JPH0240880A - Socket for semiconductor parts - Google Patents

Abstract

PURPOSE:To enable the simultaneous terminal dimension inspection and electrical characteristic measurement of a measured material bv providing a go gauge allowing the passing of a terminal of a specified dimension of a semiconductor part and a not-go gauge preventing the passing of a terminal beyond the specified dimension. CONSTITUTION:A go gauge 2 and a not-go gauge 4 are provided on the passing-in side and the passing-out side of a pin hole 3a in a socket 3. The gauge 2 is provided with a gauge port 2a having an aperture allowing the passing of a terminal 1a of a specified dimension of a semiconductor part 1, and the not-go gauge 4 is provided with a gauge port 4a having an aperture preventing the passing of the terminal 1a beyond the specified dimension, and the gauge ports 2a, 4a are formed so as to coincide with the pin hole 3a of the socket 3. Thus, the terminal 1a within the specified dimension of the semiconductor part 1 is passed through the gauge port 2a of the go gauge 2, inserted into the pin port 3a of the socket a for electrical continuity, and stopped by the not-go gauge 4, so that it can not be inserted beyond that. Hence, the terminal dimension inspection and electric characteristic measurement of a measured material can be conducted simultaneously.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a jig used for testing semiconductor components.

[Conventional technology]

Conventionally, the terminal dimensions of conductor parts have been inspected using ordinary length measuring instruments (calipers, dial gauges).

[Problem to be solved by the invention]

Inspecting the terminal dimensions of semiconductor components using the conventional length measuring device described above takes time and effort to measure each terminal, and the measurement of electrical characteristics must be done separately, and must be carried out separately as part of the product inspection process. I had to.

An object of the present invention is to provide a socket for semiconductor components that solves the above problems.

[Means to solve the problem]

To achieve the above object, the present invention provides a semiconductor component socket used for measuring the electrical characteristics of a semiconductor component, which allows a terminal of a specified size of the semiconductor component to pass before and after a pin hole into which the terminal of the semiconductor component is inserted. It has a pass gauge and a blind gauge that prevents terminals with dimensions other than the specified size from passing.

〔Example〕

Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

FIG. 1 is a longitudinal sectional view showing one embodiment of the present invention.

In the figure, a socket 3 for measuring the +, l+ atmospheric characteristics of a semiconductor component is equipped with a pin hole 3a into which a terminal 1a of a semiconductor component 1 is inserted, and a spring-like material that is crimped onto the terminal 1a is inserted into the pin hole 3a. A contactor 3b is provided, and a cable 5 for exchanging signals with an external circuit is connected to the contactor 3b.

Further, a pass gauge 2 is provided before and after the pin hole 3a of the socket 3, that is, a pass gauge 2 is provided on the passing side of the pin hole 3a, and a blind gauge 4 is provided on the exit side. The pass gauge 2 has a gauge hole 2a with a diameter that allows the terminal 1a of a specified size of the semiconductor component 1 to pass through, and the blind gauge 4 has a gauge hole 4a with a diameter that prevents the terminal 1a of a size other than the specified size from passing through. The gauge holes 2a and 4a of each gauge 2.4 are equipped with a socket 3.
This corresponds to the pin hole 3a.

The terminal 1a of the semiconductor component 1 within the specified dimensions is determined by the pass gauge 2.
It passes through the gauge hole 2a, is inserted into the pin hole 3a of the socket 3, and electrical continuity is established, and stops at the dead gauge 4, so that it cannot be inserted any further.

In addition, products whose terminal thickness deviates from the maximum standard size cannot be inserted into this soget, and products whose terminal thickness deviates from the minimum standard size cannot be inserted into this soget.
By inserting the device deeper into the socket than specified, it can be confirmed that the device is out of compliance with the standard.

〔Effect of the invention〕

As explained above, the present invention simultaneously inspects the terminal dimensions and measures the electrical characteristics of the semiconductor component to be measured by combining a socket for measuring electrical characteristics with a dimension gauge that matches the terminals of the semiconductor component to be measured. It has the effect that it can.

[Brief explanation of the drawing]

FIG. 1 is a longitudinal sectional view showing one embodiment of the present invention.

Claims (1)

[Claims] (1) In a socket for semiconductor components used to measure the electrical characteristics of semiconductor components, a gauge and a gauge other than the specified size are placed before and after the pin hole into which the terminal of the semiconductor component is inserted. A socket for semiconductor components characterized by having a dead gauge that prevents passage of a terminal.