JPH0248877U - - Google Patents
Info
- Publication number
- JPH0248877U JPH0248877U JP12871588U JP12871588U JPH0248877U JP H0248877 U JPH0248877 U JP H0248877U JP 12871588 U JP12871588 U JP 12871588U JP 12871588 U JP12871588 U JP 12871588U JP H0248877 U JPH0248877 U JP H0248877U
- Authority
- JP
- Japan
- Prior art keywords
- defect
- inspected
- board
- defect location
- crt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 claims description 13
- 238000007689 inspection Methods 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 239000000523 sample Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Locating Faults (AREA)
Description
第１図は本考案の一実施例を説明する欠陥箇所
指示装置の外観斜視図、第２図は第１図における
筐体部の横断面図、第３図ａは本考案の実施例の
装置を使用した欠陥箇所の指示手段を説明する斜
視図、第３図ｂは第３図ａにおいて白黒ＣＲＴを
使用した場合の表示例を示す平面図、第３図ｃは
同じくカラーＣＲＴを使用した場合の表示例を示
す平面図、第４図は本考案における布線検査手段
の分解斜視図、第５図は従来の一例を説明するた
めの欠陥箇所指示手段の分解斜視図である。
１…筐体、１ａ…足、２…枠体、３…透明板、
４…ＣＲＴ、５…印刷配線基板、５ａ…パイロツ
ト孔、６…キーボード装置、７…記憶装置、８…
制御部、８ａ…テスター装置、９…指示回路、１
０…支持体、１１…プローブ配列板、１２…測定
プローブ、１３…パイロツトピン。
Fig. 1 is an external perspective view of a defect point indicating device illustrating an embodiment of the present invention, Fig. 2 is a cross-sectional view of the casing in Fig. 1, and Fig. 3a is a device according to an embodiment of the present invention. FIG. 3b is a plan view showing an example of the display when a monochrome CRT is used in FIG. 3a, and FIG. FIG. 4 is an exploded perspective view of the wiring inspection means of the present invention, and FIG. 5 is an exploded perspective view of the defect point indicating means for explaining a conventional example. 1... Housing, 1a... Legs, 2... Frame body, 3... Transparent plate,
4...CRT, 5...Printed wiring board, 5a...Pilot hole, 6...Keyboard device, 7...Storage device, 8...
Control unit, 8a...Tester device, 9...Instruction circuit, 1
0...Support body, 11...Probe array plate, 12...Measurement probe, 13...Pilot pin.
Claims (1)
透明板と、複数の導通孔を形成した被検査基板の
品名情報等を入力するキーボード装置と、前記被
検査基板の布線検査欠陥箇所及び欠陥の種類に関
する情報を記憶する記憶装置と、前記記憶装置に
基づき前記欠陥箇所を示すＸ，Ｙ座標値信号と欠
陥種類を示す信号と前記基板の位置決めパイロツ
ト位置を示すＸ，Ｙ座標値信号とを入力し前記Ｃ
ＲＴ上に欠陥箇所アドレスと欠陥種類と位置決め
パイロツト位置とを表示出力する指示回路と、前
記欠陥箇所を示すＸ，Ｙ座標値をチエツクするテ
スター装置と、前記キーボード装置と前記記憶装
置と前記指示回路と前記テスター装置とに接続さ
れこれらを制御する制御部とを有し、前記被検査
基板を前記透明板の上に位置決めし、前記ＣＲＴ
より光照射して前記基板の布線検査欠陥箇所と欠
陥種類を指示するようにしたことを特徴とする布
線検査欠陥箇所の指示装置。 A CRT attached to the housing, a transparent plate placed on the CRT, a keyboard device for inputting product name information, etc. of the board to be inspected with a plurality of conductive holes formed therein, and a keyboard device for inputting information such as the product name of the board to be inspected, and information on wiring inspection defects and defects on the board to be inspected. a memory device that stores information regarding the type of defect; and an X, Y coordinate value signal indicating the defect location based on the memory device, a signal indicating the defect type, and an X, Y coordinate value signal indicating the positioning pilot position of the substrate. Enter the above C
an instruction circuit that displays and outputs a defect location address, defect type, and positioning pilot position on RT; a tester device that checks X and Y coordinate values indicating the defect location; the keyboard device; the storage device; and the instruction circuit. and a control section that is connected to and controls the tester device, positions the substrate to be inspected on the transparent plate, and controls the CRT.
1. A wiring inspection defect location indicating device, characterized in that the wiring inspection defect location and defect type of the board are indicated by irradiating more light.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12871588U JPH0248877U (en) | 1988-09-30 | 1988-09-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12871588U JPH0248877U (en) | 1988-09-30 | 1988-09-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0248877U true JPH0248877U (en) | 1990-04-04 |
Family
ID=31382315
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12871588U Pending JPH0248877U (en) | 1988-09-30 | 1988-09-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0248877U (en) |
-
1988
- 1988-09-30 JP JP12871588U patent/JPH0248877U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0248877U (en) | ||
| JPS63159775U (en) | ||
| JPH0447668U (en) | ||
| JPH0399376U (en) | ||
| JPH0299373U (en) | ||
| JPH01142870U (en) | ||
| JPS62140466U (en) | ||
| JPH01128179U (en) | ||
| JPH04566A (en) | Conductive land position determining system | |
| JPS59149070U (en) | Printed wiring board wiring test equipment | |
| JPS6196570U (en) | ||
| JPH0690262B2 (en) | Defect location indicator for component mounted printed circuit board | |
| TW200846686A (en) | A lead contact module for detecting circuit board | |
| JPS62108874U (en) | ||
| JPS62140471U (en) | ||
| JPH025083U (en) | ||
| JPH0469779U (en) | ||
| JPH02136762A (en) | Apparatus for inspecting wiring of printed circuit board | |
| JPH01148871U (en) | ||
| JPS5813000U (en) | Printed circuit board defective location display device | |
| JPS6146479U (en) | Printed circuit board inspection equipment | |
| JPS62102173U (en) | ||
| JPS63276U (en) | ||
| JPS6117671U (en) | Printed board testing equipment | |
| TW202122744A (en) | Thickness measuring method and system of PCB capable of improving the degree of precision for subsequent drillings by conducting thickness measurements on multiple locations of the PCB |