導波路は下記の効果を有する。[Effects of the Invention 1 As described above, the optical waveguide of the II-VI group compound semiconductor of the present invention has the following effects.
1)本発明の光導波路の構造において光の閉じ込めを有
効に行うことができる。1) Light can be effectively confined in the optical waveguide structure of the present invention.
1i)i)により光学的な非線形効果を有効に使うこと
が可能になる。1i) i) makes it possible to effectively use optical nonlinear effects.
1ii)可視の光に対して低損失である。1ii) Low loss for visible light.
iv)発光素子及び受光素子を構成するIII −V族
化合物半導体と同じ結晶構造を有する為、これ等の光デ
バイスと同一基板上に本発明の光導波路を容易に作製す
ることが可能である。これは1本発明の光導波路が光集
積回路或いは光電子集積回路等の構成要素として適して
いることを意味する。iv) Since it has the same crystal structure as the III-V compound semiconductor constituting the light emitting element and the light receiving element, it is possible to easily fabricate the optical waveguide of the present invention on the same substrate as these optical devices. This means that the optical waveguide of the present invention is suitable as a component of an optical integrated circuit or an optoelectronic integrated circuit.
又、本発明の光導波路の製造方法は以下の様な効果を有
する。Furthermore, the method for manufacturing an optical waveguide of the present invention has the following effects.
V)上記の構造の光導波路をセルファラインプロセスで
容易に作製することができる。V) The optical waveguide having the above structure can be easily manufactured by a self-line process.
vi)導波路層のエツチング工程が不要である為、エツ
チングによって、必然的に起る表面の荒れを防ぐことが
でき散乱損失の小さい光導波路を作製することができる
。vi) Since the etching process of the waveguide layer is unnecessary, it is possible to prevent surface roughness that inevitably occurs due to etching, and to produce an optical waveguide with low scattering loss.
第1図は本発明の実施例におけるII −Vl族化合物
半導体の光導波路の概略断面図。
第2図は(a)〜(d)は本発明のTI −Vl族化合
物半導体の光導波路の製造工程を示す概略断面図。
第3図は従来技術のII −Vl族化合物半導体の光導
波路の概略図。
・GaAS基板
・ZnSクラッド層
Zn5e導波路層
SiO□マスク
GaAs基板
ZnSクラッド層
Zn5e−ZnS超格子導波路層
in2
以上
出願人 セイコーエプソン株式会社
代理人 弁理士 上 柳 雅 誉(他1名)[裏
早
ろFIG. 1 is a schematic cross-sectional view of an optical waveguide made of a II-Vl group compound semiconductor in an embodiment of the present invention. FIGS. 2(a) to 2(d) are schematic cross-sectional views showing the manufacturing process of the optical waveguide of the TI-Vl group compound semiconductor of the present invention. FIG. 3 is a schematic diagram of a conventional II-Vl group compound semiconductor optical waveguide.・GaAS substrate ・ZnS cladding layer Zn5e waveguide layer SiO□ mask GaAs substrate ZnS cladding layer Zn5e-ZnS superlattice waveguide layer in2 Hurry up
Claims (2)
層と、該クラッド層上の一部に該クラッド層よりも大き
な屈折率を有するII−VI族化合物半導体より成る導波路
層を積層した構造を有することを特徴とする光導波路。(1) A cladding layer made of a II-VI compound semiconductor is laminated on a substrate, and a waveguide layer made of a II-VI compound semiconductor having a larger refractive index than the cladding layer is partially laminated on the cladding layer. An optical waveguide characterized by having a structure.
ド層上にマスクを形成する工程と、該マスクを用いて導
波路層をクラッド層上の一部に選択的に形成する工程と
、マスクを除去する工程を含むことを特徴とする光導波
路の製造方法。(2) forming a cladding layer on the substrate; forming a mask on the cladding layer; and selectively forming a waveguide layer on a portion of the cladding layer using the mask; A method for manufacturing an optical waveguide, the method comprising the step of removing a mask.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18761088A JPH0237305A (en) | 1988-07-27 | 1988-07-27 | Optical waveguide and its manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18761088A JPH0237305A (en) | 1988-07-27 | 1988-07-27 | Optical waveguide and its manufacturing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0237305A true JPH0237305A (en) | 1990-02-07 |
Family
ID=16209122
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18761088A Pending JPH0237305A (en) | 1988-07-27 | 1988-07-27 | Optical waveguide and its manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0237305A (en) |
-
1988
- 1988-07-27 JP JP18761088A patent/JPH0237305A/en active Pending
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