JPH0247566U - - Google Patents
Info
- Publication number
- JPH0247566U JPH0247566U JP12605888U JP12605888U JPH0247566U JP H0247566 U JPH0247566 U JP H0247566U JP 12605888 U JP12605888 U JP 12605888U JP 12605888 U JP12605888 U JP 12605888U JP H0247566 U JPH0247566 U JP H0247566U
- Authority
- JP
- Japan
- Prior art keywords
- calibration
- sections
- scanning direction
- flaw
- test piece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
第１図は本考案の校正用テストピースの平面図
。第２図は第１図の―線からみた側面図。第
３図は第１図の―線からみた側面図。第４図
は従来の校正用テストピースの平面図。第５図は
第４図の―線からみた側面図。第６図は従来
の校正用テストピースの使用例の説明図。第７図
は本考案の校正用テストピースの使用例の説明図
。第８図は本考案の探傷装置側面図。第９図は第
８図の別な実施例を示す側面図。
１：板厚校正部、２：傷校正部、１１：厚み基
準区分、２１：疑似欠陥傷基準区分。
FIG. 1 is a plan view of the calibration test piece of the present invention. Figure 2 is a side view taken from the - line in Figure 1. Figure 3 is a side view taken from the - line in Figure 1. FIG. 4 is a plan view of a conventional calibration test piece. Figure 5 is a side view taken from the - line in Figure 4. FIG. 6 is an explanatory diagram of an example of the use of a conventional calibration test piece. FIG. 7 is an explanatory diagram of an example of use of the calibration test piece of the present invention. FIG. 8 is a side view of the flaw detection device of the present invention. FIG. 9 is a side view showing another embodiment of FIG. 8. 1: Plate thickness calibration section, 2: Flaw calibration section, 11: Thickness reference division, 21: Pseudo defect flaw reference division.
Claims (1)
のテストピースにおいて、走査方向に関して、複
数の厚み基準区分からなる板厚校正部と、複数の
疑似欠陥基準区分からなる傷校正部とを複数列に
設けると共に、走査方向に対して直角方向に移動
装置を設けた校正用テストピース。 In a test piece for calibrating an ultrasonic flaw detector for full-surface flaw detection of thick plates, a plurality of plate thickness calibration sections consisting of a plurality of thickness reference sections and flaw calibration sections consisting of a plurality of pseudo defect reference sections are used in the scanning direction. Calibration test pieces provided in rows and provided with a moving device in a direction perpendicular to the scanning direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12605888U JPH0247566U (en) | 1988-09-27 | 1988-09-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12605888U JPH0247566U (en) | 1988-09-27 | 1988-09-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0247566U true JPH0247566U (en) | 1990-03-30 |
Family
ID=31377224
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12605888U Pending JPH0247566U (en) | 1988-09-27 | 1988-09-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0247566U (en) |
-
1988
- 1988-09-27 JP JP12605888U patent/JPH0247566U/ja active Pending
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